temperature control

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G01N2223/31

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/31temperature control

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Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
System and method for imaging a subject
- Patent number 12,070,344
- Issue date Aug 27, 2024
- Medtronic Navigation, Inc.
- Patrick A. Helm
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems of testing formation samples using a rock hydro...
- Patent number 11,971,369
- Issue date Apr 30, 2024
- Halliburton Energy Services, Inc.
- Abraham S. Grader
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-physical field imaging method and system based on PET-CT and DAS
- Patent number 11,965,995
- Issue date Apr 23, 2024
- Yibo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Enclosed x-ray chopper wheel
- Patent number 11,940,395
- Issue date Mar 26, 2024
- Videray Technologies, LLC
- Paul Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
- Patent number 11,921,062
- Issue date Mar 5, 2024
- UNIVERSITE DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for preparing a sample for laser induced breakdown spectroscopy
- Patent number 11,852,570
- Issue date Dec 26, 2023
- Foss Analytical A/S
- Thomas Nikolajsen
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elemental analysis method
- Patent number 11,796,491
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Shinji Miyauchi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Re-entrant cones for moderator chamber of a neutron imaging system
- Patent number 11,774,375
- Issue date Oct 3, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive test system comprising a neutron emission unit for e...
- Patent number 11,754,516
- Issue date Sep 12, 2023
- Topcon Corporation
- Hisashi Tsukada
- G01 - MEASURING TESTING
Information Patent Grant
Defining parameters for scan of single crystal structure
- Patent number 11,740,189
- Issue date Aug 29, 2023
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Method for optimizing radiation beam intensity profile shape using...
- Patent number 11,724,129
- Issue date Aug 15, 2023
- The Johns Hopkins University
- Joseph Webster Stayman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scatter correction for computed tomography imaging
- Patent number 11,698,349
- Issue date Jul 11, 2023
- Baker Hughes Oilfield Operations LLC
- Nils Rothe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray imaging apparatus and method
- Patent number 11,681,068
- Issue date Jun 20, 2023
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE
- Publication number 20240379258
- Publication date Nov 14, 2024
- Nuctech Company Limited
- Yaohong LIU
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR SCANNING A COMPONENT
- Publication number 20240361218
- Publication date Oct 31, 2024
- Rolls-Royce plc
- Akhil MULLOTH
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL
- Publication number 20240361255
- Publication date Oct 31, 2024
- VIDERAY TECHNOLOGIES, INC.
- Paul Bradshaw
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Imaging A Subject
- Publication number 20240298986
- Publication date Sep 12, 2024
- Medtronic Navigation, Inc.
- Patrick A. HELM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240288592
- Publication date Aug 29, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING
- Publication number 20240280519
- Publication date Aug 22, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Yurun LIU
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...
- Publication number 20240272096
- Publication date Aug 15, 2024
- STF Technologies LLC
- Norman J. Wagner
- G01 - MEASURING TESTING
Information Patent Application
ENCLOSED X-RAY CHOPPER WHEEL
- Publication number 20240230560
- Publication date Jul 11, 2024
- VIDERAY TECHNOLOGIES, INC.
- PAUL Bradshaw
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20240219324
- Publication date Jul 4, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20240167967
- Publication date May 23, 2024
- Woorien Co., Ltd.
- Taehee HAN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...
- Publication number 20240068966
- Publication date Feb 29, 2024
- Danmarks Tekniske Universitet
- Henning Friis Poulsen
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Tomographic Imaging of Core Samples
- Publication number 20240053284
- Publication date Feb 15, 2024
- Orimtech Ltd.
- Boris S. Goldberg
- G01 - MEASURING TESTING
Information Patent Application
COMBINED XRF ANALYSIS DEVICE
- Publication number 20240044821
- Publication date Feb 8, 2024
- Shenzhen Angstrom Excellence Technology Co. Ltd
- Xuena ZHANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230408425
- Publication date Dec 21, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20230393082
- Publication date Dec 7, 2023
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
Methods and Means for the Measurement of Tubing, Casing, Perforatio...
- Publication number 20230392491
- Publication date Dec 7, 2023
- Philip Teague
- E21 - EARTH DRILLING MINING
Information Patent Application
X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS
- Publication number 20230384247
- Publication date Nov 30, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki TAKAHARA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR REAL-TIME MONITORING OF ORGANIC MATTER POROSITY EVOLU...
- Publication number 20230375457
- Publication date Nov 23, 2023
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
- Publication number 20230375484
- Publication date Nov 23, 2023
- The University of North Carolina at Chapel Hill
- Christina Inscoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COLLIMATOR
- Publication number 20230358692
- Publication date Nov 9, 2023
- ISTITUTO NAZIONALE DI FISICA NUCLEARE
- Roberto BEDOGNI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
- Publication number 20230349842
- Publication date Nov 2, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...
- Publication number 20230333035
- Publication date Oct 19, 2023
- The Governing Council of the University of Toronto
- Ali PUNJANI
- G01 - MEASURING TESTING
Information Patent Application
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
- Publication number 20230333029
- Publication date Oct 19, 2023
- Phoenix, LLC
- Tye Gribb
- G01 - MEASURING TESTING
Information Patent Application
A DEVICE FOR TESTING A FLAT PLATE-SHAPED MATERIAL
- Publication number 20230314346
- Publication date Oct 5, 2023
- FORCE TECHNOLOGY
- Finn Falentin Olesen
- G01 - MEASURING TESTING
Information Patent Application
AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...
- Publication number 20230304946
- Publication date Sep 28, 2023
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING

temperature control

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

X-ray fluorescence analyzer

Device and method for measuring short-wavelength characteristic X-r...

System and method for imaging a subject

X-ray automated calibration and monitoring

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

Methods and systems of testing formation samples using a rock hydro...

Sample inspection system comprising a beam former to project a poly...

Multi-physical field imaging method and system based on PET-CT and DAS

Enclosed x-ray chopper wheel

Anti-frosting and anti-dew device for spectroscopic measurements

Screening system

Structure for pressurization analysis, X-ray diffraction apparatus...

Controlling process parameters by means of radiographic online dete...

X-ray sequential array wavelength dispersive spectrometer

X-ray reflectometry apparatus and method thereof for measuring thre...

X-ray collimator and related X-ray inspection apparatus

Method for preparing a sample for laser induced breakdown spectroscopy

X-ray examination device

X-ray spectroscopic analysis apparatus and elemental analysis method

System and method for material characterization

Apparatuses and methods for combined simultaneous analyses of mater...

Diffraction analysis device and method for full-field x-ray fluores...

Re-entrant cones for moderator chamber of a neutron imaging system

Nondestructive test system comprising a neutron emission unit for e...

Defining parameters for scan of single crystal structure

Method for optimizing radiation beam intensity profile shape using...

Scatter correction for computed tomography imaging

X-ray imaging apparatus and method

Patents Applicationslast 30 patents

AN X-RAY SYSTEM

RAY COLLIMATION DEVICE AND RADIATION INSPECTION DEVICE

SYSTEM AND METHOD FOR SCANNING A COMPONENT

HANDHELD X-RAY SYSTEM INCLUDING A STAND-ALONE DETECTOR PANEL

Systems and Methods for Monitoring Output Energy of a High-Energy X...

System And Method For Imaging A Subject

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY INSPECTION APPARATUS

APPARATUS AND METHOD FOR X-RAY FLUORESCENCE IMAGING

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

HIGH-THROUGHPUT HIGH-PRESSURE SMALL-ANGLE NEUTRON SCATTERING SAMPLE...

ENCLOSED X-RAY CHOPPER WHEEL

X-RAY INSPECTION DEVICE

X-RAY IMAGING APPARATUS

X-RAY DIFFRACTION METHOD FOR THE ANALYSIS OF AMORPHOUS AND SEMI-CRY...

System and Method for Tomographic Imaging of Core Samples

COMBINED XRF ANALYSIS DEVICE

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD

Methods and Means for the Measurement of Tubing, Casing, Perforatio...

X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS

APPARATUS FOR REAL-TIME MONITORING OF ORGANIC MATTER POROSITY EVOLU...

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...

COLLIMATOR

X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER

METHODS AND SYSTEMS FOR 3D STRUCTURE ESTIMATION USING NON-UNIFORM R...

Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System

A DEVICE FOR TESTING A FLAT PLATE-SHAPED MATERIAL

AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...