Stimuli generation or application of test patterns to the device under test [DUT]

Industry

CPC
G01R31/31917

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31917Stimuli generation or application of test patterns to the device under test [DUT]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Virtual machine testing of electrical machines using physical domai...
- Patent number 12,117,482
- Issue date Oct 15, 2024
- Vestas Wind Systems A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for automatic time domain reflectometer measure...
- Patent number 12,117,491
- Issue date Oct 15, 2024
- Advantest Corporation
- Siegfried Podolski
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for transferring data from one clock domain to another
- Patent number 12,092,688
- Issue date Sep 17, 2024
- Advantest Corporation
- Andreas Beermann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method of over-the-air testing of a device under test
- Patent number 11,828,801
- Issue date Nov 28, 2023
- Rohde & Schwarz GmbH & Co. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Grant
Methods of producing augmented probe system images and associated p...
- Patent number 11,821,912
- Issue date Nov 21, 2023
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for controlling unit specific junction tempera...
- Patent number 11,808,813
- Issue date Nov 7, 2023
- Intel Corporation
- Mahesh Deshmane
- G01 - MEASURING TESTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,768,241
- Issue date Sep 26, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for protecting a reconfigurable digital integrated circuit a...
- Patent number 11,762,722
- Issue date Sep 19, 2023
- Thales
- Yann Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Self diagnostic apparatus for electronic device
- Patent number 11,686,772
- Issue date Jun 27, 2023
- PHOSPHIL INC.
- Byung Kyu Kim
- G01 - MEASURING TESTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,675,009
- Issue date Jun 13, 2023
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Noise-compensated jitter measurement instrument and methods
- Patent number 11,624,781
- Issue date Apr 11, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,573,270
- Issue date Feb 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,573,269
- Issue date Feb 7, 2023
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Watermarking for electronic device tracking or verification
- Patent number 11,528,152
- Issue date Dec 13, 2022
- Raytheon Company
- Colby K. Hoffman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Battery emulation apparatus
- Patent number 11,474,160
- Issue date Oct 18, 2022
- Rohde & Schwarz GmbH & Co. KG
- Sascha Kunisch
- G01 - MEASURING TESTING
Information Patent Grant
Signal injection technique for measurement and control of source re...
- Patent number 11,467,209
- Issue date Oct 11, 2022
- Anteverta-mw B.V.
- Mauro Marchetti
- G01 - MEASURING TESTING
Information Patent Grant
Automated testing machine with data processing function and informa...
- Patent number 11,415,622
- Issue date Aug 16, 2022
- HEFEI SPIROX TECHNOLOGY CO., LTD.
- Hsing-Fu Lin
- G01 - MEASURING TESTING
Information Patent Grant
Laser-assisted device alteration using synchronized laser pulses
- Patent number 11,353,479
- Issue date Jun 7, 2022
- FEI EFA, Inc.
- Praveen Vedagarbha
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for determining a phase and amplitude...
- Patent number 11,307,231
- Issue date Apr 19, 2022
- Rohde & Schwarz GmbH & Co. KG
- Christian Kuhn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for operating a test apparatus and a test apparatus
- Patent number 11,243,254
- Issue date Feb 8, 2022
- Advantest Corporation
- Wolfgang Horn
- G01 - MEASURING TESTING
Information Patent Grant
Converting formal verification testbench drivers with nondeterminis...
- Patent number 11,150,298
- Issue date Oct 19, 2021
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic weight selection process for logic built-in self test
- Patent number 11,112,457
- Issue date Sep 7, 2021
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test systems for executing self-testing in deployed automotive plat...
- Patent number 11,079,434
- Issue date Aug 3, 2021
- NVIDIA Corporation
- Anitha Kalva
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing apparatus for spintronics devices
- Patent number 11,054,471
- Issue date Jul 6, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and methods for reducing peak noise and peak power consumpti...
- Patent number 11,047,908
- Issue date Jun 29, 2021
- Samsung Electronics Co., Ltd.
- Jong-tae Hwang
- G01 - MEASURING TESTING
Information Patent Grant
One-shot circuit
- Patent number 10,996,272
- Issue date May 4, 2021
- Teradyne, Inc.
- Jan Paul Antonie van der Wagt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Receiving test input message packets and transmitting modulated ack...
- Patent number 10,928,444
- Issue date Feb 23, 2021
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
ATE compatible high-efficient functional test
- Patent number 10,768,232
- Issue date Sep 8, 2020
- International Business Machines Corporation
- Thomas Gentner
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...
- Publication number 20240418778
- Publication date Dec 19, 2024
- HCL America Inc.
- MANICKAM MUTHIAH
- G01 - MEASURING TESTING
Information Patent Application
MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...
- Publication number 20240402251
- Publication date Dec 5, 2024
- Intel Corporation
- Aryeh FARBER
- G01 - MEASURING TESTING
Information Patent Application
DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...
- Publication number 20240175907
- Publication date May 30, 2024
- SAMSUNG DISPLAY CO., LTD.
- YOUNG JE CHO
- G01 - MEASURING TESTING
Information Patent Application
Serial Protocol-Based Event Trigger
- Publication number 20240061042
- Publication date Feb 22, 2024
- NXP USA, Inc.
- Tiefei Zang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC INSTRUMENT FOR ANALYZING A DUT
- Publication number 20230333164
- Publication date Oct 19, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mathias HELLWIG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
- Publication number 20230305056
- Publication date Sep 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...
- Publication number 20230288480
- Publication date Sep 14, 2023
- Intel Corporation
- Mahesh DESHMANE
- G01 - MEASURING TESTING
Information Patent Application
VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...
- Publication number 20230176125
- Publication date Jun 8, 2023
- VESTAS WIND SYSTEMS A/S
- Peter Mongeau
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROTECTING A RECONFIGURABLE DIGITAL INTEGRATED CIRCUIT A...
- Publication number 20230051943
- Publication date Feb 16, 2023
- THALES
- Yann OSTER
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Software-Defined Synthesizable Testbench
- Publication number 20230052788
- Publication date Feb 16, 2023
- Intel Corporation
- Sheran Rashel Cardoza
- G01 - MEASURING TESTING
Information Patent Application
TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...
- Publication number 20230019995
- Publication date Jan 19, 2023
- SRI International
- Michael Locasto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS
- Publication number 20220299566
- Publication date Sep 22, 2022
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR TRANSFERRING DATA FROM ONE CLOCK DOMAIN TO ANOTHER
- Publication number 20220260635
- Publication date Aug 18, 2022
- Advantest Corporation
- Andreas BEERMANN
- G01 - MEASURING TESTING
Information Patent Application
CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...
- Publication number 20220187368
- Publication date Jun 16, 2022
- International Business Machines Corporation
- Bradley Donald Bingham
- G01 - MEASURING TESTING
Information Patent Application
SELF DIAGNOSTIC APPARATUS FOR ELECTRONIC DEVICE
- Publication number 20220137130
- Publication date May 5, 2022
- PhosPhil Inc.
- Byung Kyu KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TRACKING OR VERIFIWATERMARKING FOR ELECTRONICCATION
- Publication number 20220116233
- Publication date Apr 14, 2022
- Colby K. Hoffman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...
- Publication number 20220099729
- Publication date Mar 31, 2022
- SPIROX CORPORATION
- HSING-FU LIN
- G01 - MEASURING TESTING
Information Patent Application
BATTERY EMULATION APPARATUS
- Publication number 20220057454
- Publication date Feb 24, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Sascha KUNISCH
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF PRODUCING AUGMENTED PROBE SYSTEM IMAGES AND ASSOCIATED P...
- Publication number 20210373073
- Publication date Dec 2, 2021
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...
- Publication number 20210341537
- Publication date Nov 4, 2021
- NVIDIA Corporation
- Anitha Kalva
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20210325460
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR AUTOMATIC TIME DOMAIN REFLECTOMETER MEASURE...
- Publication number 20210311118
- Publication date Oct 7, 2021
- Advantest Corporation
- Siegfried PODOLSKI
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC TOOL FOR TRAFFIC CAPTURE WITH KNOWN SIGNATURE DATABASE
- Publication number 20210173010
- Publication date Jun 10, 2021
- Linden HSU
- G01 - MEASURING TESTING
Information Patent Application
Signal injection technique for measurement and control of source re...
- Publication number 20200408838
- Publication date Dec 31, 2020
- Anteverta-mw B.V.
- Mauro Marchetti
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A PHASE AND AMPLITUDE...
- Publication number 20200200810
- Publication date Jun 25, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Christian Kuhn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR SCHEMATIC VERIFICATION OF ELECTRONIC CIRCUITS
- Publication number 20200192995
- Publication date Jun 18, 2020
- BQR RELIABILITY ENGINEERING LTD.
- Yizhak BOT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electrical Testing Apparatus for Spintronics Devices
- Publication number 20200116790
- Publication date Apr 16, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Guenole Jan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES
- Publication number 20200025799
- Publication date Jan 23, 2020
- FEI EFA, Inc.
- Praveen Vedagarbha
- G01 - MEASURING TESTING
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
SELF TESTING CIRCUIT FOR POWER OPTIMIZATION
- Publication number 20190195948
- Publication date Jun 27, 2019
- SanDisk Technologies LLC
- Amandeep Kaur
- G06 - COMPUTING CALCULATING COUNTING

Stimuli generation or application of test patterns to the device under test [DUT]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Virtual machine testing of electrical machines using physical domai...

Systems and methods for automatic time domain reflectometer measure...

Circuit for transferring data from one clock domain to another

Test method for control chip and related device

System and method of over-the-air testing of a device under test

Methods of producing augmented probe system images and associated p...

Apparatus and method for controlling unit specific junction tempera...

Test systems for executing self-testing in deployed automotive plat...

Method for protecting a reconfigurable digital integrated circuit a...

Self diagnostic apparatus for electronic device

Converting formal verification testbench drivers with nondeterminis...

Noise-compensated jitter measurement instrument and methods

Electrical testing apparatus for spintronics devices

Test systems for executing self-testing in deployed automotive plat...

Watermarking for electronic device tracking or verification

Battery emulation apparatus

Signal injection technique for measurement and control of source re...

Automated testing machine with data processing function and informa...

Laser-assisted device alteration using synchronized laser pulses

Measurement system and method for determining a phase and amplitude...

Method for operating a test apparatus and a test apparatus

Converting formal verification testbench drivers with nondeterminis...

Dynamic weight selection process for logic built-in self test

Tester and method for testing a device under test and tester and me...

Test systems for executing self-testing in deployed automotive plat...

Electrical testing apparatus for spintronics devices

Device and methods for reducing peak noise and peak power consumpti...

One-shot circuit

Receiving test input message packets and transmitting modulated ack...

ATE compatible high-efficient functional test

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT)...

MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL...

DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC...

Serial Protocol-Based Event Trigger

ELECTRONIC INSTRUMENT FOR ANALYZING A DUT

SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST

APPARATUS AND METHOD FOR CONTROLLING UNIT SPECIFIC JUNCTION TEMPERA...

VIRTUAL MACHINE TESTING OF ELECTRICAL MACHINES USING PHYSICAL DOMAI...

METHOD FOR PROTECTING A RECONFIGURABLE DIGITAL INTEGRATED CIRCUIT A...

Software-Defined Synthesizable Testbench

TROJAN DETECTION VIA DISTORTIONS, NITROGEN-VACANCY DIAMOND (NVD) SE...

NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS

CIRCUIT FOR TRANSFERRING DATA FROM ONE CLOCK DOMAIN TO ANOTHER

CONVERTING FORMAL VERIFICATION TESTBENCH DRIVERS WITH NONDETERMINIS...

SELF DIAGNOSTIC APPARATUS FOR ELECTRONIC DEVICE

DEVICE TRACKING OR VERIFIWATERMARKING FOR ELECTRONICCATION

AUTOMATED TESTING MACHINE WITH DATA PROCESSING FUNCTION AND INFORMA...

BATTERY EMULATION APPARATUS

METHODS OF PRODUCING AUGMENTED PROBE SYSTEM IMAGES AND ASSOCIATED P...

TEST SYSTEMS FOR EXECUTING SELF-TESTING IN DEPLOYED AUTOMOTIVE PLAT...

Electrical Testing Apparatus for Spintronics Devices

SYSTEMS AND METHODS FOR AUTOMATIC TIME DOMAIN REFLECTOMETER MEASURE...

DIAGNOSTIC TOOL FOR TRAFFIC CAPTURE WITH KNOWN SIGNATURE DATABASE

Signal injection technique for measurement and control of source re...

MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A PHASE AND AMPLITUDE...

METHOD AND APPARATUS FOR SCHEMATIC VERIFICATION OF ELECTRONIC CIRCUITS

Electrical Testing Apparatus for Spintronics Devices

LASER-ASSISTED DEVICE ALTERATION USING SYNCHRONIZED LASER PULSES

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

SELF TESTING CIRCUIT FOR POWER OPTIMIZATION