standards (constitution)

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G01N2223/3037

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3037standards (constitution)

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Portable XRF data screening method for heavy metal contaminated soil
- Patent number 11,698,354
- Issue date Jul 11, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analysing and processing granular material
- Patent number 11,519,868
- Issue date Dec 6, 2022
- Sorterra Global Pty Ltd
- Jan Verboomen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,513,086
- Issue date Nov 29, 2022
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for analyzing chemical state of battery material
- Patent number 11,378,530
- Issue date Jul 5, 2022
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Methods for detecting stability of X-ray photoelectron spectrometer
- Patent number 11,327,033
- Issue date May 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Pengpeng Lu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and chemical state analysis method using the same
- Patent number 11,137,360
- Issue date Oct 5, 2021
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a reference blade for calibrating tomographic...
- Patent number 11,060,986
- Issue date Jul 13, 2021
- SAFRAN AIRCRAFT ENGINES
- Sara Somanou
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for multivariate analysis using multi-subsystem...
- Patent number 10,859,556
- Issue date Dec 8, 2020
- Malvern Panalytical Inc.
- Daniel A. Shiley
- G01 - MEASURING TESTING
Information Patent Grant
Mobile and free-form x-ray imaging systems and methods
- Patent number 10,539,708
- Issue date Jan 21, 2020
- The University of North Carolina at Chapel Hill
- Otto Z. Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing an object by diffractometry using a...
- Patent number 10,352,882
- Issue date Jul 16, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Resolution control in X-ray fluorescence spectroscopy systems
- Patent number 10,247,836
- Issue date Apr 2, 2019
- THERMO GAMMA-METRICS PTY LTD
- Bryan John Crosby
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor analysis of complex geologic materials
- Patent number 10,107,788
- Issue date Oct 23, 2018
- Malvern Panalytical Inc.
- Daniel A. Shiley
- G01 - MEASURING TESTING
Information Patent Grant
Radiometric measuring arrangement and method for detection of accre...
- Patent number 10,101,192
- Issue date Oct 16, 2018
- ENDRESS+HAUSER SE+CO.KG
- Dirk Glaser
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and X-ray fluorescence analyzing me...
- Patent number 9,746,433
- Issue date Aug 29, 2017
- Rigaku Corporation
- Takashi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Detecting gaps between fasteners and openings
- Patent number 9,689,813
- Issue date Jun 27, 2017
- The Boeing Company
- Taisia Tsukruk Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a standard
- Patent number 9,658,352
- Issue date May 23, 2017
- PANalytical B.V.
- Mark Ingham
- G01 - MEASURING TESTING
Information Patent Grant
Method for rapid analysis of gold
- Patent number 9,528,951
- Issue date Dec 27, 2016
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Tickner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and device for identifying a material by the spectral analys...
- Patent number 9,476,923
- Issue date Oct 25, 2016
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Guillaume Beldjoudi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Automated EDS standards calibration
- Patent number 9,188,555
- Issue date Nov 17, 2015
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Liquid mixture used to test and validate test devices
- Patent number 9,052,398
- Issue date Jun 9, 2015
- Smiths Heimann GmbH
- Uwe Siedenburg
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Compositions, methods of use and systems for analysis of silicon le...
- Patent number 8,908,827
- Issue date Dec 9, 2014
- X-Ray Optical Systems, Inc.
- James Carnahan
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 8,901,493
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
Target for calibrating and determining the spatial resolution, SNR...
- Publication number 20240159693
- Publication date May 16, 2024
- The University of Manchester
- Tristan James Lowe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
GLASS COMPOSITION AND METHOD FOR PRODUCING GLASS COMPOSITION
- Publication number 20230365455
- Publication date Nov 16, 2023
- Nikon Corporation
- Kohei YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...
- Publication number 20230160843
- Publication date May 25, 2023
- SINTOKOGIO, LTD.
- Yuji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND D...
- Publication number 20220299455
- Publication date Sep 22, 2022
- NCS TESTING TECHNOLOGY CO., LTD
- DONGLING LI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS
- Publication number 20200393391
- Publication date Dec 17, 2020
- Endress+Hauser SE+Co. KG
- Arun Shankar Venkatesh Iyer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR MULTIVARIATE ANALYISIS USING MULTI-SUBSYSTE...
- Publication number 20190049421
- Publication date Feb 14, 2019
- Malvern PANalytical Inc.
- Daniel A. Shiley
- G01 - MEASURING TESTING
Information Patent Application
RESOLUTION CONTROL IN X-RAY FLUORESCENCE SPECTROSCOPY SYSTEMS
- Publication number 20170168172
- Publication date Jun 15, 2017
- THERMO GAMMA-METRICS PTY LTD
- Bryan John CROSBY
- G01 - MEASURING TESTING
Information Patent Application
A Method And System For Analyzing An Object By Diffractometry Using...
- Publication number 20170153189
- Publication date Jun 1, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
LIQUID MIXTURE USED TO TEST AND VALIDATE TEST DEVICES
- Publication number 20140166936
- Publication date Jun 19, 2014
- Smiths Heimann GmbH
- Uwe SIEDENBURG
- G01 - MEASURING TESTING
Information Patent Application
LIQUID MIXTURE USED TO TEST AND VALIDATE TEST DEVICES
- Publication number 20140166937
- Publication date Jun 19, 2014
- Smiths Heimann GmbH
- Uwe SIEDENBURG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR IDENTIFYING A MATERIAL BY THE SPECTRAL ANALYS...
- Publication number 20140126693
- Publication date May 8, 2014
- COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
- Guillaume Beldjoudi
- G01 - MEASURING TESTING
Information Patent Application
Automated EDS Standards Calibration
- Publication number 20140032131
- Publication date Jan 30, 2014
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...
- Publication number 20120321045
- Publication date Dec 20, 2012
- X-Ray Optical Systems, Inc.
- James CARNAHAN
- G01 - MEASURING TESTING
Information Patent Application
Electron Microscope
- Publication number 20120241611
- Publication date Sep 27, 2012
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL DETECTOR CALIBRATION
- Publication number 20110012014
- Publication date Jan 20, 2011
- Koninklijke Philips Electronics N.V.
- Amir Livne
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CALIBRATION STANDARDS FOR ELECTRON MICROSCOPES AND ELECTRON COLUMN...
- Publication number 20100308221
- Publication date Dec 9, 2010
- John MASTOVICH
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...
- Publication number 20100288031
- Publication date Nov 18, 2010
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...
- Publication number 20100288032
- Publication date Nov 18, 2010
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROSCOPE
- Publication number 20090242766
- Publication date Oct 1, 2009
- Hitachi High-Technologies Corporation
- Shohei TERADA
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for reducing a degradation effect on a signal
- Publication number 20090166551
- Publication date Jul 2, 2009
- GE Security, Inc.
- Geoffrey Harding
- G01 - MEASURING TESTING
Information Patent Application
Standard specimen for a charged particle beam apparatus, specimen p...
- Publication number 20080073521
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
Processes to create discrete corrosion defects on substrates and es...
- Publication number 20070220946
- Publication date Sep 27, 2007
- Joseph Pecina
- G01 - MEASURING TESTING

standards (constitution)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

Monitoring properties of X-ray beam during X-ray analysis

Ore component analysis device and method

System and method for crack detection

Quantitative analysis method, quantitative analysis program, and X-...

Apparatus for inspecting semiconductor device and method for inspec...

Quantitative analysis method, quantitative analysis program, and X-...

Portable XRF data screening method for heavy metal contaminated soil

Apparatus and method for analysing and processing granular material

X-ray fluorescence spectrometer

Apparatus and method for analyzing chemical state of battery material

Methods for detecting stability of X-ray photoelectron spectrometer

X-ray spectrometer and chemical state analysis method using the same

X-ray diffraction and X-ray spectroscopy method and related apparatus

Method of fabricating a reference blade for calibrating tomographic...

Systems and methods for multivariate analysis using multi-subsystem...

Mobile and free-form x-ray imaging systems and methods

Method and system for analyzing an object by diffractometry using a...

Resolution control in X-ray fluorescence spectroscopy systems

Multi-sensor analysis of complex geologic materials

Radiometric measuring arrangement and method for detection of accre...

X-ray fluorescence spectrometer and X-ray fluorescence analyzing me...

Detecting gaps between fasteners and openings

Method of making a standard

Method for rapid analysis of gold

Method and device for identifying a material by the spectral analys...

Automated EDS standards calibration

Liquid mixture used to test and validate test devices

Compositions, methods of use and systems for analysis of silicon le...

Electron microscope

Patents Applicationslast 30 patents

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

Target for calibrating and determining the spatial resolution, SNR...

GLASS COMPOSITION AND METHOD FOR PRODUCING GLASS COMPOSITION

METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...

METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND D...

METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS

SYSTEMS AND METHODS FOR MULTIVARIATE ANALYISIS USING MULTI-SUBSYSTE...

RESOLUTION CONTROL IN X-RAY FLUORESCENCE SPECTROSCOPY SYSTEMS

A Method And System For Analyzing An Object By Diffractometry Using...

LIQUID MIXTURE USED TO TEST AND VALIDATE TEST DEVICES

LIQUID MIXTURE USED TO TEST AND VALIDATE TEST DEVICES

METHOD AND DEVICE FOR IDENTIFYING A MATERIAL BY THE SPECTRAL ANALYS...

Automated EDS Standards Calibration

COMPOSITIONS, METHODS OF USE AND SYSTEMS FOR ANALYSIS OF SILICON LE...

Electron Microscope

SPECTRAL DETECTOR CALIBRATION

CALIBRATION STANDARDS FOR ELECTRON MICROSCOPES AND ELECTRON COLUMN...

PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...

PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...

TRANSMISSION ELECTRON MICROSCOPE HAVING ELECTRON SPECTROSCOPE

Systems and methods for reducing a degradation effect on a signal

Standard specimen for a charged particle beam apparatus, specimen p...

Processes to create discrete corrosion defects on substrates and es...