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G01R31/3185
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/3185
Reconfiguring for testing
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Interface system for interconnected die and MPU and communication m...
Patent number
11,971,446
Issue date
Apr 30, 2024
Jinghe Wei
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining parameters in on-wafer calibration piece model
Patent number
11,971,451
Issue date
Apr 30, 2024
THE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
Aihua Wu
G01 - MEASURING TESTING
Information
Patent Grant
Process for scan chain in a memory
Patent number
11,971,448
Issue date
Apr 30, 2024
Ceremorphic, Inc.
Robert F. Wiser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test compression in a JTAG daisy-chain environment
Patent number
11,965,930
Issue date
Apr 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Dummy dual in-line memory module (DIMM) testing system based on bou...
Patent number
11,965,931
Issue date
Apr 23, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Yuan Sang
G01 - MEASURING TESTING
Information
Patent Grant
Single “A” latch with an array of “B” latches
Patent number
11,961,575
Issue date
Apr 16, 2024
SambaNova Systems, Inc.
Thomas A. Ziaja
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Invisible scan architecture for secure testing of digital designs
Patent number
11,953,548
Issue date
Apr 9, 2024
University of Florida Research Foundation, Incorporated
Swarup Bhunia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data recorder
Patent number
11,953,547
Issue date
Apr 9, 2024
Bae Systems Controls Inc.
Thomas J. Cummings
G01 - MEASURING TESTING
Information
Patent Grant
Server JTAG component adaptive interconnection system and method
Patent number
11,953,550
Issue date
Apr 9, 2024
INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
Yanpo Huang
G01 - MEASURING TESTING
Information
Patent Grant
Detection system for SlimSAS slot and method thereof
Patent number
11,953,549
Issue date
Apr 9, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Kai Zou
G01 - MEASURING TESTING
Information
Patent Grant
Test-point flop sharing with improved testability in a circuit design
Patent number
11,947,887
Issue date
Apr 2, 2024
Cadence Design Systems, Inc.
Krishna Chakravadhanula
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hold time improved low area flip-flop architecture
Patent number
11,946,973
Issue date
Apr 2, 2024
Texas Instruments Incorporated
Arnab Khawas
G01 - MEASURING TESTING
Information
Patent Grant
Test architecture for electronic circuits, corresponding device and...
Patent number
11,940,492
Issue date
Mar 26, 2024
STMicroelectronics S.r.l.
Lorenzo Re Fiorentin
G01 - MEASURING TESTING
Information
Patent Grant
Built in self-test of heterogeneous integrated radio frequency chip...
Patent number
11,940,495
Issue date
Mar 26, 2024
PseudolithIC, Inc.
James Buckwalter
G01 - MEASURING TESTING
Information
Patent Grant
System on chip for performing scan test and method of designing the...
Patent number
11,940,494
Issue date
Mar 26, 2024
Samsung Electronics Co., Ltd.
Woohyun Son
G01 - MEASURING TESTING
Information
Patent Grant
FPGA chip with protected JTAG interface
Patent number
11,941,133
Issue date
Mar 26, 2024
Hewlett Packard Enterprise Development LP
Siung Siew Liew
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built-in self-test for die-to-die physical interfaces
Patent number
11,940,491
Issue date
Mar 26, 2024
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Grant
Flexible one-hot decoding logic for clock controls
Patent number
11,940,493
Issue date
Mar 26, 2024
NVIDIA Corp.
Mahmut Yilmaz
G01 - MEASURING TESTING
Information
Patent Grant
Boundary scan test method and storage medium
Patent number
11,933,845
Issue date
Mar 19, 2024
SHENZHEN PANGO MICROSYSTEMS CO., LTD.
Shiyjun Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and system for debugging solid-state disk (SSD) device
Patent number
11,933,847
Issue date
Mar 19, 2024
Silicon Motion, Inc.
Han-Chih Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-bit flip-flop circuit with reduced area and reduced wire comp...
Patent number
11,936,384
Issue date
Mar 19, 2024
Samsung Electronics Co., Ltd.
Wonhyun Choi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Techniques to enable integrated circuit debug across low power states
Patent number
11,933,843
Issue date
Mar 19, 2024
Intel Corporation
Keith A. Jones
G01 - MEASURING TESTING
Information
Patent Grant
Memory tester and test method that uses memory tester
Patent number
11,933,846
Issue date
Mar 19, 2024
Kioxia Coporation
Kenji Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Systems, methods, and devices for high-speed input/output margin te...
Patent number
11,927,627
Issue date
Mar 12, 2024
Tektronix, Inc.
Daniel S. Froelich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Secured scan access for a device including a scan chain
Patent number
11,927,633
Issue date
Mar 12, 2024
Texas Instruments Incorporated
Mudasir Kawoosa
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for database scan acceleration
Patent number
11,927,634
Issue date
Mar 12, 2024
Samsung Electronics Co., Ltd.
Andrew Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for schedule-based I/O multiplexing for integrate...
Patent number
11,927,630
Issue date
Mar 12, 2024
MARVELL ASIA PTE. LTD.
Sounil Biswas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
DIMM slot test system without series connection of test board throu...
Patent number
11,927,632
Issue date
Mar 12, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Chang-Qing Mu
G01 - MEASURING TESTING
Information
Patent Grant
Compressed scan chain diagnosis by internal chain observation, proc...
Patent number
11,921,159
Issue date
Mar 5, 2024
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for providing wireless FPGA programming download...
Patent number
11,923,847
Issue date
Mar 5, 2024
Gowin Semiconductor Corporation
Jinghui Zhu
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Processing Devices for reducing scan traffic, Method and Computer P...
Publication number
20240159829
Publication date
May 16, 2024
Intel Corporation
Min LIU
G01 - MEASURING TESTING
Information
Patent Application
Scan Tree Construction
Publication number
20240151771
Publication date
May 9, 2024
TSINGHUA UNIVERSITY
Can Xiang
G01 - MEASURING TESTING
Information
Patent Application
META-STABILITY-FREE TWO-CLOCK-DOMAIN SYNCHRONOUS LATCH
Publication number
20240146285
Publication date
May 2, 2024
VIETTEL GROUP
Thai Ha Le
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTEGRATED CIRCUIT HAVING TEST CIRCUITRY FOR MEMORY SUB-SYSTEMS
Publication number
20240142520
Publication date
May 2, 2024
NXP USA, Inc.
Alexander Hoefler
G01 - MEASURING TESTING
Information
Patent Application
SCAN FLIP-FLOP, SCAN CHAIN CIRCUIT INCLUDING THE SAME, AND CONTROL...
Publication number
20240142521
Publication date
May 2, 2024
Research & Business Foundation Sungkyunkwan University
Changyoun Im
G01 - MEASURING TESTING
Information
Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
Publication number
20240133951
Publication date
Apr 25, 2024
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Sandeep Kumar GOEL
G01 - MEASURING TESTING
Information
Patent Application
Techniques For Storing States Of Signals In Configurable Storage Ci...
Publication number
20240137026
Publication date
Apr 25, 2024
Altera Corporation
Bee Yee Ng
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTERPOSER INSTRUMENTATION METHOD AND APPARATUS
Publication number
20240133947
Publication date
Apr 25, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Automatic Test Pattern Generation-Based Circuit Verification Method...
Publication number
20240125850
Publication date
Apr 18, 2024
Huawei Technologies Co., Ltd
Huiling Zhen
G01 - MEASURING TESTING
Information
Patent Application
MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS
Publication number
20240125851
Publication date
Apr 18, 2024
Micron Technology, Inc.
Kenneth M. Curewitz
G01 - MEASURING TESTING
Information
Patent Application
LOW POWER FLIP-FLOP
Publication number
20240128952
Publication date
Apr 18, 2024
Samsung Electronics Co., Ltd.
Byounggon Kang
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS
Publication number
20240118340
Publication date
Apr 11, 2024
Advantest Corporation
Edmundo De La Puente
G01 - MEASURING TESTING
Information
Patent Application
AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES
Publication number
20240120016
Publication date
Apr 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Devanathan Varadarajan
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT
Publication number
20240110978
Publication date
Apr 4, 2024
Global Unichip Corporation
Hung-Yi CHANG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SCAN CHAIN INTERFACE FOR NON-VOLATILE STORA...
Publication number
20240112713
Publication date
Apr 4, 2024
EVERSPIN TECHNOLOGIES, INC.
Syed M. ALAM
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC VOLTAGE FREQUENCY SCALING TO REDUCE TEST TIME
Publication number
20240110979
Publication date
Apr 4, 2024
MEDIATEK INC.
Anshul Varma
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS
Publication number
20240103077
Publication date
Mar 28, 2024
Intel Corporation
Rakesh KANDULA
G01 - MEASURING TESTING
Information
Patent Application
SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN
Publication number
20240103078
Publication date
Mar 28, 2024
TEXAS INSTRUMENTS INCORPORATED
Mudasir KAWOOSA
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM CONFIGURATION ADAPTER SYSTEMS AND METHODS
Publication number
20240103037
Publication date
Mar 28, 2024
Advantest Corporation
Eddy Wayne CHOW
G01 - MEASURING TESTING
Information
Patent Application
INFIELD PERIODIC DEVICE TESTING WHILE MAINTAINING HOST CONNECTIVITY
Publication number
20240103079
Publication date
Mar 28, 2024
Intel Corporation
Rakesh Kandula
G01 - MEASURING TESTING
Information
Patent Application
TSV TESTING
Publication number
20240094280
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERPOSER CIRCUIT
Publication number
20240094289
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SECURE BOOT APPARATUS AND METHOD
Publication number
20240095366
Publication date
Mar 21, 2024
Huawei Technologies Co., Ltd
Jilong Ye
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD
Publication number
20240097661
Publication date
Mar 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Huaixin XIAN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS
Publication number
20240094291
Publication date
Mar 21, 2024
NVIDIA Corp.
Mahmut Yilmaz
G01 - MEASURING TESTING
Information
Patent Application
System of Performing Boundary Scan Test on Pin Through Test Point a...
Publication number
20240094292
Publication date
Mar 21, 2024
Inventec (Pudong) Technology Corporation
Qiu-Yue Duan
G01 - MEASURING TESTING
Information
Patent Application
STRESS-TESTING ELECTRICAL COMPONENTS USING TELEMETRY MODELING
Publication number
20240085477
Publication date
Mar 14, 2024
Cisco Technology, Inc.
James Edwin Turman
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS
Publication number
20240087668
Publication date
Mar 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Ankita Patidar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan Flip-Flops With Pre-Setting Combinational Logic
Publication number
20240077534
Publication date
Mar 7, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Johnny Chiahao Li
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ACCESS CONTROL OF A PLURALITY OF INSTRUMENTS...
Publication number
20240061041
Publication date
Feb 22, 2024
Erik Larsson
G01 - MEASURING TESTING