Testing of individual semiconductor devices

Industry

CPC
G01R31/26

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/26Testing of individual semiconductor devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Test circuit of semiconductor apparatus and test system including t...
- Patent number 12,283,533
- Issue date Apr 22, 2025
- SK Hynix Inc.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupling probe for micro device inspection
- Patent number 12,276,679
- Issue date Apr 15, 2025
- VueReal Inc.
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, and method for manufacturing semiconductor de...
- Patent number 12,278,262
- Issue date Apr 15, 2025
- Rohm Co., Ltd.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for estimating parameters of a junction of a power semi-cond...
- Patent number 12,270,715
- Issue date Apr 8, 2025
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Switch short-circuited diagnosis method
- Patent number 12,270,851
- Issue date Apr 8, 2025
- Delta Electronics, Inc.
- Kai-Wei Hu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device testing with lead extender
- Patent number 12,270,850
- Issue date Apr 8, 2025
- Infineon Technologies AG
- Soon Lai Kho
- G01 - MEASURING TESTING
Information Patent Grant
Digital loop dual-stage source measure unit
- Patent number 12,265,115
- Issue date Apr 1, 2025
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting light-emitting diode
- Patent number 12,265,116
- Issue date Apr 1, 2025
- Century Technology (Shenzhen) Corporation Limited
- Kuang-Hua Liu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser inspection apparatus
- Patent number 12,259,408
- Issue date Mar 25, 2025
- Mitsubishi Electric Corporation
- Yohei Mikami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuits and techniques for predicting failure of circuits based on...
- Patent number 12,254,254
- Issue date Mar 18, 2025
- Infineon Technologies AG
- Veit Kleeberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prediction of electrical properties of a semiconductor specimen
- Patent number 12,250,503
- Issue date Mar 11, 2025
- Applied Materials Israel Ltd.
- Ofer Adan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode test module for monitoring leakage current and its method the...
- Patent number 12,248,019
- Issue date Mar 11, 2025
- Amazing Microelectronic Corp.
- Chih-Ting Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation of life of switching devices
- Patent number 12,248,016
- Issue date Mar 11, 2025
- EATON INTELLIGENT POWER LIMITED
- Deepak Balaji Somayajula
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus
- Patent number 12,241,926
- Issue date Mar 4, 2025
- Advantest Corporation
- Naoyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level semiconductor high-voltage reliability test fixture
- Patent number 12,228,603
- Issue date Feb 18, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring an ideal diode
- Patent number 12,228,604
- Issue date Feb 18, 2025
- Continental Automotive Technologies GmbH
- Sebastien Bernard
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
Model parameter test structures for transistors and preparation met...
- Patent number 12,224,216
- Issue date Feb 11, 2025
- Changxin Memory Technologies, Inc.
- Guochao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,218,658
- Issue date Feb 4, 2025
- Leoni-Bordnetz Systeme GmbH
- Matthias Ebert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Degradation detection device and degradation detection method
- Patent number 12,216,149
- Issue date Feb 4, 2025
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 12,210,053
- Issue date Jan 28, 2025
- Dyi-Chung Hu
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,209,996
- Issue date Jan 28, 2025
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting light-emitting diode dies
- Patent number 12,203,971
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for automatically monitored signalling of a vehicle state an...
- Patent number 12,202,497
- Issue date Jan 21, 2025
- Valeo Schalter und Sensoren GmbH
- Sascha Staude
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
Methods, Apparatuses and Composite Power Switch Capable of Detectin...
- Publication number 20250130267
- Publication date Apr 24, 2025
- Weltrend Semiconductor Inc.
- Hui-Yuan HSU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST APPARATUS
- Publication number 20250130268
- Publication date Apr 24, 2025
- Samsung Electronics Co., Ltd.
- Chunghyun KIM
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE O...
- Publication number 20250130270
- Publication date Apr 24, 2025
- INFINEON TECHNOLOGIES AG
- Guang Zeng
- G01 - MEASURING TESTING
Information Patent Application
POWER TRANSISTOR AGE DETECTION
- Publication number 20250130269
- Publication date Apr 24, 2025
- Infineon Technologies Canada Inc.
- Lucas Andrew MILNER
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Module Inspection Device
