Soft error testing; Soft error rate evaluation; Single event testing

Industry

CPC
G01R31/31816

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31816Soft error testing; Soft error rate evaluation; Single event testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Error protection analysis of an integrated circuit
- Patent number 12,188,979
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Benjamin Neil Trombley
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for single-event upset fault injection testing
- Patent number 11,378,622
- Issue date Jul 5, 2022
- Raytheon Company
- Patrick Fleming
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system and device to test a plurality of devices by compari...
- Patent number 11,353,508
- Issue date Jun 7, 2022
- STMicroelectronics S.A.
- Ricardo Gomez Gomez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for determining soft error occurred in a memory having stack...
- Patent number 11,321,166
- Issue date May 3, 2022
- FANUC CORPORATION
- Kenichiro Kurihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for generating redundant configuration in FPGAs
- Patent number 11,106,849
- Issue date Aug 31, 2021
- Universita degli Studi di Napoli Federico II
- Raffaele Giordano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatuses to detect test probe contact at external te...
- Patent number 10,969,434
- Issue date Apr 6, 2021
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for analyzing failure rates due to soft/hard er...
- Patent number 10,768,227
- Issue date Sep 8, 2020
- Mentor Graphics Corporation
- Sanjay Pillay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Soft error-resilient latch
- Patent number 10,644,700
- Issue date May 5, 2020
- STMicroelectronics International N.V.
- Andrea Mario Veggetti
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Flip flop of a digital electronic chip
- Patent number 10,585,143
- Issue date Mar 10, 2020
- STMicroelectronics International N.V.
- Pascal Urard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Soft error rate calculation device and calculation method for semic...
- Patent number 10,401,424
- Issue date Sep 3, 2019
- Hitachi, Ltd.
- Takumi Uezono
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device and method, and data analysis device
- Patent number 10,191,099
- Issue date Jan 29, 2019
- Samsung Electronics Co., Ltd.
- Soon-Young Lee
- G01 - MEASURING TESTING
Information Patent Grant
Embedded transient scanning systems, transient scanning data visual...
- Patent number 10,191,109
- Issue date Jan 29, 2019
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for 3D semiconductor device and method for testing the...
- Patent number 10,095,591
- Issue date Oct 9, 2018
- Industry-Academic Cooperation Foundation, Yonsei University
- Sung Ho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of fault tolerance in combinational circuits
- Patent number 10,013,296
- Issue date Jul 3, 2018
- King Fahd University of Petroleum & Minerals
- Aiman Helmi El-Maleh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-die electric cosmic ray detector
- Patent number 9,989,655
- Issue date Jun 5, 2018
- Intel Corporation
- Eric C. Hannah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single event latchup (SEL) current surge mitigation
- Patent number 9,960,593
- Issue date May 1, 2018
- Harris Corporation
- David Vail
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device with upset event detection and method of making
- Patent number 9,702,925
- Issue date Jul 11, 2017
- NXP USA, INC.
- Mark D. Hall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for power glitch detection in integrated circuits
- Patent number 9,541,603
- Issue date Jan 10, 2017
- Apple Inc.
- Brian S. Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation apparatus and simulation method for determining soft err...
- Patent number 9,507,895
- Issue date Nov 29, 2016
- Hitachi, Ltd.
- Tadanobu Toba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing the sensitivity of electronic components...
- Patent number 9,506,970
- Issue date Nov 29, 2016
- AIRBUS GROUP SAS
- Florent Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Embedded transient scanning system apparatus and methodology
- Patent number 9,297,852
- Issue date Mar 29, 2016
- PRAGMA DESIGN, INC.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring alpha particle induced soft erro...
- Patent number 9,291,660
- Issue date Mar 22, 2016
- GLOBALFOUNDRIES Inc.
- Elief Paffrath
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die electric cosmic ray detector
- Patent number 9,110,804
- Issue date Aug 18, 2015
- Intel Corporation
- Eric C. Hannah
- G01 - MEASURING TESTING
Information Patent Grant
Memory error detection and correction circuitry
- Patent number 9,081,062
- Issue date Jul 14, 2015
- Altera Corporation
- Bruce B. Pedersen
- G01 - MEASURING TESTING
Information Patent Grant
Single event upset enhanced architecture
- Patent number 9,054,684
- Issue date Jun 9, 2015
- Xilinx, Inc.
- Santosh Kumar Sood
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with error repair and fault tolerance
- Patent number 9,021,298
- Issue date Apr 28, 2015
- ARM Limited
- Shidhartha Das
- G01 - MEASURING TESTING
Information Patent Grant
Method and circuit structure for suppressing single event transient...
- Patent number 8,975,913
- Issue date Mar 10, 2015
- Nelson Mandela Metropolitan University
- Farouk Smith
- G01 - MEASURING TESTING
Information Patent Grant
Hardware execution driven application level derating calculation fo...
- Patent number 8,949,101
- Issue date Feb 3, 2015
- International Business Machines Corporation
- Pradip Bose
- G01 - MEASURING TESTING
Information Patent Grant
Noise rejection for built-in self-test with loopback
- Patent number 8,904,248
- Issue date Dec 2, 2014
- Apple Inc.
- Brian S. Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Measurement device and measurement method
- Patent number 8,892,967
- Issue date Nov 18, 2014
- Hitachi, Ltd.
- Hidefumi Ibe
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT
- Publication number 20240402246
- Publication date Dec 5, 2024
- International Business Machines Corporation
- BENJAMIN NEIL TROMBLEY
- G01 - MEASURING TESTING
Information Patent Application
GLITCH DETECTOR WITH HIGH RELIABILITY
- Publication number 20230228813
- Publication date Jul 20, 2023
- MEDIATEK INC.
- Tze-Chien Wang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220200595
- Publication date Jun 23, 2022
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazuyuki NAKANISHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUSES TO DETECT TEST PROBE CONTACT AT EXTERNAL TE...
- Publication number 20210063487
- Publication date Mar 4, 2021
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOFT ERROR-RESILIENT LATCH
- Publication number 20200007129
- Publication date Jan 2, 2020
- STMicroelectronics International N.V.
- Andrea Mario Veggetti
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
FLIP FLOP OF A DIGITAL ELECTRONIC CHIP
- Publication number 20190018062
- Publication date Jan 17, 2019
- STMicroelectronics S.A.
- Pascal URARD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING FAILURE RATES DUE TO SOFT/HARD ER...
- Publication number 20180364306
- Publication date Dec 20, 2018
- Austemper Design Systems Inc.
- Sanjay Pillay
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN...
- Publication number 20170082689
- Publication date Mar 23, 2017
- Altera Corporation
- Nelson Joseph Gaspard
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE ELECTRIC COSMIC RAY DETECTOR
- Publication number 20150355343
- Publication date Dec 10, 2015
- Eric C. Hannah
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND CIRCUIT STRUCTURE FOR SUPPRESSING SINGLE EVENT TRANSIENT...
- Publication number 20140247068
- Publication date Sep 4, 2014
- NELSON MANDELA METROPOLITAN UNIVERSITY
- Farouk Smith
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ALPHA PARTICLE INDUCED SOFT ERRO...
- Publication number 20140203814
- Publication date Jul 24, 2014
- GLOBALFOUNDRIES INC.
- Elief Paffrath
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT...
- Publication number 20140203836
- Publication date Jul 24, 2014
- EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY-EADS FRANCE
- Florent Miller
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE ELECTRIC COSMIC RAY DETECTOR
- Publication number 20140138555
- Publication date May 22, 2014
- Eric C. Hannah
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE
- Publication number 20140115376
- Publication date Apr 24, 2014
- ARM Limited
- Shidhartha DAS
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE
- Publication number 20140115377
- Publication date Apr 24, 2014
- ARM Limited
- Shidhartha DAS
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE
- Publication number 20140068371
- Publication date Mar 6, 2014
- ARM Limited
- Shidhartha DAS
- G01 - MEASURING TESTING
Information Patent Application
Noise Rejection for Built-In Self-Test with Loopback
- Publication number 20140019817
- Publication date Jan 16, 2014
- Brian S. Park
- G01 - MEASURING TESTING
Information Patent Application
SIMULATION APPARATUS AND SIMULATION METHOD
- Publication number 20130132056
- Publication date May 23, 2013
- Tadanobu Toba
- G01 - MEASURING TESTING
Information Patent Application
EMBEDDED TRANSIENT SCANNING SYSTEM APPARATUS AND METHODOLOGY
- Publication number 20130132007
- Publication date May 23, 2013
- Pragma Design, Inc.
- Jeffrey C. Dunnihoo
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING THE SENSITIVITY OF ELECTRONIC COMPONENTS...
- Publication number 20130099774
- Publication date Apr 25, 2013
- EUROPEAN AERONAUTIC DEFENSE AND SPACE COMPANY EADS FRANCE
- Florent Miller
- G01 - MEASURING TESTING
Information Patent Application
Hardware Execution Driven Application Level Derating Calculation fo...
- Publication number 20130096902
- Publication date Apr 18, 2013
- International Business Machines Corporation
- Pradip Bose
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING THE PARTICLE SENSITIVITY OF ELECTRONIC COMPON...
- Publication number 20120284006
- Publication date Nov 8, 2012
- AIRBUS FRANCE
- Florent Miller
- G01 - MEASURING TESTING
Information Patent Application
SINGLE EVENT TRANSIENT DIRECT MEASUREMENT METHODOLOGY AND CIRCUIT
- Publication number 20120274352
- Publication date Nov 1, 2012
- AEROFLEX COLORADO SPRINGS INC.
- Radu Dumitru
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING SYSTEM, CO...
- Publication number 20120254676
- Publication date Oct 4, 2012
- SONY CORPORATION
- Koji Hirairi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WIDE AREA SOFT DEFECT LOCALIZATION
- Publication number 20120206158
- Publication date Aug 16, 2012
- Abdullah M. Yassine
- G01 - MEASURING TESTING
Information Patent Application
ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS
- Publication number 20120173940
- Publication date Jul 5, 2012
- StarDFX Technologies, Inc.
- Laung-Terng WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Device and Measurement Method
- Publication number 20120159269
- Publication date Jun 21, 2012
- Hitachi, Ltd
- Hidefumi IBE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SINGLE EVENT TRANSIENT DIRECT MEASUREMENT METHODOLOGY AND CIRCUIT
- Publication number 20120119780
- Publication date May 17, 2012
- AEROFLEX COLORADO SPRINGS INC.
- Radu Dumitru
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST CIRCUIT-BASED RADIATION SENSOR, RADIATION SENSIN...
- Publication number 20120065919
- Publication date Mar 15, 2012
- LSI Corporation
- Jeff S. Brown
- G01 - MEASURING TESTING
Information Patent Application
SER Testing for an IC Chip Using Hot Underfill
- Publication number 20120045853
- Publication date Feb 23, 2012
- International Business Machines Corporation
- Michael Gaynes
- G01 - MEASURING TESTING

Soft error testing; Soft error rate evaluation; Single event testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Error protection analysis of an integrated circuit

Methods and systems for single-event upset fault injection testing

Method, system and device to test a plurality of devices by compari...

Device for determining soft error occurred in a memory having stack...

Method for generating redundant configuration in FPGAs

Methods and apparatuses to detect test probe contact at external te...

Systems and methods for analyzing failure rates due to soft/hard er...

Soft error-resilient latch

Flip flop of a digital electronic chip

Soft error rate calculation device and calculation method for semic...

Semiconductor test device and method, and data analysis device

Embedded transient scanning systems, transient scanning data visual...

Test circuit for 3D semiconductor device and method for testing the...

Method of fault tolerance in combinational circuits

On-die electric cosmic ray detector

Single event latchup (SEL) current surge mitigation

Semiconductor device with upset event detection and method of making

Method and apparatus for power glitch detection in integrated circuits

Simulation apparatus and simulation method for determining soft err...

Method for characterizing the sensitivity of electronic components...

Embedded transient scanning system apparatus and methodology

Method and apparatus for measuring alpha particle induced soft erro...

On-die electric cosmic ray detector

Memory error detection and correction circuitry

Single event upset enhanced architecture

Integrated circuit with error repair and fault tolerance

Method and circuit structure for suppressing single event transient...

Hardware execution driven application level derating calculation fo...

Noise rejection for built-in self-test with loopback

Measurement device and measurement method

Patents Applicationslast 30 patents

ERROR PROTECTION ANALYSIS OF AN INTEGRATED CIRCUIT

GLITCH DETECTOR WITH HIGH RELIABILITY

SEMICONDUCTOR DEVICE

METHODS AND APPARATUSES TO DETECT TEST PROBE CONTACT AT EXTERNAL TE...

SOFT ERROR-RESILIENT LATCH

FLIP FLOP OF A DIGITAL ELECTRONIC CHIP

SYSTEMS AND METHODS FOR ANALYZING FAILURE RATES DUE TO SOFT/HARD ER...

SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN...

ON-DIE ELECTRIC COSMIC RAY DETECTOR

METHOD AND CIRCUIT STRUCTURE FOR SUPPRESSING SINGLE EVENT TRANSIENT...

METHOD AND APPARATUS FOR MEASURING ALPHA PARTICLE INDUCED SOFT ERRO...

METHOD OF CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT...

ON-DIE ELECTRIC COSMIC RAY DETECTOR

INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE

INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE

INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE

Noise Rejection for Built-In Self-Test with Loopback

SIMULATION APPARATUS AND SIMULATION METHOD

EMBEDDED TRANSIENT SCANNING SYSTEM APPARATUS AND METHODOLOGY

METHOD FOR CHARACTERIZING THE SENSITIVITY OF ELECTRONIC COMPONENTS...

Hardware Execution Driven Application Level Derating Calculation fo...

METHOD OF DETERMINING THE PARTICLE SENSITIVITY OF ELECTRONIC COMPON...

SINGLE EVENT TRANSIENT DIRECT MEASUREMENT METHODOLOGY AND CIRCUIT

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING SYSTEM, CO...

WIDE AREA SOFT DEFECT LOCALIZATION

ROBUST SCAN SYNTHESIS FOR PROTECTING SOFT ERRORS

Measurement Device and Measurement Method

SINGLE EVENT TRANSIENT DIRECT MEASUREMENT METHODOLOGY AND CIRCUIT

BUILT-IN SELF-TEST CIRCUIT-BASED RADIATION SENSOR, RADIATION SENSIN...

SER Testing for an IC Chip Using Hot Underfill