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G01N2223/33
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/33
scanning
Industries
Overview
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Correction of images
Patent number
11,983,859
Issue date
May 14, 2024
Smiths Detection France S.A.S.
Serge Maitrejean
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Insert for screening tray
Patent number
11,977,037
Issue date
May 7, 2024
Rapiscan Holdings, Inc.
Philippe Desjeans-Gauthier
G01 - MEASURING TESTING
Information
Patent Grant
System and methods for determining air content of fresh concrete, a...
Patent number
11,965,837
Issue date
Apr 23, 2024
COMMAND ALKON INCORPORATED
Denis Beaupre
G08 - SIGNALLING
Information
Patent Grant
Measurement system and method for operating a measurement system
Patent number
11,959,865
Issue date
Apr 16, 2024
RAYSCAN TECHNOLOGIES GMBH
Christoph Sauerwein
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Ore component analysis device and method
Patent number
11,953,455
Issue date
Apr 9, 2024
SHANDONG UNIVERSITY
Chen Liu
G01 - MEASURING TESTING
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Static CT detection device
Patent number
11,925,183
Issue date
Mar 12, 2024
Tsinghua University
Zhiqiang Chen
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Multi-source cone beam computed tomography
Patent number
11,921,056
Issue date
Mar 5, 2024
SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
Peiyan Cao
G01 - MEASURING TESTING
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel static CT device
Patent number
11,906,447
Issue date
Feb 20, 2024
Nuctech Company Limited
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for determining the location of artefacts and/or...
Patent number
11,898,962
Issue date
Feb 13, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Calibration method and device therefor
Patent number
11,885,752
Issue date
Jan 30, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Grant
Tolerance error estimating apparatus, method, program, reconstructi...
Patent number
11,885,754
Issue date
Jan 30, 2024
Rigaku Corporation
Takumi Ota
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tube weld X-ray inspection device comprising an X-ray source, an X-...
Patent number
11,860,113
Issue date
Jan 2, 2024
DIGIRAY CORP.
Sang Sub Kong
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
Patent number
11,854,763
Issue date
Dec 26, 2023
BORRIES PTE. LTD.
Wei Fang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for X-ray computed tomography
Patent number
11,846,592
Issue date
Dec 19, 2023
Orimtech Ltd.
Boris S. Goldberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scanning systems with dynamically adjustable shielding systems and...
Patent number
11,822,042
Issue date
Nov 21, 2023
Analogic Corporation
Steven Weed
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
11,821,854
Issue date
Nov 21, 2023
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Information
Patent Grant
Radiographic inspection system for pipes and other structures and m...
Patent number
11,821,850
Issue date
Nov 21, 2023
Varex Imaging Corporation
Rajashekar Venkatachalam
G01 - MEASURING TESTING
Information
Patent Grant
Fast industrial CT scanning system and method
Patent number
11,821,853
Issue date
Nov 21, 2023
Shandong University
Jipeng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Radiation inspection apparatus comprising a radiation inspection de...
Patent number
11,822,043
Issue date
Nov 21, 2023
Zhiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Detection system for X-ray inspection of an object
Patent number
11,817,231
Issue date
Nov 14, 2023
Carl Zeiss SMT GmbH
Johannes Ruoff
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Methods of inspecting samples with multiple beams of charged particles
Patent number
11,815,473
Issue date
Nov 14, 2023
ASML Netherlands B.V.
Kuo-Feng Tseng
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
Patent number
11,815,476
Issue date
Nov 14, 2023
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning systems and related methods
Patent number
11,807,466
Issue date
Nov 7, 2023
IDSS Holdings, Inc.
James Michael Connelly
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
Patent number
11,796,491
Issue date
Oct 24, 2023
Shimadzu Corporation
Shinji Miyauchi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
Patent number
11,796,492
Issue date
Oct 24, 2023
INEL S.A.S.
Henry Pilliere
G01 - MEASURING TESTING
Information
Patent Grant
Real-time inline digital tomosynthesis system
Patent number
11,774,377
Issue date
Oct 3, 2023
JPI Healthcare CO., LTD.
Kyong-Woo Kim
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Procedure for generating fluoroscopic images for the reconstruction...
Publication number
20240159691
Publication date
May 16, 2024
Comet Yxlon GmbH
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION APPARATUS AND VEHICLE-MOUNTED SECURITY INSP...
Publication number
20240151661
Publication date
May 9, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
Publication number
20240142392
Publication date
May 2, 2024
MULTICT IMAGING LTD
Nathan HERMONY
G01 - MEASURING TESTING
Information
Patent Application
Calibration Method and Device Therefor
Publication number
20240134083
Publication date
Apr 25, 2024
Rapiscan Holdings, Inc.
Emmanuel St-Aubin
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Determining the Location of Artefacts and/or...
Publication number
20240133822
Publication date
Apr 25, 2024
The Australian National University
Roland Fleddermann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
Publication number
20240125715
Publication date
Apr 18, 2024
TOTALENERGIES ONETECH
Michel N'GUYEN
G01 - MEASURING TESTING
Information
Patent Application
X-RAY PHASE IMAGING APPARATUS AND X-RAY PHASE IMAGING METHOD
Publication number
20240102946
Publication date
Mar 28, 2024
Shimadzu Corporation
Kana KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD
Publication number
20240102944
Publication date
Mar 28, 2024
JST POWER EQUIPMENT, INC.
Haoning Liang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING
Information
Patent Application
HIGH RESOLUTION COMPUTED TOMOGRAPHY OBJECT SCANNING
Publication number
20240102947
Publication date
Mar 28, 2024
Baker Hughes Holdings LLC
Nils Rothe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
Publication number
20240094148
Publication date
Mar 21, 2024
Industrial Technology Research Institute
Bo-Ching HE
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
Publication number
20240094147
Publication date
Mar 21, 2024
Rapiscan Holdings, Inc.
Mark Procter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Monitoring properties of X-ray beam during X-ray analysis
Publication number
20240077437
Publication date
Mar 7, 2024
BRUKER TECHNOLOGIES LTD.
Alexander Krokhmal
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Tomographic Imaging of Core Samples
Publication number
20240053284
Publication date
Feb 15, 2024
Orimtech Ltd.
Boris S. Goldberg
G01 - MEASURING TESTING
Information
Patent Application
Rapid High-Resolution Computerized Tomography
Publication number
20240044811
Publication date
Feb 8, 2024
Baker Hughes Holdings LLC
Eberhard Neuser
G01 - MEASURING TESTING
Information
Patent Application
Rotational X-ray Inspection System and Method
Publication number
20240044812
Publication date
Feb 8, 2024
Viken Detection Corporation
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF INSPECTING SAMPLES WITH A BEAM OF CHARGED PARTICLES
Publication number
20240044820
Publication date
Feb 8, 2024
ASML NETHERLANDS B.V.
Kuo-Feng TSENG
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD, APPARATUS AND SYSTEM
Publication number
20240027371
Publication date
Jan 25, 2024
Nuctech Company Limited
Zhi ZENG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
Publication number
20240027377
Publication date
Jan 25, 2024
FEI Company
Jan Klusácek
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CHANNEL RADIOGRAPHIC INSPECTION DEVICE
Publication number
20240027369
Publication date
Jan 25, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
DETECTION METHOD AND DETECTION DEVICE
Publication number
20230417692
Publication date
Dec 28, 2023
Shimadzu Corporation
Takashi NYU
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
Publication number
20230404499
Publication date
Dec 21, 2023
HOLOGIC, INC.
Kenneth DEFREITAS
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS
Publication number
20230384246
Publication date
Nov 30, 2023
HITACHI HIGH-TECH SCIENCE CORPORATION
Toshiyuki TAKAHARA
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230384248
Publication date
Nov 30, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230375485
Publication date
Nov 23, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
Publication number
20230375484
Publication date
Nov 23, 2023
The University of North Carolina at Chapel Hill
Christina Inscoe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
Publication number
20230366837
Publication date
Nov 16, 2023
ARIX TECHNOLOGIES, INC.
Bryan R. Duerfeldt
G01 - MEASURING TESTING
Information
Patent Application
Electron Microscope and Aberration Measurement Method
Publication number
20230349839
Publication date
Nov 2, 2023
JEOL Ltd.
Hidetaka Sawada
G01 - MEASURING TESTING
Information
Patent Application
X-RAY WELD INSPECTION
Publication number
20230349840
Publication date
Nov 2, 2023
Direct Conversion AB
Tuomas Pantsar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Configurable Detector Panel for an X-Ray Imaging System
Publication number
20230314347
Publication date
Oct 5, 2023
Viken Detection Corporation
James P. Ryan
G01 - MEASURING TESTING