Semiconductor wafers

Industry

CPC
G01N21/9501

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/9501Semiconductor wafers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for detecting placement of wafers in wafer cassette
- Patent number 12,217,988
- Issue date Feb 4, 2025
- Hon Hai Precision Industry Co., Ltd.
- Yu-Ting Chou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
ULED chip, uLED substrate and method for manufacturing the same, el...
- Patent number 12,218,273
- Issue date Feb 4, 2025
- BOE Technology Group Co., Ltd.
- Yuju Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact apparatus for measuring wafer thickness
- Patent number 12,209,853
- Issue date Jan 28, 2025
- Fujikoshi Machinery Corp.
- Chihiro Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge defect detection via image analytics
- Patent number 12,211,195
- Issue date Jan 28, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and measurement method
- Patent number 12,203,870
- Issue date Jan 21, 2025
- Skyverse Technology Co., Ltd.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Process tool for analyzing bonded workpiece interface
- Patent number 12,205,855
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ingot evaluation method and detecting apparatus
- Patent number 12,203,871
- Issue date Jan 21, 2025
- GlobalWafers Co., Ltd.
- Hsiu Chi Liang
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method of inspecting wafer
- Patent number 12,196,669
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining post bonding overlay
- Patent number 12,197,137
- Issue date Jan 14, 2025
- KLA Corporation
- Franz Zach
- G01 - MEASURING TESTING
Information Patent Grant
Method and system of surface topography measurement for lithography
- Patent number 12,189,306
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yung-Yao Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating coordinate position identification accuracy o...
- Patent number 12,188,880
- Issue date Jan 7, 2025
- Sumco Corporation
- Keiichiro Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspecting apparatus
- Patent number 12,181,691
- Issue date Dec 31, 2024
- Disco Corporation
- Nobuyuki Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Photoresist characteristics analysis method and characteristics ana...
- Patent number 12,174,113
- Issue date Dec 24, 2024
- FEMTO DEPLOYMENTS INC.
- Akira Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution multispectral multi-field-of-view imaging system fo...
- Patent number 12,174,128
- Issue date Dec 24, 2024
- Onto Innovation Inc.
- John A Tejada
- G01 - MEASURING TESTING
Information Patent Grant
Mapping device and a loadport having the same
- Patent number 12,174,127
- Issue date Dec 24, 2024
- Hiwin Technologies Corp.
- Jonus Liu
- G01 - MEASURING TESTING
Information Patent Grant
IC fabrication flow with dynamic sampling for measurement
- Patent number 12,169,178
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- Jonas Hoehenberger
- G01 - MEASURING TESTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and apparatus for of determining a complex-valued...
- Patent number 12,164,233
- Issue date Dec 10, 2024
- ASML Netherlands B.V.
- Alexander Prasetya Konijnenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coded LED or other light for target imaging or analysis
- Patent number 12,165,372
- Issue date Dec 10, 2024
- Emcode Photonics LLC
- Shrenik Deliwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate processing apparatus and semiconductor subs...
- Patent number 12,165,933
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Inkeun Baek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting abnormal growth of graphene
- Patent number 12,163,898
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Ryota Ifuku
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 12,152,869
- Issue date Nov 26, 2024
- Nova Ltd.
- Boaz Brill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 12,152,316
- Issue date Nov 26, 2024
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD
- Publication number 20250044236
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Douglas C. CAPPELLI
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Device
- Publication number 20250044240
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Ayumi TOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
EDGE DEFECT DETECTION VIA IMAGE ANALYTICS
- Publication number 20250045900
- Publication date Feb 6, 2025
- Applied Materials, Inc.
- Yash Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING BASED MODE SELECTION FOR INSPECTION
- Publication number 20250020598
- Publication date Jan 16, 2025
- KLA Corporation
- Rajkumar Theagarajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...
- Publication number 20250012736
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Dohun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multiple Pass Optical Measurements Of Semiconductor Structures
- Publication number 20250012734
- Publication date Jan 9, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION
- Publication number 20250012737
- Publication date Jan 9, 2025
- ONTO INNOVATION INC.
- Yiliang LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
FOCUS-LESS INSPECTION APPARATUS AND METHOD
- Publication number 20240426766
- Publication date Dec 26, 2024
- KOH YOUNG TECHNOLOGY INC.
- Chan Kwon LEE
- G01 - MEASURING TESTING
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240410835
- Publication date Dec 12, 2024
- AUROS Technology, Inc.
- Seong Yun CHOI
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE
- Publication number 20240379468
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES
- Publication number 20240379463
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES
- Publication number 20240371706
- Publication date Nov 7, 2024
- Lodestar Licensing Group LLC
- Anilkumar Chandolu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WEARABLE DEVICE PROVIDING GLUCOSE MEASUREMENT
- Publication number 20240362883
- Publication date Oct 31, 2024
- Emcode Photonics LLC
- Shrenik Deliwala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240361244
- Publication date Oct 31, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...
- Publication number 20240353795
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Seungbeom Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
- Publication number 20240353350
- Publication date Oct 24, 2024
- Samsung Electronics Co., Ltd.
- Kihong CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...
- Publication number 20240355686
- Publication date Oct 24, 2024
- Daniel Pierce RADIN
- H01 - BASIC ELECTRIC ELEMENTS

Semiconductor wafers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and device for detecting placement of wafers in wafer cassette

ULED chip, uLED substrate and method for manufacturing the same, el...

Non-contact apparatus for measuring wafer thickness

Edge defect detection via image analytics

Measurement system and measurement method

Process tool for analyzing bonded workpiece interface

Pattern inspection device and pattern inspection method

Ingot evaluation method and detecting apparatus

Method for inspecting pattern defects

Inspection apparatus and method of inspecting wafer

Defect inspection apparatus and defect inspection method

Method and apparatus for efficient high harmonic generation

System and method for determining post bonding overlay

Method and system of surface topography measurement for lithography

Method of calibrating coordinate position identification accuracy o...

Inspecting apparatus

Photoresist characteristics analysis method and characteristics ana...

High resolution multispectral multi-field-of-view imaging system fo...

Mapping device and a loadport having the same

IC fabrication flow with dynamic sampling for measurement

Optical diagnostics of semiconductor process using hyperspectral im...

Metrology method and apparatus for of determining a complex-valued...

Coded LED or other light for target imaging or analysis

Semiconductor substrate processing apparatus and semiconductor subs...

System for optical inspection of a substrate using same or differen...

Method and apparatus for detecting abnormal growth of graphene

Broadband wafer defect detection

Monitoring system and method for verifying measurements in patterne...

Passivation of nonlinear optical crystals

Defect inspection device

Patents Applicationslast 30 patents

INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

Surface Inspection Device

EDGE DEFECT DETECTION VIA IMAGE ANALYTICS

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

DEEP LEARNING BASED MODE SELECTION FOR INSPECTION

METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...

Multiple Pass Optical Measurements Of Semiconductor Structures

OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

HYBRID METROLOGY METHOD AND SYSTEM

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

FOCUS-LESS INSPECTION APPARATUS AND METHOD

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

APPARATUS AND METHOD FOR MEASURING WAFERS

PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE

SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES

AUTOMATED OPTICAL INSPECTION TOOL

METHODS AND SYSTEMS FOR MEASURING SEMICONDUCTOR DEVICES

WEARABLE DEVICE PROVIDING GLUCOSE MEASUREMENT

INSPECTION APPARATUS AND INSPECTION METHOD

HOLOGRAPHIC MICROSCOPE AND MANUFACTURING METHOD OF SEMICONDUCTOR DE...

WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...

Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...