scintillation

Industry

CPC
G01N2223/505

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/505scintillation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Flat panel detector and manufacturing method thereof
- Patent number 12,072,452
- Issue date Aug 27, 2024
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring the water content of the ground, ve...
- Patent number 12,061,158
- Issue date Aug 13, 2024
- Universita Degli Studi Di Padova
- Luca Stevanato
- G01 - MEASURING TESTING
Information Patent Grant
Detection and imaging of electric fields, using polarized neutrons
- Patent number 12,055,500
- Issue date Aug 6, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan-Yu Jau
- G01 - MEASURING TESTING
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 12,019,194
- Issue date Jun 25, 2024
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Image acquisition system and image acquisition method
- Patent number 12,013,353
- Issue date Jun 18, 2024
- Hamamatsu Photonics K.K.
- Mototsugu Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring slope stability
- Patent number 11,971,373
- Issue date Apr 30, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Grant
X-ray detector device, glass body for shielding optical detector me...
- Patent number 11,953,453
- Issue date Apr 9, 2024
- Intom GmbH
- Severin Ebner
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device, computer, and signal processing metho...
- Patent number 11,898,974
- Issue date Feb 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring total cross-sectional phase fractio...
- Patent number 11,808,719
- Issue date Nov 7, 2023
- SEA PIONEERS TECHNOLOGIES CO., LTD.
- Jige Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device, unit and method for detecting annular flooding with gamma t...
- Patent number 11,796,487
- Issue date Oct 24, 2023
- Petroleo Brasileiro S.A. Petrobras
- Carla Alves Marinho Ferreira
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Conveyor system and measuring device for determining water content...
- Patent number 11,714,053
- Issue date Aug 1, 2023
- Troxler Electronic Laboratories, Inc.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Image acquisition system and image acquisition method
- Patent number 11,698,350
- Issue date Jul 11, 2023
- Hamamatsu Photonics K.K.
- Mototsugu Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,694,873
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scintillation detector
- Patent number 11,650,338
- Issue date May 16, 2023
- BAE Systems plc
- Lionel William John Kent
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pixel summing scheme and methods for material decomposition calibra...
- Patent number 11,644,587
- Issue date May 9, 2023
- Canon Medical Systems Corporation
- Xiaohui Zhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detector and radiographic imaging device
- Patent number 11,624,716
- Issue date Apr 11, 2023
- FUJIFILM Corporation
- Shinichi Ushikura
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
- Patent number 11,579,327
- Issue date Feb 14, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,515,120
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning method and apparatus comprising a buoyancy material and a...
- Patent number 11,474,053
- Issue date Oct 18, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning method and apparatus comprising a buoyancy material for sc...
- Patent number 11,402,339
- Issue date Aug 2, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiation detector, radiation inspecting device, and method for pro...
- Patent number 11,402,517
- Issue date Aug 2, 2022
- Nihon Kessho Kogaku Co., Ltd.
- Makoto Otake
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition system and image acquisition method
- Patent number 11,385,191
- Issue date Jul 12, 2022
- Hamamatsu Photonics K.K.
- Mototsugu Sugiyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY IMAGE ACQUISITION DEVICE AND X-RAY IMAGE ACQUISITION SYSTEM
- Publication number 20240319116
- Publication date Sep 26, 2024
- Hamamatsu Photonics K.K.
- Haruki SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY IMAGING OF BATTERY LAYERS DURING MANUFA...
- Publication number 20240310307
- Publication date Sep 19, 2024
- Curpow Inc.
- Michael LeClair
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS
- Publication number 20240295507
- Publication date Sep 5, 2024
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...
- Publication number 20240272092
- Publication date Aug 15, 2024
- FINAPP S.r.l.
- Luca STEVANATO
- G01 - MEASURING TESTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20240210332
- Publication date Jun 27, 2024
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- G01 - MEASURING TESTING
Information Patent Application
INFERENCE OF BRIGHT FLAT-FIELD CORRECTION BASED ON SCAN RADIOGRAPHS
- Publication number 20240185395
- Publication date Jun 6, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...
- Publication number 20240168182
- Publication date May 23, 2024
- Michael Saliba
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Specimen Observation Method
- Publication number 20230343549
- Publication date Oct 26, 2023
- Hitachi High-Tech Corporation
- Masahiro FUKUTA
- G01 - MEASURING TESTING
Information Patent Application
Configurable Detector Panel for an X-Ray Imaging System
- Publication number 20230314347
- Publication date Oct 5, 2023
- Viken Detection Corporation
- James P. Ryan
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
- Publication number 20230296535
- Publication date Sep 21, 2023
- HAMAMATSU PHOTONICS K. K.
- Mototsugu SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING UNIT, RADIOLOGICAL IMAGE ACQUISITION SYSTEM, AND RADIOLOGIC...
- Publication number 20230258580
- Publication date Aug 17, 2023
- Hamamatsu Photonics K.K.
- Tetsuya TAKA
- G01 - MEASURING TESTING
Information Patent Application
Target X-Ray Inspection System and Method
- Publication number 20230236140
- Publication date Jul 27, 2023
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
- Publication number 20230221457
- Publication date Jul 13, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS
- Publication number 20230184704
- Publication date Jun 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20230153970
- Publication date May 18, 2023
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIOGRAPHIC IMAGE PROCESSING METHOD, TRAINED MODEL, RADIOGRAPHIC I...
- Publication number 20230136930
- Publication date May 4, 2023
- Hamamatsu Photonics K.K.
- Toshiyasu SUYAMA
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGE ACQUIRING DEVICE, RADIOGRAPHIC IMAGE ACQUIRING S...
- Publication number 20230135988
- Publication date May 4, 2023
- Hamamatsu Photonics K.K.
- Tatsuya ONISHI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR, CHARGED PARTICLE RAY DEVICE, RADIATION D...
- Publication number 20230050424
- Publication date Feb 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Takumu IWANAKA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT
- Publication number 20230046280
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230030651
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREOF
- Publication number 20220390623
- Publication date Dec 8, 2022
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIBER OPTICS PLATE, SCINTILLATOR PANEL, RADIATION DETECTOR, ELECTRO...
- Publication number 20220340480
- Publication date Oct 27, 2022
- Hamamatsu Photonics K.K.
- Tomoyuki NAKAYAMA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
X-RAY UNIT TECHNOLOGY MODULES AND AUTOMATED APPLICATION TRAINING
- Publication number 20220317063
- Publication date Oct 6, 2022
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
- Publication number 20220291150
- Publication date Sep 15, 2022
- HAMAMATSU PHOTONICS K. K.
- Mototsugu SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Scanning Method And Apparatus Comprising A Buoyancy Material For Sc...
- Publication number 20220244198
- Publication date Aug 4, 2022
- Johnson Matthey Public Limited Company
- Christopher Bowdon
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
PIXEL SUMMING SCHEME AND METHODS FOR MATERIAL DECOMPOSITION CALIBRA...
- Publication number 20220229196
- Publication date Jul 21, 2022
- Canon Medical Systems Corporation
- Xiaohui Zhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...
- Publication number 20220205933
- Publication date Jun 30, 2022
- TROXLER ELECTRONIC LABORATORIES, INC.
- Wewage Hiran Linus Dep
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, COMPUTER, AND SIGNAL PROCESSING METHO...
- Publication number 20220187228
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- G01 - MEASURING TESTING
Information Patent Application
LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW TEMPE...
- Publication number 20220187480
- Publication date Jun 16, 2022
- Michael Saliba
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

scintillation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Flat panel detector and manufacturing method thereof

Device and method for measuring the water content of the ground, ve...

Detection and imaging of electric fields, using polarized neutrons

Structured detectors and detector systems for radiation imaging

Image acquisition system and image acquisition method

X-ray unit technology modules and automated application training

Systems and methods for monitoring slope stability

X-ray detector device, glass body for shielding optical detector me...

Charged particle beam device, computer, and signal processing metho...

Detection system for X-ray inspection of an object

Device and method for measuring total cross-sectional phase fractio...

Device, unit and method for detecting annular flooding with gamma t...

System and method for material characterization

Conveyor system and measuring device for determining water content...

Image acquisition system and image acquisition method

Charged particle beam apparatus

Methods and systems for detecting defects in devices using X-rays

Methods and systems for printed circuit board design based on autom...

Scintillation detector

Methods and systems for manufacturing printed circuit board based o...

Pixel summing scheme and methods for material decomposition calibra...

Radiation detector and radiographic imaging device

Methods and systems for product failure prediction based on X-ray i...

Handheld backscatter imaging systems with primary and secondary det...

Charged particle beam apparatus

Scanning method and apparatus comprising a buoyancy material and a...

Methods and systems for process control based on X-ray inspection

Scanning method and apparatus comprising a buoyancy material for sc...

Radiation detector, radiation inspecting device, and method for pro...

Image acquisition system and image acquisition method

Patents Applicationslast 30 patents

X-RAY IMAGE ACQUISITION DEVICE AND X-RAY IMAGE ACQUISITION SYSTEM

SYSTEM AND METHOD FOR X-RAY IMAGING OF BATTERY LAYERS DURING MANUFA...

PIPELINE INSPECTION APPARATUS

IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

INFERENCE OF BRIGHT FLAT-FIELD CORRECTION BASED ON SCAN RADIOGRAPHS

LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW-TEMPE...

Charged Particle Beam Device and Specimen Observation Method

Configurable Detector Panel for an X-Ray Imaging System

IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD

IMAGING UNIT, RADIOLOGICAL IMAGE ACQUISITION SYSTEM, AND RADIOLOGIC...

Target X-Ray Inspection System and Method

Handheld Backscatter Scanning Systems With Different Detector Panel...

SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

RADIOGRAPHIC IMAGE PROCESSING METHOD, TRAINED MODEL, RADIOGRAPHIC I...

RADIOGRAPHIC IMAGE ACQUIRING DEVICE, RADIOGRAPHIC IMAGE ACQUIRING S...

CHARGED PARTICLE DETECTOR, CHARGED PARTICLE RAY DEVICE, RADIATION D...

DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT

CHARGED PARTICLE BEAM APPARATUS

FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREOF

FIBER OPTICS PLATE, SCINTILLATOR PANEL, RADIATION DETECTOR, ELECTRO...

X-RAY UNIT TECHNOLOGY MODULES AND AUTOMATED APPLICATION TRAINING

IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD

Scanning Method And Apparatus Comprising A Buoyancy Material For Sc...

PIXEL SUMMING SCHEME AND METHODS FOR MATERIAL DECOMPOSITION CALIBRA...

CONVEYOR SYSTEM AND MEASURING DEVICE FOR DETERMINING WATER CONTENT...

CHARGED PARTICLE BEAM DEVICE, COMPUTER, AND SIGNAL PROCESSING METHO...

LOW-TEMPERATURE PEROVSKITE SCINTILLATORS AND DEVICES WITH LOW TEMPE...