Special manufacturing steps or sacrificial layers or layer structures

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G01J5/024

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

Current Industry

G01J5/024Special manufacturing steps or sacrificial layers or layer structures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Monolithic post complementary metal-oxide-semiconductor integration...
- Patent number 12,168,603
- Issue date Dec 17, 2024
- MERIDIAN INNOVATION PTE LTD
- Wan Chia Ang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Far infrared (FIR) sensor device and manufacturing method thereof a...
- Patent number 12,123,779
- Issue date Oct 22, 2024
- Pixart Imaging Incorporation
- Ming-Han Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bolometer and method for manufacturing same
- Patent number 12,055,440
- Issue date Aug 6, 2024
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Grant
High-sensitivity electromagnetic radiation detection component and...
- Patent number 12,044,577
- Issue date Jul 23, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Jean-Jacques Yon
- G01 - MEASURING TESTING
Information Patent Grant
Low thermal capacity micro-bolometer and associated manufacturing m...
- Patent number 11,988,560
- Issue date May 21, 2024
- LYNRED
- Nicolas Boudou
- G01 - MEASURING TESTING
Information Patent Grant
CMOS cap for MEMS devices
- Patent number 11,990,498
- Issue date May 21, 2024
- MERIDIAN INNOVATION PTE LTD
- Wan Chia Ang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing a detection structure with an optimised ab...
- Patent number 11,967,665
- Issue date Apr 23, 2024
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Abdelkader Aliane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS sensors and systems
- Patent number 11,959,806
- Issue date Apr 16, 2024
- OBSIDIAN SENSORS, INC.
- John Hong
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,955,504
- Issue date Apr 9, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combined near and mid infrared sensor in a chip scale package
- Patent number 11,953,380
- Issue date Apr 9, 2024
- NEXTINPUT, INC.
- Ali Foughi
- G01 - MEASURING TESTING
Information Patent Grant
Scalable thermoelectric-based infrared detector
- Patent number 11,848,348
- Issue date Dec 19, 2023
- MERIDIAN INNOVATION PTE LTD
- Piotr Kropelnicki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Microbolometer systems and methods
- Patent number 11,824,078
- Issue date Nov 21, 2023
- TELEDYNE FLIR, LLC
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensitive pixel based detection system comprising a thermal detecto...
- Patent number 11,815,400
- Issue date Nov 14, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Abdelkader Aliane
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microsystem and method for making a microsystem
- Patent number 11,788,895
- Issue date Oct 17, 2023
- Avago Technologies International Sales Pte. Limited
- John Phair
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale bolometer operating near the thermodynamic limit
- Patent number 11,788,893
- Issue date Oct 17, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Charles Thomas Harris
- G01 - MEASURING TESTING
Information Patent Grant
MEMS sensors and systems
- Patent number 11,624,657
- Issue date Apr 11, 2023
- OBSIDIAN SENSORS, INC.
- John Hong
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Long-wave infrared detecting element, long-wave infrared detecting...
- Patent number 11,614,364
- Issue date Mar 28, 2023
- Samsung Electronics Co., Ltd.
- Dongkyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Silicon nitride-carbon nanotube-graphene nanocomposite microbolomet...
- Patent number 11,609,122
- Issue date Mar 21, 2023
- Magnolia Optical Technologies, Inc.
- Ashok K. Sood
- G01 - MEASURING TESTING
Information Patent Grant
Readout circuits and methods
- Patent number 11,555,744
- Issue date Jan 17, 2023
- OBSIDIAN SENSORS, INC.
- Edward Chan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical detection device having adhesive member
- Patent number 11,555,741
- Issue date Jan 17, 2023
- Hamamatsu Photonics K.K.
- Masaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Light detector
- Patent number 11,519,785
- Issue date Dec 6, 2022
- Hamamatsu Photonics K.K.
- Masahiro Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stray light suppression in eye-tracking imaging
- Patent number 11,428,930
- Issue date Aug 30, 2022
- Meta Platforms Technologies, LLC
- Qi Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Process for producing an infrared detector and associated infrared...
- Patent number 11,408,772
- Issue date Aug 9, 2022
- LYNRED
- Sébastien Cortial
- G01 - MEASURING TESTING
Information Patent Grant
Ultraviolet, infrared and terahertz photo/radiation sensors using g...
- Patent number 11,404,643
- Issue date Aug 2, 2022
- Magnolia Optical Technologies, Inc.
- Elwood J. Egerton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared sensor structure
- Patent number 11,378,459
- Issue date Jul 5, 2022
- Shanghai IC R&D Center Co., Ltd.
- Xiaoxu Kang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS device having curved reflective layer and method for manufactu...
- Patent number 11,359,973
- Issue date Jun 14, 2022
- Korea Advanced Institute of Science and Technology
- Jong-Kwon Lee
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for fabricating a detection device comprising a step of tran...
- Patent number 11,346,722
- Issue date May 31, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Sébastien Becker
- G01 - MEASURING TESTING
Information Patent Grant
Rear surface incident type light receiving device comprising an upp...
- Patent number 11,339,494
- Issue date May 24, 2022
- Mitsubishi Electric Corporation
- Yasuo Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light detector
- Patent number 11,255,730
- Issue date Feb 22, 2022
- Hamamatsu Photonics K.K.
- Masahiro Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Infrared imaging element, infrared imaging array, and method for ma...
- Patent number 11,231,326
- Issue date Jan 25, 2022
- Mitsubishi Electric Corporation
- Tomohiro Maegawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGHLY SENSITIVE THERMOELECTRIC-BASED INFRARED DETECTOR WITH HIGH C...
- Publication number 20240351863
- Publication date Oct 24, 2024
- Meridian Innovation Pte Ltd
- Wan Chia Ang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20240339482
- Publication date Oct 10, 2024
- Teledyne FLIR Commercial Systems, Inc.
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A DETECTION DEVICE COMPRISING AN ENCAPSULA...
- Publication number 20240295439
- Publication date Sep 5, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jean-Jacques Yon
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION ELEMENT AND ELECTROMAGNETIC WAVE SEN...
- Publication number 20240280409
- Publication date Aug 22, 2024
- TDK Corporation
- Susumu AOKI
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR AND ITS REFERENCE ELEMENT AND MANUFACTURING METHOD...
- Publication number 20240230413
- Publication date Jul 11, 2024
- Industrial Technology Research Institute
- Chin-Jou KUO
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20240162272
- Publication date May 16, 2024
- Teledyne FLIR, LLC
- Eric A. Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOLOMETER AND MANUFACTURING METHOD OF TEMPERATURE SENSING UNIT
- Publication number 20240077362
- Publication date Mar 7, 2024
- HON HAI PRECISION INDUSTRY CO., LTD.
- Kuo-Bin HONG
- G01 - MEASURING TESTING
Information Patent Application
INFRARED SENSOR, AND METHOD FOR MANUFACTURING INFRARED SENSOR
- Publication number 20240060824
- Publication date Feb 22, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- KOUHEI TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSORS AND SYSTEMS
- Publication number 20230314228
- Publication date Oct 5, 2023
- Obsidian Sensors, Inc.
- John HONG
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROBOLOMETER AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230251140
- Publication date Aug 10, 2023
- HON HAI PRECISION INDUSTRY CO., LTD.
- Chun-Yuan CHOU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFRARED IMAGING MICROBOLOMETER AND ASSOCIATED PRODUCTION METHODS
