Testing of individual semiconductor devices

Industry

CPC
G01R31/26

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/26Testing of individual semiconductor devices

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Integrated current monitor using variable drain-to-source voltages
- Patent number 12,360,152
- Issue date Jul 15, 2025
- NVIDIA Corporation
- Miguel Rodriguez
- G01 - MEASURING TESTING
Information Patent Grant
In-line device electrical property estimating method and test struc...
- Patent number 12,360,153
- Issue date Jul 15, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Chen-Han Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fast transient detection
- Patent number 12,360,139
- Issue date Jul 15, 2025
- Google LLC
- Ali Eltoukhy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 12,360,159
- Issue date Jul 15, 2025
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and manufacturing method
- Patent number 12,360,150
- Issue date Jul 15, 2025
- Fuji Electric Co., Ltd.
- Atsushi Shoji
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing, wafer, and testing station
- Patent number 12,360,151
- Issue date Jul 15, 2025
- Rockley Photonics Limited
- Mohamad Dernaika
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring dynamic on-resistance of nitride...
- Patent number 12,352,800
- Issue date Jul 8, 2025
- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
- Chang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Superluminescent diode with integrated absorber and photodetector
- Patent number 12,356,758
- Issue date Jul 8, 2025
- Intel Corporation
- Karan Mehta
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing for current property of a power transistor
- Patent number 12,352,801
- Issue date Jul 8, 2025
- Infineon Technologies Canada Inc.
- Iman Abdali Mashhadi
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and techniques for predicting end of life based on in situ...
- Patent number 12,352,802
- Issue date Jul 8, 2025
- Infineon Technologies AG
- Georg Georgakos
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 12,345,739
- Issue date Jul 1, 2025
- Mitsubishi Electric Corporation
- Yoshiyuki Ueda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzing an operation of a power semiconductor device
- Patent number 12,345,754
- Issue date Jul 1, 2025
- MASCHINENFABRIK REINHAUSEN GMBH
- Angus Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, manufacturing method of integrated circuit, a...
- Patent number 12,347,708
- Issue date Jul 1, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsung-Fu Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energization inspection apparatus, method for manufacturing semicon...
- Patent number 12,339,309
- Issue date Jun 24, 2025
- Hitachi Power Semiconductor Device, Ltd.
- Masakazu Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring degradation mechanism of switch device in pow...
- Patent number 12,339,310
- Issue date Jun 24, 2025
- CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTI...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for adapting temperatures of semiconductor compon...
- Patent number 12,339,312
- Issue date Jun 24, 2025
- Robert Bosch GmbH
- Karl Oberdieck
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a component, method of testing the component,...
- Patent number 12,339,308
- Issue date Jun 24, 2025
- Advantest Corporation
- Frank Mielke
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring semiconductor-based light sources
- Patent number 12,339,162
- Issue date Jun 24, 2025
- Instrument Systems GmbH
- Reto Häring
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection system
- Patent number 12,332,295
- Issue date Jun 17, 2025
- CHROMA ATE INC.
- Wei-Chih Chen
- G01 - MEASURING TESTING
Information Patent Grant
Active load pull system
- Patent number 12,332,296
- Issue date Jun 17, 2025
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit die test architecture
- Patent number 12,313,667
- Issue date May 27, 2025
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining gate capacitance
- Patent number 12,313,663
- Issue date May 27, 2025
- Microsoft Technology Licensing, LLC
- Jonne Verneri Koski
- G01 - MEASURING TESTING
Information Patent Grant
Battery diode fault monitoring
- Patent number 12,313,668
- Issue date May 27, 2025
- WISK AERO LLC
- Geoffrey Alan Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and tools for electrical property depth profiling using ele...
- Patent number 12,313,669
- Issue date May 27, 2025
- Active Layer Parametrics, Inc.
- Bulent Mehmet Basol
- G01 - MEASURING TESTING
Information Patent Grant
High resolution imaging of microelectronic devices
- Patent number 12,315,105
- Issue date May 27, 2025
- Battelle Memorial Institute
- Thomas F. Kent
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for wafer-level testing
- Patent number 12,313,675
- Issue date May 27, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Jun He
- G01 - MEASURING TESTING
Information Patent Grant
Gate charge and leakage measurement test sequence for solid state d...
- Patent number 12,306,240
- Issue date May 20, 2025
- Infineon Technologies Austria AG
- Leo Aichriedler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting aging-dictated damage or delamin...
- Patent number 12,306,264
- Issue date May 20, 2025
- Siemens Aktiengesellschaft
- Robert Baumgartner
- G01 - MEASURING TESTING
Information Patent Grant
Enclosure detection for reliable optical failsafe
- Patent number 12,306,126
- Issue date May 20, 2025
- Apple Inc.
- Michael K. McCord
- G01 - MEASURING TESTING
Information Patent Grant
Automated probe landing
- Patent number 12,306,241
- Issue date May 20, 2025
- Innovatum Instruments Inc.
- Richard E Stallcup
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEARCH FUNCTION WITH DEVICE MODELING
- Publication number 20250231231
- Publication date Jul 17, 2025
- KEITHLEY INSTRUMENTS, LLC
- Connor Andrew Hemmelgarn
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...
- Publication number 20250233027
- Publication date Jul 17, 2025
- SK HYNIX INC.
- Seong Joo Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING SEMICONDUCTOR MODULES
- Publication number 20250224438
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sunhee Kim
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
- Publication number 20250224423
- Publication date Jul 10, 2025
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
- Publication number 20250216438
- Publication date Jul 3, 2025
- Kabushiki Kaisha Toshiba
- Ryusei MASUDA
- G01 - MEASURING TESTING
Information Patent Application
SMART ELECTRONIC SWITCH
- Publication number 20250219633
- Publication date Jul 3, 2025
- INFINEON TECHNOLOGIES AG
- Robert Illing
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALIT...
- Publication number 20250216418
- Publication date Jul 3, 2025
- CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
- Marco MARCINNO'
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE
- Publication number 20250216439
- Publication date Jul 3, 2025
- INFINEON TECHNOLOGIES AG
- Cristian Mihai Boianceanu
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT BEFORE BEING CO-P...
- Publication number 20250216450
- Publication date Jul 3, 2025
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Jhih-hong CHENG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR LIGHT EMITTING ELEMENT, MANUFACTURING METHOD...
- Publication number 20250208189
- Publication date Jun 26, 2025
- SAMSUNG DISPLAY CO., LTD.
- Chan Woo JOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
- Publication number 20250208210
- Publication date Jun 26, 2025
- Google LLC
- Bhaskar Narayana Talatam
- G01 - MEASURING TESTING
Information Patent Application
PULSE CURRENT APPLICATION DEVICE AND CONTROL METHOD OF PULSE CURREN...
- Publication number 20250211213
- Publication date Jun 26, 2025
- Fuji Electric Co., Ltd.
- Naoki KUMAGAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TITLE DIRECT FLUID COOLING WITH MULTI TEMPERATURE CONTROL
- Publication number 20250208190
- Publication date Jun 26, 2025
- Intel Corporation
- Craig YOST
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...
- Publication number 20250203962
- Publication date Jun 19, 2025
- ROHM CO., LTD.
- Katsuhisa NAGAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEGRADATION DIAGNOSIS SYSTEM, DEGRADATION DIAGNOSIS METHOD, AND POW...
- Publication number 20250199054
- Publication date Jun 19, 2025
- Fuji Electric Co., Ltd.
- Ryoga KIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEM
- Publication number 20250199055
- Publication date Jun 19, 2025
- Industrial Technology Research Institute
- Fu-An Tu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING ELECTRONIC DEVICE THERMAL RESISTA...
- Publication number 20250199053
- Publication date Jun 19, 2025
- NXP USA, Inc.
- Michael Eugene MAJERUS
- G01 - MEASURING TESTING
Information Patent Application
ADAPTER DEVICE FOR CHIP PACKAGING TEST
- Publication number 20250194323
- Publication date Jun 12, 2025
- Jade Bird Display (Shanghai) Limited
- Chenchao XU
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ESTIMATING TEMPERATURE AND MAIN CURRENT OF...
- Publication number 20250180626
- Publication date Jun 5, 2025
- Mitsubishi Electric Corporation
- Yukihiko WADA
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE III-N DEVICES AND STRUCTURES WITH REDUCED CURRENT DEGR...
- Publication number 20250185274
- Publication date Jun 5, 2025
- Transphorm Technology, Inc.
- Davide Bisi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20250180627
- Publication date Jun 5, 2025
- ROHM CO., LTD.
- Satoru KOMINAMI
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF THE TEMPERATURE DEPENDENCY OF A FORWARD RESISTANCE
- Publication number 20250172606
- Publication date May 29, 2025
- ZF Friedrichshafen AG
- Fabian Gross
- B60 - VEHICLES IN GENERAL
Information Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
- Publication number 20250176105
- Publication date May 29, 2025
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTI...
- Publication number 20250174976
- Publication date May 29, 2025
- Monolithic Power Systems, Inc.
- Di Han
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE
- Publication number 20250164545
- Publication date May 22, 2025
- Mitsubishi Electric Corporation
- JULIO BRANDELERO
- G01 - MEASURING TESTING
Information Patent Application
NOISE ANALYSIS APPARATUS, NOISE ANALYSIS METHOD, AND PROGRAM
- Publication number 20250164536
- Publication date May 22, 2025
- Mitsubishi Electric Corporation
- Keita TAKAHASHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Pixel Comparison
- Publication number 20250164544
- Publication date May 22, 2025
- Imagination Technologies Limited
- Marcin JASINSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164543
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
- Publication number 20250164552
- Publication date May 22, 2025
- ATECO INC.
- Taek Seon LEE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
- Publication number 20250155483
- Publication date May 15, 2025
- RENESAS ELECTRONICS CORPORATION
- Takehiro UEDA
- G01 - MEASURING TESTING

