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G01N23/20025

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/20025Sample holders or supports

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 12,123,840
- Issue date Oct 22, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 12,105,034
- Issue date Oct 1, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 12,092,593
- Issue date Sep 17, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Soaking machine of single-crystal X-ray structure analysis sample,...
- Patent number 12,055,501
- Issue date Aug 6, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Dual source X-ray inspection system and method
- Patent number 12,050,187
- Issue date Jul 30, 2024
- XWINSYS Technology Developments Ltd.
- Avishai Shklar
- G01 - MEASURING TESTING
Information Patent Grant
Mesh-based crystal sample holder for serial crystallography
- Patent number 12,031,926
- Issue date Jul 9, 2024
- Korea University Research and Business Foundation
- Ki Hyun Nam
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Method for cross-section sample preparation
- Patent number 12,007,344
- Issue date Jun 11, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
- Patent number 11,942,231
- Issue date Mar 26, 2024
- Rigaku Corporation
- Koichiro Ito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing property characteristic of transmission s...
- Patent number 11,933,744
- Issue date Mar 19, 2024
- China Institute of Atomic Energy
- Zhongqi Wang
- G01 - MEASURING TESTING
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder unit for single-crystal X-ray structure analysis appa...
- Patent number 11,921,060
- Issue date Mar 5, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 11,908,655
- Issue date Feb 20, 2024
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
- Patent number 11,874,204
- Issue date Jan 16, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 11,874,238
- Issue date Jan 16, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 11,867,644
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
- Patent number 11,846,594
- Issue date Dec 19, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
- Patent number 11,846,593
- Issue date Dec 19, 2023
- PROTO PATENTS LTD.
- James Pineault
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
- Patent number 11,835,476
- Issue date Dec 5, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for single-crystal X-ray structure analysis apparatus...
- Patent number 11,821,855
- Issue date Nov 21, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection of surface and near surface abnormalities...
- Patent number 11,815,477
- Issue date Nov 14, 2023
- The University of Sheffield
- Matthew Brown
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,808,721
- Issue date Nov 7, 2023
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal x-ray structure analysis apparatus and method, and s...
- Patent number 11,802,844
- Issue date Oct 31, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...
- Publication number 20240353356
- Publication date Oct 24, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE
- Publication number 20240328968
- Publication date Oct 3, 2024
- Korea Institute of Science and Technology
- Hye Jung Chang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD
- Publication number 20240319122
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Yuki OTSUKA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240319121
- Publication date Sep 26, 2024
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CELL, LOADING STATION, MEASURING DEVICE, METHODS FOR EXAMINI...
- Publication number 20240269579
- Publication date Aug 15, 2024
- DEUTSCHES ELEKTRONEN-SYNCHROTRON DESY
- Alke MEENTS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER
- Publication number 20240201111
- Publication date Jun 20, 2024
- Saudi Arabian Oil Company
- Matteo Leoni
- G01 - MEASURING TESTING
Information Patent Application
RADIATION MEASUREMENT APPARATUS
- Publication number 20240167968
- Publication date May 23, 2024
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
- Publication number 20240151662
- Publication date May 9, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...
- Publication number 20240068965
- Publication date Feb 29, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION...
- Publication number 20240044818
- Publication date Feb 8, 2024
- Hyundai Motor Company
- Yun Sung Kim
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, APPARATUS AND SYSTEM
- Publication number 20240027371
- Publication date Jan 25, 2024
- Nuctech Company Limited
- Zhi ZENG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND APPARATUS, AND RADIATION MEASURING DEVICE
- Publication number 20240027368
- Publication date Jan 25, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Liangjie YAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20240027373
- Publication date Jan 25, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR
- Publication number 20240019385
- Publication date Jan 18, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE SAMPLE HOLDER FOR CRYSTALLINE SPONGE
- Publication number 20230417688
- Publication date Dec 28, 2023
- Merck Patent GmbH
- WOLFGANG HIERSE
- G01 - MEASURING TESTING
Information Patent Application
2D POLYMER BASED TARGETS FOR SERIAL X-RAY CRYSTALLOGRAPHY
- Publication number 20230417689
- Publication date Dec 28, 2023
- The Regents of the University of California
- Tonya L. Kuhl
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20230358696
- Publication date Nov 9, 2023
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349841
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
- Publication number 20230341340
- Publication date Oct 26, 2023
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
- Publication number 20230341325
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Lars LOETGERING
- G01 - MEASURING TESTING
Information Patent Application
LOW NON-REPETITIVE RUNOUT ROTATIONAL MOUNT
- Publication number 20230304628
- Publication date Sep 28, 2023
- Bruker AXS, LLC
- Bruce BECKER
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20230258584
- Publication date Aug 17, 2023
- MALVERN PANALYTICAL B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
- Publication number 20230258586
- Publication date Aug 17, 2023
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
LABORATORY-BASED 3D SCANNING X-RAY LAUE MICRO-DIFFRACTION SYSTEM AN...
- Publication number 20230251213
- Publication date Aug 10, 2023
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
LIQUID SAMPLE DELIVERY DEVICE
- Publication number 20230234043
- Publication date Jul 27, 2023
- SERIAL X AB
- Richard NEUTZE
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Sample holders or supports

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Component residual stress testing platform based on neutron diffrac...

Device for tuning microfluidic droplet frequency and synchronizing...

Single-crystal X-ray structure analysis apparatus, and method therefor

Single-crystal X-ray structure analysis apparatus and method, and s...

Soaking machine of single-crystal X-ray structure analysis sample,...

Dual source X-ray inspection system and method

Mesh-based crystal sample holder for serial crystallography

Transmissive small-angle scattering device

Method for cross-section sample preparation

Method and system to determine crystal structure

Method for improving an EBSD/TKD map

Airtight box for measurement, airtight apparatus, measurement syste...

Device for hosting a probe solution of molecules in a plurality of...

Method for characterizing property characteristic of transmission s...

Sample mounting system for an X-ray analysis apparatus

Sample holder unit for single-crystal X-ray structure analysis appa...

Cryotransfer holder and workstation

Single-crystal X-ray structure analysis apparatus, and method therefor

Single-crystal X-ray structure analysis apparatus and method, and s...

Device for tuning microfluidic droplet frequency and synchronizing...

Single-crystal X-ray structure analysis apparatus and sample holder

Ball-mapping system comprising a sample stage and a sample holder f...

Diffraction device and method for non-destructive testing of intern...

Single-crystal X-ray structure analysis apparatus and sample holder...

X-ray examination device

Sample holder for single-crystal X-ray structure analysis apparatus...

Non-destructive detection of surface and near surface abnormalities...

Methods and systems for acquiring three-dimensional electron diffra...

X-ray analysis apparatus

Single-crystal x-ray structure analysis apparatus and method, and s...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR OPTIMIZED SAMPLE IRRADIATION IN A CABINET IRR...

SEM-EDS HOLDER DEVICE FOR THIN FILTER-TYPE SAMPLE

ELECTRON MICROSCOPE AND CRYSTAL EVALUATION METHOD

ANALYSIS APPARATUS, ANALYSIS METHOD, AND ANALYSIS PROGRAM

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

SAMPLE CELL, LOADING STATION, MEASURING DEVICE, METHODS FOR EXAMINI...

SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER

RADIATION MEASUREMENT APPARATUS

Laue Measurement System With Turntable And Method Of Operating The...

Systems and Methods for Generating High-Energy Three-Dimensional Co...

DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...

SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION...

DETECTION METHOD, APPARATUS AND SYSTEM

MEASUREMENT METHOD AND APPARATUS, AND RADIATION MEASURING DEVICE

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR

FLEXIBLE SAMPLE HOLDER FOR CRYSTALLINE SPONGE

2D POLYMER BASED TARGETS FOR SERIAL X-RAY CRYSTALLOGRAPHY

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

INSPECTION APPARATUS AND INSPECTION METHOD

DIFFRACTIVE ANALYZER OF PATIENT TISSUE

WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...

LOW NON-REPETITIVE RUNOUT ROTATIONAL MOUNT

SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS

X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD

LABORATORY-BASED 3D SCANNING X-RAY LAUE MICRO-DIFFRACTION SYSTEM AN...

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

LIQUID SAMPLE DELIVERY DEVICE