Membership
Tour
Register
Log in
Sockets for un-leaded IC's having matrix type contact fields
Follow
Industry
CPC
G01R1/0483
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R1/00
Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
Current Industry
G01R1/0483
Sockets for un-leaded IC's having matrix type contact fields
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Apparatuses and methods for monitoring health of probing u-bump clu...
Patent number
11,740,282
Issue date
Aug 29, 2023
Intel Corporation
Jagat Shakya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Socket and inspection socket
Patent number
11,714,105
Issue date
Aug 1, 2023
Enplas Corporation
Leo Azumi
G01 - MEASURING TESTING
Information
Patent Grant
Localized onboard socket heating elements for burn-in test boards
Patent number
11,650,246
Issue date
May 16, 2023
Western Digital Technologies, Inc.
Tony Leong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspecting device and its testing socket
Patent number
11,624,759
Issue date
Apr 11, 2023
Global Unichip Corporation
Chih-Chieh Liao
G01 - MEASURING TESTING
Information
Patent Grant
Testing holders for chip unit and die package
Patent number
11,579,190
Issue date
Feb 14, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Grant
IC chip holder
Patent number
11,499,991
Issue date
Nov 15, 2022
Brother Kogyo Kabushiki Kaisha
Hidekazu Komiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for depopulating pins from contactor test socke...
Patent number
11,493,535
Issue date
Nov 8, 2022
Texas Instruments Incorporated
Kay Chan Tong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contact and test socket device for testing semiconductor device
Patent number
11,486,896
Issue date
Nov 1, 2022
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Contact and test socket device for testing semiconductor device
Patent number
11,486,897
Issue date
Nov 1, 2022
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing semiconductor devices
Patent number
11,408,913
Issue date
Aug 9, 2022
Texas Instruments Incorporated
Dale Lee Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Contactor with angled depressible probes in shifted bores
Patent number
11,378,588
Issue date
Jul 5, 2022
Essai, Inc.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Grant
Pressing assembly and chip testing apparatus
Patent number
11,366,136
Issue date
Jun 21, 2022
ONE TEST SYSTEMS
Chen-Lung Tsai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing holders for chip unit and die package
Patent number
11,340,291
Issue date
May 24, 2022
Taiwan Semiconductor Manufacturing Co., Ltd
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Grant
Conductive contactor unit
Patent number
11,293,946
Issue date
Apr 5, 2022
NHK Spring Co., Ltd.
Kohei Hironaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Socket with thermal conductor
Patent number
11,259,399
Issue date
Feb 22, 2022
Intel Corporation
Hongfei Yan
G01 - MEASURING TESTING
Information
Patent Grant
Test socket assembly and related methods
Patent number
11,088,051
Issue date
Aug 10, 2021
Xcerra Corporation
Valts Treibergs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ball grid array current meter with a current sense mesh
Patent number
11,054,442
Issue date
Jul 6, 2021
International Business Machines Corporation
Layne A. Berge
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus of package enabled ESD protection
Patent number
11,043,484
Issue date
Jun 22, 2021
Xilinx, Inc.
Hong Shi
G01 - MEASURING TESTING
Information
Patent Grant
Universal test mechanism for semiconductor device
Patent number
11,029,331
Issue date
Jun 8, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Grant
Vertical probe testing head with improved frequency properties
Patent number
11,029,337
Issue date
Jun 8, 2021
Technoprobe S.p.A.
Roberto Crippa
G01 - MEASURING TESTING
Information
Patent Grant
BGA socket device for testing BGA IC
Patent number
10,971,843
Issue date
Apr 6, 2021
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Contact and test socket device for testing semiconductor device
Patent number
10,935,572
Issue date
Mar 2, 2021
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Grant
Multiple insertion testing of test socket
Patent number
10,838,018
Issue date
Nov 17, 2020
Xilinx, Inc.
David M. Mahoney
G01 - MEASURING TESTING
Information
Patent Grant
Universal test socket, semiconductor test device, and method of tes...
Patent number
10,802,048
Issue date
Oct 13, 2020
Samsung Electronics Co., Ltd.
Daisuke Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Current leakage and charge injection mitigating solid state switch
Patent number
10,725,105
Issue date
Jul 28, 2020
KEITHLEY INSTRUMENTS, LLC
Matthew Holtz
G01 - MEASURING TESTING
Information
Patent Grant
Testing holders for chip unit and die package
Patent number
10,698,026
Issue date
Jun 30, 2020
Taiwan Semiconductor Manufacturing Co., Ltd
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Grant
High volume system level testing of devices with pop structures
Patent number
10,656,200
Issue date
May 19, 2020
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive testing of integrated circuit chips
Patent number
10,651,099
Issue date
May 12, 2020
International Business Machines Corporation
David W. Abraham
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device
Patent number
10,551,432
Issue date
Feb 4, 2020
Renesas Electronics Corporation
Toshitsugu Ishii
G01 - MEASURING TESTING
Information
Patent Grant
Socket
Patent number
10,517,186
Issue date
Dec 24, 2019
Sensata Technologies, Inc.
Hideyuki Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOCKET BOARD AND METHOD FOR INSPECTING A SEMICONDUCTOR DEVICE
Publication number
20240094244
Publication date
Mar 21, 2024
KIOXIA Corporation
Tsunehiro KITA
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGIES FOR TESTING LIQUID METAL ARRAY INTERCONNECT PACKAGES
Publication number
20230314503
Publication date
Oct 5, 2023
Intel Corporation
Gregorio Roberto Murtagian
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST BOARD AND METHOD FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20230273239
Publication date
Aug 31, 2023
KIOXIA Corporation
Hideaki MURAKAMI
G01 - MEASURING TESTING
Information
Patent Application
MODULE SUBSTRATE FOR SEMICONDUCTOR MODULE, SEMICONDUCTOR MODULE AND...
Publication number
20230213554
Publication date
Jul 6, 2023
Samsung Electronics Co., Ltd.
Kwangkyu Bang
G01 - MEASURING TESTING
Information
Patent Application
SOCKET
Publication number
20230038252
Publication date
Feb 9, 2023
ENPLAS CORPORATION
Yuki Ueyama
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES
Publication number
20220413010
Publication date
Dec 29, 2022
ESSAI, INC.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Application
IC CHIP HOLDER
Publication number
20220413011
Publication date
Dec 29, 2022
BROTHER KOGYO KABUSHIKI KAISHA
Hidekazu KOMIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOCKET AND INSPECTION SOCKET
Publication number
20220317151
Publication date
Oct 6, 2022
ENPLAS CORPORATION
Leo AZUMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE
Publication number
20220283221
Publication date
Sep 8, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Mill-Jer Wang
G01 - MEASURING TESTING
Information
Patent Application
LIDLESS BGA SOCKET APPARATUS FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20220163561
Publication date
May 26, 2022
HICON CO., LTD.
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Application
PRESSING ASSEMBLY AND CHIP TESTING APPARATUS
Publication number
20220128600
Publication date
Apr 28, 2022
ONE TEST SYSTEMS
CHEN-LUNG TSAI
G01 - MEASURING TESTING
Information
Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20210148950
Publication date
May 20, 2021
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20210140997
Publication date
May 13, 2021
Dong Weon Hwang
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORES
Publication number
20210102972
Publication date
Apr 8, 2021
ESSAI, INC.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Application
BALL GRID ARRAY CURRENT METER WITH A CURRENT SENSE MESH
Publication number
20210096157
Publication date
Apr 1, 2021
International Business Machines Corporation
Layne A. Berge
G01 - MEASURING TESTING
Information
Patent Application
TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE
Publication number
20200326370
Publication date
Oct 15, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Mill-Jer WANG
G01 - MEASURING TESTING
Information
Patent Application
IC CHIP HOLDER
Publication number
20200249257
Publication date
Aug 6, 2020
BROTHER KOGYO KABUSHIKI KAISHA
Hidekazu KOMIYA
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES
Publication number
20200225264
Publication date
Jul 16, 2020
ESSAI, INC.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Application
BGA SOCKET DEVICE FOR TESTING BGA IC
Publication number
20200176910
Publication date
Jun 4, 2020
Dong Weon Hwang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONDUCTIVE CONTACTOR UNIT
Publication number
20200141975
Publication date
May 7, 2020
NHK Spring Co., Ltd.
Kohei Hironaka
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL PROBE TESTING HEAD WITH IMPROVED FREQUENCY PROPERTIES
Publication number
20190377006
Publication date
Dec 12, 2019
Technoprobe S.p.A.
Roberto CRIPPA
G01 - MEASURING TESTING
Information
Patent Application
Method for Testing Semiconductor Devices
Publication number
20190120874
Publication date
Apr 25, 2019
TEXAS INSTRUMENTS INCORPORATED
Dale Lee Anderson
G01 - MEASURING TESTING
Information
Patent Application
SOCKET
Publication number
20190064214
Publication date
Feb 28, 2019
Sensata Technologies, Inc.
Hideyuki Takahashi
G01 - MEASURING TESTING
Information
Patent Application
TESTING HOLDERS FOR CHIP UNIT AND DIE PACKAGE
Publication number
20180372796
Publication date
Dec 27, 2018
Taiwan Semiconductor Manufacturing Co., Ltd.
Mill-Jer WANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20180340976
Publication date
Nov 29, 2018
RENESAS ELECTRONICS CORPORATION
Toshitsugu ISHII
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, INSPECTION DEVICE OF...
Publication number
20180277449
Publication date
Sep 27, 2018
RENESAS ELECTRONICS CORPORATION
Yu Muto
G01 - MEASURING TESTING
Information
Patent Application
CONTACTOR WITH ANGLED DEPRESSIBLE PROBES
Publication number
20180172730
Publication date
Jun 21, 2018
ESSAI, INC.
Nasser Barabi
G01 - MEASURING TESTING
Information
Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
Publication number
20180096917
Publication date
Apr 5, 2018
XCERRA CORPORATION
Valts Treibergs
G01 - MEASURING TESTING
Information
Patent Application
ELECTRIC COMPONENT SOCKET
Publication number
20170373416
Publication date
Dec 28, 2017
ENPLAS CORPORATION
Yuki UEYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20170338159
Publication date
Nov 23, 2017
RENESAS ELECTRONICS CORPORATION
Toshitsugu Ishii
G01 - MEASURING TESTING