TREA

Screening arrangements against electric or magnetic fields

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  • G01R1/18
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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/18Screening arrangements against electric or magnetic fields
Industries

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CURRENT SENSOR
    • Publication number 20240361362
    • Publication date Oct 31, 2024
    • ALPS ALPINE CO., LTD.
    • Manabu TAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCLOSURE FOR TESTING ELECTRONIC DEVICES
    • Publication number 20240235708
    • Publication date Jul 11, 2024
    • Promptlink Communications, Inc.
    • Foad TOWFIQ
    • G01 - MEASURING TESTING
  • Information Patent Application

    APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION
    • Publication number 20240219450
    • Publication date Jul 4, 2024
    • International Business Machines Corporation
    • MATTHEW DOYLE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Ground Reference Lead
    • Publication number 20240151745
    • Publication date May 9, 2024
    • PMK Mess- und Kommunikationstechnik, GmbH
    • Michael Engels
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD FOR SHIELDING A PRINTED CIRCUIT BOARD FROM ELECTROMAGNETIC I...
    • Publication number 20240090122
    • Publication date Mar 14, 2024
    • Skyworks Solutions, Inc.
    • Cesar Verdugo Muñoz
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR ASSEMBLY
    • Publication number 20230142008
    • Publication date May 11, 2023
    • LG Magna e-Powertrain Co., Ltd.
    • Somi SIM
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE SYSTEM AND MACHINE APPARATUS THEREOF
    • Publication number 20230059740
    • Publication date Feb 23, 2023
    • MPI Corporation
    • STOJAN KANEV
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CABLE ASSEMBLY AND METHOD
    • Publication number 20230024181
    • Publication date Jan 26, 2023
    • Rohde& Schwarz GmbH & Co. KG
    • Franz STRASSER
    • G01 - MEASURING TESTING
  • Information Patent Application

    WIRELESS SENSING DEVICE
    • Publication number 20220170962
    • Publication date Jun 2, 2022
    • ABB Schweiz AG
    • Felix Sutton
    • G01 - MEASURING TESTING
  • Information Patent Application

    ENCAPSULATED PRINTED CIRCUIT BOARD ASSEMBLY
    • Publication number 20220030701
    • Publication date Jan 27, 2022
    • 3M Innovative Properties Company
    • Gunther A. J. Stollwerck
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS FOR SIMULATING AND DESIGNING STRUCTURE PARAMET...
    • Publication number 20220011350
    • Publication date Jan 13, 2022
    • Institute of Geology and Geophysics, Chinese Academy of Sciences
    • Qingyun DI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SYSTEMS AND METHODS FOR WEARABLE VOLTAGE SENSING DEVICES
    • Publication number 20210318362
    • Publication date Oct 14, 2021
    • GENERAL ELECTRIC COMPANY
    • Radislav Alexandrovich Potyrailo
    • G08 - SIGNALLING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20210132114
    • Publication date May 6, 2021
    • LEENO INDUSTRIAL INC.
    • Dong-hoon PARK
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTROMAGNETIC SHIELDING DURING WAFER STAGE TESTING
    • Publication number 20210080487
    • Publication date Mar 18, 2021
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Ching-Nen Peng
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    EMI SHIELDING FOR A SIGNAL TRACE
    • Publication number 20210076546
    • Publication date Mar 11, 2021
    • Teradyne, Inc.
    • Luis A. Valiente
    • G01 - MEASURING TESTING
  • Information Patent Application

    PORTABLE ANECHOIC CHAMBER
    • Publication number 20200408823
    • Publication date Dec 31, 2020
    • Gregory Gerten
    • G01 - MEASURING TESTING
  • Information Patent Application

    CABLE CONDITION MONITORING SENSOR DEVICE METHOD
    • Publication number 20200241087
    • Publication date Jul 30, 2020
    • TSINGHUA UNIVERSITY
    • Pinjia ZHANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST PROBE ASSEMBLY AND TEST SOCKET
    • Publication number 20200241042
    • Publication date Jul 30, 2020
    • LEENO INDUSTRIAL INC.
    • Jae-hwan Jeong
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE STATION
    • Publication number 20200209279
    • Publication date Jul 2, 2020
    • MPI Corporation
    • Yu-Hsun HSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    Noise Measurement System
    • Publication number 20200209303
    • Publication date Jul 2, 2020
    • ProPlus Design Solutions, Inc.
    • Zhihong Liu
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSING COIL ELECTROSTATIC SHIELDING
    • Publication number 20200141981
    • Publication date May 7, 2020
    • Analog Devices International Unlimited Company
    • Jonathan Ephraim David Hurwitz
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    MINIATURE TEST PROBE
    • Publication number 20200057094
    • Publication date Feb 20, 2020
    • KEYSIGHT TECHNOLOGIES, INC.
    • Jason Andrew Swaim
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    MAGNETICALLY SHIELDED ROOM
    • Publication number 20190368191
    • Publication date Dec 5, 2019
    • TDK Corporation
    • Tomohiko SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RF TESTING APPARATUS, MOVABLE TESTING DEVICE THEREOF, AND CASE MODU...
    • Publication number 20190361070
    • Publication date Nov 28, 2019
    • ADIVIC TECHNOLOGY CO.,LTD
    • HSIEH-SHENG HUANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    Enclosure for testing electronic devices
    • Publication number 20190113540
    • Publication date Apr 18, 2019
    • Promptlink Communications, Inc.
    • Foad TOWFIQ
    • G01 - MEASURING TESTING
  • Information Patent Application

    INPUT BUFFER AND NOISE CANCELLATION METHOD THEREOF
    • Publication number 20190107559
    • Publication date Apr 11, 2019
    • Industrial Technology Research Institute
    • CHING-FENG LEE
    • G01 - MEASURING TESTING
  • Information Patent Application

    CURRENT SENSOR
    • Publication number 20190107564
    • Publication date Apr 11, 2019
    • TAMURA CORPORATION
    • Kasuga AMANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT APPARATUS WITH PROJECTED USER INTERFACE
    • Publication number 20190107554
    • Publication date Apr 11, 2019
    • Rohde& Schwarz GmbH & Co. KG
    • Bernhard Sterzbach
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Transformer For Measuring Currents In A Gas-Insulated Substation
    • Publication number 20180364315
    • Publication date Dec 20, 2018
    • University of Electronic Science and Technology of China
    • Qi Huang
    • G01 - MEASURING TESTING
  • Information Patent Application

    Shielded Probe Tip Interface
    • Publication number 20180328962
    • Publication date Nov 15, 2018
    • Tektronix, Inc.
    • Michael J. Mende
    • G01 - MEASURING TESTING