Slit arrangements slit adjustment

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G01J3/04

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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G01J3/04Slit arrangements slit adjustment

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometer having a support plate and having a housing
- Patent number 12,188,819
- Issue date Jan 7, 2025
- Carl Zeiss Jena GmbH
- Jens Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 12,117,341
- Issue date Oct 15, 2024
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and method of detecting an electromagnetic (EM) wave s...
- Patent number 12,098,950
- Issue date Sep 24, 2024
- National University of Singapore
- Guangya James Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectrometer with high-efficiency optical coupling
- Patent number 12,019,272
- Issue date Jun 25, 2024
- OAK ANALYTICS INC
- Ruibo Wang
- G02 - OPTICS
Information Patent Grant
Curved-slit imaging spectrometer
- Patent number 11,959,804
- Issue date Apr 16, 2024
- Soochow University
- Jiacheng Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Color measurement apparatus
- Patent number 11,927,484
- Issue date Mar 12, 2024
- Seiko Epson Corporation
- Haruki Miyasaka
- G01 - MEASURING TESTING
Information Patent Grant
Freeform offner spectrometer
- Patent number 11,898,907
- Issue date Feb 13, 2024
- Raytheon Company
- Benjamin James Lewis
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
- Patent number 11,898,912
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
First optical system, monochromator, and optical apparatus
- Patent number 11,808,630
- Issue date Nov 7, 2023
- Yokogawa Test & Measurement Corporation
- Tsutomu Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral camera
- Patent number 11,614,361
- Issue date Mar 28, 2023
- Optiz, Inc.
- Rob Heeman
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device
- Patent number 11,506,534
- Issue date Nov 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeshi Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Cubesat infrared atmospheric sounder (CIRAS)
- Patent number 11,378,453
- Issue date Jul 5, 2022
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and method for analyzing a light sample using a spectr...
- Patent number 11,366,014
- Issue date Jun 21, 2022
- KROHNE Messtechnik GmbH
- Thomas Fritsch
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus for wide wavelength range imaging with...
- Patent number 11,359,966
- Issue date Jun 14, 2022
- Timothy Moggridge
- G01 - MEASURING TESTING
Information Patent Grant
Freeform concave grating imaging spectrometer
- Patent number 11,340,113
- Issue date May 24, 2022
- Tsinghua University
- Jun Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral sensing system
- Patent number 11,333,649
- Issue date May 17, 2022
- Flying Gybe Inc.
- Ivan Lalović
- G02 - OPTICS
Information Patent Grant
Coma-elimination broadband high-resolution spectrograph
- Patent number 11,293,803
- Issue date Apr 5, 2022
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel broadband high-resolution spectrograph
- Patent number 11,268,853
- Issue date Mar 8, 2022
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer including metasurface
- Patent number 11,268,854
- Issue date Mar 8, 2022
- Samsung Electronics Co., Ltd.
- Seunghoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral sensing system
- Patent number 11,221,322
- Issue date Jan 11, 2022
- Flying Gybe Inc.
- Ivan Lalović
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to obtain unprocessed intrinsic data cubes for...
- Patent number 11,151,736
- Issue date Oct 19, 2021
- CENTER FOR QUANTITATIVE CYTOMETRY
- Abraham Schwartz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
DMD based UV absorption detector for liquid chromatography
- Patent number 11,112,392
- Issue date Sep 7, 2021
- Waters Technologies Corporation
- Anthony C. Jeannotte
- G01 - MEASURING TESTING
Information Patent Grant
Optical emission spectroscopy system, method of calibrating the sam...
- Patent number 11,092,495
- Issue date Aug 17, 2021
- Samsung Electronics Co., Ltd.
- Jeongil Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopic microscope and spectroscopic observation method
- Patent number 11,002,601
- Issue date May 11, 2021
- Nanophoton Corporation
- Katsumasa Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imaging system and method for providing a hyperspectr...
- Patent number 10,897,585
- Issue date Jan 19, 2021
- Corning Incorporated
- Mohammad A. Saleh
- G02 - OPTICS
Information Patent Grant
Spectrophotometer
- Patent number 10,866,140
- Issue date Dec 15, 2020
- Shimadzu Corporation
- Masato Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition apparatus, spectral apparatus, methods, and stora...
- Patent number 10,809,538
- Issue date Oct 20, 2020
- Canon U.S.A., Inc.
- Osamu Koyama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectroscope, wavelength measuring device, and spectrum measuring m...
- Patent number 10,801,893
- Issue date Oct 13, 2020
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive sampling module and transmissive spectrometer
- Patent number 10,801,887
- Issue date Oct 13, 2020
- InnoSpectra Corporation
- Kuo-Sheng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral sensing system
- Patent number 10,794,888
- Issue date Oct 6, 2020
- FLYING GYBE INC.
- Ivan Lalović
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYPERSPECTRAL IMAGING OF MOVING MICROSCOPIC SAMPLE ELEMENTS
- Publication number 20250060252
- Publication date Feb 20, 2025
