Testing of digital circuits

Industry

CPC
G01R31/317

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/317Testing of digital circuits

Industries

Patents Grantslast 30 patents

Information Patent Grant
Software and firmware support for device interface board configured...
- Patent number 12,320,851
- Issue date Jun 3, 2025
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test device for testing on-chip clock controller having debug function
- Patent number 12,320,847
- Issue date Jun 3, 2025
- Realtek Semiconductor Corporation
- Sheng-Ping Yung
- G01 - MEASURING TESTING
Information Patent Grant
High throughput sort
- Patent number 12,320,845
- Issue date Jun 3, 2025
- Infineon Technologies AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Grant
Superconductive integrated circuit devices with on-chip testing
- Patent number 12,320,848
- Issue date Jun 3, 2025
- Synopsys, Inc.
- Abdelrahman G. Qoutb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock control circuit and method
- Patent number 12,320,849
- Issue date Jun 3, 2025
- Realtek Semiconductor Corporation
- Yu-Ting Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inspection device for a semiconductor device
- Patent number 12,320,842
- Issue date Jun 3, 2025
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Processor debugging over an interconnect fabric
- Patent number 12,320,843
- Issue date Jun 3, 2025
- International Business Machines Corporation
- Michael James Becht
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for performing clock gating in electro...
- Patent number 12,320,846
- Issue date Jun 3, 2025
- Realtek Semiconductor Corp.
- Ching-Feng Huang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 12,320,844
- Issue date Jun 3, 2025
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic voltage frequency scaling to reduce test time
- Patent number 12,320,850
- Issue date Jun 3, 2025
- Mediatek Inc.
- Anshul Varma
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit die test architecture
- Patent number 12,313,667
- Issue date May 27, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Background reads for solid state storage
- Patent number 12,315,576
- Issue date May 27, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic test pattern generation-based circuit verification method...
- Patent number 12,313,680
- Issue date May 27, 2025
- Huawei Technologies Co., Ltd.
- Huiling Zhen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Operating voltage adjustment for aging circuits
- Patent number 12,314,106
- Issue date May 27, 2025
- Advanced Micro Devices, Inc.
- Sriram Sambamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan chains with multi-bit cells and methods for testing the same
- Patent number 12,306,248
- Issue date May 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Mohammed Moiz Khan
- G01 - MEASURING TESTING
Information Patent Grant
On-chip current sensor
- Patent number 12,306,245
- Issue date May 20, 2025
- Texas Instruments Incorporated
- Guha Lakshmanan
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 12,306,041
- Issue date May 20, 2025
- INNOLUX CORPORATION
- Kazuyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit in chip and circuit test method
- Patent number 12,306,244
- Issue date May 20, 2025
- Huawei Technologies Co., Ltd.
- Yu Huang
- G01 - MEASURING TESTING
Information Patent Grant
Interactive DRAM signal analyzer and method of analyzing and calibr...
- Patent number 12,308,084
- Issue date May 20, 2025
- COSIGNON
- Sung Ho Park
- G01 - MEASURING TESTING
Information Patent Grant
Partial chain reconfiguration for test time reduction
- Patent number 12,306,246
- Issue date May 20, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Secured scan access for a device including a scan chain
- Patent number 12,298,346
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Mudasir Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive voltage scaling using temperature and performance sensors
- Patent number 12,301,229
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Jose Luis Flores
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-frequency oscillator monitoring circuit
- Patent number 12,298,345
- Issue date May 13, 2025
- Texas Instruments Incorporated
- Brett Forejt
- G01 - MEASURING TESTING
Information Patent Grant
Yield improvements for three-dimensionally stacked neural network a...
- Patent number 12,292,473
- Issue date May 6, 2025
- Google LLC
- Andreas Georg Nowatzyk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 12,287,366
- Issue date Apr 29, 2025
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating a signal test specification, data processing...
- Patent number 12,287,368
- Issue date Apr 29, 2025
- Rohde & Schwarz GmbH & Co. KG
- Markus Herdin
- G01 - MEASURING TESTING
Information Patent Grant
Data gating using scan enable pin
- Patent number 12,287,370
- Issue date Apr 29, 2025
- Apple Inc.
- FNU Rajeev Kumar
- G01 - MEASURING TESTING
Information Patent Grant
GaN HEMT device for irradiation damage detection and detection and...
- Patent number 12,287,360
- Issue date Apr 29, 2025
- Nanjing University
- Feng Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing system and testing method
- Patent number 12,276,698
- Issue date Apr 15, 2025
- ASMedia Technology Inc.
- Te-Ming Kung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZING TRANSMISSION LINES
- Publication number 20250180629
- Publication date Jun 5, 2025
- Teradyne, Inc.
- Tushar Gohel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Subsets of...
- Publication number 20250180643
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring a Duty Cycle of a Clock Signal
- Publication number 20250180644
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Eric SOENEN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER
- Publication number 20250180645
- Publication date Jun 5, 2025
- QUALCOMM Incorporated
- Jais ABRAHAM
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Clock Frequency Estimation With Delayed Me...
- Publication number 20250180642
- Publication date Jun 5, 2025
- MICROCHIP TECHNOLOGY INCORPORATED
- Gary Qu Jin
- G01 - MEASURING TESTING
Information Patent Application
CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...
- Publication number 20250174293
- Publication date May 29, 2025
- Samsung Electronics Co., Ltd.
- Jinuk Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS
- Publication number 20250173233
- Publication date May 29, 2025
- DELL PRODUCTS, L.P.
- Ibrahim Sayyed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20250164556
- Publication date May 22, 2025
- DENSO CORPORATION
- Tomoo MORINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING
- Publication number 20250164554
- Publication date May 22, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Abhinay Patil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH
- Publication number 20250166716
- Publication date May 22, 2025
- PURE STORAGE, INC.
- Hari Kannan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AND CHIP TESTING METHOD
- Publication number 20250155501
- Publication date May 15, 2025
- REALTEK SEMICONDUCTOR CORPORATION
- Chang-Hsien Tai
- G01 - MEASURING TESTING
Information Patent Application
DEVICE ACCESS PORT SELECTION
- Publication number 20250155502
- Publication date May 15, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
TESTING CIRCUIT
- Publication number 20250155503
- Publication date May 15, 2025
- GLOBAL UNICHIP CORPORATION
- Yu-Lun Wan
- G01 - MEASURING TESTING
Information Patent Application
INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...
- Publication number 20250157558
- Publication date May 15, 2025
- COSIGNON
- Sung Ho PARK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHODS FOR JITTER MEASUREMENT
- Publication number 20250155499
- Publication date May 15, 2025
- Analog Devices International Unlimited Company
- Seamus Anthony RYAN
- G01 - MEASURING TESTING
Information Patent Application
Supply Chain Security for Chiplets
- Publication number 20250155500
- Publication date May 15, 2025
- ADVANCED MICRO DEVICES, INC.
- Robert Landon Pelt
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND MEMORY MODULE UNDER TEST
- Publication number 20250157557
- Publication date May 15, 2025
- NANYA TECHNOLOGY CORPORATION
- Bo Jung PENG
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20250147102
- Publication date May 8, 2025
- INFINEON TECHNOLOGIES AG
- Wei Wang
- G01 - MEASURING TESTING
Information Patent Application
BATTERY MANAGEMENT MODULE AND METHOD FOR DETECTING DEFECTIVE NAND G...
- Publication number 20250147100
- Publication date May 8, 2025
- Samsung SDI Co., Ltd.
- Jin Cheol BAE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...
- Publication number 20250149107
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- Sehoon Park
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TESTING METHOD AND APPARATUS
- Publication number 20250147101
- Publication date May 8, 2025
- XIAMEN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE CO., LTD.
- Yonghong HUANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MONITORING A CLOCK SIGNAL
- Publication number 20250138577
- Publication date May 1, 2025
- ARM Limited
- Amit Chhabra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...
- Publication number 20250138088
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR ANALYZING A DEVICE-UNDER-TEST
- Publication number 20250138089
- Publication date May 1, 2025
- ROHDE & SCHWARZ GMBH & CO. KG
- Gerd BRESSER
- G01 - MEASURING TESTING
Information Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
- Publication number 20250130278
- Publication date Apr 24, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD
- Publication number 20250123327
- Publication date Apr 17, 2025
- IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
- Hyungdong ROH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AUTOMATED DATA RETRIEVAL FROM AN INTEGRATED CIRCUIT FOR...
- Publication number 20250123329
- Publication date Apr 17, 2025
- NVIDIA Corporation
- Padmanabham Patki
- G01 - MEASURING TESTING
Information Patent Application
Boundary Scan Power Up Voltage Level Configuration
- Publication number 20250123328
- Publication date Apr 17, 2025
- Ching Sia Lim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING CLOCK PULSES FOR AT-SPEED TESTING...
- Publication number 20250116703
- Publication date Apr 10, 2025
- NXP B.V.
- Chandan Gupta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHOTONIC WAFER LEVEL TESTING SYSTEMS, DEVICES, AND METHODS OF OPERA...
- Publication number 20250116570
- Publication date Apr 10, 2025
- STMicroelectronics S.r.l.
- Marco Piazza
- G01 - MEASURING TESTING

Testing of digital circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Software and firmware support for device interface board configured...

Test device for testing on-chip clock controller having debug function

High throughput sort

Superconductive integrated circuit devices with on-chip testing

Clock control circuit and method

Inspection device for a semiconductor device

Processor debugging over an interconnect fabric

Electronic device and method for performing clock gating in electro...

Integrated circuit profiling and anomaly detection

Dynamic voltage frequency scaling to reduce test time

Integrated circuit die test architecture

Background reads for solid state storage

Automatic test pattern generation-based circuit verification method...

Operating voltage adjustment for aging circuits

Scan chains with multi-bit cells and methods for testing the same

On-chip current sensor

Electronic device

Test circuit in chip and circuit test method

Interactive DRAM signal analyzer and method of analyzing and calibr...

Partial chain reconfiguration for test time reduction

Secured scan access for a device including a scan chain

Adaptive voltage scaling using temperature and performance sensors

Low-frequency oscillator monitoring circuit

Yield improvements for three-dimensionally stacked neural network a...

Automated test equipment comprising a device under test loopback an...

Method for generating a signal test specification, data processing...

Data gating using scan enable pin

GaN HEMT device for irradiation damage detection and detection and...

Component die validation built-in self-test (VBIST) engine

Testing system and testing method

Patents Applicationslast 30 patents

ANALYZING TRANSMISSION LINES

Apparatus and Method for Clock Frequency Estimation With Subsets of...

Device and Method for Measuring a Duty Cycle of a Clock Signal

MODULAR SCAN DATA NETWORK FOR HIGH SPEED SCAN DATA TRANSFER

Apparatus and Method for Clock Frequency Estimation With Delayed Me...

CLOCK CONVERSION DEVICE, TEST SYSTEM INCLUDING THEREOF AND METHOD O...

ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS

METHOD AND DEVICE OF MANUFACTURING SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR FAULT SEQUENCE RECORDING

SYSTEM AND METHOD FOR SOLID STATE MEMORY REFRESH

CHIP AND CHIP TESTING METHOD

DEVICE ACCESS PORT SELECTION

TESTING CIRCUIT

INTERACTIVE DRAM SIGNAL ANALYZER AND METHOD OF ANALYZING AND CALIBR...

APPARATUSES AND METHODS FOR JITTER MEASUREMENT

Supply Chain Security for Chiplets

TESTING METHOD AND MEMORY MODULE UNDER TEST

ELECTRONIC DEVICE

BATTERY MANAGEMENT MODULE AND METHOD FOR DETECTING DEFECTIVE NAND G...

TEST DEVICE, OPERATING METHOD OF TEST DEVICE, AND SEMICONDUCTOR DEV...

CHIP TESTING METHOD AND APPARATUS

METHOD OF MONITORING A CLOCK SIGNAL

PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...

METHODS AND DEVICES FOR ANALYZING A DEVICE-UNDER-TEST

AT-SPEED TEST ACCESS PORT OPERATIONS

JITTER MEASUREMENT CIRCUIT AND JITTER MEASUREMENT METHOD

SYSTEM FOR AUTOMATED DATA RETRIEVAL FROM AN INTEGRATED CIRCUIT FOR...

Boundary Scan Power Up Voltage Level Configuration

SYSTEM AND METHOD FOR GENERATING CLOCK PULSES FOR AT-SPEED TESTING...

PHOTONIC WAFER LEVEL TESTING SYSTEMS, DEVICES, AND METHODS OF OPERA...