- Publication number 20250130252
- Publication date Apr 24, 2025
- Nippon Telegraph and Telephone Corporation
- Masayuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING LIGHT EMITTING DIODE PACKAGE
- Publication number 20250130271
- Publication date Apr 24, 2025
- Taiwan-Asia Semiconductor Corporation
- Chih-Hung CHEN
- G01 - MEASURING TESTING
Information Patent Application
DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELA...
- Publication number 20250123330
- Publication date Apr 17, 2025
- CreeLED, Inc.
- Christopher P. Hussell
- G01 - MEASURING TESTING
Information Patent Application
APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...
- Publication number 20250123320
- Publication date Apr 17, 2025
- InZiv Ltd.
- David Judah Lewis
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR LED TEST SYSTEM
- Publication number 20250123319
- Publication date Apr 17, 2025
- Teradyne, Inc.
- Frank Brian Parrish
- G01 - MEASURING TESTING
Information Patent Application
MONITOR STRUCTURES FOR MEASURING DEVICE IMPEDANCE
- Publication number 20250123316
- Publication date Apr 17, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Gang XUE
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TESTING METHOD
- Publication number 20250123317
- Publication date Apr 17, 2025
- Fuji Electric Co., Ltd.
- Yuki SAWA
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DETECTION DEVICE
- Publication number 20250123318
- Publication date Apr 17, 2025
- YAZAKI CORPORATION
- Atsushi Takahashi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250118687
- Publication date Apr 10, 2025
- Fuji Electric Co., Ltd.
- Daisuke ISOBE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR INSPECTING JUNCTION PORTION OF POWER MODULE
- Publication number 20250116695
- Publication date Apr 10, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE VARIATION EXTRACTION CHIP
- Publication number 20250102556
- Publication date Mar 27, 2025
- Shanghai Huali Integrated Circuit Corporation
- Pinhan CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING RDSon, RDSoff AND CURRENT COLLAPSE...
- Publication number 20250102557
- Publication date Mar 27, 2025
- Microtesters, LLC
- Andre Claude Olivier
- G01 - MEASURING TESTING
Information Patent Application
CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...
- Publication number 20250102559
- Publication date Mar 27, 2025
- ASTI GLOBAL INC., TAIWAN
- CHIEN-SHOU LIAO
- G01 - MEASURING TESTING
Information Patent Application
PULSED LASER MICRO LED INSPECTION
- Publication number 20250102558
- Publication date Mar 27, 2025
- ORBOTECH LTD.
- Arie Glazer
- G01 - MEASURING TESTING
Information Patent Application
Switching Transient Based Junction Temperature Estimation of SiC MO...
- Publication number 20250102369
- Publication date Mar 27, 2025
- Board of Regents, The University of Texas System
- Bilal Akin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHOTONIC DEVICE, A PHOTONIC SYSTEM COMPRISING THE PHOTONIC DEVICE A...
- Publication number 20250107274
- Publication date Mar 27, 2025
- Junsheng XIE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250098192
- Publication date Mar 20, 2025
- Fuji Electric Co., Ltd.
- Shigeki SATO
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Calibrating a Wireless Harness Automated Me...
- Publication number 20250093388
- Publication date Mar 20, 2025
- Lockheed Martin Corporation
- Kevin Bell
- G01 - MEASURING TESTING
Information Patent Application
CONTROL CIRCUIT AND SEMICONDUCTOR MODULE
- Publication number 20250085330
- Publication date Mar 13, 2025
- Fuji Electric Co., Ltd.
- Tatsuya OYOBIKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FA...
- Publication number 20250085329
- Publication date Mar 13, 2025
- Samsung Electronics Co., Ltd.
- Donghun Heo
- G01 - MEASURING TESTING
Information Patent Application
CARRIER-RESOLVED HALL MEASUREMENT WITH MULTI-HARMONIC MAGNETORESIST...
- Publication number 20250085331
- Publication date Mar 13, 2025
- International Business Machines Corporation
- Oki GUNAWAN
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU CHIP DESIGN FOR PULSE IV SELF-HEATING EVALUATION
- Publication number 20250076365
- Publication date Mar 6, 2025
- International Business Machines Corporation
- HUIMEI ZHOU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT RESISTANCE MEASUREMENT METHOD
- Publication number 20250076355
- Publication date Mar 6, 2025
- INFINEON TECHNOLOGIES AG
- Ralf Arnold
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...
- Publication number 20250076390
- Publication date Mar 6, 2025
- Hyundai Motor Company
- Tae Woo KWANG
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus and Mounting Base
- Publication number 20250076232
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Shigeru KASAI
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...
- Publication number 20250081714
- Publication date Mar 6, 2025
- KYULUX, INC.
- Hayato KAKIZOE
- G01 - MEASURING TESTING

Testing of individual semiconductor devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Test circuit of semiconductor apparatus and test system including t...

Coupling probe for micro device inspection

Semiconductor device, and method for manufacturing semiconductor de...

Method for estimating parameters of a junction of a power semi-cond...

Switch short-circuited diagnosis method

Semiconductor device testing with lead extender

Digital loop dual-stage source measure unit

Device and method for detecting light-emitting diode

Semiconductor laser inspection apparatus

Circuits and techniques for predicting failure of circuits based on...

Prediction of electrical properties of a semiconductor specimen

Diode test module for monitoring leakage current and its method the...

Estimation of life of switching devices

Test apparatus

Wafer metrology technologies

Composite intermediary device using vertical probe for wafer testing

Wafer-level semiconductor high-voltage reliability test fixture

Monitoring an ideal diode

System and method of measuring capacitance of device-under-test

Illuminator method and device for semiconductor package testing

Model parameter test structures for transistors and preparation met...

On-die aging measurements for dynamic timing modeling

System and method for identifying non-switching semiconductor switches

Degradation detection device and degradation detection method

Semiconductor device

Ultrasonic testing device and ultrasonic testing method

Monitoring semiconductor reliability and predicting device failure...

Apparatus and method for inspecting light-emitting diode dies

Semiconductor fault analysis device and semiconductor fault analysi...

System for automatically monitored signalling of a vehicle state an...

Patents Applicationslast 30 patents

Methods, Apparatuses and Composite Power Switch Capable of Detectin...

SEMICONDUCTOR TEST APPARATUS

TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE O...

POWER TRANSISTOR AGE DETECTION

Semiconductor Module Inspection Device

METHOD FOR INSPECTING LIGHT EMITTING DIODE PACKAGE

DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELA...

APPROACHES AND PROBES FOR EXCITATION, DETECTION, AND SENSING OF DEV...

PROBE HEAD FOR LED TEST SYSTEM

MONITOR STRUCTURES FOR MEASURING DEVICE IMPEDANCE

TEST CIRCUIT AND TESTING METHOD

FAILURE DETECTION DEVICE

SEMICONDUCTOR DEVICE

METHOD AND DEVICE FOR INSPECTING JUNCTION PORTION OF POWER MODULE

DEVICE VARIATION EXTRACTION CHIP

SYSTEM AND METHOD FOR MEASURING RDSon, RDSoff AND CURRENT COLLAPSE...

CHIP ELECTRICAL PROPERTY DETECTION DEVICE AND METHOD OF MANUFACTURI...

PULSED LASER MICRO LED INSPECTION

Switching Transient Based Junction Temperature Estimation of SiC MO...

PHOTONIC DEVICE, A PHOTONIC SYSTEM COMPRISING THE PHOTONIC DEVICE A...

SEMICONDUCTOR DEVICE

Systems and Methods for Calibrating a Wireless Harness Automated Me...

CONTROL CIRCUIT AND SEMICONDUCTOR MODULE

SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FA...

CARRIER-RESOLVED HALL MEASUREMENT WITH MULTI-HARMONIC MAGNETORESIST...

IN-SITU CHIP DESIGN FOR PULSE IV SELF-HEATING EVALUATION

CONTACT RESISTANCE MEASUREMENT METHOD

TESTING APPARATUS FOR POWER MODULE WITH INTEGRATED DC TEST AND WITH...

Inspection Apparatus and Mounting Base

ORGANIC LIGHT-EMITTING ELEMENT, METHOD FOR EVALUATING DELAYED FLUOR...