Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Industry

CPC
H01L22/30

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Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements

Current Industry

H01L22/30Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Industries

Patents Grantslast 30 patents

Information Patent Grant
Resonator for testing, method for manufacturing resonator for testi...
- Patent number 11,973,488
- Issue date Apr 30, 2024
- SUZHOU HUNTERSUN ELECTRONICS CO., LTD.
- Zhiguo Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solar cell and photovoltaic module
- Patent number 11,972,988
- Issue date Apr 30, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Andreas Beinert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-product overlay targets
- Patent number 11,967,535
- Issue date Apr 23, 2024
- KLA Corporation
- Amnon Manassen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus and semiconductor apparatus leak inspection...
- Patent number 11,967,537
- Issue date Apr 23, 2024
- Mitsubishi Electric Corporation
- Takayuki Hisaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating reticle
- Patent number 11,940,737
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hsueh-Yi Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing semiconductor ele...
- Patent number 11,942,382
- Issue date Mar 26, 2024
- Mitsubishi Electric Corporation
- Noritsugu Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric injection annealing test device and a method thereof for c...
- Patent number 11,929,448
- Issue date Mar 12, 2024
- South China University of Technology
- Xianmin Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory and method of manufacturing the semiconductor...
- Patent number 11,929,292
- Issue date Mar 12, 2024
- Kioxia Corporation
- Naoki Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel and manufacturing method thereof, method for detectin...
- Patent number 11,901,246
- Issue date Feb 13, 2024
- Chengdu BOE Optoelectronics Technology Co., Ltd.
- Zhiwen Chu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display panel and display device
- Patent number 11,903,298
- Issue date Feb 13, 2024
- BOE Technology Group Co., Ltd.
- Junbo Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Package for power electronics
- Patent number 11,887,953
- Issue date Jan 30, 2024
- Wolfspeed, Inc.
- Brice McPherson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus and substrate processing method
- Patent number 11,887,871
- Issue date Jan 30, 2024
- Tokyo Electron Limited
- Kazushige Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Verification metrology targets and their design
- Patent number 11,874,605
- Issue date Jan 16, 2024
- KLA Corporation
- Michael E. Adel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit and test method
- Patent number 11,876,021
- Issue date Jan 16, 2024
- Kabushiki Kaisha Toshiba
- Daiki Kiribuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photonic systems to enable top-side wafer-level optical and electri...
- Patent number 11,867,944
- Issue date Jan 9, 2024
- Ayar Labs, Inc.
- Roy Edward Meade
- G02 - OPTICS
Information Patent Grant
Overlay mark design for electron beam overlay
- Patent number 11,862,524
- Issue date Jan 2, 2024
- Inna Steely-Tarshish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe tomography specimen preparation
- Patent number 11,837,435
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Wei Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment holder and testing apparatus
- Patent number 11,823,936
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chih Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level package assembly handling
- Patent number 11,809,441
- Issue date Nov 7, 2023
- Onto Innovation Inc.
- Kevin Barr
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit filler and method thereof
- Patent number 11,776,948
- Issue date Oct 3, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tseng Chin Lo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Package for power electronics
- Patent number 11,756,910
- Issue date Sep 12, 2023
- Wolfspeed, Inc.
- Brice McPherson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with test structure
- Patent number 11,699,624
- Issue date Jul 11, 2023
- NANYA TECHNOLOGY CORPORATION
- Tsang-Po Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for wafer-level photonic testing
- Patent number 11,694,935
- Issue date Jul 4, 2023
- Ayar Labs, Inc.
- Roy Edward Meade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer level testing of optical components
- Patent number 11,688,652
- Issue date Jun 27, 2023
- II-VI DELAWARE, INC.
- Shiyun Lin
- G01 - MEASURING TESTING
Information Patent Grant
Interposer test structures and methods
- Patent number 11,682,593
- Issue date Jun 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzuan-Horng Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,639,901
- Issue date May 2, 2023
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Micro LED display and repair method thereof
- Patent number 11,637,044
- Issue date Apr 25, 2023
- PlayNitride Display Co., Ltd.
- Hsiang-Wen Tang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Diagnostic detection chip devices and methods of manufacture and as...
- Patent number 11,628,435
- Issue date Apr 18, 2023
- CEPHEID
- Douglas B. Dority
- G01 - MEASURING TESTING
Information Patent Grant
Methods of defect inspection
- Patent number 11,624,985
- Issue date Apr 11, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ta-Ching Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vapor as a protectant and lifetime extender in optical systems
- Patent number 11,624,904
- Issue date Apr 11, 2023
- KLA Corporation
- David Jalil Zare
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RESONATOR FOR TESTING, METHOD FOR MANUFACTURING RESONATOR FOR TESTI...
- Publication number 20240120899
- Publication date Apr 11, 2024
- Suzhou HunterSun Electronics Co., Ltd.
- Zhiguo Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...
- Publication number 20240120241
- Publication date Apr 11, 2024
- PANJIT INTERNATIONAL INC.
- Chung-Hsiung HO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER ASSEMBLY AND METHOD FOR PRODUCING A PLURALITY OF SEMICONDUCTO...
- Publication number 20240096681
- Publication date Mar 21, 2024
- ams-OSRAM International GmbH
- Teresa Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT-OVERLAY MARK AND METHOD USING THE SAME
- Publication number 20240096813
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- KAZUKO YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEFECT MONITORING STRUCTURE
- Publication number 20240087966
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chu Fu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH OVERLAY MARK, METHOD OF MANUFACTURING...
- Publication number 20240071842
- Publication date Feb 29, 2024
- NANYA TECHNOLOGY CORPORATION
- Tsai-Wei LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING WORK-AFFECTED LAYER
- Publication number 20240068958
- Publication date Feb 29, 2024
- KWANSEI GAKUIN EDUCATIONAL FOUNDATION
- Tadaaki KANEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH OVERLAY MARK AND SYSTEM FOR MANUFACTUR...
- Publication number 20240071843
- Publication date Feb 29, 2024
- NANYA TECHNOLOGY CORPORATION
- Tsai-Wei LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240063059
- Publication date Feb 22, 2024
- RENESAS ELECTRONICS CORPORATION
- Koichi ANDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...
- Publication number 20240030072
- Publication date Jan 25, 2024
- Samsung Electronics Co., Ltd.
- Mingi HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
- Publication number 20240021485
- Publication date Jan 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Kuei-Sung Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY PANEL, PREPARATION METHOD FOR DISPLAY PANEL, AND DISPLAY DE...
- Publication number 20230420311
- Publication date Dec 28, 2023
- Mianyang HKC Optoelectronics Technology Co., Ltd.
- Jianying ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE
- Publication number 20230422553
- Publication date Dec 28, 2023
- SHARP KABUSHIKI KAISHA
- YUSUKE SAKAKIBARA
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES
- Publication number 20230408545
- Publication date Dec 21, 2023
- Mikros Manufacturing, Inc.
- Jesse D. McGowan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MID-MANUFACTURING SEMICONDUCTOR WAFER LAYER TESTING
- Publication number 20230402330
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Feng-Chien Hsieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION
- Publication number 20230386783
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Wei HUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY...
- Publication number 20230384212
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Donghyun LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT FILLER AND METHOD THEREOF
- Publication number 20230369309
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tseng Chin LO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Wafer-Level Photonic Testing
- Publication number 20230343655
- Publication date Oct 26, 2023
- Ayar Labs, Inc.
- Roy Edward Meade
- G01 - MEASURING TESTING
Information Patent Application
ETCH STOP DETECTION STRUCTURE AND ETCH STOP DETECTION METHOD
- Publication number 20230343639
- Publication date Oct 26, 2023
- United Microelectronics Corp.
- Runshun Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIAGNOSTIC DETECTION CHIP DEVICES AND METHODS OF MANUFACTURE AND AS...
- Publication number 20230330666
- Publication date Oct 19, 2023
- Cepheid
- Douglas B. Dority
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL-DOSE SUBSTRATE DEPOSITION MONITORING
- Publication number 20230317531
- Publication date Oct 5, 2023
- Applied Materials, Inc.
- Albert Barrett Hicks
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PACKAGE LAYERS FOR STRESS MONITORING AND METHOD
- Publication number 20230307300
- Publication date Sep 28, 2023
- Intel Corporation
- Jan Proschwitz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE MEASUREMENT METHOD, SEMICONDUCTOR SUBSTRATE, AND SEMICO...
- Publication number 20230298948
- Publication date Sep 21, 2023
- KIOXIA Corporation
- Naoki KOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BOND WIRE LOSS DETECTION AND REDUNDANCY
- Publication number 20230298950
- Publication date Sep 21, 2023
- Semiconductor Components Industries, LLC
- Dieter Jozef JOOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST KEY AND SEMICONDUCTOR DIE INCLUDING THE SAME
- Publication number 20230290694
- Publication date Sep 14, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tse-Pan Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER AND METHOD FOR FABRICATING A SEMICONDUCTOR WAFER
- Publication number 20230282596
- Publication date Sep 7, 2023
- Infineon Technologies Austria AG
- Andreas Kleinbichler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL TESTING OF OPTICAL COMPONENTS
- Publication number 20230282527
- Publication date Sep 7, 2023
- II-VI Delaware, Inc.
- Shiyun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND TRIMMING METHOD OF THE SAME
- Publication number 20230160754
- Publication date May 25, 2023
- RENESAS ELECTRONICS CORPORATION
- Shin TAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY PANEL AND MANUFACTURING METHOD THEREOF, METHOD FOR DETECTIN...
- Publication number 20230134605
- Publication date May 4, 2023
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Zhiwen Chu
- H01 - BASIC ELECTRIC ELEMENTS

Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Resonator for testing, method for manufacturing resonator for testi...

Solar cell and photovoltaic module

On-product overlay targets

Semiconductor apparatus and semiconductor apparatus leak inspection...

Method of fabricating reticle

Semiconductor device and method for manufacturing semiconductor ele...

Electric injection annealing test device and a method thereof for c...

Semiconductor memory and method of manufacturing the semiconductor...

Display panel and manufacturing method thereof, method for detectin...

Display panel and display device

Package for power electronics

Substrate processing apparatus and substrate processing method

Verification metrology targets and their design

Test circuit and test method

Photonic systems to enable top-side wafer-level optical and electri...

Overlay mark design for electron beam overlay

Atom probe tomography specimen preparation

Alignment holder and testing apparatus

Wafer-level package assembly handling

Integrated circuit filler and method thereof

Package for power electronics

Semiconductor structure with test structure

Systems and methods for wafer-level photonic testing

Wafer level testing of optical components

Interposer test structures and methods

Test structure design for metrology measurements in patterned samples

Micro LED display and repair method thereof

Diagnostic detection chip devices and methods of manufacture and as...

Methods of defect inspection

Vapor as a protectant and lifetime extender in optical systems

Patents Applicationslast 30 patents

RESONATOR FOR TESTING, METHOD FOR MANUFACTURING RESONATOR FOR TESTI...

PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTAT...

WAFER ASSEMBLY AND METHOD FOR PRODUCING A PLURALITY OF SEMICONDUCTO...

ALIGNMENT-OVERLAY MARK AND METHOD USING THE SAME

DISPLAY DEFECT MONITORING STRUCTURE

SEMICONDUCTOR STRUCTURE WITH OVERLAY MARK, METHOD OF MANUFACTURING...

METHOD AND SYSTEM FOR EVALUATING WORK-AFFECTED LAYER

SEMICONDUCTOR STRUCTURE WITH OVERLAY MARK AND SYSTEM FOR MANUFACTUR...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR...

SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF

DISPLAY PANEL, PREPARATION METHOD FOR DISPLAY PANEL, AND DISPLAY DE...

DISPLAY DEVICE

HEAT EXCHANGER FOR THERMAL CONTROL OF HEAT PRODUCING DEVICES

MID-MANUFACTURING SEMICONDUCTOR WAFER LAYER TESTING

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

INSPECTION METHOD AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY...

INTEGRATED CIRCUIT FILLER AND METHOD THEREOF

Systems and Methods for Wafer-Level Photonic Testing

ETCH STOP DETECTION STRUCTURE AND ETCH STOP DETECTION METHOD

DIAGNOSTIC DETECTION CHIP DEVICES AND METHODS OF MANUFACTURE AND AS...

CHEMICAL-DOSE SUBSTRATE DEPOSITION MONITORING

PACKAGE LAYERS FOR STRESS MONITORING AND METHOD

TEMPERATURE MEASUREMENT METHOD, SEMICONDUCTOR SUBSTRATE, AND SEMICO...

BOND WIRE LOSS DETECTION AND REDUNDANCY

TEST KEY AND SEMICONDUCTOR DIE INCLUDING THE SAME

SEMICONDUCTOR WAFER AND METHOD FOR FABRICATING A SEMICONDUCTOR WAFER

WAFER LEVEL TESTING OF OPTICAL COMPONENTS

SEMICONDUCTOR DEVICE AND TRIMMING METHOD OF THE SAME

DISPLAY PANEL AND MANUFACTURING METHOD THEREOF, METHOD FOR DETECTIN...