Synthetic testing

Industry

CPC
G01R31/3336

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/3336Synthetic testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and method for synthetically testing at least one sw...
- Patent number 11,733,299
- Issue date Aug 22, 2023
- Bayerische Motoren Werke Aktiengesellschaft
- Suljo Hajdarbasic
- G01 - MEASURING TESTING
Information Patent Grant
Thyristor valve test system based on cooperation of logical functio...
- Patent number 11,009,542
- Issue date May 18, 2021
- NR ELECTRIC CO., LTD
- Fan Yang
- G01 - MEASURING TESTING
Information Patent Grant
DC high potential insulation breakdown test system and method
- Patent number 10,634,711
- Issue date Apr 28, 2020
- Hubbell Incorporated
- John Edward Brower
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic test circuit for testing submodule performance in power c...
- Patent number 10,436,844
- Issue date Oct 8, 2019
- LSIS Co., Ltd.
- Yong Ho Chung
- G01 - MEASURING TESTING
Information Patent Grant
DC high potential insulation breakdown test system and method
- Patent number 10,310,006
- Issue date Jun 4, 2019
- Hubbell Incorporated
- John Edward Brower
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic test circuit for valve performance test of HVDC
- Patent number 9,869,728
- Issue date Jan 16, 2018
- LSIS CO., LTD.
- Seung Taek Baek
- G01 - MEASURING TESTING
Information Patent Grant
Portable diagnostic apparatus for testing circuit breakers
- Patent number 9,753,088
- Issue date Sep 5, 2017
- Eaton Corporation
- Koustubh Dnyandeo Ashtekar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for testing thyristor valve
- Patent number 9,310,421
- Issue date Apr 12, 2016
- LSIS Co., Ltd.
- Seung Taek Baek
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic equivalence test circuit for circuit breaker testing
- Patent number 7,095,236
- Issue date Aug 22, 2006
- Ernst Slamecka
- G01 - MEASURING TESTING
Information Patent Grant
Electric arc synthesis for arc detector testing and method for arc...
- Patent number 6,781,381
- Issue date Aug 24, 2004
- Hendry Mechanical Works
- Michael T. Parker
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic making/breaking-capacity test circuit for high-voltage al...
- Patent number 6,703,839
- Issue date Mar 9, 2004
- Ernst Slamecka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing an arcing fault circuit interrupter
- Patent number 6,218,844
- Issue date Apr 17, 2001
- Square D Company
- Kon B. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Synthetic equivalent test circuit of circuit breaker
- Patent number 5,153,518
- Issue date Oct 6, 1992
- Hitachi, Ltd.
- Minori Satoh
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit for high voltage apparatus
- Patent number 4,326,167
- Issue date Apr 20, 1982
- BBC Brown, Boveri & Company, Ltd.
- Werner Fehr
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for the synthetic testing of tripolar high-voltage circ...
- Patent number 4,168,463
- Issue date Sep 18, 1979
- Siemens Aktiengesellschaft
- Ernst Slamecka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit for control of the transient recovery voltage in...
- Patent number 3,959,722
- Issue date May 25, 1976
- Institut de Recherches de l'Hydro-Quebec (IREQ)
- Vojislav Narancic
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for the testing of high voltage direct current switches
- Patent number 3,942,103
- Issue date Mar 2, 1976
- Kind; Dieter
- Dieter Kind
- G01 - MEASURING TESTING
Information Patent Grant
3867686
- Patent number 3,867,686
- Issue date Feb 18, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3604976
- Patent number 3,604,976
- Issue date Sep 14, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3515982
- Patent number 3,515,982
- Issue date Jun 2, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3467857
- Patent number 3,467,857
- Issue date Sep 16, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3454872
- Patent number 3,454,872
- Issue date Jul 8, 1969
- G01 - MEASURING TESTING
Information Patent Grant
3398357
- Patent number 3,398,357
- Issue date Aug 20, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3373350
- Patent number 3,373,350
- Issue date Mar 12, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3064183
- Patent number 3,064,183
- Issue date Nov 13, 1962
- G01 - MEASURING TESTING
Information Patent Grant
3038116
- Patent number 3,038,116
- Issue date Jun 5, 1962
- G01 - MEASURING TESTING
Information Patent Grant
3021476
- Patent number 3,021,476
- Issue date Feb 13, 1962
- G01 - MEASURING TESTING
Information Patent Grant
2898548
- Patent number 2,898,548
- Issue date Aug 4, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2888639
- Patent number 2,888,639
- Issue date May 26, 1959
- G01 - MEASURING TESTING
Information Patent Grant
2819446
- Patent number 2,819,446
- Issue date Jan 7, 1958
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ASSISTANCE APPARATUS FOR LOCALIZING ERRORS IN A MONITORED TECHNICAL...
- Publication number 20220170976
- Publication date Jun 2, 2022
- SIEMENS AKTIENGESELLSCHAFT
- Martin Ringsquandl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Apparatus and Method for Synthetically Testing at Least One Sw...
- Publication number 20210048477
- Publication date Feb 18, 2021
- Bayerische Motoren Werke Aktiengesellschaft
- Suljo HAJDARBASIC
- B60 - VEHICLES IN GENERAL
Information Patent Application
THYRISTOR VALVE TEST SYSTEM BASED ON COOPERATION OF LOGICAL FUNCTIO...
- Publication number 20200011923
- Publication date Jan 9, 2020
- NR ELECTRIC CO., LTD.
- Fan YANG
- G01 - MEASURING TESTING
Information Patent Application
DC HIGH POTENTIAL INSULATION BREAKDOWN TEST SYSTEM AND METHOD
- Publication number 20190277905
- Publication date Sep 12, 2019
- HUBBELL INCORPORATED
- John Edward BROWER
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC TEST CIRCUIT FOR TESTING SUBMODULE PERFORMANCE IN POWER C...
- Publication number 20180136281
- Publication date May 17, 2018
- LSIS CO., LTD
- Yong Ho CHUNG
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC TEST CIRCUIT
- Publication number 20170307688
- Publication date Oct 26, 2017
- General Electric Technology GmbH
- David Reginald TRAINER
- G01 - MEASURING TESTING
Information Patent Application
SYNTHETIC TEST CIRCUIT
- Publication number 20170269161
- Publication date Sep 21, 2017
- ALSTOM Technology Ltd.
- David Reginald TRAINER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING THYRISTOR VALVE
- Publication number 20130314111
- Publication date Nov 28, 2013
- Myongji University Industry and Academia Cooperation Foundation
- Seung Taek BAEK
- G01 - MEASURING TESTING
Information Patent Application
Synthetic test circuit for circuit breaker testing
- Publication number 20040174169
- Publication date Sep 9, 2004
- Ernst Slamecka
- G01 - MEASURING TESTING
Information Patent Application
Synthetic making/breaking-capacity test circuit for high-voltage al...
- Publication number 20030214302
- Publication date Nov 20, 2003
- Ernst Slamecka
- G01 - MEASURING TESTING
Information Patent Application
Electric arc synthesis for arc detector testing and method for arc...
- Publication number 20030160619
- Publication date Aug 28, 2003
- HENDRY MECHANICAL WORKS
- Michael T. Parker
- G01 - MEASURING TESTING

Synthetic testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test apparatus and method for synthetically testing at least one sw...

Thyristor valve test system based on cooperation of logical functio...

DC high potential insulation breakdown test system and method

Synthetic test circuit for testing submodule performance in power c...

DC high potential insulation breakdown test system and method

Synthetic test circuit for valve performance test of HVDC

Portable diagnostic apparatus for testing circuit breakers

Apparatus for testing thyristor valve

Synthetic equivalence test circuit for circuit breaker testing

Electric arc synthesis for arc detector testing and method for arc...

Synthetic making/breaking-capacity test circuit for high-voltage al...

Method and apparatus for testing an arcing fault circuit interrupter

Synthetic equivalent test circuit of circuit breaker

Test circuit for high voltage apparatus

Arrangement for the synthetic testing of tripolar high-voltage circ...

Integrated circuit for control of the transient recovery voltage in...

Arrangement for the testing of high voltage direct current switches

3867686

3604976

3515982

3467857

3454872

3398357

3373350

3064183

3038116

3021476

2898548

2888639

2819446

Patents Applicationslast 30 patents

ASSISTANCE APPARATUS FOR LOCALIZING ERRORS IN A MONITORED TECHNICAL...

Test Apparatus and Method for Synthetically Testing at Least One Sw...

THYRISTOR VALVE TEST SYSTEM BASED ON COOPERATION OF LOGICAL FUNCTIO...

DC HIGH POTENTIAL INSULATION BREAKDOWN TEST SYSTEM AND METHOD

SYNTHETIC TEST CIRCUIT FOR TESTING SUBMODULE PERFORMANCE IN POWER C...

SYNTHETIC TEST CIRCUIT

SYNTHETIC TEST CIRCUIT

APPARATUS FOR TESTING THYRISTOR VALVE

Synthetic test circuit for circuit breaker testing

Synthetic making/breaking-capacity test circuit for high-voltage al...

Electric arc synthesis for arc detector testing and method for arc...