Specific applications or type of materials

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G01N2223/60

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/60Specific applications or type of materials

Industries

Patents Grantslast 30 patents

Information Patent Grant
Bonding wire for semiconductor devices
- Patent number 12,132,026
- Issue date Oct 29, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro Uno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 12,123,840
- Issue date Oct 22, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for high speed detection of diamonds
- Patent number 12,072,306
- Issue date Aug 27, 2024
- University of Johannesburg
- Simon H. Connell
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Methods and apparatus for measuring fastener concentricity
- Patent number 12,038,393
- Issue date Jul 16, 2024
- The Boeing Company
- Thomas Maeder
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sorting of diamonds
- Patent number 12,030,086
- Issue date Jul 9, 2024
- BOTSWANA INTERNATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Adamu Murtala Zungeru
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method and device for analyzing diffraction pattern of mixture, and...
- Patent number 12,031,927
- Issue date Jul 9, 2024
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring slope stability
- Patent number 11,971,373
- Issue date Apr 30, 2024
- Muon Vision Inc.
- Tancredi Botto
- E21 - EARTH DRILLING MINING
Information Patent Grant
Crosslinked fluoropolymer resin and control method for same
- Patent number 11,946,924
- Issue date Apr 2, 2024
- PROTERIAL, LTD.
- Kazufumi Suenaga
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining the three-dimensional structure of molecules...
- Patent number 11,933,748
- Issue date Mar 19, 2024
- Bruker Axs GmbH
- Clemens Richert
- C30 - CRYSTAL GROWTH
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single-crystal X-ray structure analysis system
- Patent number 11,879,857
- Issue date Jan 23, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Device for tuning microfluidic droplet frequency and synchronizing...
- Patent number 11,867,644
- Issue date Jan 9, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Degree-of-crystallinity measurement apparatus, degree-of-crystallin...
- Patent number 11,852,597
- Issue date Dec 26, 2023
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
- Patent number 11,846,593
- Issue date Dec 19, 2023
- PROTO PATENTS LTD.
- James Pineault
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction device and method for non-destructive testing of intern...
- Patent number 11,846,595
- Issue date Dec 19, 2023
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection method and apparatus comprising a neutron...
- Patent number 11,841,335
- Issue date Dec 12, 2023
- Riken
- Yasuo Wakabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for identifying molecular structure
- Patent number 11,815,475
- Issue date Nov 14, 2023
- The University of Tokyo
- Makoto Fujita
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for accurately characterizing crystal three-dimensional orie...
- Patent number 11,815,474
- Issue date Nov 14, 2023
- Dalian University of Technology
- Guoqing Chen
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring total cross-sectional phase fractio...
- Patent number 11,808,719
- Issue date Nov 7, 2023
- SEA PIONEERS TECHNOLOGIES CO., LTD.
- Jige Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Mesh holder for serial crystallography
- Patent number 11,768,164
- Issue date Sep 26, 2023
- UChicago Argonne, LLC
- Alex A Lavens
- G01 - MEASURING TESTING
Information Patent Grant
Sulfate corrosion-resistant concrete and method thereof for optimiz...
- Patent number 11,746,063
- Issue date Sep 5, 2023
- Research Institute of Highway Ministry of Transport
- Chongbang Xu
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DISLOCATION ANALYSIS
- Publication number 20240337611
- Publication date Oct 10, 2024
- Oxford Instruments Nanotechnology Tools Limited
- Aimo WINKELMANN
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SOLVATED CRYSTALLINE POLYNUCLEAR METAL COMPLEX SOLVATED WITH A MIXT...
- Publication number 20240300981
- Publication date Sep 12, 2024
- Merck Patent GmbH
- Clemens Kuehn
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240297142
- Publication date Sep 5, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290743
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240290745
- Publication date Aug 29, 2024
- NIPPON MICROMETAL CORPORATION
- Daizo ODA
- G01 - MEASURING TESTING
Information Patent Application
BONDING WIRE FOR SEMICONDUCTOR DEVICES
- Publication number 20240266313
- Publication date Aug 8, 2024
- NIPPON STEEL CHEMICAL & MATERIAL CO., LTD.
- Tomohiro UNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20240167969
- Publication date May 23, 2024
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...
- Publication number 20240068965
- Publication date Feb 29, 2024
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra ROS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING FOR COLORIZATI...
- Publication number 20230384243
- Publication date Nov 30, 2023
- KUB Technologies Inc.
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SORTING OF DIAMONDS
- Publication number 20230294136
- Publication date Sep 21, 2023
- BOTSWANA INTERNATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Adamu Murtala ZUNGERU
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
- Publication number 20230243765
- Publication date Aug 3, 2023
- Alexandra Ros
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR IDENTIFYING FOIL POSITION IN POWER STORAGE DEVICE AND ME...
- Publication number 20230236139
- Publication date Jul 27, 2023
- Prime Planet Energy & Solutions, Inc.
- Hisataka FUJIMAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS
- Publication number 20230228695
- Publication date Jul 20, 2023
- The Regents of the University of California
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY-BASED TEST DEVICE AND METHOD FOR PLUGGING REMOVAL EFFECT OF S...
- Publication number 20230194446
- Publication date Jun 22, 2023
- SOUTHWEST PETROLEUM UNIVERSITY
- Xiao GUO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...
- Publication number 20230184701
- Publication date Jun 15, 2023
- INVERSA SYSTEMS LTD.
- Peter Marc CABOT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...
- Publication number 20230160843
- Publication date May 25, 2023
- SINTOKOGIO, LTD.
- Yuji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC STATE OBSERVATION SYSTEM
- Publication number 20230150393
- Publication date May 18, 2023
- NISSAN ARC, LTD.
- Takashi MATSUMOTO
- B60 - VEHICLES IN GENERAL
Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230137130
- Publication date May 4, 2023
- JEOL Ltd.
- Kouta Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...
- Publication number 20230124114
- Publication date Apr 20, 2023
- Amphastar Pharmaceuticals, Inc.
- Jack Yongfeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Scatter Diagram Display Device, Scatter Diagram Display Method, and...
- Publication number 20230083479
- Publication date Mar 16, 2023
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
- Publication number 20230031147
- Publication date Feb 2, 2023
- Merck Patent GmbH
- Carolina VON ESSEN
- G01 - MEASURING TESTING
Information Patent Application
Mineralogical Analysis System of Copper Concentrate
- Publication number 20230033441
- Publication date Feb 2, 2023
- CODELCOTEC SPA
- Leonel Contreras Rojas
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Improved Systems and Visualization Methods for Intraoperative Volum...
- Publication number 20230025370
- Publication date Jan 26, 2023
- CLARIX IMAGING CORPORATION
- Xiao HAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT SYSTEM FOR CONTROLLING OPERATIONAL PARAMETERS OF A SMEL...
- Publication number 20230003450
- Publication date Jan 5, 2023
- CODELCOTEC SPA
- Fuentes Weishaupt Claudio
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...
- Publication number 20220390392
- Publication date Dec 8, 2022
- Rigaku Corporation
- Hideo TORAYA
- G01 - MEASURING TESTING

Specific applications or type of materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bonding wire for semiconductor devices

Device for tuning microfluidic droplet frequency and synchronizing...

Device and method for measuring short-wavelength characteristic X-r...

Method and system for high speed detection of diamonds

Methods and apparatus for measuring fastener concentricity

Method and system for sorting of diamonds

Method and device for analyzing diffraction pattern of mixture, and...

Serial synchrotron crystallography sample holding system

X-ray beam shaping apparatus and method

Method and system to determine crystal structure

Systems and methods for monitoring slope stability

Crosslinked fluoropolymer resin and control method for same

Method for improving an EBSD/TKD map

Method of determining the three-dimensional structure of molecules...

System and method for in-situ X-ray diffraction-based real-time mon...

Device for hosting a probe solution of molecules in a plurality of...

Controlling process parameters by means of radiographic online dete...

Single-crystal X-ray structure analysis system

Device for tuning microfluidic droplet frequency and synchronizing...

Degree-of-crystallinity measurement apparatus, degree-of-crystallin...

Ball-mapping system comprising a sample stage and a sample holder f...

Diffraction device and method for non-destructive testing of intern...

Nondestructive inspection method and apparatus comprising a neutron...

Method for identifying molecular structure

Method for accurately characterizing crystal three-dimensional orie...

Device and method for measuring total cross-sectional phase fractio...

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Mesh holder for serial crystallography

Sulfate corrosion-resistant concrete and method thereof for optimiz...

Patents Applicationslast 30 patents

METHOD FOR DISLOCATION ANALYSIS

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SOLVATED CRYSTALLINE POLYNUCLEAR METAL COMPLEX SOLVATED WITH A MIXT...

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

BONDING WIRE FOR SEMICONDUCTOR DEVICES

Laboratory crystallographic x-ray diffraction analysis system

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...

DEVICE FOR TUNING MICROFLUIDIC DROPLET FREQUENCY AND SYNCHRONIZING...

SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING FOR COLORIZATI...

METHOD AND SYSTEM FOR SORTING OF DIAMONDS

SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...

METHOD FOR IDENTIFYING FOIL POSITION IN POWER STORAGE DEVICE AND ME...

METHODS FOR ANALYZING INTERMOLECULAR INTERACTIONS IN MICROCRYSTALS

X-RAY-BASED TEST DEVICE AND METHOD FOR PLUGGING REMOVAL EFFECT OF S...

METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...

METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...

DYNAMIC STATE OBSERVATION SYSTEM

Phase Analyzer, Sample Analyzer, and Analysis Method

SMALL ANGLE X-RAY SCATTERING METHODS FOR CHARACTERIZING THE IRON CO...

Scatter Diagram Display Device, Scatter Diagram Display Method, and...

SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...

Mineralogical Analysis System of Copper Concentrate

Improved Systems and Visualization Methods for Intraoperative Volum...

INTELLIGENT SYSTEM FOR CONTROLLING OPERATIONAL PARAMETERS OF A SMEL...

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

DEGREE-OF-CRYSTALLINITY MEASUREMENT APPARATUS, DEGREE-OF-CRYSTALLIN...