Random or pseudo-random test pattern

Industry

CPC
G01R31/318385

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/318385Random or pseudo-random test pattern

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 12,055,584
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test architecture for electronic circuits, corresponding device and...
- Patent number 11,940,492
- Issue date Mar 26, 2024
- STMicroelectronics S.r.l.
- Lorenzo Re Fiorentin
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
- Patent number 11,927,627
- Issue date Mar 12, 2024
- Tektronix, Inc.
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method and apparatus of communication chip, device and medium
- Patent number 11,927,631
- Issue date Mar 12, 2024
- MORNINGCORE TECHNOLOGY CO., CHINA
- Shanzhi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 11,899,063
- Issue date Feb 13, 2024
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Pseudo-random binary sequences (PRBS) generator for performing on-c...
- Patent number 11,774,496
- Issue date Oct 3, 2023
- INDIAN INSTITUTE OF TECHNOLOGY
- Mahendra Sakare
- G01 - MEASURING TESTING
Information Patent Grant
Re-programmable self-test
- Patent number 11,768,240
- Issue date Sep 26, 2023
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 11,747,399
- Issue date Sep 5, 2023
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for functional testing of one or more...
- Patent number 11,686,767
- Issue date Jun 27, 2023
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Spectral shaping of spread spectrum clocks/frequencies through post...
- Patent number 11,601,053
- Issue date Mar 7, 2023
- Texas Instruments Incorporated
- Joerg Erik Goller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trajectory-optimized test pattern generation for built-in self-test
- Patent number 11,585,853
- Issue date Feb 21, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Grant
Deterministic stellar built-in self test
- Patent number 11,555,854
- Issue date Jan 17, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Grant
Mode controller and integrated circuit chip including the same
- Patent number 11,550,685
- Issue date Jan 10, 2023
- Samsung Electronics Co., Ltd.
- Jongseon Shin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system to assure monitoring system validity
- Patent number 11,435,733
- Issue date Sep 6, 2022
- CartaSense Ltd.
- Shlomo Berkovitch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Per-shift X-tolerant logic built-in self-test
- Patent number 11,422,186
- Issue date Aug 23, 2022
- Synopsys, Inc.
- John A. Waicukauski
- G01 - MEASURING TESTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 11,408,936
- Issue date Aug 9, 2022
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 11,402,432
- Issue date Aug 2, 2022
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for single-event upset fault injection testing
- Patent number 11,378,622
- Issue date Jul 5, 2022
- Raytheon Company
- Patrick Fleming
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems and apparatus for in-field testing for generic dia...
- Patent number 11,335,428
- Issue date May 17, 2022
- Intel Corporation
- Asad Azam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transmitter test with interpolation
- Patent number 11,238,204
- Issue date Feb 1, 2022
- Cadence Design Systems, Inc.
- Scott David Huss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC dies with parallel PRBS testing of interposer
- Patent number 11,199,584
- Issue date Dec 14, 2021
- CREDO TECHNOLOGY GROUP LIMITED
- Calvin Xiong Fang
- G01 - MEASURING TESTING
Information Patent Grant
Generating a test sequence of code based on a directed sequence of...
- Patent number 11,156,663
- Issue date Oct 26, 2021
- ARM Limited
- Deepak Yeggina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software defined LFSR for LOC delay testing low-power test compression
- Patent number 11,156,662
- Issue date Oct 26, 2021
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,150,298
- Issue date Oct 19, 2021
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Re-programmable self-test
- Patent number 11,092,650
- Issue date Aug 17, 2021
- Texas Instruments Incorporated
- Neil John Simpson
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan test control decoder with storage elements for use within inte...
- Patent number 10,852,353
- Issue date Dec 1, 2020
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 10,739,402
- Issue date Aug 11, 2020
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Precise transmission medium delay measurement
- Patent number 10,698,030
- Issue date Jun 30, 2020
- Amazon Technologies, Inc.
- Carlos Guillermo Parodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardware assisted high speed serial transceiver testing
- Patent number 10,649,031
- Issue date May 12, 2020
- International Business Machines Corporation
- Jeremy T. Ekman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM
- Publication number 20240319271
- Publication date Sep 26, 2024
- Rohm Co., Ltd.
- Hideki Miyoshi
- G01 - MEASURING TESTING
Information Patent Application
FORWARD ERROR CORRECTION (FEC) ENCODED PHYSICAL LAYER TEST PATTERN
- Publication number 20240248135
- Publication date Jul 25, 2024
- Cisco Technology, Inc.
- Fabio Bottoni
- G01 - MEASURING TESTING
Information Patent Application
Device for Printing to a Recording Medium
- Publication number 20230202168
- Publication date Jun 29, 2023
- Canon Production Printing Holding B.V.
- Bernhard Hochwind
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...
- Publication number 20220326302
- Publication date Oct 13, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20220326303
- Publication date Oct 13, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...
- Publication number 20220187368
- Publication date Jun 16, 2022
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...
- Publication number 20220163588
- Publication date May 26, 2022
- Tektronix, Inc.
- Daniel S. Froelich
- G01 - MEASURING TESTING
Information Patent Application
DETERMINISTIC STELLAR BUILT-IN SELF TEST
- Publication number 20210373077
- Publication date Dec 2, 2021
- Yingdi Liu
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20210333324
- Publication date Oct 28, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
Trajectory-Optimized Test Pattern Generation for Built-In Self-Test
- Publication number 20210156918
- Publication date May 27, 2021
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Application
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...
- Publication number 20210041497
- Publication date Feb 11, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
IC Dies With Parallel PRBS Testing of Interposer
- Publication number 20200379044
- Publication date Dec 3, 2020
- CREDO TECHNOLOGY GROUP LIMITED
- Calvin Xiong FANG
- G01 - MEASURING TESTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20200333397
- Publication date Oct 22, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL SHAPING OF SPREAD SPECTRUM CLOCKS/FREQUENCIES THROUGH POST...
- Publication number 20200119640
- Publication date Apr 16, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Joerg Erik Goller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION
- Publication number 20190339328
- Publication date Nov 7, 2019
- TSINGHUA UNIVERSITY
- Dong XIANG
- G01 - MEASURING TESTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190227122
- Publication date Jul 25, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
HARDWARE ASSISTED HIGH SPEED SERIAL TRANSCEIVER TESTING
- Publication number 20190219636
- Publication date Jul 18, 2019
- International Business Machines Corporation
- JEREMY T. EKMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RE-PROGRAMMABLE SELF-TEST
- Publication number 20190041459
- Publication date Feb 7, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Neil John Simpson
- G01 - MEASURING TESTING
Information Patent Application
System, Apparatus And Method For Functional Testing Of One Or More...
- Publication number 20190033367
- Publication date Jan 31, 2019
- Intel Corporation
- Lakshminarayana Pappu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...
- Publication number 20180321311
- Publication date Nov 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING ENHANCED DIAGNOSTICS WITH INTELLIGENT PATTERN COMBINAT...
- Publication number 20180267102
- Publication date Sep 20, 2018
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...
- Publication number 20180017622
- Publication date Jan 18, 2018
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING
Information Patent Application
Logic Built-In Self-Test with High Test Coverage and Low Switching...
- Publication number 20140365840
- Publication date Dec 11, 2014
- Xijiang Lin
- G01 - MEASURING TESTING
Information Patent Application
PRBS TEST MEMORY INTERFACE CONSIDERING DDR BURST OPERATION
- Publication number 20140122955
- Publication date May 1, 2014
- FutureWei Technologies, Inc.
- Zhiyuan Wang
- G01 - MEASURING TESTING
Information Patent Application
IMPLEMENTING ENHANCED PSEUDO RANDOM PATTERN GENERATORS WITH HIERARC...
- Publication number 20130191695
- Publication date Jul 25, 2013
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
IIMPLEMENTING ENHANCED APERTURE FUNCTION CALIBRATION FOR LOGIC BUIL...
- Publication number 20130151918
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Steven M. Douskey
- G01 - MEASURING TESTING
Information Patent Application
Fully Programmable Parallel PRBS Generator
- Publication number 20130055039
- Publication date Feb 28, 2013
- Glenn A. Dearth
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-BASED TEST DEVICE THAT IMPLEMENTS RANDOM LOGIC FUNCTIONS
- Publication number 20120304030
- Publication date Nov 29, 2012
- GLOBALFOUNDRIES INC.
- Christian HAUFE
- G01 - MEASURING TESTING
Information Patent Application
TEST PATTERN GENERATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20120283981
- Publication date Nov 8, 2012
- KYUSHU INSTITUTE OF TECHNOLOGY
- Michiko INOUE
- G01 - MEASURING TESTING
Information Patent Application
Test Generator For Low Power Built-In Self-Test
- Publication number 20120272110
- Publication date Oct 25, 2012
- Janusz Rajski
- G01 - MEASURING TESTING

Random or pseudo-random test pattern

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, methods, and devices for high-speed input/output margin te...

Test architecture for electronic circuits, corresponding device and...

Systems, methods, and devices for high-speed input/output margin te...

Test method and apparatus of communication chip, device and medium

Generating multiple pseudo static control signals using on-chip JTA...

Pseudo-random binary sequences (PRBS) generator for performing on-c...

Re-programmable self-test

Scan test control decoder with storage elements for use within inte...

System, apparatus and method for functional testing of one or more...

Converting formal verification testbench drivers with nondeterminis...

Spectral shaping of spread spectrum clocks/frequencies through post...

Trajectory-optimized test pattern generation for built-in self-test

Deterministic stellar built-in self test

Mode controller and integrated circuit chip including the same

Method and system to assure monitoring system validity

Per-shift X-tolerant logic built-in self-test

Generating multiple pseudo static control signals using on-chip JTA...

Scan test control decoder with storage elements for use within inte...

Methods and systems for single-event upset fault injection testing

Methods, systems and apparatus for in-field testing for generic dia...

Transmitter test with interpolation

IC dies with parallel PRBS testing of interposer

Generating a test sequence of code based on a directed sequence of...

Software defined LFSR for LOC delay testing low-power test compression

Converting formal verification testbench drivers with nondeterminis...

Re-programmable self-test

Scan test control decoder with storage elements for use within inte...

Generating multiple pseudo static control signals using on-chip JTA...

Precise transmission medium delay measurement

Hardware assisted high speed serial transceiver testing

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND EVALUATION SYSTEM

FORWARD ERROR CORRECTION (FEC) ENCODED PHYSICAL LAYER TEST PATTERN

Device for Printing to a Recording Medium

SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...

SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TE...

DETERMINISTIC STELLAR BUILT-IN SELF TEST

RE-PROGRAMMABLE SELF-TEST

Trajectory-Optimized Test Pattern Generation for Built-In Self-Test

SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...

IC Dies With Parallel PRBS Testing of Interposer

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

SPECTRAL SHAPING OF SPREAD SPECTRUM CLOCKS/FREQUENCIES THROUGH POST...

SOFTWARE DEFINED LFSR FOR LOC DELAY TESTING LOW-POWER TEST COMPRESSION

RE-PROGRAMMABLE SELF-TEST

HARDWARE ASSISTED HIGH SPEED SERIAL TRANSCEIVER TESTING

RE-PROGRAMMABLE SELF-TEST

System, Apparatus And Method For Functional Testing Of One Or More...

GENERATING MULTIPLE PSEUDO STATIC CONTROL SIGNALS USING ON-CHIP JTA...

IMPLEMENTING ENHANCED DIAGNOSTICS WITH INTELLIGENT PATTERN COMBINAT...

CONTINUOUS APPLICATION AND DECOMPRESSION OF TEST PATTERNS AND SELEC...

Logic Built-In Self-Test with High Test Coverage and Low Switching...

PRBS TEST MEMORY INTERFACE CONSIDERING DDR BURST OPERATION

IMPLEMENTING ENHANCED PSEUDO RANDOM PATTERN GENERATORS WITH HIERARC...

IIMPLEMENTING ENHANCED APERTURE FUNCTION CALIBRATION FOR LOGIC BUIL...

Fully Programmable Parallel PRBS Generator

SEMICONDUCTOR-BASED TEST DEVICE THAT IMPLEMENTS RANDOM LOGIC FUNCTIONS

TEST PATTERN GENERATION FOR SEMICONDUCTOR INTEGRATED CIRCUIT

Test Generator For Low Power Built-In Self-Test