Testing of digital circuits

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CPC
G01R31/317

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/317Testing of digital circuits

Industries

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Patents Grantslast 30 patents

Information Patent Grant
NPU capable of being tested during runtime
- Patent number 12,339,318
- Issue date Jun 24, 2025
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 12,339,305
- Issue date Jun 24, 2025
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Oscillation handling method, apparatus using the same, and storage...
- Patent number 12,339,319
- Issue date Jun 24, 2025
- SHENZHEN HUAPTEC CO., LTD.
- Chuanzhen Ou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of failure analysis for semiconduct...
- Patent number 12,339,321
- Issue date Jun 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Wei Peng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for automatic fault detection in an electronic de...
- Patent number 12,332,304
- Issue date Jun 17, 2025
- Cadence Design Systems, Inc.
- Sushobhit Singh
- G01 - MEASURING TESTING
Information Patent Grant
Built-in testing in modular system-on-chip device
- Patent number 12,332,310
- Issue date Jun 17, 2025
- MARVELL ASIA PTE. LTD.
- Xiongzhi Ning
- G01 - MEASURING TESTING
Information Patent Grant
Transmitter for ultra-high speed and storage device including the same
- Patent number 12,332,307
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Ikjin Jo
- G01 - MEASURING TESTING
Information Patent Grant
Machine-learning-based design-for-test (DFT) recommendation system...
- Patent number 12,333,227
- Issue date Jun 17, 2025
- Synopsys, Inc.
- Apik A Zorian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Constructing quantum processes for quantum processors
- Patent number 12,333,380
- Issue date Jun 17, 2025
- Rigetti & Co, LLC
- William J. Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating and testing semiconductor devices
- Patent number 12,334,170
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Taewook Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for implementing a scalable digital infrastruc...
- Patent number 12,332,306
- Issue date Jun 17, 2025
- TOKYO ELECTRON U.S. HOLDINGS, INC.
- Richard Wunderlich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method to measure simulation to silicon timing correlation
- Patent number 12,332,305
- Issue date Jun 17, 2025
- MediaTek Singapore Pte Ltd.
- Ashish Kumar Nayak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Software and firmware support for device interface board configured...
- Patent number 12,320,851
- Issue date Jun 3, 2025
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test device for testing on-chip clock controller having debug function
- Patent number 12,320,847
- Issue date Jun 3, 2025
- Realtek Semiconductor Corporation
- Sheng-Ping Yung
- G01 - MEASURING TESTING
Information Patent Grant
High throughput sort
- Patent number 12,320,845
- Issue date Jun 3, 2025
- Infineon Technologies AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Grant
Superconductive integrated circuit devices with on-chip testing
- Patent number 12,320,848
- Issue date Jun 3, 2025
- Synopsys, Inc.
- Abdelrahman G. Qoutb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock control circuit and method
- Patent number 12,320,849
- Issue date Jun 3, 2025
- Realtek Semiconductor Corporation
- Yu-Ting Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inspection device for a semiconductor device
- Patent number 12,320,842
- Issue date Jun 3, 2025
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Processor debugging over an interconnect fabric
- Patent number 12,320,843
- Issue date Jun 3, 2025
- International Business Machines Corporation
- Michael James Becht
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for performing clock gating in electro...
- Patent number 12,320,846
- Issue date Jun 3, 2025
- Realtek Semiconductor Corp.
- Ching-Feng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 12,320,844
- Issue date Jun 3, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic voltage frequency scaling to reduce test time
- Patent number 12,320,850
- Issue date Jun 3, 2025
- Mediatek Inc.
- Anshul Varma
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit die test architecture
- Patent number 12,313,667
- Issue date May 27, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Background reads for solid state storage
- Patent number 12,315,576
- Issue date May 27, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test pattern generation-based circuit verification method...
- Patent number 12,313,680
- Issue date May 27, 2025
- Huawei Technologies Co., Ltd.
- Huiling Zhen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating voltage adjustment for aging circuits
- Patent number 12,314,106
- Issue date May 27, 2025
- Advanced Micro Devices, Inc.
- Sriram Sambamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan chains with multi-bit cells and methods for testing the same
- Patent number 12,306,248
- Issue date May 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Mohammed Moiz Khan
- G01 - MEASURING TESTING
Information Patent Grant
On-chip current sensor
- Patent number 12,306,245
- Issue date May 20, 2025
- Texas Instruments Incorporated
- Guha Lakshmanan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 12,306,041
- Issue date May 20, 2025
- INNOLUX CORPORATION
- Kazuyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit in chip and circuit test method
- Patent number 12,306,244
- Issue date May 20, 2025
- Huawei Technologies Co., Ltd.
- Yu Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT FOR DETECTION AND MITIGATION OF DEVICE DAMAGE TO AN ELECTRO...
- Publication number 20250210958
- Publication date Jun 26, 2025
- NXP B.V.
- Rishi BHOOSHAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
AUTOMATED LOW POWER CELL INSERTION IN DFT-ENABLED MULTI POWER PLANE...
- Publication number 20250208206
- Publication date Jun 26, 2025
- Intel Corporation
- Jay RAVAL
- G01 - MEASURING TESTING
Information Patent Application
TEST (DFT) AND DESIGN FOR DEBUG (DFD) GATED POWER DOMAINS
- Publication number 20250208207
- Publication date Jun 26, 2025
- Intel Corporation
- Huah Yuah TAN
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR FAULT ISOLATION WITH SCANNING ELECTRON MI...
- Publication number 20250208208
- Publication date Jun 26, 2025
- Intel Corporation
- Joshua Kevek
- G01 - MEASURING TESTING
Information Patent Application
DEBUG TRACE MICROSECTORS
- Publication number 20250208209
- Publication date Jun 26, 2025
- Altera Corporation
- Sean R. Atsatt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting a Function Section in a Representation of a Quantum Circuit
- Publication number 20250199064
- Publication date Jun 19, 2025
- Classiq Technologies LTD.
- Amir Naveh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST IMPLEMENTATION
- Publication number 20250199066
- Publication date Jun 19, 2025
- STMicroelectronics International N.V.
- Thomas SARNO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST, FAULT INJECTION TESTING SYSTEM AND METHOD FOR FA...
- Publication number 20250199065
- Publication date Jun 19, 2025
- NXP B.V.
- Jean-Michel Cioranesco
- G01 - MEASURING TESTING
Information Patent Application
SCAN FLIP-FLOP
- Publication number 20250199070
- Publication date Jun 19, 2025
- NXP B.V.
- Pramod Gayakwad
- G01 - MEASURING TESTING
Information Patent Application
ARCHITECTURE FOR TESTING MULTIPLE SCAN CHAINS
- Publication number 20250199069
- Publication date Jun 19, 2025
- STMicroelectronics International N.V.
- Enea Dimroci
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING DIES WITH OFF-DIE CLOCKS
- Publication number 20250201637
- Publication date Jun 19, 2025
- ADVANCED MICRO DEVICES, INC.
- Russell Schreiber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCK-UP LATCH FOR DUAL-EDGE-TRIGGERED FLIP-FLOPS
- Publication number 20250192757
- Publication date Jun 12, 2025
- QUALCOMM Incorporated
- Yimai PENG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ERROR DETECTION SYSTEM APPLICABLE TO RTL MODULE AND OPERATION METHO...
- Publication number 20250189578
- Publication date Jun 12, 2025
- TELECHIPS INC.
- Yeongbeen KIM
- G01 - MEASURING TESTING
Information Patent Application
SELF-FUNCTIONAL DETECTION SYSTEM FOR TAP CONTROLLER AND METHOD THEREOF
- Publication number 20250189582
- Publication date Jun 12, 2025
- SQ Technology ( Shanghai ) Corporation
- Xue-Shan Han
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MACHINE FOR FACTORY TESTING OF INTEGRATED CIRCUITS USING...
- Publication number 20250189579
- Publication date Jun 12, 2025
- HIMAX TECHNOLOGIES LIMITED
- Yaw-Guang Chang
- G01 - MEASURING TESTING
Information Patent Application
ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME
- Publication number 20250188326
- Publication date Jun 12, 2025
- SAINT-GOBAIN PERFORMANCE PLASTICS CORPORATION
- Nicky CHAN
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
ANALYZING TRANSMISSION LINES
- Publication number 20250180629
- Publication date Jun 5, 2025
- Teradyne, Inc.
- Tushar Gohel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Subsets of...
- Publication number 20250180643
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring a Duty Cycle of a Clock Signal
- Publication number 20250180644
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Eric SOENEN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER
- Publication number 20250180645
- Publication date Jun 5, 2025
- QUALCOMM Incorporated
- Jais ABRAHAM
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Delayed Me...
- Publication number 20250180642
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
- Publication number 20250174293
- Publication date May 29, 2025
- Samsung Electronics Co., Ltd.
- Jinuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS
- Publication number 20250173233
- Publication date May 29, 2025
- DELL PRODUCTS, L.P.
- Ibrahim Sayyed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20250164556
- Publication date May 22, 2025
- DENSO CORPORATION
- Tomoo MORINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING
- Publication number 20250164554
- Publication date May 22, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Abhinay Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH
- Publication number 20250166716
- Publication date May 22, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AND CHIP TESTING METHOD
- Publication number 20250155501
- Publication date May 15, 2025
- REALTEK SEMICONDUCTOR CORPORATION
- Chang-Hsien Tai
- G01 - MEASURING TESTING
Information Patent Application
DEVICE ACCESS PORT SELECTION
- Publication number 20250155502
- Publication date May 15, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT
- Publication number 20250155503
- Publication date May 15, 2025
- GLOBAL UNICHIP CORPORATION
- Yu-Lun Wan
- G01 - MEASURING TESTING
Information Patent Application
INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...
- Publication number 20250157558
- Publication date May 15, 2025
- COSIGNON
- Sung Ho PARK
- G01 - MEASURING TESTING

