simultaneous quadrature detection

Industry

CPC
G01B9/02081

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02081simultaneous quadrature detection

Industries

Patents Grantslast 30 patents

Information Patent Grant
Four-quadrant interferometry system based on an integrated array wa...
- Patent number 12,140,425
- Issue date Nov 12, 2024
- National Institute of Metrology, China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Grant
Device for interferometric distance measurement
- Patent number 11,885,607
- Issue date Jan 30, 2024
- Dr. Johannes Heidenhain GmbH
- Herbert Huber-Lenk
- G01 - MEASURING TESTING
Information Patent Grant
Truncated non-linear interferometer-based sensor system
- Patent number 11,561,453
- Issue date Jan 24, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Displacement detection device
- Patent number 11,512,942
- Issue date Nov 29, 2022
- DMG MORI CO., LTD.
- Akinori Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase cancellation microscopy
- Patent number 11,255,656
- Issue date Feb 22, 2022
- Massachusetts Institute of Technology
- Peter T. C. So
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coherent receiver array
- Patent number 11,187,517
- Issue date Nov 30, 2021
- Acacia Communications, Inc.
- Christopher Doerr
- G01 - MEASURING TESTING
Information Patent Grant
Truncated nonlinear interferometer-based atomic force microscopes
- Patent number 11,119,386
- Issue date Sep 14, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sub-resolution defect detection
- Patent number 10,935,501
- Issue date Mar 2, 2021
- Onto Innovation Inc.
- Nigel P. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric position sensor
- Patent number 10,928,192
- Issue date Feb 23, 2021
- MBDA UK Limited
- Ross Matthew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for measuring etch depth by differential pola...
- Patent number 10,859,366
- Issue date Dec 8, 2020
- HORIBA FRANCE SAS
- Simon Richard
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measurement device
- Patent number 10,704,888
- Issue date Jul 7, 2020
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring vibration displacement using state variation p...
- Patent number 10,337,911
- Issue date Jul 2, 2019
- Korea Research Institute of Standards and Science
- Wan Sup Cheung
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a self-referencing interferometer
- Patent number 10,197,380
- Issue date Feb 5, 2019
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Grant
Real time dual mode full-field optical coherence microscopy with fu...
- Patent number 10,190,867
- Issue date Jan 29, 2019
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Avner Safrani
- G02 - OPTICS
Information Patent Grant
Method and arrangement for determining the heating condition of a m...
- Patent number 10,161,808
- Issue date Dec 25, 2018
- Carl Zeiss SMT GmbH
- Peter Vogt
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 10,006,755
- Issue date Jun 26, 2018
- Hitachi-LG Data Storage, Inc.
- Hiroyuki Minemura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Thickness measuring apparatus and thickness measuring method
- Patent number 9,921,051
- Issue date Mar 20, 2018
- Korea Research Institute of Standards and Science
- Jae-Wan Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing optical imaging using frequency...
- Patent number 9,812,846
- Issue date Nov 7, 2017
- The General Hospital Corporation
- Seok-Hyun Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometric distance sensing device and method with less depend...
- Patent number 9,791,259
- Issue date Oct 17, 2017
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Lun Kai Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Optical tomograph and optical tomographic method
- Patent number 9,759,545
- Issue date Sep 12, 2017
- Hitachi-LG Data Storage, Inc.
- Masaki Mukoh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical coherence tomography with homodyne-phase diversity detection
- Patent number 9,625,380
- Issue date Apr 18, 2017
- Hitachi, Ltd.
- Masaki Mukoh
- G01 - MEASURING TESTING
Information Patent Grant
Displacement detecting device
- Patent number 9,612,104
- Issue date Apr 4, 2017
- DMG MORI SEIKI CO., LTD.
- Hideaki Tamiya
- G01 - MEASURING TESTING
Information Patent Grant
Optical image measuring apparatus
- Patent number 9,593,935
- Issue date Mar 14, 2017
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for a self-referencing interferometer
- Patent number 9,513,105
- Issue date Dec 6, 2016
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Grant
Methods for 3-dimensional interferometric microscopy
- Patent number 9,482,512
- Issue date Nov 1, 2016
- Howard Hughes Medical Institute
- Harald F. Hess
- G02 - OPTICS
Information Patent Grant
System for fourier domain optical coherence tomography
- Patent number 9,448,056
- Issue date Sep 20, 2016
- Duke University
- Joseph A. Izatt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, methods and storage medium for performing polarization-b...
- Patent number 9,441,948
- Issue date Sep 13, 2016
- The General Hospital Corporation
- Benjamin J. Vakoc
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical measurement apparatus for measuring a target using signal,...
- Patent number 9,423,238
- Issue date Aug 23, 2016
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Polarization-sensitive optical measurement instrument
- Patent number 9,383,188
- Issue date Jul 5, 2016
- Hitachi-LG Data Storage, Inc.
- Kentaro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing optical imaging using frequency...
