Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements

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H01L22/20Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

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Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing electronic device
- Patent number 12,368,079
- Issue date Jul 22, 2025
- Innolux Corporation
- Cheng-Chi Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device including circuitry under bond pads
- Patent number 12,362,244
- Issue date Jul 15, 2025
- Micron Technology, Inc.
- Chiara Cerafogli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for measuring a magnetic core layer profile in an integrate...
- Patent number 12,363,920
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- W. C. Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for measuring magnetic fields in PVD system
- Patent number 12,360,179
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Wen-Hao Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for detecting semiconductor device
- Patent number 12,362,240
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Fan Hu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for heating the top lid of a process chamber
- Patent number 12,354,844
- Issue date Jul 8, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuo-Shiou Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device including memory chip and peripheral memory chip and...
- Patent number 12,354,985
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Jooyong Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus, manufacturing method of integrated circuit, a...
- Patent number 12,347,708
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsung-Fu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using cumulative heat amount data to qualify hot plate used for pos...
- Patent number 12,347,682
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Cheng Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside metal patterning die singulation system and related methods
- Patent number 12,341,069
- Issue date Jun 24, 2025
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Michael J. Seddon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus match detection method, detection system, prewarning meth...
- Patent number 12,341,070
- Issue date Jun 24, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weigang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface position detection device, exposure apparatus, substrate-pr...
- Patent number 12,334,404
- Issue date Jun 17, 2025
- Nikon Corporation
- Satoshi Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling etching tool
- Patent number 12,326,714
- Issue date Jun 10, 2025
- NANYA TECHNOLOGY CORPORATION
- Tzu-Ching Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for managing chip manufacturing equipment, apparatus, electr...
- Patent number 12,327,769
- Issue date Jun 10, 2025
- Saimeite Technology Co, Ltd.
- Wang Sheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing system and substrate processing method
- Patent number 12,327,768
- Issue date Jun 10, 2025
- Tokyo Electron Limited
- Hayato Tanoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pitch scaling in microfabrication
- Patent number 12,322,597
- Issue date Jun 3, 2025
- Tokyo Electron Limited
- Katie Lutker-Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device and method of fabricating the same
- Patent number 12,322,663
- Issue date Jun 3, 2025
- Samsung Display Co., Ltd.
- Deok Jun Choi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for selecting semiconductor components
- Patent number 12,322,636
- Issue date Jun 3, 2025
- AMS-OSRAM INTERNATIONAL GMBH
- Alexander Pfeuffer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive control of variability in device performance in advanced s...
- Patent number 12,322,618
- Issue date Jun 3, 2025
- Applied Materials, Inc.
- Samer Banna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Displacement measurements in semiconductor wafer processing
- Patent number 12,322,662
- Issue date Jun 3, 2025
- Applied Materials, Inc.
- Justin Wong
- B24 - GRINDING POLISHING
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 12,322,742
- Issue date Jun 3, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Hsiang-Tai Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining crystallinity and method of manufacturing a d...
- Patent number 12,324,345
- Issue date Jun 3, 2025
- Samsung Display Co., Ltd.
- Eon Pil Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for obtaining parameters of semiconductor structure, method...
- Patent number 12,308,295
- Issue date May 20, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinran Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rapid tuning of critical dimension non-uniformity by modulating tem...
- Patent number 12,308,264
- Issue date May 20, 2025
- Lam Research Corporation
- Ravi Kumar
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Process control system including process condition determination us...
- Patent number 12,300,552
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Shuqian Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing system
- Patent number 12,300,524
- Issue date May 13, 2025
- Tokyo Electron Limited
- Yoshifumi Amano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating semiconductor wafer, method for selecting sem...
- Patent number 12,300,553
- Issue date May 13, 2025
- Shin-Etsu Handotai Co., Ltd.
- Junya Suzuki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Systems and methods for analyzing defects in CVD films
- Patent number 12,300,554
- Issue date May 13, 2025
- Applied Materials, Inc.
- Mandar B. Pandit
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Imager system comprising lens composed of a plurality of material l...
- Patent number 12,300,555
- Issue date May 13, 2025
- JABIL INC.
- Girish S. Wable
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
UV cure for local stress modulation
