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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R35/00
Testing or calibrating of apparatus covered by the preceding groups
Current Industry
G01R35/007
Standards or reference devices
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for providing a secondary reference for evaluat...
Patent number
11,959,992
Issue date
Apr 16, 2024
ELECTDIS AB
Laurens Swaans
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Temperature-corrected control data for verifying of structural inte...
Patent number
11,946,891
Issue date
Apr 2, 2024
3M Innovative Properties Company
David H. Redinger
G05 - CONTROLLING REGULATING
Information
Patent Grant
Impedance standard
Patent number
11,927,663
Issue date
Mar 12, 2024
Bayerische Motoren Werke Aktiengesellschaft
Thomas Hammerschmidt
G01 - MEASURING TESTING
Information
Patent Grant
Offset calibration and diagnostics for resistance-based bridge circ...
Patent number
11,906,610
Issue date
Feb 20, 2024
Honeywell International Inc.
Ian Bentley
G01 - MEASURING TESTING
Information
Patent Grant
Accurate and model-based measurement and management systems and met...
Patent number
11,879,956
Issue date
Jan 23, 2024
HEATHKIT COMPANY, INC.
Andrew S. Cromarty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Self-calibration of flux gate offset and gain drift to improve meas...
Patent number
11,872,042
Issue date
Jan 16, 2024
HI LLC
Julian Kates-Harbeck
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
High precision current sampling circuit with on-chip real-time cali...
Patent number
11,846,658
Issue date
Dec 19, 2023
X-SIGNAL INTEGRATED CO., LTD.
Wei Qi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field calibration device and method of calibrating magneti...
Patent number
11,846,693
Issue date
Dec 19, 2023
TDK Corporation
Tomohiko Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Low profile millimeterwave load pull tuner
Patent number
11,688,919
Issue date
Jun 27, 2023
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,567,113
Issue date
Jan 31, 2023
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
Josephson voltage standard
Patent number
11,557,708
Issue date
Jan 17, 2023
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Alain Rufenacht
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Accurate and model-based measurement and management systems and met...
Patent number
11,536,794
Issue date
Dec 27, 2022
HEATHKIT COMPANY, INC.
Andrew S. Cromarty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Calibration apparatus and calibrating cross-frequency phases of lar...
Patent number
11,536,793
Issue date
Dec 27, 2022
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Dylan Forrest Williams
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibration using impedance simulation
Patent number
11,525,881
Issue date
Dec 13, 2022
Fluke Corporation
Liangzhu Chen
G01 - MEASURING TESTING
Information
Patent Grant
Comb signal generator and method of providing a phase and amplitude...
Patent number
11,515,863
Issue date
Nov 29, 2022
Rohde & Schwarz GmbH & Co. KG
Paul Gareth Lloyd
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring secondary power device, and ele...
Patent number
11,506,741
Issue date
Nov 22, 2022
Samsung Electronics Co., Ltd.
Suck-Hyun Nam
G11 - INFORMATION STORAGE
Information
Patent Grant
Current measurement in power-gated microprocessors
Patent number
11,435,426
Issue date
Sep 6, 2022
International Business Machines Corporation
Miguel E. Perez
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method of setting a measurement instrument and system for setting a...
Patent number
11,366,193
Issue date
Jun 21, 2022
Rohde & Schwarz GmbH & Co. KG
Florian Ramian
G01 - MEASURING TESTING
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,280,818
Issue date
Mar 22, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
Removing effects of instabilities of measurement system
Patent number
11,209,471
Issue date
Dec 28, 2021
Keysight Technologies, Inc.
Joel P. Dunsmore
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibrating differential measurement circuitry
Patent number
11,156,692
Issue date
Oct 26, 2021
Teradyne, Inc.
