Scan or image signal processing specially adapted therefor

Industry

CPC
G01N21/8851

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8851Scan or image signal processing specially adapted therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Image processing apparatus, image processing method, and storage me...
- Patent number 12,360,053
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Kimitaka Arai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reconstruction of a distorted image of an array of structural eleme...
- Patent number 12,361,526
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,360,049
- Issue date Jul 15, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,360,052
- Issue date Jul 15, 2025
- Shimadzu Corporation
- Takahide Hatahori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus examination method and semiconductor appara...
- Patent number 12,360,056
- Issue date Jul 15, 2025
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Protective sheet fixing jig and auto visual inspection system inclu...
- Patent number 12,352,699
- Issue date Jul 8, 2025
- Samsung Display Co., Ltd.
- Woongil Choi
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming optical proximity correction model and method of...
- Patent number 12,354,920
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sang Chul Yeo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shape reconstruction method and image measurement device
- Patent number 12,352,558
- Issue date Jul 8, 2025
- Machine Vision Lighting Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, defect inspection method, and adjustment...
- Patent number 12,345,654
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Blister-strip inspection device
- Patent number 12,347,097
- Issue date Jul 1, 2025
- BLISTER PARTNERS HOLDING BV
- Gijsbert Olivier Van Schelven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,345,661
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous back and/or front and/or bulk defect detection
- Patent number 12,339,235
- Issue date Jun 24, 2025
- Onto Innovation Inc.
- Felix Moellmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Physical body inspection system and display control method
- Patent number 12,335,630
- Issue date Jun 17, 2025
- TOYOTA PRODUCTION ENGINEERING
- Haruki Kabashima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for detecting product for defects, electronic device, and st...
- Patent number 12,332,183
- Issue date Jun 17, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chung-Yu Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for automatic diagnostics and monitoring of semiconductor de...
- Patent number 12,332,182
- Issue date Jun 17, 2025
- KLA Corporation
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-defect detecting method, surface-defect detecting apparatus...
- Patent number 12,320,756
- Issue date Jun 3, 2025
- JFE Steel Corporation
- Hiroaki Ono
- G01 - MEASURING TESTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Light reflection support and through hole inspection system
- Patent number 12,313,568
- Issue date May 27, 2025
- JOONGWOO M-TECH CO., LTD.
- Sung Soo Park
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Container leakage detection using thermal imaging
- Patent number 12,306,065
- Issue date May 20, 2025
- Institut National D'Optique
- Timothy Pope
- G01 - MEASURING TESTING
Information Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
- Patent number 12,298,255
- Issue date May 13, 2025
- Industrial Intelligence Inc.
- George T. Armbruster
- B08 - CLEANING
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for defect detection and correction in additive...
- Patent number 12,280,429
- Issue date Apr 22, 2025
- Sentient Science Corporation
- Jingfu Liu
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Information display apparatus, information display method, and info...
- Patent number 12,283,035
- Issue date Apr 22, 2025
- FUJIFILM Corporation
- Makoto Yonaha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tool wear monitoring device, tool wear monitoring system, and program
- Patent number 12,283,038
- Issue date Apr 22, 2025
- Hitachi, Ltd.
- Kenji Nishikawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for treating plastics preforms
- Publication number 20250231118
- Publication date Jul 17, 2025
- KRONES AG
- Florian GELTINGER
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING
- Publication number 20250232573
- Publication date Jul 17, 2025
- QC HERO, INC.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS
- Publication number 20250231081
- Publication date Jul 17, 2025
- VIAVI SOLUTIONS INC.
- Eugene CHAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBSERVING SURFACE
- Publication number 20250231116
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Shin OOWADA
- G01 - MEASURING TESTING
Information Patent Application
LEATHER DEFECT DETECTION SYSTEM
- Publication number 20250232428
- Publication date Jul 17, 2025
- Feng Chia University
- Sze Teng LIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF MEASURING AN ANGLE BETWEEN TWO SURFACES
- Publication number 20250231117
- Publication date Jul 17, 2025
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...
- Publication number 20250231119
- Publication date Jul 17, 2025
- NEC Corporation
- Michiaki INOUE
- G01 - MEASURING TESTING
Information Patent Application
VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...
- Publication number 20250231122
- Publication date Jul 17, 2025
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Guangze LI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND INS...
- Publication number 20250225643
- Publication date Jul 10, 2025
- Mitsubishi Heavy Industries, Ltd.
- Shota ISHII
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrode Sheet Defect Inspection Device
- Publication number 20250224341
- Publication date Jul 10, 2025
- LG ENERGY SOLUTION, LTD.
- Jong Hwa Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...
- Publication number 20250225641
- Publication date Jul 10, 2025
- HEFEI GENERAL MACHINERY RESEARCH INSTITUTE CO., LTD
- Tao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD WITH DEFECT DETECTION
- Publication number 20250225647
- Publication date Jul 10, 2025
- Samsung Electro-Mechanics Co., Ltd.
- Dongjin PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...
- Publication number 20250216336
- Publication date Jul 3, 2025
- TOKYO ELECTRON LIMITED
- Colin PILCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
- Publication number 20250209607
- Publication date Jun 26, 2025
- Pratt & Whitney Canada Corp.
- Michael Morash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL
- Publication number 20250208058
- Publication date Jun 26, 2025
- Beckman Coulter, Inc.
- Jose Chacon
- G01 - MEASURING TESTING
Information Patent Application
Laser scanning of cable and cable accessory components subjected to...
- Publication number 20250208062
- Publication date Jun 26, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING FOR AN OPTICAL MONITORING APPARATUS
- Publication number 20250208055
- Publication date Jun 26, 2025
- BÜHLER UK LTD.
- Brice THURIN
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...
- Publication number 20250207300
- Publication date Jun 26, 2025
- ZHEJIANG HENGYI PETROCHEMICAL CO., LTD.
- Mingyi LIU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...
- Publication number 20250208056
- Publication date Jun 26, 2025
- THE JAPAN STEEL WORKS, LTD
- Tomoya ODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus
- Publication number 20250208057
- Publication date Jun 26, 2025
- Noki Technologies Oy
- Marja Pauliina Salmimaa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL FEATURE MEASUREMENT METHOD
- Publication number 20250198915
- Publication date Jun 19, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM
- Publication number 20250198940
- Publication date Jun 19, 2025
- LG ENERGY SOLUTION, LTD.
- Ki Deok HAN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
PROCESSING SYSTEM AND PROCESSING METHOD CAPABLE OF AUTOMATICALLY MO...
- Publication number 20250198948
- Publication date Jun 19, 2025
- GLORY STEEL ENTERPRISE CO., LTD.
- YI-LIANG CHEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Measurements Of Complex Semiconductor Structures Based On Component...
- Publication number 20250198942
- Publication date Jun 19, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
- Publication number 20250198941
- Publication date Jun 19, 2025
- Samsung Electronics Co., Ltd.
- Min Ho RIM
- G01 - MEASURING TESTING
Information Patent Application
ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...
- Publication number 20250198947
- Publication date Jun 19, 2025
- HEXAGON TECHNOLOGY CENTER GMBH
- Bernd REIMANN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
- Publication number 20250189458
- Publication date Jun 12, 2025
- GUDENG EQUIPMENT CO., LTD.
- Che-Wei Chan
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- Davide Giassi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20250191173
- Publication date Jun 12, 2025
- Hitachi Astemo, Ltd.
- Yoshihiko KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING

Scan or image signal processing specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Image processing apparatus, image processing method, and storage me...

Reconstruction of a distorted image of an array of structural eleme...

Surface analysis of gemstones

Defect inspection apparatus and defect inspection method

Semiconductor apparatus examination method and semiconductor appara...

Protective sheet fixing jig and auto visual inspection system inclu...

Method of forming optical proximity correction model and method of...

Shape reconstruction method and image measurement device

Defect inspection device, defect inspection method, and adjustment...

Blister-strip inspection device

Defect inspection apparatus and defect inspection method

Simultaneous back and/or front and/or bulk defect detection

Method and apparatus for determination of textile fiber composition

Physical body inspection system and display control method

Method for detecting product for defects, electronic device, and st...

System for automatic diagnostics and monitoring of semiconductor de...

Surface-defect detecting method, surface-defect detecting apparatus...

Detection method of crease degree of screen and visual detection ap...

Light reflection support and through hole inspection system

Inspection device and inspection method

3D image acquisition system for optical inspection and method for o...

Container leakage detection using thermal imaging

Continuous dust accumulation monitoring system with impaired optics...

Apparatus and method for inspecting laser defect inside of transpar...

Deterioration diagnosis device, deterioration diagnosis method, and...

System and method of object detection using AI deep learning models

Ultra-micro defect detection apparatus and detection method thereof

Systems and methods for defect detection and correction in additive...

Information display apparatus, information display method, and info...

Tool wear monitoring device, tool wear monitoring system, and program

Patents Applicationslast 30 patents

Apparatus and method for treating plastics preforms

SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING

INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS

METHOD FOR OBSERVING SURFACE

LEATHER DEFECT DETECTION SYSTEM

SYSTEM AND METHOD OF MEASURING AN ANGLE BETWEEN TWO SURFACES

INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...

VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...

INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND INS...

Electrode Sheet Defect Inspection Device

CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...

APPARATUS AND METHOD WITH DEFECT DETECTION

FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...

METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE

BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL

Laser scanning of cable and cable accessory components subjected to...

LIGHTING FOR AN OPTICAL MONITORING APPARATUS

YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...

SCREW CONSTRUCTION INFERENCE DEVICE, SCREW CONSTRUCTION INFERENCE M...

Apparatus

SPECTRAL FEATURE MEASUREMENT METHOD

ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM

PROCESSING SYSTEM AND PROCESSING METHOD CAPABLE OF AUTOMATICALLY MO...

Measurements Of Complex Semiconductor Structures Based On Component...

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

ADAPTATION OF ILLUMINATION SETTINGS FOR OPTICAL MEASUREMENT AND INS...

OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD