Testing digital circuits including elements other than semiconductor transistors

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G01R31/31702

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31702Testing digital circuits including elements other than semiconductor transistors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for creating dipole moment model
- Patent number 12,105,142
- Issue date Oct 1, 2024
- Realtek Semiconductor Corporation
- Min-Hsu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method, calibration apparatus, and program
- Patent number 12,078,675
- Issue date Sep 3, 2024
- NEC Corporation
- Tsuyoshi Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 11,656,275
- Issue date May 23, 2023
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Injection device, semiconductor testing system and its testing method
- Patent number 11,567,125
- Issue date Jan 31, 2023
- Hermes Testing Solutions Inc.
- Bo-Lung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor and method for sensing a strength of an electric cur...
- Patent number 11,500,014
- Issue date Nov 15, 2022
- Infineon Technologies AG
- Lifeng Guan
- G01 - MEASURING TESTING
Information Patent Grant
In-field monitoring of on-chip thermal, power distribution network,...
- Patent number 11,416,049
- Issue date Aug 16, 2022
- QUALCOMM Incorporated
- Palkesh Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Partitioned force-sense system for test equipment
- Patent number 11,340,295
- Issue date May 24, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having state machine-driven flops in wrapper cha...
- Patent number 11,342,914
- Issue date May 24, 2022
- Juniper Networks, Inc.
- Gustav Laub
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Symbolic backend for execution of quantum programs
- Patent number 11,243,248
- Issue date Feb 8, 2022
- International Business Machines Corporation
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
External port measurement of qubit port responses
- Patent number 11,164,102
- Issue date Nov 2, 2021
- International Business Machines Corporation
- Firat Solgun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems for probing superconducting circuits including the use of a...
- Patent number 11,137,443
- Issue date Oct 5, 2021
- Microsoft Technology Licensing, LLC
- Miriam E. Marizan
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method for in chip decoupling capacitor circuits
- Patent number 11,131,711
- Issue date Sep 28, 2021
- NVIDIA Corporation
- Krishnamraju Kurra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tester and method for testing a device under test and tester and me...
- Patent number 11,105,855
- Issue date Aug 31, 2021
- Advantest Corporation
- Jochen Rivoir
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microelectromechanical systems sensor testing device, system and me...
- Patent number 11,001,496
- Issue date May 11, 2021
- STMicroelectronics S.r.l.
- Federico Iaccarino
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Single pin test interface for pin limited systems
- Patent number 10,816,597
- Issue date Oct 27, 2020
- Silicon Laboratories Inc.
- Huanhui Zhan
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining characteristic parameters of an oscillator
- Patent number 10,651,791
- Issue date May 12, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Antoine Nowodzinski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
External port measurement of qubit port responses
- Patent number 10,621,502
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Firat Solgun
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the quality factor of an oscillator
- Patent number 10,578,661
- Issue date Mar 3, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Antoine Nowodzinski
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Order O(1) algorithm for first-principles calculation of transient...
- Patent number 10,330,712
- Issue date Jun 25, 2019
- The University of Hong Kong
- Jian Wang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detection of current change in an integrated circuit
- Patent number 10,048,296
- Issue date Aug 14, 2018
- Infineon Technologies AG
- Franz Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for testing magnetic switches at wafer-level stag...
- Patent number 8,451,016
- Issue date May 28, 2013
- STMicroelectronics Pte Ltd
- Ravi Shankar
- G01 - MEASURING TESTING
Information Patent Grant
Clock generator and method for providing reliable clock signal usin...
- Patent number 7,941,723
- Issue date May 10, 2011
- Integrated Device Technology, Inc.
- Chuen-Der Lien
- G01 - MEASURING TESTING
Information Patent Grant
Sensor array and method for detecting the condition of a transistor...
- Patent number 6,856,161
- Issue date Feb 15, 2005
- Infineon Technologies AG
- Roland Thewes
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit provided with means for calibrating an electroni...
- Patent number 6,691,055
- Issue date Feb 10, 2004
- EM Microelectronic-Marin SA
- Fabrice Walter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test structure and method for flash memory tunnel oxide quality
- Patent number 6,613,595
- Issue date Sep 2, 2003
- Macronix International Co., Ltd.
- Tso-Hung Fan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,365,421
- Issue date Apr 2, 2002
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor programmable test arrangement such as an antifuse ID...
- Patent number 6,259,270
- Issue date Jul 10, 2001
- Micron Technology, Inc.
- Todd A. Merritt
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,194,738
- Issue date Feb 27, 2001
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor programmable test arrangement such as an antifuse to...
- Patent number 6,188,239
- Issue date Feb 13, 2001
- Micron Technology, Inc.
- Todd A. Merritt
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
A METHOD OF PRECHARGING A SWITCHABLE FILTER
- Publication number 20240275364
- Publication date Aug 15, 2024
- QDEVIL APS
- Jonatan KUTCHINSKY
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Detecting a Function Section in a Representation of a Quantum Circuit
- Publication number 20240044973
- Publication date Feb 8, 2024
- Classiq Technologies LTD.
- Amir Haveh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS
- Publication number 20230400510
- Publication date Dec 14, 2023
- D-WAVE SYSTEMS INC.
- Jed D. Whittaker
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR DETERMINING THE CONVERSION FACTOR BETWEEN THE VOLTAGE A...
- Publication number 20230194600
- Publication date Jun 22, 2023
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Pierre-André MORTEMOUSQUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CREATING DIPOLE MOMENT MODEL
- Publication number 20230103493
- Publication date Apr 6, 2023
- REALTEK SEMICONDUCTOR CORPORATION
- Min-Hsu TSAI
- G01 - MEASURING TESTING
Information Patent Application
INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD
- Publication number 20220349939
- Publication date Nov 3, 2022
- HERMES TESTING SOLUTIONS INC.
- Bo-Lung CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CROSSTALK ANALYSIS OF QUBITS, COMPUTER DEV...
- Publication number 20220230088
- Publication date Jul 21, 2022
- TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED
- Yuqin CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS
- Publication number 20220178997
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Ungjin JANG
- G11 - INFORMATION STORAGE
Information Patent Application
PARTITIONED FORCE-SENSE SYSTEM FOR TEST EQUIPMENT
- Publication number 20220099739
- Publication date Mar 31, 2022
- Analog Devices, Inc.
- Amit Kumar Singh
- G01 - MEASURING TESTING
Information Patent Application
In-field Monitoring of On-Chip Thermal, Power Distribution Network,...
- Publication number 20210294398
- Publication date Sep 23, 2021
- QUALCOMM Incorporated
- Palkesh JAIN
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD, CALIBRATION APPARATUS, AND PROGRAM
- Publication number 20210116499
- Publication date Apr 22, 2021
- NEC Corporation
- Tsuyoshi YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CURRENT SENSOR AND METHOD FOR SENSING A STRENGTH OF AN ELECTRIC CUR...
- Publication number 20210072309
- Publication date Mar 11, 2021
- INFINEON TECHNOLOGIES AG
- Lifeng GUAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR PROBING SUPERCONDUCTING CIRCUITS INCLUDING THE USE OF A...
- Publication number 20210011082
- Publication date Jan 14, 2021
- Microsoft Technology Licensing, LLC
- Miriam E. Marizan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
EXTERNAL PORT MEASUREMENT OF QUBIT PORT RESPONSES
- Publication number 20200293938
- Publication date Sep 17, 2020
- International Business Machines Corporation
- Firat Solgun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYMBOLIC BACKEND FOR EXECUTION OF QUANTUM PROGRAMS
- Publication number 20200116784
- Publication date Apr 16, 2020
- International Business Machines Corporation
- Peng Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXTERNAL PORT MEASUREMENT OF QUBIT PORT RESPONSES
- Publication number 20200074345
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Firat Solgun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEMS SENSOR TESTING DEVICE, SYSTEM AND ME...
- Publication number 20200048083
- Publication date Feb 13, 2020
- STMicroelectronics S.r.l.
- Federico IACCARINO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...
- Publication number 20190377027
- Publication date Dec 12, 2019
- Advantest Corporation
- Jochen Rivoir
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PIN TEST INTERFACE FOR PIN LIMITED SYSTEMS
- Publication number 20190178937
- Publication date Jun 13, 2019
- Silicon Laboratories Inc.
- Huanhui Zhan
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20170343604
- Publication date Nov 30, 2017
- FU TAI HUA INDUSTRY (SHENZHEN) CO., LTD.
- KANG-XIAN YANG
- G01 - MEASURING TESTING
Information Patent Application
DE-BUGGING ENVIRONMENT WITH SMART CARD
- Publication number 20170082687
- Publication date Mar 23, 2017
- ROLAND W. KLINGER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR TESTING MAGNETIC SWITCHES AT WAFER-LEVEL STAG...
- Publication number 20110156712
- Publication date Jun 30, 2011
- STMicroelectronics Asia Pacific Pte. Ltd.
- Ravi Shankar
- G01 - MEASURING TESTING
Information Patent Application
MEMS SENSOR WITH BUILT-IN SELF-TEST
- Publication number 20100145660
- Publication date Jun 10, 2010
- ROBERT BOSCH GmbH
- Christoph Lang
- G01 - MEASURING TESTING
Information Patent Application
Sensor array and method for detecting the condition of a transistor...
- Publication number 20030155942
- Publication date Aug 21, 2003
- Roland Thewes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Test structure and method for flash memory tunnel oxide quality
- Publication number 20030134442
- Publication date Jul 17, 2003
- Tso-Hung Fan
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for storage of test results within an integrat...
- Publication number 20020006676
- Publication date Jan 17, 2002
- Brett Debenham
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit provided with means for calibrating an electroni...
- Publication number 20010007091
- Publication date Jul 5, 2001
- Fabrice Walter
- G01 - MEASURING TESTING

Testing digital circuits including elements other than semiconductor transistors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test devices, test systems, and operating methods of test systems

Method and system for creating dipole moment model

Calibration method, calibration apparatus, and program

Injection device, semiconductor testing system and its testing method

Injection device, semiconductor testing system and its testing method

Current sensor and method for sensing a strength of an electric cur...

In-field monitoring of on-chip thermal, power distribution network,...

Partitioned force-sense system for test equipment

Integrated circuit having state machine-driven flops in wrapper cha...

Symbolic backend for execution of quantum programs

External port measurement of qubit port responses

Systems for probing superconducting circuits including the use of a...

Testing system and method for in chip decoupling capacitor circuits

Tester and method for testing a device under test and tester and me...

Microelectromechanical systems sensor testing device, system and me...

Single pin test interface for pin limited systems

Method for determining characteristic parameters of an oscillator

External port measurement of qubit port responses

Method for determining the quality factor of an oscillator

Order O(1) algorithm for first-principles calculation of transient...

Detection of current change in an integrated circuit

Device and method for testing magnetic switches at wafer-level stag...

Clock generator and method for providing reliable clock signal usin...

Sensor array and method for detecting the condition of a transistor...

Integrated circuit provided with means for calibrating an electroni...

Test structure and method for flash memory tunnel oxide quality

Method and apparatus for storage of test results within an integrat...

Semiconductor programmable test arrangement such as an antifuse ID...

Method and apparatus for storage of test results within an integrat...

Semiconductor programmable test arrangement such as an antifuse to...

Patents Applicationslast 30 patents

A METHOD OF PRECHARGING A SWITCHABLE FILTER

Detecting a Function Section in a Representation of a Quantum Circuit

SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS

METHODS FOR DETERMINING THE CONVERSION FACTOR BETWEEN THE VOLTAGE A...

METHOD AND SYSTEM FOR CREATING DIPOLE MOMENT MODEL

INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD

METHOD AND APPARATUS FOR CROSSTALK ANALYSIS OF QUBITS, COMPUTER DEV...

TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS

PARTITIONED FORCE-SENSE SYSTEM FOR TEST EQUIPMENT

In-field Monitoring of On-Chip Thermal, Power Distribution Network,...

CALIBRATION METHOD, CALIBRATION APPARATUS, AND PROGRAM

CURRENT SENSOR AND METHOD FOR SENSING A STRENGTH OF AN ELECTRIC CUR...

SYSTEMS FOR PROBING SUPERCONDUCTING CIRCUITS INCLUDING THE USE OF A...

EXTERNAL PORT MEASUREMENT OF QUBIT PORT RESPONSES

SYMBOLIC BACKEND FOR EXECUTION OF QUANTUM PROGRAMS

EXTERNAL PORT MEASUREMENT OF QUBIT PORT RESPONSES

MICROELECTROMECHANICAL SYSTEMS SENSOR TESTING DEVICE, SYSTEM AND ME...

TESTER AND METHOD FOR TESTING A DEVICE UNDER TEST AND TESTER AND ME...

SINGLE PIN TEST INTERFACE FOR PIN LIMITED SYSTEMS

TEST DEVICE

DE-BUGGING ENVIRONMENT WITH SMART CARD

DEVICE AND METHOD FOR TESTING MAGNETIC SWITCHES AT WAFER-LEVEL STAG...

MEMS SENSOR WITH BUILT-IN SELF-TEST

Sensor array and method for detecting the condition of a transistor...

Test structure and method for flash memory tunnel oxide quality

Method and apparatus for storage of test results within an integrat...

Integrated circuit provided with means for calibrating an electroni...