- CYTOVIVA, INC.
- James Melvin Beach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20240110830
- Publication date Apr 4, 2024
- OSAKA UNIVERSITY
- Katsumasa FUJITA
- G01 - MEASURING TESTING
Information Patent Application
ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240102859
- Publication date Mar 28, 2024
- Korea Advanced Institute of Science and Technology
- Ki Hun Jeong
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PICKUP APPARATUS, MEASURING APPARATUS, AND ARTICLE MANUFACTUR...
- Publication number 20240053197
- Publication date Feb 15, 2024
- Canon Kabushiki Kaisha
- Soya SAIJO
- G01 - MEASURING TESTING
Information Patent Application
CURVED-SLIT IMAGING SPECTROMETER
- Publication number 20230332953
- Publication date Oct 19, 2023
- SOOCHOW UNIVERSITY
- Jiacheng ZHU
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER HAVING A SUPPORT PLATE AND HAVING A HOUSING
- Publication number 20230273068
- Publication date Aug 31, 2023
- Carl Zeiss Jena GmbH
- Jens HOFMANN
- G01 - MEASURING TESTING
Information Patent Application
GRATING SPECTROMETER HAVING V-SHAPED PROJECTION LIGHT AND CAPABLE O...
- Publication number 20230069726
- Publication date Mar 2, 2023
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
FIRST OPTICAL SYSTEM, MONOCHROMATOR, AND OPTICAL APPARATUS
- Publication number 20230036417
- Publication date Feb 2, 2023
- Yokogawa Test & Measurement Corporation
- Tsutomu Kaneko
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPE DEVICE, SPECTROSCOPE, AND MICROSCOPE SYSTEM
- Publication number 20220413275
- Publication date Dec 29, 2022
- SONY GROUP CORPORATION
- TETSURO KUWAYAMA
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP
- Publication number 20220412800
- Publication date Dec 29, 2022
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...
- Publication number 20220381611
- Publication date Dec 1, 2022
- National University of Singapore
- Guangya James ZHOU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTROMETER WITH HIGH-EFFICIENCY OPTICAL COUPLING
- Publication number 20220326440
- Publication date Oct 13, 2022
- Oak Analytics Inc.
- Ruibo Wang
- G01 - MEASURING TESTING
Information Patent Application
System, Method and Apparatus for Wide Wavelength Range Imaging with...
- Publication number 20220299369
- Publication date Sep 22, 2022
- Westboro Photonics Inc.
- TIMOTHY MOGGRIDGE
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...
- Publication number 20220170792
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20220146314
- Publication date May 12, 2022
- SEIKO EPSON CORPORATION
- Haruki MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONFOCAL MICROSCOPES
- Publication number 20210396981
- Publication date Dec 23, 2021
- Arizona Board of Regents on behalf of The University of Arizona
- Dongkyun Kang
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL SENSING SYSTEM
- Publication number 20200371082
- Publication date Nov 26, 2020
- Flying Gybe Inc.
- Ivan LALOVIC
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL SENSING SYSTEM
- Publication number 20200371081
- Publication date Nov 26, 2020
- Flying Gybe Inc.
- Ivan LALOVIC
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH
- Publication number 20200348172
- Publication date Nov 5, 2020
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
COMA-ELIMINATION BROADBAND HIGH-RESOLUTION SPECTROGRAPH
- Publication number 20200348174
- Publication date Nov 5, 2020
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
System, Method and Apparatus for Wide Wavelength Range Imaging with...
- Publication number 20200333187
- Publication date Oct 22, 2020
- Westboro Photonics Inc.
- TIMOTHY MOGGRIDGE
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...
- Publication number 20200194294
- Publication date Jun 18, 2020
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- G01 - MEASURING TESTING
Information Patent Application
SPECTROPHOTOMETER
- Publication number 20200158571
- Publication date May 21, 2020
- Shimadzu Corporation
- Masato WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER AND METHOD FOR ANALYZING A LIGHT SAMPLE USING A SPECTR...
- Publication number 20200103282
- Publication date Apr 2, 2020
- KROHNE MESSTECHNIK GMBH
- Thomas FRITSCH
- G01 - MEASURING TESTING
Information Patent Application
CUBESAT INFRARED ATMOSPHERIC SOUNDER (CIRAS)
- Publication number 20200096388
- Publication date Mar 26, 2020
- California Institute of Technology
- Thomas S. Pagano
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER INCLUDING METASURFACE
- Publication number 20200072668
- Publication date Mar 5, 2020
- Samsung Electronics Co., Ltd.
- Seunghoon HAN
- G02 - OPTICS
Information Patent Application
OPTICAL EMISSION SPECTROSCOPY SYSTEM, METHOD OF CALIBRATING THE SAM...
- Publication number 20200049560
- Publication date Feb 13, 2020
- Samsung Electronics Co., Ltd.
- Jeongil MUN
- G01 - MEASURING TESTING
Information Patent Application
DMD BASED UV ABSORPTION DETECTOR FOR LIQUID CHROMATOGRAPHY
- Publication number 20200049674
- Publication date Feb 13, 2020
- Water Technologies Corporation
- Anthony C. Jeannotte
- G02 - OPTICS
Information Patent Application
SPECTROSCOPIC MICROSCOPE AND SPECTROSCOPIC OBSERVATION METHOD
- Publication number 20200003618
- Publication date Jan 2, 2020
- NANOPHOTON CORPORATION
- Katsumasa FUJITA
- G02 - OPTICS
Information Patent Application
SPECTROPHOTOMETRIC DEVICE WITH A PLURALITY OF SPECTRAL MEASUREMENT...
- Publication number 20190339125
- Publication date Nov 7, 2019
- AIRBUS DEFENCE AND SPACE SAS
- Frédéric PASTERNAK
- G02 - OPTICS