Testing of digital circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

NPU capable of being tested during runtime

Method and system for real time outlier detection and product re-bi...

Oscillation handling method, apparatus using the same, and storage...

Semiconductor device and method of failure analysis for semiconduct...

System and method for automatic fault detection in an electronic de...

Built-in testing in modular system-on-chip device

Transmitter for ultra-high speed and storage device including the same

Machine-learning-based design-for-test (DFT) recommendation system...

Constructing quantum processes for quantum processors

Operating and testing semiconductor devices

Apparatus and method for implementing a scalable digital infrastruc...

Circuit and method to measure simulation to silicon timing correlation

Software and firmware support for device interface board configured...

Test device for testing on-chip clock controller having debug function

High throughput sort

Superconductive integrated circuit devices with on-chip testing

Clock control circuit and method

Inspection device for a semiconductor device

Processor debugging over an interconnect fabric

Electronic device and method for performing clock gating in electro...

Integrated circuit profiling and anomaly detection

Dynamic voltage frequency scaling to reduce test time

Integrated circuit die test architecture

Background reads for solid state storage

Automatic test pattern generation-based circuit verification method...

Operating voltage adjustment for aging circuits

Scan chains with multi-bit cells and methods for testing the same

On-chip current sensor

Electronic device

Test circuit in chip and circuit test method

Patents Applicationslast 30 patents

CIRCUIT FOR DETECTION AND MITIGATION OF DEVICE DAMAGE TO AN ELECTRO...

AUTOMATED LOW POWER CELL INSERTION IN DFT-ENABLED MULTI POWER PLANE...

TEST (DFT) AND DESIGN FOR DEBUG (DFD) GATED POWER DOMAINS

METHODS AND APPARATUS FOR FAULT ISOLATION WITH SCANNING ELECTRON MI...

DEBUG TRACE MICROSECTORS

Detecting a Function Section in a Representation of a Quantum Circuit

TEST IMPLEMENTATION

DEVICE UNDER TEST, FAULT INJECTION TESTING SYSTEM AND METHOD FOR FA...

SCAN FLIP-FLOP

ARCHITECTURE FOR TESTING MULTIPLE SCAN CHAINS

DEVICES AND METHODS FOR TESTING DIES WITH OFF-DIE CLOCKS

LOCK-UP LATCH FOR DUAL-EDGE-TRIGGERED FLIP-FLOPS

ERROR DETECTION SYSTEM APPLICABLE TO RTL MODULE AND OPERATION METHO...

SELF-FUNCTIONAL DETECTION SYSTEM FOR TAP CONTROLLER AND METHOD THEREOF

METHOD AND MACHINE FOR FACTORY TESTING OF INTEGRATED CIRCUITS USING...

ADHESIVE COMPOSITION AND METHODS OF FORMING THE SAME

ANALYZING TRANSMISSION LINES

Apparatus and Method for Clock Frequency Estimation With Subsets of...

Device and Method for Measuring a Duty Cycle of a Clock Signal

MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER

Apparatus and Method for Clock Frequency Estimation With Delayed Me...

CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...

ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS

METHOD AND DEVICE OF MANUFACTURING SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING

SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH

CHIP AND CHIP TESTING METHOD

DEVICE ACCESS PORT SELECTION

TESTING CIRCUIT

INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...