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G01N2223/33

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
Specimen radiography system comprising a cabinet and a specimen dra...
- Patent number 12,364,443
- Issue date Jul 22, 2025
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-channel radiographic inspection device
- Patent number 12,352,706
- Issue date Jul 8, 2025
- Nuctech Company Limited
- Li Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Multiple secondary electron beam alignment method, multiple seconda...
- Patent number 12,339,241
- Issue date Jun 24, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system, an x-ray imaging accessory, a sample suppo...
- Patent number 12,332,189
- Issue date Jun 17, 2025
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Grant
Detection method, apparatus and system
- Patent number 12,326,408
- Issue date Jun 10, 2025
- Nuctech Company Limited
- Zhi Zeng
- G01 - MEASURING TESTING
Information Patent Grant
Automatic particle beam focusing
- Patent number 12,327,342
- Issue date Jun 10, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter imaging device, control method and inspection system
- Patent number 12,298,261
- Issue date May 13, 2025
- Nuctech Company Limited
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
High resolution continuous rotation industrial radiography imaging...
- Patent number 12,281,993
- Issue date Apr 22, 2025
- Illinois Tool Works Inc.
- Camaron Mitchell Lemmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Movable detection device and detection method
- Patent number 12,281,994
- Issue date Apr 22, 2025
- Nutech Company Limited
- Kejin Gao
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
High-energy x-ray imaging system
- Patent number 12,253,648
- Issue date Mar 18, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase imaging apparatus and X-ray phase imaging method
- Patent number 12,247,933
- Issue date Mar 11, 2025
- Shimadzu Corporation
- Kana Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring residual stress
- Patent number 12,241,803
- Issue date Mar 4, 2025
- Kobe Steel, Ltd.
- Mariko Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,235,227
- Issue date Feb 25, 2025
- JED CO., LTD
- Osamu Kinoshita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,228,527
- Issue date Feb 18, 2025
- Saki Corporation
- Hiroyuki Murata
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Secondary image removal using high resolution x-ray transmission so...
- Patent number 12,181,423
- Issue date Dec 31, 2024
- Sigray, Inc.
- Sylvia Jia Yun Lewis
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of stationary-source nonplanar-trajectory narr...
- Patent number 12,181,424
- Issue date Dec 31, 2024
- MALCOVA, INC.
- Peymon Mirsaeid Ghazi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter imaging system for precise searching for containe...
- Patent number 12,181,428
- Issue date Dec 31, 2024
- KOREA INSTITUTE OF OCEAN SCIENCE & TECHNOLOGY
- Jongwon Park
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography systems and methods for imaging an aircraft part
- Patent number 12,174,129
- Issue date Dec 24, 2024
- The Boeing Company
- Donald Duane Palmer
- G01 - MEASURING TESTING
Information Patent Grant
X-ray weld inspection
- Patent number 12,163,902
- Issue date Dec 10, 2024
- Varex Imaging Sweden AB
- Tuomas Pantsar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR MAPPING IRREGULAR SURFACES
- Publication number 20250231128
- Publication date Jul 17, 2025
- IXRF, Inc.
- Robert Tisdale
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
HIGH RESOLUTION CONTINUOUS ROTATION INDUSTRIAL RADIOGRAPHY IMAGING...
- Publication number 20250216345
- Publication date Jul 3, 2025
- Illinois Tool Works Inc.
- Camaron Mitchell Lemmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...
- Publication number 20250182258
- Publication date Jun 5, 2025
- ISHIDA CO., LTD.
- Shinya IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20250164420
- Publication date May 22, 2025
- Varex Imaging Sweden AB
- Tuomas Pantsar
- G01 - MEASURING TESTING
Information Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
- Publication number 20250155383
- Publication date May 15, 2025
- TESMEC S.P.A.
- Silvestro Di Gioia
- G01 - MEASURING TESTING
Information Patent Application
Object Manipulator for an X-ray Inspection System
- Publication number 20250155385
- Publication date May 15, 2025
- Comet Yxlon GmbH
- Laurenz Rosemann
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20250146962
- Publication date May 8, 2025
- Seethru AI Inc.
- OMAR AL-KOFAHI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137945
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE EQUIPMENT QUALITY CONTROL
- Publication number 20250137943
- Publication date May 1, 2025
- CARESTREAM HEALTH, INC.
- Luca BOGONI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20250110064
- Publication date Apr 3, 2025
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION X-RAY REFLECTOMETER
- Publication number 20250110068
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Application
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20250085239
- Publication date Mar 13, 2025
- Anritsu Corporation
- Michihiko IKEDA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...
- Publication number 20250079030
- Publication date Mar 6, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...
- Publication number 20250052701
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Norbert J. Pelc
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...
- Publication number 20240410838
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...
- Publication number 20240410837
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Qingping HUANG
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CT IMAGING SYSTEM
- Publication number 20240410839
- Publication date Dec 12, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240361257
- Publication date Oct 31, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Specimen radiography system comprising a cabinet and a specimen dra...

Multi-channel radiographic inspection device

Multiple secondary electron beam alignment method, multiple seconda...

X-ray inspection system, an x-ray imaging accessory, a sample suppo...

Detection method, apparatus and system

Automatic particle beam focusing

Method for quantitatively characterizing dendrite segregation and d...

Customizable axes of rotation for industrial radiography systems

Backscatter imaging device, control method and inspection system

X-ray analysis system and method with multi-source design

High resolution continuous rotation industrial radiography imaging...

Movable detection device and detection method

Material detection in X-ray security screening

System to inspect, modify or analyze a region of interest of a samp...

Jet blades optical inspection

High-energy x-ray imaging system

X-ray phase imaging apparatus and X-ray phase imaging method

Method for measuring residual stress

X-ray inspection apparatus

Inspection device

Transmissive small-angle scattering device

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray reflectometry apparatus and method thereof for measuring thre...

Spent or decommissioned accumulator treatment plant and process

Secondary image removal using high resolution x-ray transmission so...

System and method for inspecting defects of structure by using X-ray

Method and apparatus of stationary-source nonplanar-trajectory narr...

X-ray backscatter imaging system for precise searching for containe...

X-ray tomography systems and methods for imaging an aircraft part

X-ray weld inspection

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR MAPPING IRREGULAR SURFACES

HIGH RESOLUTION CONTINUOUS ROTATION INDUSTRIAL RADIOGRAPHY IMAGING...

IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...

X-RAY WELD INSPECTION

RAIL DIAGNOSTIC INSPECTION APPARATUS

Object Manipulator for an X-ray Inspection System

X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

X-RAY INSPECTION APPARATUS

PROTECTIVE EQUIPMENT QUALITY CONTROL

ARTICLE INSPECTION APPARATUS

System to Assess Golf ball quality using multiple orientations of x...

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

HIGH RESOLUTION X-RAY REFLECTOMETER

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

X-RAY SHIELDING MATERIAL, X-RAY INSPECTION APPARATUS INCLUDING SAME...

X-RAY IMAGING APPARATUS

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

SYSTEM AND METHOD FOR IMPROVED DATA HANDLING IN A COMPUTED TOMOGRAP...

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

INSPECTION DEVICE USED FOR SCANNING AND INSPECTING OBJECT TO BE INS...

ATTITUDE ADJUSTMENT STRUCTURE, CONVEYING DEVICE, RADIATION IMAGING...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

Methods and Systems for Generating Three-Dimensional Images that En...

CT IMAGING SYSTEM

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

RAY SCANNING APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD