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G01N23/20025
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
Current Industry
G01N23/20025
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Patents Grants
last 30 patents
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
Patent number
11,942,231
Issue date
Mar 26, 2024
Rigaku Corporation
Koichiro Ito
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Method for characterizing property characteristic of transmission s...
Patent number
11,933,744
Issue date
Mar 19, 2024
China Institute of Atomic Energy
Zhongqi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Sample mounting system for an X-ray analysis apparatus
Patent number
11,927,550
Issue date
Mar 12, 2024
Malvern Panalytical B.V.
Jaap Boksem
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder unit for single-crystal X-ray structure analysis appa...
Patent number
11,921,060
Issue date
Mar 5, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Cryotransfer holder and workstation
Patent number
11,908,655
Issue date
Feb 20, 2024
Gatan, Inc.
Alexander Jozef Gubbens
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus, and method therefor
Patent number
11,874,204
Issue date
Jan 16, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
Patent number
11,874,238
Issue date
Jan 16, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
Patent number
11,867,644
Issue date
Jan 9, 2024
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
Patent number
11,846,594
Issue date
Dec 19, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
Patent number
11,846,593
Issue date
Dec 19, 2023
PROTO PATENTS LTD.
James Pineault
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction device and method for non-destructive testing of intern...
Patent number
11,846,595
Issue date
Dec 19, 2023
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
Patent number
11,835,476
Issue date
Dec 5, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination device
Patent number
11,821,856
Issue date
Nov 21, 2023
Anton Paar GmbH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder for single-crystal X-ray structure analysis apparatus...
Patent number
11,821,855
Issue date
Nov 21, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive detection of surface and near surface abnormalities...
Patent number
11,815,477
Issue date
Nov 14, 2023
The University of Sheffield
Matthew Brown
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
Patent number
11,815,476
Issue date
Nov 14, 2023
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray analysis apparatus
Patent number
11,808,721
Issue date
Nov 7, 2023
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal x-ray structure analysis apparatus and method, and s...
Patent number
11,802,844
Issue date
Oct 31, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray spectrometer and methods for use
Patent number
11,796,490
Issue date
Oct 24, 2023
University of Washington
Gerald Todd Seidler
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Low non-repetitive runout rotational mount
Patent number
11,781,708
Issue date
Oct 10, 2023
Bruce Becker
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Soaking machine and soaking method of sample for single-crystal X-r...
Patent number
11,774,379
Issue date
Oct 3, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Mesh holder for serial crystallography
Patent number
11,768,164
Issue date
Sep 26, 2023
UChicago Argonne, LLC
Alex A Lavens
G01 - MEASURING TESTING
Information
Patent Grant
Transmissive small-angle scattering device
Patent number
11,754,515
Issue date
Sep 12, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Grant
Method for cross-section sample preparation
Patent number
11,726,050
Issue date
Aug 15, 2023
Fibics Incorporated
Michael William Phaneuf
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Part inspection method using computed tomography
Patent number
11,719,651
Issue date
Aug 8, 2023
Faro Technologies, Inc.
Ariane Stiebeiner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Single piece droplet generation and injection device for serial cry...
Patent number
11,624,718
Issue date
Apr 11, 2023
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
G01 - MEASURING TESTING
Information
Patent Grant
Sample holding device for X-ray analysis
Patent number
11,525,790
Issue date
Dec 13, 2022
Rigaku Corporation
Koichiro Ito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Laue Measurement System With Turntable And Method Of Operating The...
Publication number
20240151662
Publication date
May 9, 2024
PROTO PATENTS LTD.
Mohammed BELASSEL
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...
Publication number
20240068965
Publication date
Feb 29, 2024
Arizona Board of Regents on behalf of Arizona State University
Alexandra ROS
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION...
Publication number
20240044818
Publication date
Feb 8, 2024
Hyundai Motor Company
Yun Sung Kim
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD, APPARATUS AND SYSTEM
Publication number
20240027371
Publication date
Jan 25, 2024
Nuctech Company Limited
Zhi ZENG
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD AND APPARATUS, AND RADIATION MEASURING DEVICE
Publication number
20240027368
Publication date
Jan 25, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Liangjie YAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20240027373
Publication date
Jan 25, 2024
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS, AND METHOD THEREFOR
Publication number
20240019385
Publication date
Jan 18, 2024
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE SAMPLE HOLDER FOR CRYSTALLINE SPONGE
Publication number
20230417688
Publication date
Dec 28, 2023
Merck Patent GmbH
WOLFGANG HIERSE
G01 - MEASURING TESTING
Information
Patent Application
2D POLYMER BASED TARGETS FOR SERIAL X-RAY CRYSTALLOGRAPHY
Publication number
20230417689
Publication date
Dec 28, 2023
The Regents of the University of California
Tonya L. Kuhl
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230384248
Publication date
Nov 30, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230375485
Publication date
Nov 23, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
Publication number
20230358696
Publication date
Nov 9, 2023
Fibics Incorporated
Michael William PHANEUF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349841
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
Publication number
20230341340
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
WAVEFRONT METROLOGY SENSOR AND MASK THEREFOR, METHOD FOR OPTIMIZING...
Publication number
20230341325
Publication date
Oct 26, 2023
ASML NETHERLANDS B.V.
Lars LOETGERING
G01 - MEASURING TESTING
Information
Patent Application
LOW NON-REPETITIVE RUNOUT ROTATIONAL MOUNT
Publication number
20230304628
Publication date
Sep 28, 2023
Bruker AXS, LLC
Bruce BECKER
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER FOR AN X-RAY ANALYSIS APPARATUS
Publication number
20230258584
Publication date
Aug 17, 2023
MALVERN PANALYTICAL B.V.
Milen Gateshki
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
Publication number
20230258586
Publication date
Aug 17, 2023
Rigaku Corporation
Hisashi KONAKA
G01 - MEASURING TESTING
Information
Patent Application
LABORATORY-BASED 3D SCANNING X-RAY LAUE MICRO-DIFFRACTION SYSTEM AN...
Publication number
20230251213
Publication date
Aug 10, 2023
Danmarks Tekniske Universitet
Yubin Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
Publication number
20230243765
Publication date
Aug 3, 2023
Alexandra Ros
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
LIQUID SAMPLE DELIVERY DEVICE
Publication number
20230234043
Publication date
Jul 27, 2023
SERIAL X AB
Richard NEUTZE
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
Publication number
20230228695
Publication date
Jul 20, 2023
The Regents of the University of California
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TOOL HOLDER FOR MANIPULATING SMALL OBJECTS
Publication number
20230175990
Publication date
Jun 8, 2023
Merck Patent GmbH
Carolina VON ESSEN
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
IMAGING PROCESS AND SYSTEM
Publication number
20230168238
Publication date
Jun 1, 2023
MASTER DYNAMIC LIMITED
Yau Chuen YIU
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE CELL, LOADING STATION, MEASURING DEVICE, METHODS FOR EXAMINI...
Publication number
20230063359
Publication date
Mar 2, 2023
DEUTSCHES ELEKTRONEN-SYNCHROTRON DESY
Alke MEENTS
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Analysis System
Publication number
20230055155
Publication date
Feb 23, 2023
Hitachi High-Tech Corporation
Tsunenori NOMAGUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
Publication number
20230031147
Publication date
Feb 2, 2023
Merck Patent GmbH
Carolina VON ESSEN
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Publication number
20230024986
Publication date
Jan 26, 2023
KIOXIA Corporation
Takaki HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MEASURING ANGLES OF ORIENTATION OF AN X-RAY I...
Publication number
20230003673
Publication date
Jan 5, 2023
SAFRAN
Edward ROMERO
G01 - MEASURING TESTING