- Patent number 9,377,290
- Issue date Jun 28, 2016
- The General Hospital Corporation
- Seok-Hyun Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...
- Publication number 20240219167
- Publication date Jul 4, 2024
- DUKE UNIVERSITY
- Joseph A. IZATT
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20230161220
- Publication date May 25, 2023
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...
- Publication number 20230127285
- Publication date Apr 27, 2023
- National Institute of Metrology,China
- Xiaofei Diao
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT
- Publication number 20220276040
- Publication date Sep 1, 2022
- Dr. Johannes Heidenhain Gmbh
- Herbert HUBER-LENK
- G01 - MEASURING TESTING
Information Patent Application
TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM
- Publication number 20210405503
- Publication date Dec 30, 2021
- UT-Battelle, LLC
- Raphael C. Pooser
- B82 - NANO-TECHNOLOGY
Information Patent Application
Phase Cancellation Microscopy
- Publication number 20210270595
- Publication date Sep 2, 2021
- Peter T. C. So
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...
- Publication number 20200103214
- Publication date Apr 2, 2020
- HORIBA FRANCE SAS
- Simon RICHARD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COHERENT RECEIVER ARRAY
- Publication number 20190310071
- Publication date Oct 10, 2019
- Acacia Communications, Inc.
- Christopher Doerr
- G01 - MEASURING TESTING
Information Patent Application
REAL TIME DUAL MODE FULL-FIELD OPTICAL COHERENCE MICROSCOPY WITH FU...
- Publication number 20170059299
- Publication date Mar 2, 2017
- B.G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., AT BEN-GURION UNIVERSITY
- Avner SAFRANI
- G02 - OPTICS
Information Patent Application
System and Method For a Self-Referencing Interferometer
- Publication number 20170059301
- Publication date Mar 2, 2017
- Leidos, Inc.
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...
- Publication number 20160320170
- Publication date Nov 3, 2016
- The General Hospital Corporation
- Seok-Hyun Yun
- G02 - OPTICS
Information Patent Application
INTERFEROMETRIC DETERMINATION OF DISTANCE CHANGE WITH LASER DIODE,...
- Publication number 20140368832
- Publication date Dec 18, 2014
- Yves SALVADÉ
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR 3-DIMENSIONAL INTERFEROMETRIC MICROSCOPY
- Publication number 20140293015
- Publication date Oct 2, 2014
- Harald F. Hess
- G02 - OPTICS
Information Patent Application
OPTICAL TOMOGRAPH AND OPTICAL TOMOGRAPHIC METHOD
- Publication number 20140204389
- Publication date Jul 24, 2014
- Hitachi Media Electronics Co., Ltd.
- Masaki MUKOH
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION-SENSITIVE OPTICAL MEASUREMENT INSTRUMENT
- Publication number 20140152996
- Publication date Jun 5, 2014
- HITACHI MEDIA ELECTRONICS CO., LTD.
- Kentaro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
System and Method For a Self-Referencing Interferometer
- Publication number 20140139842
- Publication date May 22, 2014
- Science Applications International Corporation
- Troy Rhoadarmer
- G01 - MEASURING TESTING
Information Patent Application
Displacement Detecting Device
- Publication number 20130250307
- Publication date Sep 26, 2013
- MORI SEIKI CO., LTD.
- Hideaki TAMIYA
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for determining the heating condition of a m...
- Publication number 20130230073
- Publication date Sep 5, 2013
- Peter Vogt
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...
- Publication number 20130128274
- Publication date May 23, 2013
- The General Hospital Corporation
- Seok-Hyun Yun
- G02 - OPTICS
Information Patent Application
MODULATED SIGNAL DETECTING APPARATUS AND MODULATED SIGNAL DETECTING...
- Publication number 20130128709
- Publication date May 23, 2013
- Kiyotaka Ito
- G01 - MEASURING TESTING
Information Patent Application
SPATIAL PHASE SHIFTING INTERFEROMETER USING MULTI WAVELENGTH
- Publication number 20130113925
- Publication date May 9, 2013
- Jae Wan Kim
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN-FREQUENCY DOMAIN OPTICAL COHERENCE TOMOGRAPHY APPARATUS...
- Publication number 20130027711
- Publication date Jan 31, 2013
- Arsen R. HAJIAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING MOTION ERROR OF LINEAR STAGE
- Publication number 20120314220
- Publication date Dec 13, 2012
- Gwangju Institute of Science and Technology
- Sun-Kyu LEE
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC DISTANCE MEASUREMENT DEVICE
- Publication number 20120242994
- Publication date Sep 27, 2012
- Johannes Heidenhain GmbH
- Walter Huber
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROM...
- Publication number 20120140239
- Publication date Jun 7, 2012
- Cheng-Chung LEE
- G01 - MEASURING TESTING
Information Patent Application
Optical Coherence Tomography System And Method
- Publication number 20120120407
- Publication date May 17, 2012
- FINISAR CORPORATION
- Steven James Frisken
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...
- Publication number 20120062903
- Publication date Mar 15, 2012
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...
- Publication number 20120026507
- Publication date Feb 2, 2012
- Piotr Szwaykowski
- G01 - MEASURING TESTING
Information Patent Application
Optical Distance-Measuring Device
- Publication number 20120002188
- Publication date Jan 5, 2012
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME INTERFEROMETER
- Publication number 20110299090
- Publication date Dec 8, 2011
- FUJIFILM CORPORATION
- Nobuaki UEKI
- G01 - MEASURING TESTING

simultaneous quadrature detection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Four-quadrant interferometry system based on an integrated array wa...

Device for interferometric distance measurement

Truncated non-linear interferometer-based sensor system

Displacement detection device

Phase cancellation microscopy

Coherent receiver array

Truncated nonlinear interferometer-based atomic force microscopes

Sub-resolution defect detection

Interferometric position sensor

Method and instrument for measuring etch depth by differential pola...

Three-dimensional measurement device

Method for measuring vibration displacement using state variation p...

System and method for a self-referencing interferometer

Real time dual mode full-field optical coherence microscopy with fu...

Method and arrangement for determining the heating condition of a m...

Optical measurement apparatus and optical measurement method

Thickness measuring apparatus and thickness measuring method

Method and apparatus for performing optical imaging using frequency...

Interferometric distance sensing device and method with less depend...

Optical tomograph and optical tomographic method

Optical coherence tomography with homodyne-phase diversity detection

Displacement detecting device

Optical image measuring apparatus

System and method for a self-referencing interferometer

Methods for 3-dimensional interferometric microscopy

System for fourier domain optical coherence tomography

Apparatus, methods and storage medium for performing polarization-b...

Optical measurement apparatus for measuring a target using signal,...

Polarization-sensitive optical measurement instrument

Method and apparatus for performing optical imaging using frequency...

Patents Applicationslast 30 patents

RAPID COHERENT SYNTHETIC WAVELENGTH INTERFEROMETRIC ABSOLUTE DISTAN...

TRUNCATED NONLINEAR INTERFEROMETER-BASED SENSOR SYSTEM

FOUR-QUADRANT INTERFEROMETRY SYSTEM BASED ON AN INTEGRATED ARRAY WA...

DEVICE FOR INTERFEROMETRIC DISTANCE MEASUREMENT

TRUNCATED NON-LINEAR INTERFEROMETER-BASED SENSOR SYSTEM

Phase Cancellation Microscopy

METHOD AND INSTRUMENT FOR MEASURING ETCH DEPTH BY DIFFERENTIAL POLA...

COHERENT RECEIVER ARRAY

REAL TIME DUAL MODE FULL-FIELD OPTICAL COHERENCE MICROSCOPY WITH FU...

System and Method For a Self-Referencing Interferometer

METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...

INTERFEROMETRIC DETERMINATION OF DISTANCE CHANGE WITH LASER DIODE,...

SYSTEMS AND METHODS FOR 3-DIMENSIONAL INTERFEROMETRIC MICROSCOPY

OPTICAL TOMOGRAPH AND OPTICAL TOMOGRAPHIC METHOD

POLARIZATION-SENSITIVE OPTICAL MEASUREMENT INSTRUMENT

System and Method For a Self-Referencing Interferometer

Displacement Detecting Device

Method and arrangement for determining the heating condition of a m...

METHOD AND APPARATUS FOR PERFORMING OPTICAL IMAGING USING FREQUENCY...

MODULATED SIGNAL DETECTING APPARATUS AND MODULATED SIGNAL DETECTING...

SPATIAL PHASE SHIFTING INTERFEROMETER USING MULTI WAVELENGTH

TIME DOMAIN-FREQUENCY DOMAIN OPTICAL COHERENCE TOMOGRAPHY APPARATUS...

METHOD AND DEVICE FOR MEASURING MOTION ERROR OF LINEAR STAGE

INTERFEROMETRIC DISTANCE MEASUREMENT DEVICE

METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROM...

Optical Coherence Tomography System And Method

METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...

INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELAT...

Optical Distance-Measuring Device

REAL-TIME INTERFEROMETER