Scanning or positioning arrangements

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CPC
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Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for optogenetic imaging
- Patent number 12,109,074
- Issue date Oct 8, 2024
- INSCOPIX, INC.
- Mark O. Trulson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for scanning probe sample property measurement...
- Patent number 11,994,533
- Issue date May 28, 2024
- The Regents of the University of Colorado, a Body Corporate
- Rafael Piestun
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 11,959,936
- Issue date Apr 16, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
- Patent number 11,852,654
- Issue date Dec 26, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
- Patent number 11,846,653
- Issue date Dec 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for analyte detection and analysis
- Patent number 11,747,323
- Issue date Sep 5, 2023
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope using artificial intelligence object recogn...
- Patent number 11,709,180
- Issue date Jul 25, 2023
- Chungbuk National University Industry-Academic Cooperation Foundation
- Man Hee Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for optogenetic imaging
- Patent number 11,690,696
- Issue date Jul 4, 2023
- INSCOPIX, INC.
- Mark O. Trulson
- G01 - MEASURING TESTING
Information Patent Grant
High speed atomic force profilometry of large areas
- Patent number 11,668,730
- Issue date Jun 6, 2023
- Bruker Nano, Inc.
- Jason Osborne
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring dimension of semiconductor structure
- Patent number 11,656,245
- Issue date May 23, 2023
- Changxin Memory Technologies, Inc.
- Zheng Li
- G01 - MEASURING TESTING
Information Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
- Patent number 11,656,244
- Issue date May 23, 2023
- Bruker Nano GmbH
- Wolfgang Dobler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,650,222
- Issue date May 16, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally stable, drift resistant probe for a scanning probe micros...
- Patent number 11,644,480
- Issue date May 9, 2023
- Bruker Nano, Inc.
- Jeffrey K. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,630,124
- Issue date Apr 18, 2023
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope equipped with optical measurement device an...
- Patent number 11,619,649
- Issue date Apr 4, 2023
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with real time drift correction
- Patent number 11,604,210
- Issue date Mar 14, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND PROGRAM
- Publication number 20240402215
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...
- Publication number 20240264199
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Egor UKRAINTSEV
- G01 - MEASURING TESTING
Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...
- Publication number 20240264198
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Bohuslav REZEK
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20240230709
- Publication date Jul 11, 2024
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...
- Publication number 20240210444
- Publication date Jun 27, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Gaëlle Charrier
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL MICROSCOPIC IMAGING
- Publication number 20240207011
- Publication date Jun 27, 2024
- Inscopix, Inc.
- Koen VISSCHER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20240027425
- Publication date Jan 25, 2024
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
Surface Analysis Device
- Publication number 20230296644
- Publication date Sep 21, 2023
- Hitachi High-Tech Corporation
- Ritsuo FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20230251285
- Publication date Aug 10, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...
- Publication number 20230194566
- Publication date Jun 22, 2023
- The Regents of the University of California
- Shenkai Wang
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20230152300
- Publication date May 18, 2023
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
- Publication number 20230018874
- Publication date Jan 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
- Publication number 20230019239
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Real Time Drift Correction
- Publication number 20230009857
- Publication date Jan 12, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE SYSTEM
- Publication number 20220390484
- Publication date Dec 8, 2022
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...
- Publication number 20220373575
- Publication date Nov 24, 2022
- CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Man Hee LEE
- G06 - COMPUTING CALCULATING COUNTING

Scanning or positioning arrangements

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Systems and approaches for semiconductor metrology and surface anal...

Systems and methods for optogenetic imaging

Automated optimization of AFM light source positioning

Methods and systems for scanning probe sample property measurement...

Device and method for operating a bending beam in a closed control...

Scanning probe system

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Coated active cantilever probes for use in topography imaging in op...

Probe for scanning probe microscope and binary state scanning probe...

Cantilever with a collocated piezoelectric actuator-sensor pair

Scanning probe microscope and method for resonance-enhanced detecti...

Apparatus and method for a scanning probe microscope

Integrated dual-probe rapid in-situ switching measurement method an...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for analyte detection and analysis

Method of imaging a surface using a scanning probe microscope

Cantilever, scanning probe microscope, and measurement method using...

AFM imaging with creep correction

Atomic force microscope using artificial intelligence object recogn...

Systems and methods for optogenetic imaging

High speed atomic force profilometry of large areas

Method and device for measuring dimension of semiconductor structure

Compensating control signal for raster scan of a scanning probe mic...

Methods and devices configured to operated scanning tunneling micro...

Thermally stable, drift resistant probe for a scanning probe micros...

Automated optimization of AFM light source positioning

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Device and method for operating a bending beam in a closed control...

Atomic force microscope equipped with optical measurement device an...

AFM imaging with real time drift correction

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE AND PROGRAM

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...

A METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE U...

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...

MULTI-MODAL MICROSCOPIC IMAGING

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Scanning Probe Microscope, Sample Observation Processing System, an...

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

OPTOMECHANICAL TRANSDUCER

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

Surface Analysis Device

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUN...

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...

INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...

AFM Imaging with Real Time Drift Correction

SCANNING PROBE SYSTEM

AFM Imaging with Creep Correction

ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...