producing ion implantation

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CPC
H01L21/265

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Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Current Industry

H01L21/265producing ion implantation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Switching device and method of manufacturing such a device
- Patent number 12,230,628
- Issue date Feb 18, 2025
- STMicroelectronics (Tours) SAS
- Aurelie Arnaud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing semiconductor device
- Patent number 12,230,501
- Issue date Feb 18, 2025
- Fuji Electric Co., Ltd.
- Naoko Kodama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation hardened high voltage superjunction MOSFET
- Patent number 12,230,674
- Issue date Feb 18, 2025
- IceMos Technology Limited
- Kiraneswar Muthuseenu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor device using gate-through imp...
- Patent number 12,224,211
- Issue date Feb 11, 2025
- SK keyfoundry Inc.
- Hee Hwan Ji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming backside power rails
- Patent number 12,224,324
- Issue date Feb 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Po-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radio frequency transistor amplifiers having self-aligned double im...
- Patent number 12,224,318
- Issue date Feb 11, 2025
- Wolfspeed, Inc.
- Kyle Bothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for FinFet fabrication and structure thereof
- Patent number 12,224,210
- Issue date Feb 11, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Han-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming an oxide volume within a fin
- Patent number 12,224,202
- Issue date Feb 11, 2025
- Intel Corporation
- Cheng-Ying Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical power semiconductor device and manufacturing method
- Patent number 12,224,317
- Issue date Feb 11, 2025
- Infineon Technologies AG
- Hans-Joachim Schulze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and fabrication method thereof
- Patent number 12,224,335
- Issue date Feb 11, 2025
- United Microelectronics Corp.
- Ching-Chung Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact architecture for capacitance reduction and satisfactory con...
- Patent number 12,224,326
- Issue date Feb 11, 2025
- Intel Corporation
- Rishabh Mehandru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryogenic packaging for thermalization of low temperature devices
- Patent number 12,219,737
- Issue date Feb 4, 2025
- International Business Machines Corporation
- Oblesh Jinka
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Device architectures with tensile and compressive strained substrates
- Patent number 12,218,201
- Issue date Feb 4, 2025
- National University of Singapore
- Bich-Yen Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flash memory device with three dimensional half flash structure and...
- Patent number 12,218,253
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Chu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device and method of forming same
- Patent number 12,218,222
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Wei Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 12,218,234
- Issue date Feb 4, 2025
- Rohm Co., Ltd.
- Kengo Omori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor gate structures and methods of forming the same
- Patent number 12,218,199
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsin-Yi Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Doped semiconductor layer forming method
- Patent number 12,217,964
- Issue date Feb 4, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Virginie Maffini Alvaro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside ohmic contacts for semiconductor devices
- Patent number 12,211,920
- Issue date Jan 28, 2025
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Srinivasa Reddy Yeduru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device and method of forming same
- Patent number 12,211,938
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shahaji B. More
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power diode and method of manufacturing a power diode
- Patent number 12,211,945
- Issue date Jan 28, 2025
- Infineon Technologies Austria AG
- Anton Mauder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a doped fin well
- Patent number 12,211,901
- Issue date Jan 28, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bau-Ming Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming a semiconductor device having a second semicond...
- Patent number 12,211,703
- Issue date Jan 28, 2025
- Infineon Technologies AG
- Hans-Joachim Schulze
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, and method of manufacturing semiconductor device
- Patent number 12,205,993
- Issue date Jan 21, 2025
- Fuji Electric Co., Ltd.
- Hiroki Wakimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure for IC with epi regions sharing the same tank
- Patent number 12,205,944
- Issue date Jan 21, 2025
- Texas Instruments Incorporated
- Henry Litzmann Edwards
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with gradual injection of charge carriers for...
- Patent number 12,199,141
- Issue date Jan 14, 2025
- HITACHI ENERGY LTD
- Wolfgang Amadeus Vitale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage edge termination structure for power semiconductor dev...
- Patent number 12,199,153
- Issue date Jan 14, 2025
- TAIWAN SEMICONDUCTOR CO., LTD.
- Hamza Yilmaz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for modifying the strain state of a block of a semiconductin...
- Patent number 12,198,940
- Issue date Jan 14, 2025
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sylvain Maitrejean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing semiconductor device
- Patent number 12,199,186
- Issue date Jan 14, 2025
- Semiconductor Energy Laboratory Co., Ltd.