Slit arrangements slit adjustment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrometer having a support plate and having a housing

Spectrometer

Spectrometer and method of detecting an electromagnetic (EM) wave s...

Optical spectrometer with high-efficiency optical coupling

Curved-slit imaging spectrometer

Color measurement apparatus

Freeform offner spectrometer

Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...

First optical system, monochromator, and optical apparatus

Hyperspectral camera

Automated analysis device

Cubesat infrared atmospheric sounder (CIRAS)

Spectrometer and method for analyzing a light sample using a spectr...

System, method and apparatus for wide wavelength range imaging with...

Freeform concave grating imaging spectrometer

Hyperspectral sensing system

Coma-elimination broadband high-resolution spectrograph

Multichannel broadband high-resolution spectrograph

Spectrometer including metasurface

Hyperspectral sensing system

Apparatus and method to obtain unprocessed intrinsic data cubes for...

DMD based UV absorption detector for liquid chromatography

Optical emission spectroscopy system, method of calibrating the sam...

Spectroscopic microscope and spectroscopic observation method

Hyperspectral imaging system and method for providing a hyperspectr...

Spectrophotometer

Image acquisition apparatus, spectral apparatus, methods, and stora...

Spectroscope, wavelength measuring device, and spectrum measuring m...

Transmissive sampling module and transmissive spectrometer

Hyperspectral sensing system

Patents Applicationslast 30 patents

HYPERSPECTRAL IMAGING OF MOVING MICROSCOPIC SAMPLE ELEMENTS

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

ULTRATHIN MICRO-SPECTROMETER AND METHOD OF MANUFACTURING THE SAME

IMAGE PICKUP APPARATUS, MEASURING APPARATUS, AND ARTICLE MANUFACTUR...

CURVED-SLIT IMAGING SPECTROMETER

SPECTROMETER HAVING A SUPPORT PLATE AND HAVING A HOUSING

GRATING SPECTROMETER HAVING V-SHAPED PROJECTION LIGHT AND CAPABLE O...

FIRST OPTICAL SYSTEM, MONOCHROMATOR, AND OPTICAL APPARATUS

MICROSCOPE DEVICE, SPECTROSCOPE, AND MICROSCOPE SYSTEM

INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP

SPECTROMETER AND METHOD OF DETECTING AN ELECTROMAGNETIC (EM) WAVE S...

OPTICAL SPECTROMETER WITH HIGH-EFFICIENCY OPTICAL COUPLING

System, Method and Apparatus for Wide Wavelength Range Imaging with...

HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...

COLOR MEASUREMENT APPARATUS

METHOD AND APPARATUS FOR CONFOCAL MICROSCOPES

HYPERSPECTRAL SENSING SYSTEM

HYPERSPECTRAL SENSING SYSTEM

MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH

COMA-ELIMINATION BROADBAND HIGH-RESOLUTION SPECTROGRAPH

System, Method and Apparatus for Wide Wavelength Range Imaging with...

SPECTROSCOPIC SYSTEM, OPTICAL INSPECTION METHOD, AND SEMICONDUCTOR...

SPECTROPHOTOMETER

SPECTROMETER AND METHOD FOR ANALYZING A LIGHT SAMPLE USING A SPECTR...

CUBESAT INFRARED ATMOSPHERIC SOUNDER (CIRAS)

SPECTROMETER INCLUDING METASURFACE

OPTICAL EMISSION SPECTROSCOPY SYSTEM, METHOD OF CALIBRATING THE SAM...

DMD BASED UV ABSORPTION DETECTOR FOR LIQUID CHROMATOGRAPHY

SPECTROSCOPIC MICROSCOPE AND SPECTROSCOPIC OBSERVATION METHOD

SPECTROPHOTOMETRIC DEVICE WITH A PLURALITY OF SPECTRAL MEASUREMENT...