Igor Golger
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor with modulated diagnostic signal
Patent number
11,143,732
Issue date
Oct 12, 2021
ALLEGRO MICROSYSTEMS, LLC
Hernán D. Romero
G01 - MEASURING TESTING
Information
Patent Grant
Proximity sensing system with component compatibility testing
Patent number
11,112,522
Issue date
Sep 7, 2021
Bendy Nevada, LLC
Dan Tho Lu
G01 - MEASURING TESTING
Information
Patent Grant
System for continuous calibration of hall sensors
Patent number
11,061,100
Issue date
Jul 13, 2021
Texas Instruments Incorporated
Tony Ray Larson
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-corrected control data for verifying of structural inte...
Patent number
11,016,047
Issue date
May 25, 2021
3M Innovative Properties Company
David H. Redinger
G01 - MEASURING TESTING
Information
Patent Grant
Accurate and model-based measurement and management systems and met...
Patent number
10,962,623
Issue date
Mar 30, 2021
HEATHKIT COMPANY, INC.
Andrew S. Cromarty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Variable passive intermodulation load
Patent number
10,942,206
Issue date
Mar 9, 2021
Nokia Shanghai Bell Co., Ltd
Paul A. Carney
G01 - MEASURING TESTING
Information
Patent Grant
Point stick device and point stick module
Patent number
10,914,807
Issue date
Feb 9, 2021
Elan Microelectronics Corporation
Chun-Chieh Huang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring secondary power device, and ele...
Patent number
10,908,249
Issue date
Feb 2, 2021
Samsung Electronics Co., Ltd.
Suck-Hyun Nam
G11 - INFORMATION STORAGE
Information
Patent Grant
Sensor measurement verification in quasi real-time
Patent number
10,790,844
Issue date
Sep 29, 2020
Lear Corporation
Antoni Ferre Fabregas
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD
Publication number
20240125881
Publication date
Apr 18, 2024
Rohde& Schwarz GmbH & Co. KG
Nico RIEDMANN
G01 - MEASURING TESTING
Information
Patent Application
RECONFIGURABLE SMALL AREA BANDGAP WITH A NOVEL TECHNIQUE FOR SWITCH...
Publication number
20240118723
Publication date
Apr 11, 2024
Vidatronic, Inc.
Hazem Hassan Mohamed Hammam
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION UNIT, CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A V...
Publication number
20230408617
Publication date
Dec 21, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Maximilian FRIESINGER
G01 - MEASURING TESTING
Information
Patent Application
Broad Band Coaxial Load
Publication number
20230408618
Publication date
Dec 21, 2023
SPINNER GmbH
Wolfgang Zißler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS AND SYSTEMS FOR PROVIDING A SECONDARY REFERENCE FOR EVALUAT...
Publication number
20230393227
Publication date
Dec 7, 2023
ELECTDIS AB
Laurens Swaans
G01 - MEASURING TESTING
Information
Patent Application
HIGH PRECISION CURRENT SAMPLING CIRCUIT WITH ON-CHIP REAL-TIME CALI...
Publication number
20230375598
Publication date
Nov 23, 2023
X-SIGNAL INTEGRATED CO., LTD.
Wei QI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING A SENSOR, AND ELECTRONIC CIRCUIT
Publication number
20230266420
Publication date
Aug 24, 2023
ROBERT BOSCH GmbH
Domenico Tangredi
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Determining a Plurality of Electrical Param...
Publication number
20230221358
Publication date
Jul 13, 2023
IMAGINETEC LTD
Ivan Kaloyanov
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR CALIBRATING A BATTERY EMULATOR
Publication number
20230194643
Publication date
Jun 22, 2023
dSPACE GmbH
Peter SCHEIBELHUT
G01 - MEASURING TESTING
Information
Patent Application
LOW NOISE HIGH PRECISION VOLTAGE REFERENCE
Publication number
20220390976
Publication date
Dec 8, 2022
TEXAS INSTRUMENTS INCORPORATED
Rajat Chauhan
G01 - MEASURING TESTING
Information
Patent Application
OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...
Publication number
20220291322
Publication date
Sep 15, 2022
Honeywell International Inc.
Ian Bentley
G01 - MEASURING TESTING
Information
Patent Application
COMB SIGNAL GENERATOR AND METHOD OF PROVIDING A PHASE AND AMPLITUDE...
Publication number
20220286119
Publication date
Sep 8, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Paul Gareth Lloyd
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Impedance Standard
Publication number
20220163613
Publication date
May 26, 2022
Bayerische Motoren Werke Aktiengesellschaft
Thomas HAMMERSCHMIDT
G01 - MEASURING TESTING
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20220074980
Publication date
Mar 10, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD CALIBRATION DEVICE AND METHOD OF CALIBRATING MAGNETI...
Publication number
20220057470
Publication date
Feb 24, 2022
TDK Corporation
Tomohiko SHIBUYA
G01 - MEASURING TESTING
Information
Patent Application
PROXIMITY SENSING SYSTEM WITH COMPONENT COMPATIBILITY TESTING
Publication number
20210389494
Publication date
Dec 16, 2021
Bently Nevada, LLC
Dan Tho LU
G01 - MEASURING TESTING
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20210382100
Publication date
Dec 9, 2021
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
REMOVING EFFECTS OF INSTABILITIES OF MEASUREMENT SYSTEM
Publication number
20210341526
Publication date
Nov 4, 2021
KEYSIGHT TECHNOLOGIES, INC.
Joel P. Dunsmore
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION APPARATUS AND CALIBRATING CROSS-FREQUENCY PHASES OF LAR...
Publication number
20210286036
Publication date
Sep 16, 2021
Government of the United States of America, as Represented by the Secretary o...
Dylan Forrest Williams
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATING DIFFERENTIAL MEASUREMENT CIRCUITRY
Publication number
20210255268
Publication date
Aug 19, 2021
Teradyne, Inc.
Igor Golger
G01 - MEASURING TESTING
Information
Patent Application
SELF-CALIBRATION OF FLUX GATE OFFSET AND GAIN DRIFT TO IMPROVE MEAS...
Publication number
20210244328
Publication date
Aug 12, 2021
HI LLC
Julian Kates-Harbeck
G01 - MEASURING TESTING
Information
Patent Application
CURRENT MEASUREMENT IN POWER-GATED MICROPROCESSORS
Publication number
20210215785
Publication date
Jul 15, 2021
International Business Machines Corporation
Miguel E. Perez
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND RECORDING MEDIUM HAVING RE...
Publication number
20210199713
Publication date
Jul 1, 2021
Advantest Corporation
Yuji SAKAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING SECONDARY POWER DEVICE, AND ELE...
Publication number
20210116529
Publication date
Apr 22, 2021
SUCK-HYUN NAM
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF SETTING A MEASUREMENT INSTRUMENT AND SYSTEM FOR SETTING A...
Publication number
20210088615
Publication date
Mar 25, 2021
Florian RAMIAN
G01 - MEASURING TESTING
Information
Patent Application
SENSOR MEASUREMENT VERIFICATION IN QUASI REAL-TIME
Publication number
20200403629
Publication date
Dec 24, 2020
LEAR CORPORATION
Antoni FERRE FABREGAS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR CONTINUOUS CALIBRATION OF HALL SENSORS
Publication number
20200393529
Publication date
Dec 17, 2020
TEXAS INSTRUMENTS INCORPORATED
Tony Ray LARSON
G01 - MEASURING TESTING
Information
Patent Application
PROXIMITY SENSING SYSTEM WITH COMPONENT COMPATIBILITY TESTING
Publication number
20200158904
Publication date
May 21, 2020
Bently Nevada, LLC
Dan Tho LU
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING SECONDARY POWER DEVICE, AND ELE...
Publication number
20200064430
Publication date
Feb 27, 2020
Samsung Electronics Co., Ltd.
SUCK-HYUN NAM
G01 - MEASURING TESTING
Information
Patent Application
SENSOR MEASUREMENT VERIFICATION IN QUASI REAL-TIME
Publication number
20190393884
Publication date
Dec 26, 2019
LEAR CORPORATION
Antoni FERRE FABREGAS
H03 - BASIC ELECTRONIC CIRCUITRY