- Publication number 20230236065
- Publication date Jul 27, 2023
- LYNRED
- Willy Ludurczak
- G01 - MEASURING TESTING
Information Patent Application
READOUT CIRCUITS AND METHODS
- Publication number 20230236067
- Publication date Jul 27, 2023
- Obsidian Sensors, Inc.
- Edward CHAN
- G01 - MEASURING TESTING
Information Patent Application
BOLOMETER AND METHOD FOR MANUFACTURING SAME
- Publication number 20230160750
- Publication date May 25, 2023
- NEC Corporation
- Ryota Yuge
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SENSITIVITY ELECTROMAGNETIC RADIATION DETECTION COMPONENT AND...
- Publication number 20230012423
- Publication date Jan 12, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Jean-Jacques YON
- G01 - MEASURING TESTING
Information Patent Application
BEAM SHAPING OPTIC FOR LIGHT SOURCES
- Publication number 20220365343
- Publication date Nov 17, 2022
- Meta Platforms Technologies, LLC
- QI ZHANG
- G01 - MEASURING TESTING
Information Patent Application
FAR INFRARED (FIR) SENSOR DEVICE AND MANUFACTURING METHOD THEREOF A...
- Publication number 20220364927
- Publication date Nov 17, 2022
- PIXART IMAGING INCORPORATION
- Ming-Han Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Thermal detector
- Publication number 20220344561
- Publication date Oct 27, 2022
- Teknologian Tutkimuskeskus VTT Oy
- Aapo Varpula
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR MANUFACTURING A DEVICE FOR DETECTING ELECTROMAGNETIC RA...
- Publication number 20220291044
- Publication date Sep 15, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Geoffroy DUMONT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Thermal Capacity Micro-Bolometer and Associated Manufacturing M...
- Publication number 20220228917
- Publication date Jul 21, 2022
- LYNRED
- Nicolas Boudou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
COMBINED NEAR AND MID INFRARED SENSOR IN A CHIP SCALE PACKAGE
- Publication number 20220214223
- Publication date Jul 7, 2022
- Ali FOUGHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL FIELD OF VIEW CONTROL FOR A PASSIVE LIGHT SENSOR
- Publication number 20220217829
- Publication date Jul 7, 2022
- IDEAL INDUSTRIES LIGHTING LLC
- Amruteshwar Hiremath
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METAMATERIALS-BASED FOCUSING LENSES FOR THERMAL IMAGING
- Publication number 20220196480
- Publication date Jun 23, 2022
- Meridian Innovation Pte Ltd
- Wan Chia Ang
- G02 - OPTICS
Information Patent Application
MONOLITHIC POST COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR INTEGRATION...
- Publication number 20220185660
- Publication date Jun 16, 2022
- Meridian Innovation Pte Ltd
- Wan Chia Ang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
LONG-WAVE INFRARED DETECTING ELEMENT, LONG-WAVE INFRARED DETECTING...
- Publication number 20220178754
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Dongkyun KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A DETECTION STRUCTURE WITH AN OPTIMISED AB...
- Publication number 20220020892
- Publication date Jan 20, 2022
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Abdelkader ALIANE
- G01 - MEASURING TESTING
Information Patent Application
MICROSYSTEM AND METHOD FOR MAKING A MICROSYSTEM
- Publication number 20220018716
- Publication date Jan 20, 2022
- PYREOS LTD.
- John PHAIR
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20210404878
- Publication date Dec 30, 2021
- FLIR Commercial Systems, Inc.
- Eric A. Kurth
- G01 - MEASURING TESTING
Information Patent Application
MICROBOLOMETER SYSTEMS AND METHODS
- Publication number 20210404881
- Publication date Dec 30, 2021
- FLIR Commercial Systems, Inc.
- Eric A. Kurth
- G01 - MEASURING TESTING
Information Patent Application
Process for Producing an Infrared Detector and Associated Infrared...
- Publication number 20210389186
- Publication date Dec 16, 2021
- LYNRED
- Sébastien Cortial
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER
- Publication number 20210372854
- Publication date Dec 2, 2021
- HAMAMATSU PHOTONICS K. K.
- Masaki HIROSE
- G02 - OPTICS

Special manufacturing steps or sacrificial layers or layer structures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monolithic post complementary metal-oxide-semiconductor integration...

Far infrared (FIR) sensor device and manufacturing method thereof a...

Bolometer and method for manufacturing same

High-sensitivity electromagnetic radiation detection component and...

Low thermal capacity micro-bolometer and associated manufacturing m...

CMOS cap for MEMS devices

Method for manufacturing a detection structure with an optimised ab...

MEMS sensors and systems

Microbolometer systems and methods

Combined near and mid infrared sensor in a chip scale package

Scalable thermoelectric-based infrared detector

Microbolometer systems and methods

Sensitive pixel based detection system comprising a thermal detecto...

Microsystem and method for making a microsystem

Nanoscale bolometer operating near the thermodynamic limit

MEMS sensors and systems

Long-wave infrared detecting element, long-wave infrared detecting...

Silicon nitride-carbon nanotube-graphene nanocomposite microbolomet...

Readout circuits and methods

Optical detection device having adhesive member

Light detector

Stray light suppression in eye-tracking imaging

Process for producing an infrared detector and associated infrared...

Ultraviolet, infrared and terahertz photo/radiation sensors using g...

Infrared sensor structure

MEMS device having curved reflective layer and method for manufactu...

Method for fabricating a detection device comprising a step of tran...

Rear surface incident type light receiving device comprising an upp...

Light detector

Infrared imaging element, infrared imaging array, and method for ma...

Patents Applicationslast 30 patents

HIGHLY SENSITIVE THERMOELECTRIC-BASED INFRARED DETECTOR WITH HIGH C...

MICROBOLOMETER SYSTEMS AND METHODS

METHOD FOR MANUFACTURING A DETECTION DEVICE COMPRISING AN ENCAPSULA...

ELECTROMAGNETIC WAVE DETECTION ELEMENT AND ELECTROMAGNETIC WAVE SEN...

INFRARED SENSOR AND ITS REFERENCE ELEMENT AND MANUFACTURING METHOD...

MICROBOLOMETER SYSTEMS AND METHODS

BOLOMETER AND MANUFACTURING METHOD OF TEMPERATURE SENSING UNIT

INFRARED SENSOR, AND METHOD FOR MANUFACTURING INFRARED SENSOR

MEMS SENSORS AND SYSTEMS

MICROBOLOMETER AND METHOD OF MANUFACTURING THE SAME

INFRARED IMAGING MICROBOLOMETER AND ASSOCIATED PRODUCTION METHODS

READOUT CIRCUITS AND METHODS

BOLOMETER AND METHOD FOR MANUFACTURING SAME

HIGH-SENSITIVITY ELECTROMAGNETIC RADIATION DETECTION COMPONENT AND...

BEAM SHAPING OPTIC FOR LIGHT SOURCES

FAR INFRARED (FIR) SENSOR DEVICE AND MANUFACTURING METHOD THEREOF A...

Thermal detector

PROCESS FOR MANUFACTURING A DEVICE FOR DETECTING ELECTROMAGNETIC RA...

Low Thermal Capacity Micro-Bolometer and Associated Manufacturing M...

COMBINED NEAR AND MID INFRARED SENSOR IN A CHIP SCALE PACKAGE

ELECTRICAL FIELD OF VIEW CONTROL FOR A PASSIVE LIGHT SENSOR

METAMATERIALS-BASED FOCUSING LENSES FOR THERMAL IMAGING

MONOLITHIC POST COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR INTEGRATION...

LONG-WAVE INFRARED DETECTING ELEMENT, LONG-WAVE INFRARED DETECTING...

METHOD FOR MANUFACTURING A DETECTION STRUCTURE WITH AN OPTIMISED AB...

MICROSYSTEM AND METHOD FOR MAKING A MICROSYSTEM

MICROBOLOMETER SYSTEMS AND METHODS

MICROBOLOMETER SYSTEMS AND METHODS

Process for Producing an Infrared Detector and Associated Infrared...

OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER