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Scan or image signal processing specially adapted therefor
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G01N21/8851
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N21/00
Investigating or analysing materials by the use of optical means
Current Industry
G01N21/8851
Scan or image signal processing specially adapted therefor
Industries
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Rail assessment device
Patent number
11,982,598
Issue date
May 14, 2024
KONECRANES, INC.
Johnny Glenn Curtis
G01 - MEASURING TESTING
Information
Patent Grant
Measurement device and method for semiconductor structure
Patent number
11,984,366
Issue date
May 14, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Xin Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detecting defects on imaged items
Patent number
11,982,628
Issue date
May 14, 2024
INSPEKTO A.M.V. LTD.
Yonatan Hyatt
G01 - MEASURING TESTING
Information
Patent Grant
System and method for visual production line inspection of differen...
Patent number
11,983,857
Issue date
May 14, 2024
INSPEKTO A.M.V. LTD.
Yonatan Hyatt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device and method for checking an object produced by sin...
Patent number
11,983,862
Issue date
May 14, 2024
Volkswagen A en gesellschaft
Shahrooz Sadeghi Borujeni
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for recognizing defects in finished surface of product
Patent number
11,982,629
Issue date
May 14, 2024
Fu Tai Hua Industry (Shenzhen) Co., Ltd.
Liu-Bin Hu
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection device, defect detection method, and defect observ...
Patent number
11,982,631
Issue date
May 14, 2024
HITACHI HIGH-TECH CORPORATION
Yuko Otani
G01 - MEASURING TESTING
Information
Patent Grant
Learning device, inspection device, learning method, and inspection...
Patent number
11,977,033
Issue date
May 7, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yuya Sugasawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus and image processing method
Patent number
11,972,550
Issue date
Apr 30, 2024
FUJIFILM Corporation
Shuhei Horita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device inspection method and semiconductor device ins...
Patent number
11,971,364
Issue date
Apr 30, 2024
Hamamatsu Photonics K.K.
Shinsuke Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Damage figure creation supporting apparatus, damage figure creation...
Patent number
11,959,862
Issue date
Apr 16, 2024
FUJIFILM Corporation
Shuhei Horita
G01 - MEASURING TESTING
Information
Patent Grant
Method for defect inspection
Patent number
11,953,448
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Tsun-Cheng Tang
G01 - MEASURING TESTING
Information
Patent Grant
Defective part recognition device and defective part recognition me...
Patent number
11,953,447
Issue date
Apr 9, 2024
V Technology Co., Ltd.
Michinobu Mizumura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image view angle conversion/fault determination method and device,...
Patent number
11,956,407
Issue date
Apr 9, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Ruirui Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for evaluating defective region of wafer
Patent number
11,955,386
Issue date
Apr 9, 2024
SK SILTRON CO., LTD.
Jae Hyeong Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple camera imager for inspection of large diameter pipes, cham...
Patent number
11,949,989
Issue date
Apr 2, 2024
RedZone Robotics, Inc.
Justin Starr
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Selecting a representative subset of potential defects to improve d...
Patent number
11,940,390
Issue date
Mar 26, 2024
Applied Materials Israel Ltd.
Yotam Sofer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Vision inspection system and method of inspecting parts
Patent number
11,935,216
Issue date
Mar 19, 2024
Tyco Electronics (Shanghai) Co., Ltd.
Roberto Francisco-Yi Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Object inspection system and method for inspecting an object
Patent number
11,937,020
Issue date
Mar 19, 2024
INOVISION SOFTWARE SOLUTIONS, INC.
Jacob Nathaniel Allen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection device and method for detecting workpiece
Patent number
11,933,737
Issue date
Mar 19, 2024
Tyco Electronics AMP Guangdong Ltd.
Lei (Alex) Zhou
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Measurement apparatus, information processing apparatus, and non-tr...
Patent number
11,933,603
Issue date
Mar 19, 2024
FUJIFILM Business Innovation Corp.
Takashi Hiramatsu
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus
Patent number
11,933,739
Issue date
Mar 19, 2024
NEC Corporation
Takashi Shibata
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Marking system, diagnosis support apparatus, diagnosis support meth...
Patent number
11,933,738
Issue date
Mar 19, 2024
Keyence Corporation
Osamu Iwabuchi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Information processing apparatus, information processing method, an...
Patent number
11,927,540
Issue date
Mar 12, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated system for assessing and modeling integrity of wheels an...
Patent number
11,921,084
Issue date
Mar 5, 2024
CleanSolv International LTD
Thomas Shumka
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Inspection with previous step subtraction
Patent number
11,921,052
Issue date
Mar 5, 2024
KLA Corporation
Robert M. Danen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Structure management device, structure management method, and struc...
Patent number
11,915,411
Issue date
Feb 27, 2024
FUJIFILM Corporation
Hiroaki Kikuchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for visualizing and analyzing a rail surface
Patent number
11,912,320
Issue date
Feb 27, 2024
Ensco, Inc.
Matthew Dick
G01 - MEASURING TESTING
Information
Patent Grant
Inspection management device, inspection management method, and rec...
Patent number
11,913,789
Issue date
Feb 27, 2024
NEC Corporation
Hiroaki Inotsume
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Prediction device for predicting a growth direction of a crack in a...
Patent number
11,913,889
Issue date
Feb 27, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Yuki Maruyama
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS AND APPARATUS FOR ANALYZING A BODILY SAMPLE
Publication number
20240151959
Publication date
May 9, 2024
S.D. SIGHT DIAGNOSTICS LTD
Yochay Shlomo ESHEL
G01 - MEASURING TESTING
Information
Patent Application
CARVED CODE QUALITY DETECTION APPARATUS AND SYSTEM
Publication number
20240151655
Publication date
May 9, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Xiaohong ZOU
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20240151650
Publication date
May 9, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G01 - MEASURING TESTING
Information
Patent Application
Surface Water Quality Monitoring Method Based on High Spatial Resol...
Publication number
20240151703
Publication date
May 9, 2024
Wuhan University
Yanjun ZHANG
G01 - MEASURING TESTING
Information
Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
Publication number
20240144467
Publication date
May 2, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chien-Huei Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...
Publication number
20240142389
Publication date
May 2, 2024
SEMES CO., LTD.
Jeong Hoon HAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CLASSIFICATION OF DEFECT PATTERNS OF SUBSTRATES
Publication number
20240144464
Publication date
May 2, 2024
Applied Materials, Inc.
Chandrani Roy Chowdhury
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR ROAD INSPECTION
Publication number
20240141601
Publication date
May 2, 2024
Telefonaktiebolaget LM Ericsson (publ)
Ning ZHANG
E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information
Patent Application
OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING...
Publication number
20240134010
Publication date
Apr 25, 2024
NEC Corporation
Katsuhiro YUTANI
G01 - MEASURING TESTING
Information
Patent Application
Identifying 3D Objects
Publication number
20240133821
Publication date
Apr 25, 2024
FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES
Valerio PRUNERI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
Publication number
20240133824
Publication date
Apr 25, 2024
HITACHI HIGH-TECH CORPORATION
Yuta URANO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240131559
Publication date
Apr 25, 2024
Ackley Machine Corporation
E. Michael ACKLEY
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
Publication number
20240133772
Publication date
Apr 25, 2024
SPINFRAME TECHNOLOGIES LTD
Ori Yakov DANGUR
G01 - MEASURING TESTING
Information
Patent Application
PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLU...
Publication number
20240118217
Publication date
Apr 11, 2024
SAMSUNG DISPLAY CO., LTD.
WOONGIL CHOI
G01 - MEASURING TESTING
Information
Patent Application
ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF
Publication number
20240119577
Publication date
Apr 11, 2024
Casi Vision Technology (Luoyang) Co., Ltd.
Feng Lei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD
Publication number
20240118222
Publication date
Apr 11, 2024
PlayNitride Display Co., Ltd.
Chang-Rong Lin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
Publication number
20240112935
Publication date
Apr 4, 2024
Photon Dynamics, Inc.
Neil Dang Nguyen
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
Publication number
20240110878
Publication date
Apr 4, 2024
Chevron U.S.A. Inc.
Nikolaos Ioannis Salmatanis
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION BELT
Publication number
20240110617
Publication date
Apr 4, 2024
Aktiebolaget SKF
Lakdar SADI-HADDAD
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF
Publication number
20240102169
Publication date
Mar 28, 2024
JNK TECH
Youngjin Choi
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Apparatus for detecting defects of reflective element
Publication number
20240103026
Publication date
Mar 28, 2024
Hong-I Tsai
G01 - MEASURING TESTING
Information
Patent Application
CAMERA-ALIGNMENT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240104777
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102938
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
Publication number
20240102939
Publication date
Mar 28, 2024
Apple Inc.
Mikael B. MANNBERG
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND C...
Publication number
20240094137
Publication date
Mar 21, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Zhiyu Wang
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD AND SYSTEM FOR DETERMINING THE LOCATION OF A SURFA...
Publication number
20240094145
Publication date
Mar 21, 2024
HUA YANG Precision Machinery Co.,Ltd
Hsien-Te HSIAO
G01 - MEASURING TESTING
Information
Patent Application
PRINTED-MATTER INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER READAB...
Publication number
20240094138
Publication date
Mar 21, 2024
FUJIFILM Business Innovation Corp.
Yoshie OHIRA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
BLISTER-STRIP INSPECTION DEVICE
Publication number
20240087110
Publication date
Mar 14, 2024
Blister Partners Holding BV
Gijsbert Olivier Van Schelven
G06 - COMPUTING CALCULATING COUNTING