scanning

Industry

CPC
G01N2223/33

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/33scanning

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring residual stress
- Patent number 12,241,803
- Issue date Mar 4, 2025
- Kobe Steel, Ltd.
- Mariko Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Seal element for a pipeline pig
- Patent number 12,163,591
- Issue date Dec 10, 2024
- Rosen Swiss AG
- Patrik Rosen
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Systems and methods for x-ray computed tomography
- Patent number 12,163,901
- Issue date Dec 10, 2024
- Orimtech, Ltd.
- Boris S. Goldberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 12,135,297
- Issue date Nov 5, 2024
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scanning system and method for inspecting an object
- Patent number 12,111,271
- Issue date Oct 8, 2024
- Seethru AI, Inc.
- Omar Al-Kofahi
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Battery holder device and battery test system including the same
- Patent number 12,061,157
- Issue date Aug 13, 2024
- SK ON CO., LTD.
- Hye Ju Jang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Radiography inspection and fail-safe mechanism for pipe traversing...
- Patent number 12,038,395
- Issue date Jul 16, 2024
- Arix Technologies, Inc.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION X-RAY REFLECTOMETER
- Publication number 20250110068
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Application
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20250085239
- Publication date Mar 13, 2025
- Anritsu Corporation
- Michihiko IKEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...
- Publication number 20250079030
- Publication date Mar 6, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
- Publication number 20240410838
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
- Publication number 20240410837
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CT IMAGING SYSTEM
- Publication number 20240410839
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Tray Insert for Screening Tray
- Publication number 20240353354
- Publication date Oct 24, 2024
- Rapiscan Holdings, Inc.
- Philippe Desjeans-Gauthier
- G01 - MEASURING TESTING
Information Patent Application
BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME
- Publication number 20240345004
- Publication date Oct 17, 2024
- SK On Co., Ltd.
- Hye Ju JANG
- G01 - MEASURING TESTING
Information Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
- Publication number 20240345003
- Publication date Oct 17, 2024
- Faxitron Bioptics, LLC
- Ciaran PURDY
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CYCLIC IMAGING A ROCK SAMPLE
- Publication number 20240328966
- Publication date Oct 3, 2024
- Saudi Arabian Oil Company
- Sinan Caliskan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGE ACQUISITION DEVICE AND X-RAY IMAGE ACQUISITION SYSTEM
- Publication number 20240319116
- Publication date Sep 26, 2024
- Hamamatsu Photonics K.K.
- Haruki SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
- Publication number 20240319119
- Publication date Sep 26, 2024
- ARIX TECHNOLOGIES, INC.
- Bryan R. Duerfeldt
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319117
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240310305
- Publication date Sep 19, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Jet blades optical inspection

High-energy x-ray imaging system

X-ray phase imaging apparatus and X-ray phase imaging method

Method for measuring residual stress

X-ray inspection apparatus

Inspection device

Transmissive small-angle scattering device

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray reflectometry apparatus and method thereof for measuring thre...

Spent or decommissioned accumulator treatment plant and process

Secondary image removal using high resolution x-ray transmission so...

System and method for inspecting defects of structure by using X-ray

Method and apparatus of stationary-source nonplanar-trajectory narr...

X-ray backscatter imaging system for precise searching for containe...

X-ray tomography systems and methods for imaging an aircraft part

X-ray weld inspection

Seal element for a pipeline pig

Systems and methods for x-ray computed tomography

System, method, and apparatus for x-ray backscatter inspection of p...

Automated circumferential pipe scanning system

X-ray scanning system and method for inspecting an object

Method for scanning a sample by means of X-ray optics and an appara...

Inspection system, determination processing apparatus, and inspecti...

Device and method for measuring short-wavelength characteristic X-r...

Rotational X-ray inspection system and method

Battery holder device and battery test system including the same

Methods and systems for generating three-dimensional images that en...

System to inspect, modify or analyze a region of interest of a samp...

X-ray automated calibration and monitoring

Radiography inspection and fail-safe mechanism for pipe traversing...

Patents Applicationslast 30 patents

System to Assess Golf ball quality using multiple orientations of x...

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

HIGH RESOLUTION X-RAY REFLECTOMETER

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...

X-RAY IMAGING APPARATUS

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...

ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

Methods and Systems for Generating Three-Dimensional Images that En...

CT IMAGING SYSTEM

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

Tray Insert for Screening Tray

BATTERY HOLDER DEVICE AND BATTERY TEST SYSTEM INCLUDING THE SAME

3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE

INSPECTION SYSTEM AND METHOD

METHOD AND APPARATUS FOR CYCLIC IMAGING A ROCK SAMPLE

X-RAY IMAGE ACQUISITION DEVICE AND X-RAY IMAGE ACQUISITION SYSTEM

RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...

X-RAY INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD