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G01R35/007

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R35/00Testing or calibrating of apparatus covered by the preceding groups

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G01R35/007Standards or reference devices

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Patents Grantslast 30 patents

Information Patent Grant
Accurate and model-based measurement and management systems and met...
- Patent number 12,298,376
- Issue date May 13, 2025
- HEATHKIT COMPANY, INC.
- Andrew S. Cromarty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for testing antenna performance
- Patent number 12,196,796
- Issue date Jan 14, 2025
- AMOSENSE CO., LTD.
- Wonjin Seok
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a sensor, and electronic circuit
- Patent number 12,189,016
- Issue date Jan 7, 2025
- Robert Bosch GmbH
- Domenico Tangredi
- G01 - MEASURING TESTING
Information Patent Grant
Low noise high precision voltage reference
- Patent number 12,181,905
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Rajat Chauhan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for verifying alternating current (AC)/direct cur...
- Patent number 12,130,313
- Issue date Oct 29, 2024
- State Grid Jiangsu Electric Power Co., Ltd. Marketing Service Center
- Qing Xu
- G01 - MEASURING TESTING
Information Patent Grant
Calibration unit, calibration system and calibration method for a v...
- Patent number 12,130,351
- Issue date Oct 29, 2024
- Rohde & Schwarz GmbH & Co. KG
- Maximilian Friesinger
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a plurality of electrical param...
- Patent number 12,032,007
- Issue date Jul 9, 2024
- Imaginetec LTD
- Ivan Kaloyanov
- G01 - MEASURING TESTING
Information Patent Grant
Broad band coaxial load
- Patent number 12,013,454
- Issue date Jun 18, 2024
- Spinner GmbH
- Wolfgang Ziβler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for providing a secondary reference for evaluat...
- Patent number 11,959,992
- Issue date Apr 16, 2024
- ELECTDIS AB
- Laurens Swaans
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Temperature-corrected control data for verifying of structural inte...
- Patent number 11,946,891
- Issue date Apr 2, 2024
- 3M Innovative Properties Company
- David H. Redinger
- G05 - CONTROLLING REGULATING
Information Patent Grant
Impedance standard
- Patent number 11,927,663
- Issue date Mar 12, 2024
- Bayerische Motoren Werke Aktiengesellschaft
- Thomas Hammerschmidt
- G01 - MEASURING TESTING
Information Patent Grant
Offset calibration and diagnostics for resistance-based bridge circ...
- Patent number 11,906,610
- Issue date Feb 20, 2024
- Honeywell International Inc.
- Ian Bentley
- G01 - MEASURING TESTING
Information Patent Grant
Accurate and model-based measurement and management systems and met...
- Patent number 11,879,956
- Issue date Jan 23, 2024
- HEATHKIT COMPANY, INC.
- Andrew S. Cromarty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self-calibration of flux gate offset and gain drift to improve meas...
- Patent number 11,872,042
- Issue date Jan 16, 2024
- HI LLC
- Julian Kates-Harbeck
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
High precision current sampling circuit with on-chip real-time cali...
- Patent number 11,846,658
- Issue date Dec 19, 2023
- X-SIGNAL INTEGRATED CO., LTD.
- Wei Qi
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field calibration device and method of calibrating magneti...
- Patent number 11,846,693
- Issue date Dec 19, 2023
- TDK Corporation
- Tomohiko Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Low profile millimeterwave load pull tuner
- Patent number 11,688,919
- Issue date Jun 27, 2023
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
AC impedance measurement circuit with calibration function
- Patent number 11,567,113
- Issue date Jan 31, 2023
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Josephson voltage standard
- Patent number 11,557,708
- Issue date Jan 17, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Alain Rufenacht
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accurate and model-based measurement and management systems and met...
- Patent number 11,536,794
- Issue date Dec 27, 2022
- HEATHKIT COMPANY, INC.
- Andrew S. Cromarty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration apparatus and calibrating cross-frequency phases of lar...
- Patent number 11,536,793
- Issue date Dec 27, 2022
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Dylan Forrest Williams
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for calibration using impedance simulation
- Patent number 11,525,881
- Issue date Dec 13, 2022
- Fluke Corporation
- Liangzhu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Comb signal generator and method of providing a phase and amplitude...
- Patent number 11,515,863
- Issue date Nov 29, 2022
- Rohde & Schwarz GmbH & Co. KG
- Paul Gareth Lloyd
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for monitoring secondary power device, and ele...
- Patent number 11,506,741
- Issue date Nov 22, 2022
- Samsung Electronics Co., Ltd.
- Suck-Hyun Nam
- G11 - INFORMATION STORAGE
Information Patent Grant
Current measurement in power-gated microprocessors
- Patent number 11,435,426
- Issue date Sep 6, 2022
- International Business Machines Corporation
- Miguel E. Perez
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method of setting a measurement instrument and system for setting a...
- Patent number 11,366,193
- Issue date Jun 21, 2022
- Rohde & Schwarz GmbH & Co. KG
- Florian Ramian
- G01 - MEASURING TESTING
Information Patent Grant
AC impedance measurement circuit with calibration function
- Patent number 11,280,818
- Issue date Mar 22, 2022
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Grant
Removing effects of instabilities of measurement system
- Patent number 11,209,471
- Issue date Dec 28, 2021
- Keysight Technologies, Inc.
- Joel P. Dunsmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibrating differential measurement circuitry
- Patent number 11,156,692
- Issue date Oct 26, 2021
- Teradyne, Inc.
- Igor Golger
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with modulated diagnostic signal
- Patent number 11,143,732
- Issue date Oct 12, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER VECTOR ANALYZER
- Publication number 20250130279
- Publication date Apr 24, 2025
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A VECTOR NETWORK ANAL...
- Publication number 20250116746
- Publication date Apr 10, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Maximilian FRIESINGER
- G01 - MEASURING TESTING
Information Patent Application
LOW NOISE HIGH PRECISION VOLTAGE REFERENCE
- Publication number 20250076915
- Publication date Mar 6, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Rajat Chauhan
- G01 - MEASURING TESTING
Information Patent Application
TEST AND/OR MEASUREMENT SYSTEM
- Publication number 20250052807
- Publication date Feb 13, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Julian HARMS
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20250052847
- Publication date Feb 13, 2025
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Ryosuke MORI
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...
- Publication number 20250044346
- Publication date Feb 6, 2025
- MPI CORPORATION
- ANDREJ RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
PROCESS AND SYSTEM FOR CHARACTERIZING A FIXTURE COMPONENT OF A TEST...
- Publication number 20240385275
- Publication date Nov 21, 2024
- ROHDE & SCHWARZ GMBH & CO. KG
- Mathias HELLWIG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CALIBRATION USING IMPEDANCE SIMULATION
- Publication number 20240369667
- Publication date Nov 7, 2024
- FLUKE CORPORATION
- Liangzhu Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING ANTENNA PERFORMANCE
- Publication number 20240241164
- Publication date Jul 18, 2024
- AMOSENSE CO.,LTD
- Wonjin SEOK
- G01 - MEASURING TESTING
Information Patent Application
RF SIGNAL PARAMETER MEASUREMENT IN AN INTEGRATED CIRCUIT FABRICATIO...
- Publication number 20240203711
- Publication date Jun 20, 2024
- LAM RESEARCH CORPORATION
- Sunil Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD
- Publication number 20240125881
- Publication date Apr 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Nico RIEDMANN
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE SMALL AREA BANDGAP WITH A NOVEL TECHNIQUE FOR SWITCH...
- Publication number 20240118723
- Publication date Apr 11, 2024
- Vidatronic, Inc.
- Hazem Hassan Mohamed Hammam
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION UNIT, CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A V...
- Publication number 20230408617
- Publication date Dec 21, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Maximilian FRIESINGER
- G01 - MEASURING TESTING
Information Patent Application
Broad Band Coaxial Load
- Publication number 20230408618
- Publication date Dec 21, 2023
- SPINNER GmbH
- Wolfgang Zißler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR PROVIDING A SECONDARY REFERENCE FOR EVALUAT...
- Publication number 20230393227
- Publication date Dec 7, 2023
- ELECTDIS AB
- Laurens Swaans
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRECISION CURRENT SAMPLING CIRCUIT WITH ON-CHIP REAL-TIME CALI...
- Publication number 20230375598
- Publication date Nov 23, 2023
- X-SIGNAL INTEGRATED CO., LTD.
- Wei QI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A SENSOR, AND ELECTRONIC CIRCUIT
- Publication number 20230266420
- Publication date Aug 24, 2023
- ROBERT BOSCH GmbH
- Domenico Tangredi
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Determining a Plurality of Electrical Param...
- Publication number 20230221358
- Publication date Jul 13, 2023
- IMAGINETEC LTD
- Ivan Kaloyanov
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CALIBRATING A BATTERY EMULATOR
- Publication number 20230194643
- Publication date Jun 22, 2023
- dSPACE GmbH
- Peter SCHEIBELHUT
- G01 - MEASURING TESTING
Information Patent Application
LOW NOISE HIGH PRECISION VOLTAGE REFERENCE
- Publication number 20220390976
- Publication date Dec 8, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Rajat Chauhan
- G01 - MEASURING TESTING
Information Patent Application
OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...
- Publication number 20220291322
- Publication date Sep 15, 2022
- Honeywell International Inc.
- Ian Bentley
- G01 - MEASURING TESTING
Information Patent Application
COMB SIGNAL GENERATOR AND METHOD OF PROVIDING A PHASE AND AMPLITUDE...
- Publication number 20220286119
- Publication date Sep 8, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Paul Gareth Lloyd
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Impedance Standard
- Publication number 20220163613
- Publication date May 26, 2022
- Bayerische Motoren Werke Aktiengesellschaft
- Thomas HAMMERSCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
AC Impedance Measurement Circuit with Calibration Function
- Publication number 20220074980
- Publication date Mar 10, 2022
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD CALIBRATION DEVICE AND METHOD OF CALIBRATING MAGNETI...
- Publication number 20220057470
- Publication date Feb 24, 2022
- TDK Corporation
- Tomohiko SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
PROXIMITY SENSING SYSTEM WITH COMPONENT COMPATIBILITY TESTING
- Publication number 20210389494
- Publication date Dec 16, 2021
- Bently Nevada, LLC
- Dan Tho LU
- G01 - MEASURING TESTING
Information Patent Application
AC Impedance Measurement Circuit with Calibration Function
- Publication number 20210382100
- Publication date Dec 9, 2021
- Hycon Technology Corporation
- Po-Yin Chao
- G01 - MEASURING TESTING
Information Patent Application
REMOVING EFFECTS OF INSTABILITIES OF MEASUREMENT SYSTEM
- Publication number 20210341526
- Publication date Nov 4, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Joel P. Dunsmore
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS AND CALIBRATING CROSS-FREQUENCY PHASES OF LAR...
- Publication number 20210286036
- Publication date Sep 16, 2021
- Government of the United States of America, as Represented by the Secretary o...
- Dylan Forrest Williams
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING DIFFERENTIAL MEASUREMENT CIRCUITRY
- Publication number 20210255268
- Publication date Aug 19, 2021
- Teradyne, Inc.
- Igor Golger
- G01 - MEASURING TESTING

Standards or reference devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Accurate and model-based measurement and management systems and met...

System for testing antenna performance

Method for testing a sensor, and electronic circuit

Low noise high precision voltage reference

System and method for verifying alternating current (AC)/direct cur...

Calibration unit, calibration system and calibration method for a v...

Methods and systems for determining a plurality of electrical param...

Broad band coaxial load

Methods and systems for providing a secondary reference for evaluat...

Temperature-corrected control data for verifying of structural inte...

Impedance standard

Offset calibration and diagnostics for resistance-based bridge circ...

Accurate and model-based measurement and management systems and met...

Self-calibration of flux gate offset and gain drift to improve meas...

High precision current sampling circuit with on-chip real-time cali...

Magnetic field calibration device and method of calibrating magneti...

Low profile millimeterwave load pull tuner

AC impedance measurement circuit with calibration function

Josephson voltage standard

Accurate and model-based measurement and management systems and met...

Calibration apparatus and calibrating cross-frequency phases of lar...

Systems and methods for calibration using impedance simulation

Comb signal generator and method of providing a phase and amplitude...

Method and apparatus for monitoring secondary power device, and ele...

Current measurement in power-gated microprocessors

Method of setting a measurement instrument and system for setting a...

AC impedance measurement circuit with calibration function

Removing effects of instabilities of measurement system

Calibrating differential measurement circuitry

Magnetic field sensor with modulated diagnostic signal

Patents Applicationslast 30 patents

POWER VECTOR ANALYZER

CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A VECTOR NETWORK ANAL...

LOW NOISE HIGH PRECISION VOLTAGE REFERENCE

TEST AND/OR MEASUREMENT SYSTEM

MEASUREMENT SYSTEM

WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL...

PROCESS AND SYSTEM FOR CHARACTERIZING A FIXTURE COMPONENT OF A TEST...

SYSTEMS AND METHODS FOR CALIBRATION USING IMPEDANCE SIMULATION

SYSTEM FOR TESTING ANTENNA PERFORMANCE

RF SIGNAL PARAMETER MEASUREMENT IN AN INTEGRATED CIRCUIT FABRICATIO...

POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD

RECONFIGURABLE SMALL AREA BANDGAP WITH A NOVEL TECHNIQUE FOR SWITCH...

CALIBRATION UNIT, CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A V...

Broad Band Coaxial Load

METHODS AND SYSTEMS FOR PROVIDING A SECONDARY REFERENCE FOR EVALUAT...

HIGH PRECISION CURRENT SAMPLING CIRCUIT WITH ON-CHIP REAL-TIME CALI...

METHOD FOR TESTING A SENSOR, AND ELECTRONIC CIRCUIT

Methods and Systems for Determining a Plurality of Electrical Param...

APPARATUS AND METHOD FOR CALIBRATING A BATTERY EMULATOR

LOW NOISE HIGH PRECISION VOLTAGE REFERENCE

OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...

COMB SIGNAL GENERATOR AND METHOD OF PROVIDING A PHASE AND AMPLITUDE...

Impedance Standard

AC Impedance Measurement Circuit with Calibration Function

MAGNETIC FIELD CALIBRATION DEVICE AND METHOD OF CALIBRATING MAGNETI...

PROXIMITY SENSING SYSTEM WITH COMPONENT COMPATIBILITY TESTING

AC Impedance Measurement Circuit with Calibration Function

REMOVING EFFECTS OF INSTABILITIES OF MEASUREMENT SYSTEM

CALIBRATION APPARATUS AND CALIBRATING CROSS-FREQUENCY PHASES OF LAR...

CALIBRATING DIFFERENTIAL MEASUREMENT CIRCUITRY