related to electrical or environmental aspects

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
In-situ testing system for semiconductor device in aerospace irradi...
- Patent number 12,146,908
- Issue date Nov 19, 2024
- Nanjing University
- Feng Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Virtual machine testing of electrical machines using physical domai...
- Patent number 12,117,482
- Issue date Oct 15, 2024
- Vestas Wind Systems A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package test apparatus and method
- Patent number 12,072,370
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Sung Ok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Chip testing method and apparatus, and electronic equipment
- Patent number 12,044,724
- Issue date Jul 23, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Hang Gao
- G01 - MEASURING TESTING
Information Patent Grant
Detection of an aged circuit
- Patent number 11,879,932
- Issue date Jan 23, 2024
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting and controlling battery status by using sensor...
- Patent number 11,733,303
- Issue date Aug 22, 2023
- Samsung Electronics Co., Ltd.
- Dae Ung Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for delivering a thermal shock
- Patent number 11,543,327
- Issue date Jan 3, 2023
- GM CRUISE HOLDINGS LLC
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection of power switch using modulation of driver ou...
- Patent number 11,378,614
- Issue date Jul 5, 2022
- Infineon Technologies AG
- Jens Barrenscheen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical overstress detection device
- Patent number 11,372,030
- Issue date Jun 28, 2022
- Analog Devices International Unlimited Company
- David J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flexible test systems and methods
- Patent number 11,334,459
- Issue date May 17, 2022
- Advantest Corporation
- Michael Bautista
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,255,903
- Issue date Feb 22, 2022
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for health monitoring of system-on-chip
- Patent number 11,231,702
- Issue date Jan 25, 2022
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of testing semiconductor device
- Patent number 11,029,356
- Issue date Jun 8, 2021
- Fuji Electric Co., Ltd.
- Yuki Sawa
- G01 - MEASURING TESTING
Information Patent Grant
IC with insulating trench and related methods
- Patent number 10,964,646
- Issue date Mar 30, 2021
- STMicroelectronics S.r.l.
- Alberto Pagani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,852,347
- Issue date Dec 1, 2020
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection device
- Patent number 10,845,409
- Issue date Nov 24, 2020
- Tokyo Electron Limited
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in preform and method of making the same
- Patent number 10,838,002
- Issue date Nov 17, 2020
- Indium Corporation
- Thomas R. Gross
- G01 - MEASURING TESTING
Information Patent Grant
Electrical overstress detection device
- Patent number 10,677,822
- Issue date Jun 9, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Grant
System reference with compensation of electrical and mechanical str...
- Patent number 10,438,835
- Issue date Oct 8, 2019
- Infineon Technologies AG
- Mario Motz
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of fabricating surface-emitting laser
- Patent number 10,416,227
- Issue date Sep 17, 2019
- Sumitomo Electric Industries, Ltd.
- Ryosuke Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compensating for degradation of electronics due to radiation vulner...
- Patent number 10,305,478
- Issue date May 28, 2019
- Honeywell International Inc.
- Zygmunt Zubkow
- G01 - MEASURING TESTING
Information Patent Grant
System reference with compensation of electrical and mechanical str...
- Patent number 10,103,050
- Issue date Oct 16, 2018
- Infineon Technologies AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 10,094,872
- Issue date Oct 9, 2018
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and method for detecting a stress condition in t...
- Patent number 9,910,087
- Issue date Mar 6, 2018
- Allegro Microsystems, LLC
- Jeffrey Eagen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for integrated circuit forensics
- Patent number 9,885,745
- Issue date Feb 6, 2018
- The United States of America as represented by the Secretary of the Navy
- Brett J Hamilton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC with insulating trench and related methods
- Patent number 9,887,165
- Issue date Feb 6, 2018
- STMicroelectronics S.R.L.
- Alberto Pagani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology of grading reliability and performance of chips across...
- Patent number 9,575,115
- Issue date Feb 21, 2017
- GLOBALFOUNDRIES Inc.
- Nathaniel R. Chadwick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Limiting aging effects in analog differential circuits
- Patent number 9,531,398
- Issue date Dec 27, 2016
- Analog Devices, Inc.
- Paul F. Ferguson
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
RADIATION ANOMALY CHARACTERIZATION SYSTEM
- Publication number 20240337684
- Publication date Oct 10, 2024
- HAMILTON SUNDSTRAND SPACE SYSTEMS INTERNATIONAL, INC.
- Joshua Todd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20230176125
- Publication date Jun 8, 2023
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK
- Publication number 20230084486
- Publication date Mar 16, 2023
- GM Cruise Holdings LLC
- Fen Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING DROP TEST EQUIPMENT
- Publication number 20220397606
- Publication date Dec 15, 2022
- Konepaja-Heinä Oy
- Ilkka HEINÄ
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20220137121
- Publication date May 5, 2022
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE DETECTION OF POWER SWITCH USING MODULATION OF DRIVER OU...
- Publication number 20220065924
- Publication date Mar 3, 2022
- INFINEON TECHNOLOGIES AG
- Jens Barrenscheen
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD
- Publication number 20220057444
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Sung Ok KIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUDIO OUTPUT DEVICE TESTING
- Publication number 20210306780
- Publication date Sep 30, 2021
- LIQUIDITY SERVICES, INC.
- Kristopher SCHOBERT
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20210025935
- Publication date Jan 28, 2021
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL OVERSTRESS DETECTION DEVICE
- Publication number 20200400725
- Publication date Dec 24, 2020
- Analog Devices Global Unlimited Company
- David J. Clarke
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AND CONTROLLING BATTERY STATUS BY USING SENSOR...
- Publication number 20200386816
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Dae Ung JEONG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20200284835
- Publication date Sep 10, 2020
- Fuji Electric Co., Ltd.
- Yuki SAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION OF AN AGED CIRCUIT
- Publication number 20200132751
- Publication date Apr 30, 2020
- International Business Machines Corporation
- Franco Stellari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE
- Publication number 20190331731
- Publication date Oct 31, 2019
- TOKYO ELECTRON LIMITED
- Hiroshi Yamada
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN PREFORM AND METHOD OF MAKING THE SAME
- Publication number 20190128953
- Publication date May 2, 2019
- Indium Corporation
- THOMAS R. GROSS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM REFERENCE WITH COMPENSATION OF ELECTRICAL AND MECHANICAL STR...
- Publication number 20190013233
- Publication date Jan 10, 2019
- INFINEON TECHNOLOGIES AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20180372792
- Publication date Dec 27, 2018
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FABRICATING SURFACE-EMITTING LASER
- Publication number 20180356459
- Publication date Dec 13, 2018
- Sumitomo Electric Industries, Ltd.
- Ryosuke KUBOTA
- G01 - MEASURING TESTING
Information Patent Application
IC with Insulating Trench and Related Methods
- Publication number 20180122752
- Publication date May 3, 2018
- STMicroelectronics S.r. I.
- Alberto Pagani
- G01 - MEASURING TESTING
Information Patent Application
WEAR-OUT MONITOR DEVICE
- Publication number 20170299650
- Publication date Oct 19, 2017
- ANALOG DEVICES GLOBAL
- Edward John Coyne
- G01 - MEASURING TESTING
Information Patent Application
CHIP TRANSIENT TEMPERATURE PREDICTOR
- Publication number 20170261380
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Chen-Yong Cher
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND METHOD FOR DETECTING A STRESS CONDITION IN T...
- Publication number 20170261546
- Publication date Sep 14, 2017
- Allegro Microsystems, LLC
- Jeffrey Eagen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN...
- Publication number 20170082689
- Publication date Mar 23, 2017
- Altera Corporation
- Nelson Joseph Gaspard
- G01 - MEASURING TESTING
Information Patent Application
LIMITING AGING EFFECTS IN ANALOG DIFFERENTIAL CIRCUITS
- Publication number 20160269038
- Publication date Sep 15, 2016
- Analog Devices, Inc.
- PAUL F. FERGUSON
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20150369858
- Publication date Dec 24, 2015
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COMPENSATING FOR EFFECTS OF MECHANICAL STRESSES IN A MICR...
- Publication number 20150346275
- Publication date Dec 3, 2015
- STMicroelectronics (Rousset) SAS
- Pascal Fornara
- G01 - MEASURING TESTING
Information Patent Application
Analysis of Stimulus by RFID
- Publication number 20150226792
- Publication date Aug 13, 2015
- U.S. PHOTONICS, INC.
- Jacob Conner
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20140232424
- Publication date Aug 21, 2014
- Aehr Test Systems
- Donald P. Richmond
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS OF STIMULUS BY RFID
- Publication number 20140144994
- Publication date May 29, 2014
- Jacob Conner
- G01 - MEASURING TESTING

related to electrical or environmental aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus for testing electronic devices

In-situ testing system for semiconductor device in aerospace irradi...

Virtual machine testing of electrical machines using physical domai...

Semiconductor package test apparatus and method

Chip testing method and apparatus, and electronic equipment

Detection of an aged circuit

Apparatus for testing electronic devices

Method for detecting and controlling battery status by using sensor...

Method and apparatus for delivering a thermal shock

Temperature detection of power switch using modulation of driver ou...

Electrical overstress detection device

Flexible test systems and methods

Apparatus for testing electronic devices

Method, device and system for health monitoring of system-on-chip

Method of testing semiconductor device

IC with insulating trench and related methods

Apparatus for testing electronic devices

Substrate inspection device

Burn-in preform and method of making the same

Electrical overstress detection device

System reference with compensation of electrical and mechanical str...

Method of fabricating surface-emitting laser

Compensating for degradation of electronics due to radiation vulner...

System reference with compensation of electrical and mechanical str...

Apparatus for testing electronic devices

Integrated circuit and method for detecting a stress condition in t...

Apparatus and method for integrated circuit forensics

IC with insulating trench and related methods

Methodology of grading reliability and performance of chips across...

Limiting aging effects in analog differential circuits

Patents Applicationslast 30 patents

RADIATION ANOMALY CHARACTERIZATION SYSTEM

APPARATUS FOR TESTING ELECTRONIC DEVICES

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

METHOD AND APPARATUS FOR DELIVERING A THERMAL SHOCK

METHOD FOR CONTROLLING DROP TEST EQUIPMENT

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEMPERATURE DETECTION OF POWER SWITCH USING MODULATION OF DRIVER OU...

SEMICONDUCTOR PACKAGE TEST APPARATUS AND METHOD

SYSTEM AND METHOD FOR AUDIO OUTPUT DEVICE TESTING

APPARATUS FOR TESTING ELECTRONIC DEVICES

ELECTRICAL OVERSTRESS DETECTION DEVICE

METHOD FOR DETECTING AND CONTROLLING BATTERY STATUS BY USING SENSOR...

METHOD OF TESTING SEMICONDUCTOR DEVICE

DETECTION OF AN AGED CIRCUIT

SUBSTRATE INSPECTION DEVICE

BURN-IN PREFORM AND METHOD OF MAKING THE SAME

SYSTEM REFERENCE WITH COMPENSATION OF ELECTRICAL AND MECHANICAL STR...

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD OF FABRICATING SURFACE-EMITTING LASER

IC with Insulating Trench and Related Methods

WEAR-OUT MONITOR DEVICE

CHIP TRANSIENT TEMPERATURE PREDICTOR

INTEGRATED CIRCUIT AND METHOD FOR DETECTING A STRESS CONDITION IN T...

SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN...

LIMITING AGING EFFECTS IN ANALOG DIFFERENTIAL CIRCUITS

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD OF COMPENSATING FOR EFFECTS OF MECHANICAL STRESSES IN A MICR...

Analysis of Stimulus by RFID

APPARATUS FOR TESTING ELECTRONIC DEVICES

ANALYSIS OF STIMULUS BY RFID