Testing of individual semiconductor devices

Industry

CPC
G01R31/26

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/26Testing of individual semiconductor devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Wafer-level semiconductor high-voltage reliability test fixture
- Patent number 12,228,603
- Issue date Feb 18, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe Lian
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring an ideal diode
- Patent number 12,228,604
- Issue date Feb 18, 2025
- Continental Automotive Technologies GmbH
- Sebastien Bernard
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method of measuring capacitance of device-under-test
- Patent number 12,228,598
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
Model parameter test structures for transistors and preparation met...
- Patent number 12,224,216
- Issue date Feb 11, 2025
- Changxin Memory Technologies, Inc.
- Guochao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,218,658
- Issue date Feb 4, 2025
- Leoni-Bordnetz Systeme GmbH
- Matthias Ebert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-die aging measurements for dynamic timing modeling
- Patent number 12,216,150
- Issue date Feb 4, 2025
- Altera Corporation
- Dheeraj Subbareddy
- G01 - MEASURING TESTING
Information Patent Grant
Degradation detection device and degradation detection method
- Patent number 12,216,149
- Issue date Feb 4, 2025
- Kabushiki Kaisha Toshiba
- Hideaki Majima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 12,210,053
- Issue date Jan 28, 2025
- Dyi-Chung Hu
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic testing device and ultrasonic testing method
- Patent number 12,209,996
- Issue date Jan 28, 2025
- National University Corporation Toyohashi University of Technology
- Naohiro Hozumi
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring semiconductor reliability and predicting device failure...
- Patent number 12,203,973
- Issue date Jan 21, 2025
- Tartan Silicon Systems, Inc.
- Alan Paul Aronoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting light-emitting diode dies
- Patent number 12,203,971
- Issue date Jan 21, 2025
- Industrial Technology Research Institute
- Yan-Rung Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for automatically monitored signalling of a vehicle state an...
- Patent number 12,202,497
- Issue date Jan 21, 2025
- Valeo Schalter und Sensoren GmbH
- Sascha Staude
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate drive circuit, test device, and switching method
- Patent number 12,206,390
- Issue date Jan 21, 2025
- Sintokogio, Ltd.
- Masayoshi Takinami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Display panel and burn-in test method of the display panel
- Patent number 12,203,972
- Issue date Jan 21, 2025
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Jida Hou
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying non-switching semiconductor switches
- Patent number 12,203,988
- Issue date Jan 21, 2025
- Leoni-Bordnetz Systeme GmbH
- Wolfgang Koch
- G01 - MEASURING TESTING
Information Patent Grant
Selective micro device transfer to receiver substrate
- Patent number 12,199,058
- Issue date Jan 14, 2025
- VueReal Inc.
- Gholamreza Chaji
- G01 - MEASURING TESTING
Information Patent Grant
Two-domain two-stage sensing front-end circuits and systems
- Patent number 12,196,801
- Issue date Jan 14, 2025
- Samsung Display Co., Ltd.
- Ali Fazli Yeknami
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device and method for inspecting semicondu...
- Patent number 12,196,802
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for testing inaccessible interface circuits i...
- Patent number 12,196,805
- Issue date Jan 14, 2025
- RAMBUS INC.
- Frederick A. Ware
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing light-emitting devices
- Patent number 12,188,974
- Issue date Jan 7, 2025
- Epistar Corporation
- Sheng Jie Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices comprising failure detectors for detecting fa...
- Patent number 12,181,512
- Issue date Dec 31, 2024
- Samsung Electronics Co., Ltd.
- Donghun Heo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method
- Patent number 12,181,513
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Shota Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing wafer, electronic device and storage...
- Patent number 12,181,511
- Issue date Dec 31, 2024
- Saimeite Technology Co., Ltd.
- Lincheng Han
- G01 - MEASURING TESTING
Information Patent Grant
Luminous flux test circuitry, test method and display panel
- Patent number 12,181,338
- Issue date Dec 31, 2024
- Beijing BOE Optoelectronics Technology Co., Ltd
- Yifan Song
- G01 - MEASURING TESTING
Information Patent Grant
Onboard circuits and methods to predict the health of critical elem...
- Patent number 12,174,237
- Issue date Dec 24, 2024
- University of Houston System
- Harish Krishnamoorthy
- G01 - MEASURING TESTING
Information Patent Grant
Array substrate, display panel, and method of testing array substrate
- Patent number 12,175,898
- Issue date Dec 24, 2024
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Probe module for inspecting display panel, panel inspection apparat...
- Patent number 12,175,942
- Issue date Dec 24, 2024
- LX Semicon Co., Ltd.
- Ho Min Lim
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER DEVICE THRESHOLD VOLTAGE MEASUREMENT CIRCUIT AND OPERATION ME...
- Publication number 20250060403
- Publication date Feb 20, 2025
- National Yang Ming Chiao Tung University
- Rustam Kumar
- G01 - MEASURING TESTING
Information Patent Application
GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR...
- Publication number 20250060404
- Publication date Feb 20, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Ann LAI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AN ADAPTIVE BODY BIASING SYSTEM FOR SILICON ON INSULATOR SEMICONDUC...
- Publication number 20250055455
- Publication date Feb 13, 2025
- RACYICS GMBH
- Alexander OEFELEIN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET
- Publication number 20250052805
- Publication date Feb 13, 2025
- Continental Automotive Technologies GmbH
- Erwin Kessler
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF
- Publication number 20250051104
- Publication date Feb 13, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Renwei TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING
- Publication number 20250044393
- Publication date Feb 6, 2025
- Silicon Laboratories Inc.
- Anant Verma
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES
- Publication number 20250044342
- Publication date Feb 6, 2025
- SK HYNIX INC.
- Ki Hyuk SUNG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING TURN-OFF NEGATIVE VOLTAGE OF S...
- Publication number 20250030357
- Publication date Jan 23, 2025
- ANHUI WELLING AUTO PARTS CORPORATION LIMITED
- Hongkang SHI
- G01 - MEASURING TESTING
Information Patent Application
Electro-optical device via arrangement
- Publication number 20250028112
- Publication date Jan 23, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Giovanni Delrosso
- G01 - MEASURING TESTING
Information Patent Application
PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE
- Publication number 20250030335
- Publication date Jan 23, 2025
- Infineon Technologies Austria AG
- Diego RAFFO
- G01 - MEASURING TESTING
Information Patent Application
STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE
- Publication number 20250027985
- Publication date Jan 23, 2025
- STMicroelectronics International N.V.
- Emanuele Moretti
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING ELEMENT DRIVING DEVICE
- Publication number 20250024573
- Publication date Jan 16, 2025
- Rohm Co., Ltd.
- Keisuke Miura
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
LAMP MANUFACTURING PROCESS
- Publication number 20250020733
- Publication date Jan 16, 2025
- Llink Technologies, L.L.C
- Jeff Goulet
- B60 - VEHICLES IN GENERAL
Information Patent Application
SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING
- Publication number 20250020710
- Publication date Jan 16, 2025
- STMicroelectronics International N.V.
- Francesco Rundo
- G01 - MEASURING TESTING
Information Patent Application
Method for monitoring a semiconductor switch for failure and invert...
- Publication number 20250020711
- Publication date Jan 16, 2025
- SEG Automotive Germany GmbH
- Nima SAADAT
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP
- Publication number 20250015565
- Publication date Jan 9, 2025
- Nichia Corporation.
- Tomokazu TAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TESTING TOTAL DOSE EFFECT OF SIC MOSFET DEVICE
- Publication number 20250012846
- Publication date Jan 9, 2025
- CHINA ACADEMY OF SPACE TECHNOLOGY
- Qingkui YU
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM
- Publication number 20250012847
- Publication date Jan 9, 2025
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...
- Publication number 20250012848
- Publication date Jan 9, 2025
- UNIVERSITE GUSTAVE EIFFEL
- Zoubir KHATIR
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE
- Publication number 20250015030
- Publication date Jan 9, 2025
- VueReal Inc.
- Gholamreza CHAJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH
- Publication number 20250012843
- Publication date Jan 9, 2025
- DENSO CORPORATION
- Akira TOKUMASU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
RESISTIVE-NETWORK CELL REGION, BUILT-IN SELF-TESTER INCLUDING SAME,...
- Publication number 20250012844
- Publication date Jan 9, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Huan-Neng CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE
- Publication number 20250012845
- Publication date Jan 9, 2025
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS
- Publication number 20250012849
- Publication date Jan 9, 2025
- ams-OSRAM International GmbH
- Siegfried Herrmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING CIRCUIT AND CORRESPONDING METHOD
- Publication number 20250004020
- Publication date Jan 2, 2025
- STMicroelectronics International N.V.
- Romeo LETOR
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING
- Publication number 20250004034
- Publication date Jan 2, 2025
- Analog Devices International Unlimited Company
- Edward John Coyne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE
- Publication number 20250004036
- Publication date Jan 2, 2025
- Sharp Display Technology Corporation
- Masahiro MITANI
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURIN...
- Publication number 20250004035
- Publication date Jan 2, 2025
- Intel Corporation
- Krzysztof DOMANSKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...
- