Membership
Tour
Register
Log in
Scanning or positioning arrangements
Follow
Industry
CPC
G01Q10/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01Q
SCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES
Current Industry
G01Q10/00
Scanning or positioning arrangements
Sub Industries
G01Q10/02
Coarse scanning or positioning
G01Q10/04
Fine scanning or positioning
G01Q10/045
Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself
G01Q10/06
Circuits or algorithms therefor
G01Q10/065
Feedback mechanisms
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Device and method for operating a bending beam in a closed control...
Patent number
11,965,910
Issue date
Apr 23, 2024
Carl Zeiss SMT GmbH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe system
Patent number
11,959,936
Issue date
Apr 16, 2024
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,940,461
Issue date
Mar 26, 2024
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Coated active cantilever probes for use in topography imaging in op...
Patent number
11,906,546
Issue date
Feb 20, 2024
Massachusetts Institute of Technology
Fangzhou Xia
G01 - MEASURING TESTING
Information
Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
Patent number
11,860,188
Issue date
Jan 2, 2024
Industry-Academic Cooperation Foundation, Yonsei University
Wooyoung Shim
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
Patent number
11,852,654
Issue date
Dec 26, 2023
Board of Regents, The University of Texas System
Seyed Omid Reza Moheimani
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
Patent number
11,846,653
Issue date
Dec 19, 2023
MOLECULAR VISTA, INC.
William Morrison
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for a scanning probe microscope
Patent number
11,796,563
Issue date
Oct 24, 2023
Carl Zeiss SMT GmbH
Ulrich Matejka
G01 - MEASURING TESTING
Information
Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
Patent number
11,789,037
Issue date
Oct 17, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing Liu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
Patent number
11,764,050
Issue date
Sep 19, 2023
NOVA MEASURING INSTRUMENTS INC.
David A. Reed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for analyte detection and analysis
Patent number
11,747,323
Issue date
Sep 5, 2023
ULTIMA GENOMICS, INC.
Kristopher Barbee
G01 - MEASURING TESTING
Information
Patent Grant
Method of imaging a surface using a scanning probe microscope
Patent number
11,733,265
Issue date
Aug 22, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
Patent number
11,733,264
Issue date
Aug 22, 2023
HITACHI HIGH-TECH CORPORATION
Kaifeng Zhang
G01 - MEASURING TESTING
Information
Patent Grant
AFM imaging with creep correction
Patent number
11,714,104
Issue date
Aug 1, 2023
Bruker Nano, Inc.
Jason Osborne
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Atomic force microscope using artificial intelligence object recogn...
Patent number
11,709,180
Issue date
Jul 25, 2023
Chungbuk National University Industry-Academic Cooperation Foundation
Man Hee Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for optogenetic imaging
Patent number
11,690,696
Issue date
Jul 4, 2023
INSCOPIX, INC.
Mark O. Trulson
G01 - MEASURING TESTING
Information
Patent Grant
High speed atomic force profilometry of large areas
Patent number
11,668,730
Issue date
Jun 6, 2023
Bruker Nano, Inc.
Jason Osborne
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for measuring dimension of semiconductor structure
Patent number
11,656,245
Issue date
May 23, 2023
Changxin Memory Technologies, Inc.
Zheng Li
G01 - MEASURING TESTING
Information
Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
Patent number
11,656,244
Issue date
May 23, 2023
Bruker Nano GmbH
Wolfgang Dobler
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices configured to operated scanning tunneling micro...
Patent number
11,650,222
Issue date
May 16, 2023
Board of Regents, The University of Texas System
Seyed Omid Reza Moheimani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermally stable, drift resistant probe for a scanning probe micros...
Patent number
11,644,480
Issue date
May 9, 2023
Bruker Nano, Inc.
Jeffrey K. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Automated optimization of AFM light source positioning
Patent number
11,644,478
Issue date
May 9, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
Patent number
11,635,449
Issue date
Apr 25, 2023
BRUKER NANO, INC.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Device and method for operating a bending beam in a closed control...
Patent number
11,630,124
Issue date
Apr 18, 2023
Carl Zeiss SMT GmbH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Grant
Atomic force microscope equipped with optical measurement device an...
Patent number
11,619,649
Issue date
Apr 4, 2023
Park Systems Corp.
Sang-il Park
G01 - MEASURING TESTING
Information
Patent Grant
AFM imaging with real time drift correction
Patent number
11,604,210
Issue date
Mar 14, 2023
Bruker Nano, Inc.
Vladimir Fonoberov
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope, scan head and method
Patent number
11,592,460
Issue date
Feb 28, 2023
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Roelof Willem Herfst
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for aligning a probe for scanning probe micros...
Patent number
11,549,963
Issue date
Jan 10, 2023
Imec VZW
Kristof Paredis
G01 - MEASURING TESTING
Information
Patent Grant
Phase-shift-based amplitude detector for a high-speed atomic force...
Patent number
11,549,964
Issue date
Jan 10, 2023
Cornell University
Atsushi Miyagi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting an energized e-field
Patent number
11,519,130
Issue date
Dec 6, 2022
Whirlpool Corporation
Mark L. Herman
G08 - SIGNALLING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
Publication number
20240110939
Publication date
Apr 4, 2024
Nearfield Instruments B.V.
Hamed SADEGHIAN MARNANI
G01 - MEASURING TESTING
Information
Patent Application
OPTOMECHANICAL TRANSDUCER
Publication number
20240094240
Publication date
Mar 21, 2024
Centre National de la Recherche Scientifique
Cyprien LEMOUCHI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
Publication number
20240087869
Publication date
Mar 14, 2024
NOVA MEASURING INSTRUMENTS INC.
David A. REED
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
Publication number
20240069095
Publication date
Feb 29, 2024
Intel Corporation
Huei Hao YAP
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
Publication number
20240027425
Publication date
Jan 25, 2024
Ultima Genomics, Inc.
Kristopher BARBEE
G01 - MEASURING TESTING
Information
Patent Application
Surface Analysis Device
Publication number
20230296644
Publication date
Sep 21, 2023
Hitachi High-Tech Corporation
Ritsuo FUKAYA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20230251284
Publication date
Aug 10, 2023
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
Publication number
20230251285
Publication date
Aug 10, 2023
Carl Zeiss SMT GMBH
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20230243867
Publication date
Aug 3, 2023
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
Publication number
20230194566
Publication date
Jun 22, 2023
The Regents of the University of California
Shenkai Wang
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
Publication number
20230152300
Publication date
May 18, 2023
Ultima Genomics, Inc.
Kristopher BARBEE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
Publication number
20230091625
Publication date
Mar 23, 2023
NOVA MEASURING INSTRUMENTS INC.
David A. REED
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
Publication number
20230030991
Publication date
Feb 2, 2023
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
Publication number
20230018874
Publication date
Jan 19, 2023
MOLECULAR VISTA, INC.
William Morrison
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
Publication number
20230019239
Publication date
Jan 19, 2023
Shenyang Institute of Automation, Chinese Academy of Sciences
Lianqing LIU
G01 - MEASURING TESTING
Information
Patent Application
AFM Imaging with Real Time Drift Correction
Publication number
20230009857
Publication date
Jan 12, 2023
Bruker Nano, Inc.
Vladimir Fonoberov
B82 - NANO-TECHNOLOGY
Information
Patent Application
SCANNING PROBE SYSTEM
Publication number
20220390484
Publication date
Dec 8, 2022
INFINITESIMA LIMITED
Andrew Humphris
G01 - MEASURING TESTING
Information
Patent Application
AFM Imaging with Creep Correction
Publication number
20220381803
Publication date
Dec 1, 2022
Bruker Nano, Inc.
Jason Osborne
B82 - NANO-TECHNOLOGY
Information
Patent Application
ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...
Publication number
20220373575
Publication date
Nov 24, 2022
CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
Man Hee LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
Publication number
20220357359
Publication date
Nov 10, 2022
Shimadzu Corporation
Kazuma WATANABE
G01 - MEASURING TESTING
Information
Patent Application
Probe for Scanning Probe Microscope and Binary State Scanning Probe...
Publication number
20220308086
Publication date
Sep 29, 2022
Industry-Academic Cooperation Foundation, Yonsei University
Wooyoung Shim
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC NANO-POSITIONING DEVICE
Publication number
20220299544
Publication date
Sep 22, 2022
National Research Council of Canada
Robert A. Wolkow
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
Publication number
20220260611
Publication date
Aug 18, 2022
HITACHI HIGH-TECH CORPORATION
Kaifeng ZHANG
G01 - MEASURING TESTING
Information
Patent Application
PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...
Publication number
20220260612
Publication date
Aug 18, 2022
Cornell University
Atsushi Miyagi
G01 - MEASURING TESTING
Information
Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
Publication number
20220252638
Publication date
Aug 11, 2022
Bruker Nano, Inc.
Sergey Osechinskiy
B82 - NANO-TECHNOLOGY
Information
Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
Publication number
20220244288
Publication date
Aug 4, 2022
Massachusetts Institute of Technology
Fangzhou XIA
G01 - MEASURING TESTING
Information
Patent Application
Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...
Publication number
20220244287
Publication date
Aug 4, 2022
BRUKER NANO GMBH
Torsten Jahnke
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
Publication number
20220244289
Publication date
Aug 4, 2022
Oxford Instruments Asylum Research, Inc.
Jason Bemis
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING DIMENSION OF SEMICONDUCTOR STRUCTURE
Publication number
20220229087
Publication date
Jul 21, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC
Zheng LI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
Publication number
20220146548
Publication date
May 12, 2022
Carl Zeiss SMT GMBH
Ulrich Matejka
G01 - MEASURING TESTING