- Kenichi Okazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing line-end space in integrated circuit patterning
- Patent number 12,197,131
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jing-Huei Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RIBBON BEAM ANGLE ADJUSTMENT IN AN ION IMPLANTATION SYSTEM
- Publication number 20250062097
- Publication date Feb 20, 2025
- ADVANCED ION BEAM TECHNOLOGY, INC.
- Zhimin WAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FORMING NOTCHES ON WAFER SIDEWALL FOR WAFER CUT
- Publication number 20250062159
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chen-Hua Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20250063777
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun Hsiung TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GALLIUM NITRIDE TRANSISTOR WITH A DOPED REGION
- Publication number 20250063755
- Publication date Feb 20, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Dong Seup LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NAND String Utilizing Floating Body Memory Cell
- Publication number 20250063718
- Publication date Feb 20, 2025
- Zeno Semiconductor, Inc.
- Benjamin S. Louie
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH-FREQUENCY DRAIN-EXTENDED METAL-OXIDE-SEMICONDUCTOR (DEMOS) DEV...
- Publication number 20250056829
- Publication date Feb 13, 2025
- Zhejiang University
- Kai XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MAKING
- Publication number 20250056855
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Zhuo-Cang YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20250056836
- Publication date Feb 13, 2025
- Mitsubishi Electric Corporation
- Yuichi NAGAHISA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING DISASSEMBLABLE SUBSTRATES
- Publication number 20250054762
- Publication date Feb 13, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Thierry SALVETAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20250048717
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Hokyun AN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH DIFFUSION SUPPRESSION AND LDD IMPLANTS AN...
- Publication number 20250048724
- Publication date Feb 6, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Mahalingam Nandakumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE FIELD EFFECT TRANSISTORS WITH DIFFERENT SIDEWALL SPACE...
- Publication number 20250040239
- Publication date Jan 30, 2025
- WESTERN DIGITAL TECHNOLOGIES, INC.,
- Sriharsha KARUMURI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIC SEMICONDUCTOR DEVICE IMPLEMENTED ON INSULATING OR SEMI-INSULATI...
- Publication number 20250031407
- Publication date Jan 23, 2025
- Korea Electrotechnology Research Institute
- Hyoung Woo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COUPLED GUARD RINGS FOR EDGE TERMINATION
- Publication number 20250031416
- Publication date Jan 23, 2025
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Clifford DROWLEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW COST, HIGH PERFORMANCE ANALOG METAL OXIDE SEMICONDUCTOR TRANSISTOR
- Publication number 20250031445
- Publication date Jan 23, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Pushpa Mahalingam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR A...
- Publication number 20250029838
- Publication date Jan 23, 2025
- Fuji Electric Co., Ltd.
- Kosuke YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TRANSFERRING BLOCKS FROM A DONOR SUBSTRATE ONTO A RECEIV...
- Publication number 20250022748
- Publication date Jan 16, 2025
- SOITEC
- Didier Landru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR A FRONT-FACING IMAGE SENSOR
- Publication number 20250015122
- Publication date Jan 9, 2025
- SOITEC
- Walter Schwarzenbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPLANTATION METHOD
- Publication number 20250014903
- Publication date Jan 9, 2025
- Fraunhofer Gesellschaft zur Forderung der angewandten Forschung e.V.
- Christian Giese
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SUBSTRATE, MANUFACTURING METHOD THEREOF AND MANUFACTU...
- Publication number 20250014897
- Publication date Jan 9, 2025
- Rohm Co., Ltd.
- Makoto TAKAMURA
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME
- Publication number 20250015173
- Publication date Jan 9, 2025
- UNITED MICROELECTRONICS CORP.
- Shin-Chuan Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20250006849
- Publication date Jan 2, 2025
- ROHM CO., LTD.
- Ryo YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NITRIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
- Publication number 20250006798
- Publication date Jan 2, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Hideyuki OKITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING SOURCE PRECURSOR DELIVERY SYSTEM
- Publication number 20250003057
- Publication date Jan 2, 2025
- Entegris, Inc.
- Weihang Guan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM OF JUNCTION TERMINATION EXTENSION IN HIGH VOLTAGE...
- Publication number 20250006784
- Publication date Jan 2, 2025
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Subhash Srinivas PIDAPARTHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
- Publication number 20240429315
- Publication date Dec 26, 2024
- Vanguard International Semiconductor Corporation
- Wen-Shan LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE-BALANCE POWER DEVICE, AND PROCESS FOR MANUFACTURING THE CHAR...
- Publication number 20240429273
- Publication date Dec 26, 2024
- STMicroelectronics S.r.l.
- Antonello SANTANGELO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH ISOLATION WITH FIELD OXIDE
- Publication number 20240429275
- Publication date Dec 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TEMPERATURE MEASUREMENT METHOD
- Publication number 20240421008
- Publication date Dec 19, 2024
- KIOXIA Corporation
- Shunsuke OKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240421152
- Publication date Dec 19, 2024
- Fuji Electric Co., Ltd.
- Yuki SAWA
- H01 - BASIC ELECTRIC ELEMENTS

producing ion implantation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Switching device and method of manufacturing such a device

Semiconductor device and method of manufacturing semiconductor device

Radiation hardened high voltage superjunction MOSFET

Manufacturing method of semiconductor device using gate-through imp...

Method of forming backside power rails

Radio frequency transistor amplifiers having self-aligned double im...

Method for FinFet fabrication and structure thereof

Forming an oxide volume within a fin

Vertical power semiconductor device and manufacturing method

Semiconductor device and fabrication method thereof

Contact architecture for capacitance reduction and satisfactory con...

Cryogenic packaging for thermalization of low temperature devices

Device architectures with tensile and compressive strained substrates

Flash memory device with three dimensional half flash structure and...

FinFET device and method of forming same

Semiconductor device and method of manufacturing the same

Transistor gate structures and methods of forming the same

Doped semiconductor layer forming method

Backside ohmic contacts for semiconductor devices

FinFET device and method of forming same

Power diode and method of manufacturing a power diode

Semiconductor device having a doped fin well

Methods for forming a semiconductor device having a second semicond...

Semiconductor device, and method of manufacturing semiconductor device

Isolation structure for IC with epi regions sharing the same tank

Semiconductor device with gradual injection of charge carriers for...

High voltage edge termination structure for power semiconductor dev...

Method for modifying the strain state of a block of a semiconductin...

Semiconductor device and method for manufacturing semiconductor device

Method for reducing line-end space in integrated circuit patterning

Patents Applicationslast 30 patents

RIBBON BEAM ANGLE ADJUSTMENT IN AN ION IMPLANTATION SYSTEM

FORMING NOTCHES ON WAFER SIDEWALL FOR WAFER CUT

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

GALLIUM NITRIDE TRANSISTOR WITH A DOPED REGION

NAND String Utilizing Floating Body Memory Cell

HIGH-FREQUENCY DRAIN-EXTENDED METAL-OXIDE-SEMICONDUCTOR (DEMOS) DEV...

SEMICONDUCTOR DEVICE AND METHOD OF MAKING

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING DISASSEMBLABLE SUBSTRATES

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE WITH DIFFUSION SUPPRESSION AND LDD IMPLANTS AN...

HIGH VOLTAGE FIELD EFFECT TRANSISTORS WITH DIFFERENT SIDEWALL SPACE...

SIC SEMICONDUCTOR DEVICE IMPLEMENTED ON INSULATING OR SEMI-INSULATI...

COUPLED GUARD RINGS FOR EDGE TERMINATION

LOW COST, HIGH PERFORMANCE ANALOG METAL OXIDE SEMICONDUCTOR TRANSISTOR

SEMICONDUCTOR APPARATUS AND MANUFACTURING METHOD OF SEMICONDUCTOR A...

METHOD FOR TRANSFERRING BLOCKS FROM A DONOR SUBSTRATE ONTO A RECEIV...

STRUCTURE FOR A FRONT-FACING IMAGE SENSOR

IMPLANTATION METHOD

SEMICONDUCTOR SUBSTRATE, MANUFACTURING METHOD THEREOF AND MANUFACTU...

HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

NITRIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR

SEMICONDUCTOR MANUFACTURING SOURCE PRECURSOR DELIVERY SYSTEM

METHOD AND SYSTEM OF JUNCTION TERMINATION EXTENSION IN HIGH VOLTAGE...

SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF

CHARGE-BALANCE POWER DEVICE, AND PROCESS FOR MANUFACTURING THE CHAR...

DEEP TRENCH ISOLATION WITH FIELD OXIDE

SEMICONDUCTOR WAFER TEMPERATURE MEASUREMENT METHOD

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE