Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements

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H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

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Patents Grantslast 30 patents

Information Patent Grant
Method for obtaining parameters of semiconductor structure, method...
- Patent number 12,308,295
- Issue date May 20, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinran Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid tuning of critical dimension non-uniformity by modulating tem...
- Patent number 12,308,264
- Issue date May 20, 2025
- Lam Research Corporation
- Ravi Kumar
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process control system including process condition determination us...
- Patent number 12,300,552
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Shuqian Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing system
- Patent number 12,300,524
- Issue date May 13, 2025
- Tokyo Electron Limited
- Yoshifumi Amano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor wafer, method for selecting sem...
- Patent number 12,300,553
- Issue date May 13, 2025
- Shin-Etsu Handotai Co., Ltd.
- Junya Suzuki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Systems and methods for analyzing defects in CVD films
- Patent number 12,300,554
- Issue date May 13, 2025
- Applied Materials, Inc.
- Mandar B. Pandit
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Imager system comprising lens composed of a plurality of material l...
- Patent number 12,300,555
- Issue date May 13, 2025
- JABIL INC.
- Girish S. Wable
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
UV cure for local stress modulation
- Patent number 12,300,489
- Issue date May 13, 2025
- Lam Research Corporation
- Anirvan Sircar
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Substrate processing apparatus, method of manufacturing semiconduct...
- Patent number 12,293,930
- Issue date May 6, 2025
- Kokusai Electric Corporation
- Shinobu Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device, method of manufacturing display device, and electro...
- Patent number 12,289,959
- Issue date Apr 29, 2025
- Sony Group Corporation
- Hitoshi Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus and substrate transfer position adju...
- Patent number 12,288,678
- Issue date Apr 29, 2025
- Tokyo Electron Limited
- Joji Takayoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array substrate, display panel and manufacturing method thereof
- Patent number 12,288,726
- Issue date Apr 29, 2025
- Hefei Xinsheng Optoelectronics Technology Co., Ltd.
- Yu Ji
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for manufacturing a semiconductor structure for detecting ve...
- Patent number 12,283,530
- Issue date Apr 22, 2025
- NANYA TECHNOLOGY CORPORATION
- Chun-Shun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Station-to-station control of backside bow compensation deposition
- Patent number 12,272,608
- Issue date Apr 8, 2025
- Lam Research Corporation
- Yanhui Huang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for adjusting the gap between a wafer and a top p...
- Patent number 12,266,579
- Issue date Apr 1, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Sheng-Chan Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Space-based circuit-replacing robotic system
- Patent number 12,263,959
- Issue date Apr 1, 2025
- The United States of America as represented by the Secretary of the Navy
- Daniel H. Muhleman
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Matching process controllers for improved matching of process
- Patent number 12,265,380
- Issue date Apr 1, 2025
- Applied Materials, Inc.
- James Robert Moyne
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Scanning impedance measurement in a radio frequency plasma processi...
- Patent number 12,266,506
- Issue date Apr 1, 2025
- Applied Materials, Inc.
- Yue Guo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for revitalizing plasma processing tools
- Patent number 12,261,026
- Issue date Mar 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chi-Hsing Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Control apparatus, imprint apparatus, and method of manufacturing a...
- Patent number 12,246,482
- Issue date Mar 11, 2025
- Canon Kabushiki Kaisha
- Ryo Nawata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing semiconductor package
- Patent number 12,243,788
- Issue date Mar 4, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Hui Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correction die for wafer/die stack
- Patent number 12,237,306
- Issue date Feb 25, 2025
- ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
- Belgacem Haba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment process for the transfer setup
- Patent number 12,237,234
- Issue date Feb 25, 2025
- VueReal
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline wafer defect detection system and method
- Patent number 12,230,522
- Issue date Feb 18, 2025
- Texas Instruments Incorporated
- Patrick David Noll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selection of measurement locations for patterning processes
- Patent number 12,228,862
- Issue date Feb 18, 2025
- ASML Netherlands B.V.
- Hans Van Der Laan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating SiC substrate, method of manufacturing SiC epi...
- Patent number 12,228,523
- Issue date Feb 18, 2025
- Resonac Corporation
- Ling Guo
- C30 - CRYSTAL GROWTH
Information Patent Grant
Substrate treating apparatus and substrate treating method
- Patent number 12,230,516
- Issue date Feb 18, 2025
- Semes Co., Ltd.
- Jae Oh Bang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photolithography alignment process for bonded wafers
- Patent number 12,230,585
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yeong-Jyh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process recipe search apparatus, etching recipe search method and s...
- Patent number 12,222,690
- Issue date Feb 11, 2025
- HITACHI HIGH-TECH CORPORATION
- Takashi Dobashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometer systems and methods for real time etch process compe...
- Patent number 12,218,015
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chansyun Yang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DE...
- Publication number 20250167051
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Seonghyeon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUP III NITRIDE TRANSISTOR DEVICE AND METHOD FOR FABRICATING A GR...
- Publication number 20250167116
- Publication date May 22, 2025
- Infineon Technologies Austria AG
- Herbert Gietler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...
- Publication number 20250167171
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECOND-LEVEL METALLIZATION TESTABLE FULLY INTEGRATED AND MULTI-FUNC...
- Publication number 20250169050
- Publication date May 22, 2025
- International Business Machines Corporation
- Rajiv Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETERMINING WAFER BOW
- Publication number 20250167023
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Daniel FULFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...
- Publication number 20250167172
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Method for Fabricating a Computing System with an Int...
- Publication number 20250167048
- Publication date May 22, 2025
- Apple Inc.
- Vidhya Ramachandran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT PROCESS FOR THE TRANSFER SETUP
- Publication number 20250167053
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOLITHOGRAPHY ALIGNMENT PROCESS FOR BONDED WAFERS
- Publication number 20250157943
- Publication date May 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yeong-Jyh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION DIE FOR WAFER/DIE STACK
- Publication number 20250157992
- Publication date May 15, 2025
- ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
- Belgacem Haba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate Formation Of Semiconductor Devices
- Publication number 20250149388
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Chang-Jhih Syu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOP DIE BACK-SIDE MARKING FOR MEMORY SYSTEMS
- Publication number 20250149463
- Publication date May 8, 2025
- Micron Technology, Inc.
- Po Chien Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DIE PACKAGE
- Publication number 20250140674
- Publication date May 1, 2025
- Infineon Technologies Canada Inc.
- Marco A. ZUNIGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION OF PLASMA UNIFORMITY USING COMPUTER VISION
- Publication number 20250140542
- Publication date May 1, 2025
- LAM RESEARCH CORPORATION
- Kapil Sawlani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION FOR LOCAL CHEMICAL EXPOSURE
- Publication number 20250132207
- Publication date Apr 24, 2025
- Geminatio, Inc.
- Brennan Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD INCLUDING POSITIONING A DUMMY SOURCE DIE OR A DESTINATION SI...
- Publication number 20250132206
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- Byung-Jin Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Ensuring the Integrity of Semiconductor Devices From Waf...
- Publication number 20250125278
- Publication date Apr 17, 2025
- Tracer Validation Inc.
- Matt Bellis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY INDUCED MICRO LED INSPECTION
- Publication number 20250105065
- Publication date Mar 27, 2025
- ORBOTECH LTD.
- Arie Glazer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHOWERHEAD FOR PROCESS TOOL
- Publication number 20250092521
- Publication date Mar 20, 2025
- TOKYO ELECTRON LIMITED
- Anthony Dip
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDING METHOD, BONDING APPARATUS AND ARTICLE MANUFACTURING METHOD
- Publication number 20250079397
- Publication date Mar 6, 2025
- Canon Kabushiki Kaisha
- SHUN TOKAIRIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED STEALTH LASER FOR WAFER EDGE TRIMMING PROCESS
- Publication number 20250079150
- Publication date Mar 6, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Tung Wu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DISPLAY DEVICE, METHOD OF MANUFACTURING DISPLAY DEVICE, AND ELECTRO...
- Publication number 20250072214
- Publication date Feb 27, 2025
- SONY GROUP CORPORATION
- Hitoshi Tsuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...
- Publication number 20250069958
- Publication date Feb 27, 2025
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACOUSTIC MONITORING FOR PROCESS RELIABILITY DURING POLISHING
- Publication number 20250062163
- Publication date Feb 20, 2025
- Applied Materials, Inc.
- Nicholas A. Wiswell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE
- Publication number 20250062164
- Publication date Feb 20, 2025
- LG Display Co., Ltd.
- Seeun KIM
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
HIGH-FREQUENCY DRAIN-EXTENDED METAL-OXIDE-SEMICONDUCTOR (DEMOS) DEV...
- Publication number 20250056829
- Publication date Feb 13, 2025
- Zhejiang University
- Kai XU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME
- Publication number 20250054817
- Publication date Feb 13, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Wei-Kuan Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS WINDOW OPTIMIZER
- Publication number 20250053702
- Publication date Feb 13, 2025
- ASML NETHERLANDS B.V.
- Stefan HUNSCHE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANUFACTURING SYSTEM AND METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20250038019
- Publication date Jan 30, 2025
- Hitachi High-Tech Corporation
- Makoto SATAKE
- H01 - BASIC ELECTRIC ELEMENTS

Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for obtaining parameters of semiconductor structure, method...

Rapid tuning of critical dimension non-uniformity by modulating tem...

Process control system including process condition determination us...

Substrate processing system

Method for evaluating semiconductor wafer, method for selecting sem...

Systems and methods for analyzing defects in CVD films

Imager system comprising lens composed of a plurality of material l...

UV cure for local stress modulation

Substrate processing apparatus, method of manufacturing semiconduct...

Display device, method of manufacturing display device, and electro...

Substrate processing apparatus and substrate transfer position adju...

Array substrate, display panel and manufacturing method thereof

Method for manufacturing a semiconductor structure for detecting ve...

Station-to-station control of backside bow compensation deposition

Method and system for adjusting the gap between a wafer and a top p...

Space-based circuit-replacing robotic system

Matching process controllers for improved matching of process

Scanning impedance measurement in a radio frequency plasma processi...

Method and apparatus for revitalizing plasma processing tools

Control apparatus, imprint apparatus, and method of manufacturing a...

Method of testing semiconductor package

Correction die for wafer/die stack

Alignment process for the transfer setup

Inline wafer defect detection system and method

Selection of measurement locations for patterning processes

Method of evaluating SiC substrate, method of manufacturing SiC epi...

Substrate treating apparatus and substrate treating method

Photolithography alignment process for bonded wafers

Process recipe search apparatus, etching recipe search method and s...

Interferometer systems and methods for real time etch process compe...

Patents Applicationslast 30 patents

ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DE...

GROUP III NITRIDE TRANSISTOR DEVICE AND METHOD FOR FABRICATING A GR...

MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...

SECOND-LEVEL METALLIZATION TESTABLE FULLY INTEGRATED AND MULTI-FUNC...

DEVICE AND METHOD FOR DETERMINING WAFER BOW

MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...

Structure and Method for Fabricating a Computing System with an Int...

ALIGNMENT PROCESS FOR THE TRANSFER SETUP

PHOTOLITHOGRAPHY ALIGNMENT PROCESS FOR BONDED WAFERS

CORRECTION DIE FOR WAFER/DIE STACK

Gate Formation Of Semiconductor Devices

TOP DIE BACK-SIDE MARKING FOR MEMORY SYSTEMS

MULTI-DIE PACKAGE

EVALUATION OF PLASMA UNIFORMITY USING COMPUTER VISION

OPTIMIZATION FOR LOCAL CHEMICAL EXPOSURE

METHOD INCLUDING POSITIONING A DUMMY SOURCE DIE OR A DESTINATION SI...

Method for Ensuring the Integrity of Semiconductor Devices From Waf...

RADIO FREQUENCY INDUCED MICRO LED INSPECTION

SHOWERHEAD FOR PROCESS TOOL

BONDING METHOD, BONDING APPARATUS AND ARTICLE MANUFACTURING METHOD

INTEGRATED STEALTH LASER FOR WAFER EDGE TRIMMING PROCESS

DISPLAY DEVICE, METHOD OF MANUFACTURING DISPLAY DEVICE, AND ELECTRO...

DUAL BEAM SYSTEMS AND METHODS FOR DECOUPLING THE WORKING DISTANCE O...

ACOUSTIC MONITORING FOR PROCESS RELIABILITY DURING POLISHING

DISPLAY DEVICE

HIGH-FREQUENCY DRAIN-EXTENDED METAL-OXIDE-SEMICONDUCTOR (DEMOS) DEV...

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME

PROCESS WINDOW OPTIMIZER

MANUFACTURING SYSTEM AND METHOD OF SEMICONDUCTOR DEVICE