- Patent number 12,300,489
- Issue date May 13, 2025
- Lam Research Corporation
- Anirvan Sircar
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20250239472
- Publication date Jul 24, 2025
- Kokusai Electric Corporation
- Shinobu SUGIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPOSITION APPARATUS WITH DETECTION SYSTEM AND METHODS
- Publication number 20250232992
- Publication date Jul 17, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- Ming-Yao HSIAO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING APPARATUS, SUBSTR...
- Publication number 20250226248
- Publication date Jul 10, 2025
- Kokusai Electric Corporation
- Norihito SHINOZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CORRECTING ERROR OF WAFER-LIKE SENSING APPARATUS
- Publication number 20250226267
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jonghwa Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATCHING PROCESS CONTROLLERS FOR IMPROVED MATCHING OF PROCESS
- Publication number 20250199521
- Publication date Jun 19, 2025
- Applied Materials, Inc.
- James Robert Moyne
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND APPARATUS FOR REVITALIZING PLASMA PROCESSING TOOLS
- Publication number 20250201528
- Publication date Jun 19, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chi-Hsing LIN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TEST METHOD FOR A WAFER AND WAFER
- Publication number 20250189461
- Publication date Jun 12, 2025
- United Microelectronics Corp.
- Ying TONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE STAGE INSPECTION METHOD AND SEMICONDUCTOR DEVICE MANUFACT...
- Publication number 20250191980
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Kwangkeun SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CONTROLLING ETCHING TOOL
- Publication number 20250181059
- Publication date Jun 5, 2025
- NANYA TECHNOLOGY CORPORATION
- Tzu-Ching TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20250176105
- Publication date May 29, 2025
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING SEMICONDUCTOR PACKAGE
- Publication number 20250174499
- Publication date May 29, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-HUI LAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DE...
- Publication number 20250167051
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Seonghyeon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...
- Publication number 20250167171
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GROUP III NITRIDE TRANSISTOR DEVICE AND METHOD FOR FABRICATING A GR...
- Publication number 20250167116
- Publication date May 22, 2025
- Infineon Technologies Austria AG
- Herbert Gietler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECOND-LEVEL METALLIZATION TESTABLE FULLY INTEGRATED AND MULTI-FUNC...
- Publication number 20250169050
- Publication date May 22, 2025
- International Business Machines Corporation
- Rajiv Joshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and Method for Fabricating a Computing System with an Int...
- Publication number 20250167048
- Publication date May 22, 2025
- Apple Inc.
- Vidhya Ramachandran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR DETERMINING WAFER BOW
- Publication number 20250167023
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Daniel FULFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...
- Publication number 20250167172
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT PROCESS FOR THE TRANSFER SETUP
- Publication number 20250167053
- Publication date May 22, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOLITHOGRAPHY ALIGNMENT PROCESS FOR BONDED WAFERS
- Publication number 20250157943
- Publication date May 15, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yeong-Jyh Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CORRECTION DIE FOR WAFER/DIE STACK
- Publication number 20250157992
- Publication date May 15, 2025
- ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
- Belgacem Haba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate Formation Of Semiconductor Devices
- Publication number 20250149388
- Publication date May 8, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Chang-Jhih Syu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOP DIE BACK-SIDE MARKING FOR MEMORY SYSTEMS
- Publication number 20250149463
- Publication date May 8, 2025
- Micron Technology, Inc.
- Po Chien Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-DIE PACKAGE
- Publication number 20250140674
- Publication date May 1, 2025
- Infineon Technologies Canada Inc.
- Marco A. ZUNIGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION OF PLASMA UNIFORMITY USING COMPUTER VISION
- Publication number 20250140542
- Publication date May 1, 2025
- LAM RESEARCH CORPORATION
- Kapil Sawlani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZATION FOR LOCAL CHEMICAL EXPOSURE
- Publication number 20250132207
- Publication date Apr 24, 2025
- Geminatio, Inc.
- Brennan Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD INCLUDING POSITIONING A DUMMY SOURCE DIE OR A DESTINATION SI...
- Publication number 20250132206
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- Byung-Jin Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Ensuring the Integrity of Semiconductor Devices From Waf...
- Publication number 20250125278
- Publication date Apr 17, 2025
- Tracer Validation Inc.
- Matt Bellis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIO FREQUENCY INDUCED MICRO LED INSPECTION
- Publication number 20250105065
- Publication date Mar 27, 2025
- ORBOTECH LTD.
- Arie Glazer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHOWERHEAD FOR PROCESS TOOL
- Publication number 20250092521
- Publication date Mar 20, 2025
- TOKYO ELECTRON LIMITED
- Anthony Dip
- H01 - BASIC ELECTRIC ELEMENTS

Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for manufacturing electronic device

Memory device including circuitry under bond pads

Methods for measuring a magnetic core layer profile in an integrate...

System and method for measuring magnetic fields in PVD system

Method and system for detecting semiconductor device

System and method for heating the top lid of a process chamber

Memory device including memory chip and peripheral memory chip and...

Inspection apparatus, manufacturing method of integrated circuit, a...

Using cumulative heat amount data to qualify hot plate used for pos...

Backside metal patterning die singulation system and related methods

Apparatus match detection method, detection system, prewarning meth...

Surface position detection device, exposure apparatus, substrate-pr...

Method for controlling etching tool

Method for managing chip manufacturing equipment, apparatus, electr...

Substrate processing system and substrate processing method

Pitch scaling in microfabrication

Display device and method of fabricating the same

Method for selecting semiconductor components

Adaptive control of variability in device performance in advanced s...

Displacement measurements in semiconductor wafer processing

Semiconductor structure and manufacturing method thereof

Method of determining crystallinity and method of manufacturing a d...

Method for obtaining parameters of semiconductor structure, method...

Rapid tuning of critical dimension non-uniformity by modulating tem...

Process control system including process condition determination us...

Substrate processing system

Method for evaluating semiconductor wafer, method for selecting sem...

Systems and methods for analyzing defects in CVD films

Imager system comprising lens composed of a plurality of material l...

UV cure for local stress modulation

Patents Applicationslast 30 patents

SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCT...

DEPOSITION APPARATUS WITH DETECTION SYSTEM AND METHODS

SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING APPARATUS, SUBSTR...

METHOD OF CORRECTING ERROR OF WAFER-LIKE SENSING APPARATUS

MATCHING PROCESS CONTROLLERS FOR IMPROVED MATCHING OF PROCESS

METHOD AND APPARATUS FOR REVITALIZING PLASMA PROCESSING TOOLS

TEST METHOD FOR A WAFER AND WAFER

SUBSTRATE STAGE INSPECTION METHOD AND SEMICONDUCTOR DEVICE MANUFACT...

METHOD FOR CONTROLLING ETCHING TOOL

SELECTIVE TRANSFER OF MICRO DEVICES

METHOD OF TESTING SEMICONDUCTOR PACKAGE

ELECTRONIC DEVICE FOR PREDICTING CHARACTERISTIC OF SEMICONDUCTOR DE...

MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...

GROUP III NITRIDE TRANSISTOR DEVICE AND METHOD FOR FABRICATING A GR...

SECOND-LEVEL METALLIZATION TESTABLE FULLY INTEGRATED AND MULTI-FUNC...

Structure and Method for Fabricating a Computing System with an Int...

DEVICE AND METHOD FOR DETERMINING WAFER BOW

MICRODEVICE TRANSFER SETUP AND INTEGRATION OF MICRO-DEVICES INTO SY...

ALIGNMENT PROCESS FOR THE TRANSFER SETUP

PHOTOLITHOGRAPHY ALIGNMENT PROCESS FOR BONDED WAFERS

CORRECTION DIE FOR WAFER/DIE STACK

Gate Formation Of Semiconductor Devices

TOP DIE BACK-SIDE MARKING FOR MEMORY SYSTEMS

MULTI-DIE PACKAGE

EVALUATION OF PLASMA UNIFORMITY USING COMPUTER VISION

OPTIMIZATION FOR LOCAL CHEMICAL EXPOSURE

METHOD INCLUDING POSITIONING A DUMMY SOURCE DIE OR A DESTINATION SI...

Method for Ensuring the Integrity of Semiconductor Devices From Waf...

RADIO FREQUENCY INDUCED MICRO LED INSPECTION

SHOWERHEAD FOR PROCESS TOOL