Self-interferometers

Industry

CPC
G01B9/02097

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02097Self-interferometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining a focal length of a particle in a medium
- Patent number 12,031,898
- Issue date Jul 9, 2024
- UNIVERSITÄT FÜR BODENKULTUR WIEN
- Petrus Dominicus Joannes Van Oostrum
- G01 - MEASURING TESTING
Information Patent Grant
Finger devices with self-mixing interferometric proximity sensors
- Patent number 11,940,293
- Issue date Mar 26, 2024
- Apple Inc.
- Mengshu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-mixing inteferometry sensor module, electronic device and meth...
- Patent number 11,927,441
- Issue date Mar 12, 2024
- ams International AG
- Ferran Suarez
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 11,890,052
- Issue date Feb 6, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 11,719,531
- Issue date Aug 8, 2023
- RD Synergy Ltd.
- Dov Furman
- G02 - OPTICS
Information Patent Grant
Self-mixing interference device for sensing applications
- Patent number 11,549,799
- Issue date Jan 10, 2023
- Apple Inc.
- Fei Tan
- G01 - MEASURING TESTING
Information Patent Grant
Scanning self-mixing interferometry system and sensor
- Patent number 11,536,555
- Issue date Dec 27, 2022
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Grant
Surface quality sensing using self-mixing interferometry
- Patent number 11,460,293
- Issue date Oct 4, 2022
- Apple Inc.
- Tong Chen
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Two-dimensional second harmonic dispersion interferometer
- Patent number 11,221,293
- Issue date Jan 11, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a phase of an input beam bundle
- Patent number 10,823,547
- Issue date Nov 3, 2020
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-domain interferometric based imaging systems and methods
- Patent number 10,799,111
- Issue date Oct 13, 2020
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods and systems of holographic interferometry
- Patent number 10,725,428
- Issue date Jul 28, 2020
- RD Synergy Ltd.
- Dov Furman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Three-dimensional interferometer and method for determining a phase...
- Patent number 10,663,351
- Issue date May 26, 2020
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Grant
High speed Michelson interferometer microscope
- Patent number 10,436,570
- Issue date Oct 8, 2019
- STC.UNM
- Arash Kheyraddini-Mousavi
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional interferometer, method for calibrating such an in...
- Patent number 10,386,174
- Issue date Aug 20, 2019
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Grant
Compact portable double differential fiber optic Sagnac interferometer
- Patent number 10,323,925
- Issue date Jun 18, 2019
- University of Washington
- Ivan Pelivanov
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing arrangement and lithographic apparatus including s...
- Patent number 10,317,808
- Issue date Jun 11, 2019
- ASML Netherlands B.V.
- Simon Reinald Huisman
- G01 - MEASURING TESTING
Information Patent Grant
Two-channel point-diffraction interferometer
- Patent number 10,247,539
- Issue date Apr 2, 2019
- DIFROTEC OÜ
- Nikolay Voznesenskiy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a self-referencing interferometer
- Patent number 10,197,380
- Issue date Feb 5, 2019
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device for generating wavelength-depende...
- Patent number 10,082,410
- Issue date Sep 25, 2018
- Dr. Johannes Heidenhain GmbH
- Karsten Saendig
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer based on a tilted MMI
- Patent number 10,025,035
- Issue date Jul 17, 2018
- Ciena Corporation
- Yves Painchaud
- G02 - OPTICS
Information Patent Grant
Method for detecting focal plane based on grating talbot effect
- Patent number 10,025,205
- Issue date Jul 17, 2018
- The Institute of Optics and Electronics
- Xianchang Zhu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated fourier transform optical spectrometer
- Patent number 9,964,396
- Issue date May 8, 2018
- COM DEV LTD.
- Alan Scott
- G01 - MEASURING TESTING
Information Patent Grant
Portable interferometric device
- Patent number 9,910,256
- Issue date Mar 6, 2018
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Grant
Interferometer based on a tilted MMI
- Patent number 9,869,817
- Issue date Jan 16, 2018
- Ciena Corporation
- Yves Painchaud
- G02 - OPTICS
Information Patent Grant
System and a method for quantitative sample imaging using off-axis...
- Patent number 9,816,801
- Issue date Nov 14, 2017
- Ramot at Tel Aviv University Ltd.
- Pinhas Girshovitz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Device for interferential distance measurement
- Patent number 9,739,598
- Issue date Aug 22, 2017
- Dr. Johannes Heidenhain GmbH
- Ralph Joerger
- G01 - MEASURING TESTING
Information Patent Grant
Portable interferometric device
- Patent number 9,574,868
- Issue date Feb 21, 2017
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Grant
System and method for a self-referencing interferometer
- Patent number 9,513,105
- Issue date Dec 6, 2016
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Grant
Methods for 3-dimensional interferometric microscopy
- Patent number 9,482,512
- Issue date Nov 1, 2016
- Howard Hughes Medical Institute
- Harald F. Hess
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...
- Publication number 20240369345
- Publication date Nov 7, 2024
- Martin Berz
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20240115128
- Publication date Apr 11, 2024
- Carl Zeiss Meditec, Inc.
- Tilman Schmoll
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SELF-MIXING INTEFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND METH...
- Publication number 20240060766
- Publication date Feb 22, 2024
- ams International AG
- Ferran SUAREZ
- G01 - MEASURING TESTING
Information Patent Application
Self-Mixing Interference Device for Sensing Applications
- Publication number 20230152081
- Publication date May 18, 2023
- Apple Inc.
- Fei Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE
- Publication number 20230064721
- Publication date Mar 2, 2023
- Meta Platforms Technologies, LLC
- Maik Andre Scheller
- G01 - MEASURING TESTING
Information Patent Application
SELF-REFERENCING INTERFEROMETER AND DUAL SELF-REFERENCING INTERFERO...
- Publication number 20220221802
- Publication date Jul 14, 2022
- ASML Holding N.V.
- Douglas C. CAPPELLI
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Second Harmonic Dispersion Interferometer
- Publication number 20220091032
- Publication date Mar 24, 2022
- Frank Joseph Wessel
- G01 - MEASURING TESTING
Information Patent Application
METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN I...
- Publication number 20220034645
- Publication date Feb 3, 2022
- Martin BERZ
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS
- Publication number 20210007601
- Publication date Jan 14, 2021
- Carl Zeiss Meditec, Inc.
- Tilman SCHMOLL
- G02 - OPTICS
Information Patent Application
Self-Mixing Interference Device for Sensing Applications
- Publication number 20210003385
- Publication date Jan 7, 2021
- Apple Inc.
- Fei Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A PHASE OF AN INPUT BEAM BUNDLE
- Publication number 20190219378
- Publication date Jul 18, 2019
- Martin BERZ
- G01 - MEASURING TESTING
Information Patent Application
POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...
- Publication number 20190049866
- Publication date Feb 14, 2019
- ASML NETHERLANDS B.V.
- Simon Reinald HUISMAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTERFEROMETER BASED ON A TILTED MMI
- Publication number 20180164506
- Publication date Jun 14, 2018
- CIENA CORPORATION
- Yves Painchaud
- G02 - OPTICS
Information Patent Application
ROTATION ANGLE MEASURING SYSTEM AND MACHINING SYSTEM COMPRISING THE...
- Publication number 20180143010
- Publication date May 24, 2018
- NOPORVIS CO., LTD.
- Wei-Hung Su
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INTEGRATED FOURIER TRANSFORM OPTICAL SPECTROMETER
- Publication number 20180128592
- Publication date May 10, 2018
- COM DEV International Ltd.
- Alan Scott
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20170268866
- Publication date Sep 21, 2017
- Martin BERZ
- G01 - MEASURING TESTING
Information Patent Application
Two-channel point-diffraction interferometer
- Publication number 20170191820
- Publication date Jul 6, 2017
- Difrotec OÜ
- Nikolay VOZNESENSKIY
- G01 - MEASURING TESTING
Information Patent Application
PORTABLE INTERFEROMETRIC DEVICE
- Publication number 20170153434
- Publication date Jun 1, 2017
- Ramot at Tel Aviv University Ltd.
- Natan Tzvi Shaked
- G02 - OPTICS
Information Patent Application
Compact Portable Double Differential Fiber Optic Sagnac Interferometer
- Publication number 20170115110
- Publication date Apr 27, 2017
- University of Washington
- Ivan Pelivanov
- G02 - OPTICS
Information Patent Application
System and Method For a Self-Referencing Interferometer
- Publication number 20170059301
- Publication date Mar 2, 2017
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION-SENSITIVE SPECTRAL INTERFEROMETRY
- Publication number 20170045349
- Publication date Feb 16, 2017
- Board of Regents, The University of Texas System
- Thomas E. Milner
- G01 - MEASURING TESTING
Information Patent Application
Wavelength-Encoded Tomography
- Publication number 20150168214
- Publication date Jun 18, 2015
- The University of Hong Kong
- Kenneth Kin Yip Wong
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL FREQUENCY REPRODUCING APPARATUS AND OPTICAL DISTANCE MEASUR...
- Publication number 20140374575
- Publication date Dec 25, 2014
- ASTRODESIGN, Inc.
- Toshiharu TAKESUE
- G02 - OPTICS
Information Patent Application
SYSTEMS AND METHODS FOR 3-DIMENSIONAL INTERFEROMETRIC MICROSCOPY
- Publication number 20140293015
- Publication date Oct 2, 2014
- Harald F. Hess
- G02 - OPTICS
Information Patent Application
System and Method For a Self-Referencing Interferometer
- Publication number 20140139842
- Publication date May 22, 2014
- Science Applications International Corporation
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Application
Light Reflection Mechanism, Optical Interferometer and Spectrometri...
- Publication number 20120038927
- Publication date Feb 16, 2012
- Shinya Matsuda
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR A VIRTUAL REFERENCE INTERFEROMETER
- Publication number 20120013908
- Publication date Jan 19, 2012
- Michael Galle
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for 3-Dimensional Interferometric Microscopy
- Publication number 20110170200
- Publication date Jul 14, 2011
- HOWARD HUGHES MEDICAL INSTITUTE
- Harald F. Hess
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Self-interferometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for determining a focal length of a particle in a medium

Finger devices with self-mixing interferometric proximity sensors

Self-mixing inteferometry sensor module, electronic device and meth...

Frequency-domain interferometric based imaging systems and methods

Methods and systems of holographic interferometry

Self-mixing interference device for sensing applications

Scanning self-mixing interferometry system and sensor

Surface quality sensing using self-mixing interferometry

Two-dimensional second harmonic dispersion interferometer

Method for determining a phase of an input beam bundle

Frequency-domain interferometric based imaging systems and methods

Methods and systems of holographic interferometry

Three-dimensional interferometer and method for determining a phase...

High speed Michelson interferometer microscope

Three-dimensional interferometer, method for calibrating such an in...

Compact portable double differential fiber optic Sagnac interferometer

Position sensing arrangement and lithographic apparatus including s...

Two-channel point-diffraction interferometer

System and method for a self-referencing interferometer

Optical position measuring device for generating wavelength-depende...

Interferometer based on a tilted MMI

Method for detecting focal plane based on grating talbot effect

Integrated fourier transform optical spectrometer

Portable interferometric device

Interferometer based on a tilted MMI

System and a method for quantitative sample imaging using off-axis...

Device for interferential distance measurement

Portable interferometric device

System and method for a self-referencing interferometer

Methods for 3-dimensional interferometric microscopy

Patents Applicationslast 30 patents

METHOD, INTERFEROMETER AND SIGNAL PROCESSING DEVICE, EACH FOR DETER...

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

SELF-MIXING INTEFEROMETRY SENSOR MODULE, ELECTRONIC DEVICE AND METH...

Self-Mixing Interference Device for Sensing Applications

SCANNING SELF-MIXING INTERFEROMETRY WITH WAVEGUIDE

SELF-REFERENCING INTERFEROMETER AND DUAL SELF-REFERENCING INTERFERO...

Two-Dimensional Second Harmonic Dispersion Interferometer

METHOD, INTERFEROMETER AND SIGNAL DEVICE, EACH FOR DETERMINING AN I...

FREQUENCY-DOMAIN INTERFEROMETRIC BASED IMAGING SYSTEMS AND METHODS

Self-Mixing Interference Device for Sensing Applications

METHOD FOR DETERMINING A PHASE OF AN INPUT BEAM BUNDLE

POSITION SENSING ARRANGEMENT AND LITHOGRAPHIC APPARATUS INCLUDING S...

INTERFEROMETER BASED ON A TILTED MMI

ROTATION ANGLE MEASURING SYSTEM AND MACHINING SYSTEM COMPRISING THE...

INTEGRATED FOURIER TRANSFORM OPTICAL SPECTROMETER

Interferometer

Two-channel point-diffraction interferometer

PORTABLE INTERFEROMETRIC DEVICE

Compact Portable Double Differential Fiber Optic Sagnac Interferometer

System and Method For a Self-Referencing Interferometer

POLARIZATION-SENSITIVE SPECTRAL INTERFEROMETRY

Wavelength-Encoded Tomography

SPATIAL FREQUENCY REPRODUCING APPARATUS AND OPTICAL DISTANCE MEASUR...

SYSTEMS AND METHODS FOR 3-DIMENSIONAL INTERFEROMETRIC MICROSCOPY

System and Method For a Self-Referencing Interferometer

Light Reflection Mechanism, Optical Interferometer and Spectrometri...

SYSTEM AND METHOD FOR A VIRTUAL REFERENCE INTERFEROMETER

Systems and Methods for 3-Dimensional Interferometric Microscopy