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Testing of individual semiconductor devices
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G01R31/26
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/26
Testing of individual semiconductor devices
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated current monitor using variable drain-to-source voltages
Patent number
12,360,152
Issue date
Jul 15, 2025
NVIDIA Corporation
Miguel Rodriguez
G01 - MEASURING TESTING
Information
Patent Grant
In-line device electrical property estimating method and test struc...
Patent number
12,360,153
Issue date
Jul 15, 2025
Taiwan Semiconductor Manufacturing Company Limited
Chen-Han Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast transient detection
Patent number
12,360,139
Issue date
Jul 15, 2025
Google LLC
Ali Eltoukhy
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
Patent number
12,360,159
Issue date
Jul 15, 2025
The Government of the United States, as represented by the Secretary of the Army
Greg Rupper
G01 - MEASURING TESTING
Information
Patent Grant
Testing method and manufacturing method
Patent number
12,360,150
Issue date
Jul 15, 2025
Fuji Electric Co., Ltd.
Atsushi Shoji
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing, wafer, and testing station
Patent number
12,360,151
Issue date
Jul 15, 2025
Rockley Photonics Limited
Mohamad Dernaika
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for measuring dynamic on-resistance of nitride...
Patent number
12,352,800
Issue date
Jul 8, 2025
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
Chang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Superluminescent diode with integrated absorber and photodetector
Patent number
12,356,758
Issue date
Jul 8, 2025
Intel Corporation
Karan Mehta
G01 - MEASURING TESTING
Information
Patent Grant
Wafer testing for current property of a power transistor
Patent number
12,352,801
Issue date
Jul 8, 2025
Infineon Technologies Canada Inc.
Iman Abdali Mashhadi
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and techniques for predicting end of life based on in situ...
Patent number
12,352,802
Issue date
Jul 8, 2025
Infineon Technologies AG
Georg Georgakos
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor test apparatus and semiconductor test method
Patent number
12,345,739
Issue date
Jul 1, 2025
Mitsubishi Electric Corporation
Yoshiyuki Ueda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analyzing an operation of a power semiconductor device
Patent number
12,345,754
Issue date
Jul 1, 2025
MASCHINENFABRIK REINHAUSEN GMBH
Angus Bryant
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus, manufacturing method of integrated circuit, a...
Patent number
12,347,708
Issue date
Jul 1, 2025
Taiwan Semiconductor Manufacturing Company, Ltd
Tsung-Fu Tsai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Energization inspection apparatus, method for manufacturing semicon...
Patent number
12,339,309
Issue date
Jun 24, 2025
Hitachi Power Semiconductor Device, Ltd.
Masakazu Sagawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for monitoring degradation mechanism of switch device in pow...
Patent number
12,339,310
Issue date
Jun 24, 2025
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTI...
Yiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for adapting temperatures of semiconductor compon...
Patent number
12,339,312
Issue date
Jun 24, 2025
Robert Bosch GmbH
Karl Oberdieck
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing a component, method of testing the component,...
Patent number
12,339,308
Issue date
Jun 24, 2025
Advantest Corporation
Frank Mielke
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring semiconductor-based light sources
Patent number
12,339,162
Issue date
Jun 24, 2025
Instrument Systems GmbH
Reto Häring
G01 - MEASURING TESTING
Information
Patent Grant
Wafer inspection system
Patent number
12,332,295
Issue date
Jun 17, 2025
CHROMA ATE INC.
Wei-Chih Chen
G01 - MEASURING TESTING
Information
Patent Grant
Active load pull system
Patent number
12,332,296
Issue date
Jun 17, 2025
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit die test architecture
Patent number
12,313,667
Issue date
May 27, 2025
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining gate capacitance
Patent number
12,313,663
Issue date
May 27, 2025
Microsoft Technology Licensing, LLC
Jonne Verneri Koski
G01 - MEASURING TESTING
Information
Patent Grant
Battery diode fault monitoring
Patent number
12,313,668
Issue date
May 27, 2025
WISK AERO LLC
Geoffrey Alan Long
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and tools for electrical property depth profiling using ele...
Patent number
12,313,669
Issue date
May 27, 2025
Active Layer Parametrics, Inc.
Bulent Mehmet Basol
G01 - MEASURING TESTING
Information
Patent Grant
High resolution imaging of microelectronic devices
Patent number
12,315,105
Issue date
May 27, 2025
Battelle Memorial Institute
Thomas F. Kent
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for wafer-level testing
Patent number
12,313,675
Issue date
May 27, 2025
Taiwan Semiconductor Manufacturing Company Ltd.
Jun He
G01 - MEASURING TESTING
Information
Patent Grant
Gate charge and leakage measurement test sequence for solid state d...
Patent number
12,306,240
Issue date
May 20, 2025
Infineon Technologies Austria AG
Leo Aichriedler
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting aging-dictated damage or delamin...
Patent number
12,306,264
Issue date
May 20, 2025
Siemens Aktiengesellschaft
Robert Baumgartner
G01 - MEASURING TESTING
Information
Patent Grant
Enclosure detection for reliable optical failsafe
Patent number
12,306,126
Issue date
May 20, 2025
Apple Inc.
Michael K. McCord
G01 - MEASURING TESTING
Information
Patent Grant
Automated probe landing
Patent number
12,306,241
Issue date
May 20, 2025
Innovatum Instruments Inc.
Richard E Stallcup
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEARCH FUNCTION WITH DEVICE MODELING
Publication number
20250231231
Publication date
Jul 17, 2025
KEITHLEY INSTRUMENTS, LLC
Connor Andrew Hemmelgarn
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EVALUATING INFLUENCE OF PROCESS ON SEMICON...
Publication number
20250233027
Publication date
Jul 17, 2025
SK HYNIX INC.
Seong Joo Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TESTING SEMICONDUCTOR MODULES
Publication number
20250224438
Publication date
Jul 10, 2025
Samsung Electronics Co., Ltd.
Sunhee Kim
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD...
Publication number
20250224423
Publication date
Jul 10, 2025
Aehr Test Systems
Scott E. Lindsey
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM
Publication number
20250216438
Publication date
Jul 3, 2025
Kabushiki Kaisha Toshiba
Ryusei MASUDA
G01 - MEASURING TESTING
Information
Patent Application
SMART ELECTRONIC SWITCH
Publication number
20250219633
Publication date
Jul 3, 2025
INFINEON TECHNOLOGIES AG
Robert Illing
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEST SYSTEM FOR HIGH-VOLTAGE AND HIGH-CURRENT TESTING ON A PLURALIT...
Publication number
20250216418
Publication date
Jul 3, 2025
CREA COLLAUDI ELETTRONICI AUTOMATIZZATI S.R.L.
Marco MARCINNO'
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT FOR MONITORING DEGRADATION OF A SEMICONDUCTOR DEVICE
Publication number
20250216439
Publication date
Jul 3, 2025
INFINEON TECHNOLOGIES AG
Cristian Mihai Boianceanu
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT BEFORE BEING CO-P...
Publication number
20250216450
Publication date
Jul 3, 2025
CHUNGHWA PRECISION TEST TECH. CO., LTD.
Jhih-hong CHENG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION METHOD FOR LIGHT EMITTING ELEMENT, MANUFACTURING METHOD...
Publication number
20250208189
Publication date
Jun 26, 2025
SAMSUNG DISPLAY CO., LTD.
Chan Woo JOO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System-Level Testing of a Processing Device Incorporated in a Silic...
Publication number
20250208210
Publication date
Jun 26, 2025
Google LLC
Bhaskar Narayana Talatam
G01 - MEASURING TESTING
Information
Patent Application
PULSE CURRENT APPLICATION DEVICE AND CONTROL METHOD OF PULSE CURREN...
Publication number
20250211213
Publication date
Jun 26, 2025
Fuji Electric Co., Ltd.
Naoki KUMAGAI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TITLE DIRECT FLUID COOLING WITH MULTI TEMPERATURE CONTROL
Publication number
20250208190
Publication date
Jun 26, 2025
Intel Corporation
Craig YOST
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DE...
Publication number
20250203962
Publication date
Jun 19, 2025
ROHM CO., LTD.
Katsuhisa NAGAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEGRADATION DIAGNOSIS SYSTEM, DEGRADATION DIAGNOSIS METHOD, AND POW...
Publication number
20250199054
Publication date
Jun 19, 2025
Fuji Electric Co., Ltd.
Ryoga KIGUCHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION SYSTEM
Publication number
20250199055
Publication date
Jun 19, 2025
Industrial Technology Research Institute
Fu-An Tu
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR DETERMINING ELECTRONIC DEVICE THERMAL RESISTA...
Publication number
20250199053
Publication date
Jun 19, 2025
NXP USA, Inc.
Michael Eugene MAJERUS
G01 - MEASURING TESTING
Information
Patent Application
ADAPTER DEVICE FOR CHIP PACKAGING TEST
Publication number
20250194323
Publication date
Jun 12, 2025
Jade Bird Display (Shanghai) Limited
Chenchao XU
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR ESTIMATING TEMPERATURE AND MAIN CURRENT OF...
Publication number
20250180626
Publication date
Jun 5, 2025
Mitsubishi Electric Corporation
Yukihiko WADA
G01 - MEASURING TESTING
Information
Patent Application
HIGH VOLTAGE III-N DEVICES AND STRUCTURES WITH REDUCED CURRENT DEGR...
Publication number
20250185274
Publication date
Jun 5, 2025
Transphorm Technology, Inc.
Davide Bisi
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TEST APPARATUS
Publication number
20250180627
Publication date
Jun 5, 2025
ROHM CO., LTD.
Satoru KOMINAMI
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF THE TEMPERATURE DEPENDENCY OF A FORWARD RESISTANCE
Publication number
20250172606
Publication date
May 29, 2025
ZF Friedrichshafen AG
Fabian Gross
B60 - VEHICLES IN GENERAL
Information
Patent Application
SELECTIVE TRANSFER OF MICRO DEVICES
Publication number
20250176105
Publication date
May 29, 2025
VueReal Inc.
Gholamreza Chaji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SMART POWER SEMICONDUCTOR SWITCH DEVICE WITH SELF-DIAGNOSTIC FUNCTI...
Publication number
20250174976
Publication date
May 29, 2025
Monolithic Power Systems, Inc.
Di Han
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
MEASUREMENT METHOD OF FLATBAND VOLTAGE OF POWER SEMICONDUCTOR MODULE
Publication number
20250164545
Publication date
May 22, 2025
Mitsubishi Electric Corporation
JULIO BRANDELERO
G01 - MEASURING TESTING
Information
Patent Application
NOISE ANALYSIS APPARATUS, NOISE ANALYSIS METHOD, AND PROGRAM
Publication number
20250164536
Publication date
May 22, 2025
Mitsubishi Electric Corporation
Keita TAKAHASHI
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Pixel Comparison
Publication number
20250164544
Publication date
May 22, 2025
Imagination Technologies Limited
Marcin JASINSKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
Publication number
20250164543
Publication date
May 22, 2025
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
TEST TRAY FOR SEMICONDUCTOR DEVICES AND TEST APPARATUS USING THE SAME
Publication number
20250164552
Publication date
May 22, 2025
ATECO INC.
Taek Seon LEE
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND SEMICONDUCTOR MEASUREMENT METHOD
Publication number
20250155483
Publication date
May 15, 2025
RENESAS ELECTRONICS CORPORATION
Takehiro UEDA
G01 - MEASURING TESTING