Testing of individual semiconductor devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated current monitor using variable drain-to-source voltages

In-line device electrical property estimating method and test struc...

Fast transient detection

Terahertz plasmonics for testing very large-scale integrated circui...

Testing method and manufacturing method

Method of testing, wafer, and testing station

Apparatus and method for measuring dynamic on-resistance of nitride...

Superluminescent diode with integrated absorber and photodetector

Wafer testing for current property of a power transistor

Circuits and techniques for predicting end of life based on in situ...

Semiconductor test apparatus and semiconductor test method

Analyzing an operation of a power semiconductor device

Inspection apparatus, manufacturing method of integrated circuit, a...

Energization inspection apparatus, method for manufacturing semicon...

Method for monitoring degradation mechanism of switch device in pow...

Method and device for adapting temperatures of semiconductor compon...

Apparatus for testing a component, method of testing the component,...

Device and method for measuring semiconductor-based light sources

Wafer inspection system

Active load pull system

Integrated circuit die test architecture

Method and apparatus for determining gate capacitance

Battery diode fault monitoring

Methods and tools for electrical property depth profiling using ele...

High resolution imaging of microelectronic devices

Method and device for wafer-level testing

Gate charge and leakage measurement test sequence for solid state d...

Method and apparatus for detecting aging-dictated damage or delamin...

Enclosure detection for reliable optical failsafe

Automated probe landing

Patents Applicationslast 30 patents

SEARCH FUNCTION WITH DEVICE MODELING

METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...

TESTING SEMICONDUCTOR MODULES

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...

INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM

SMART ELECTRONIC SWITCH

TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALIT...

CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE

TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT BEFORE BEING CO-P...

INSPECTION METHOD FOR LIGHT EMITTING ELEMENT, MANUFACTURING METHOD...

System-Level Testing of a Processing Device Incorporated in a Silic...

PULSE CURRENT APPLICATION DEVICE AND CONTROL METHOD OF PULSE CURREN...

TITLE DIRECT FLUID COOLING WITH MULTI TEMPERATURE CONTROL

SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...

DEGRADATION DIAGNOSIS SYSTEM, DEGRADATION DIAGNOSIS METHOD, AND POW...

DETECTION SYSTEM

SYSTEM AND METHOD FOR DETERMINING ELECTRONIC DEVICE THERMAL RESISTA...

ADAPTER DEVICE FOR CHIP PACKAGING TEST

APPARATUS AND METHOD FOR ESTIMATING TEMPERATURE AND MAIN CURRENT OF...

HIGH VOLTAGE III-N DEVICES AND STRUCTURES WITH REDUCED CURRENT DEGR...

SEMICONDUCTOR TEST APPARATUS

DETERMINATION OF THE TEMPERATURE DEPENDENCY OF A FORWARD RESISTANCE

SELECTIVE TRANSFER OF MICRO DEVICES

SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTI...

MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE

NOISE ANALYSIS APPARATUS, NOISE ANALYSIS METHOD, AND PROGRAM

Pixel Comparison

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME

SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD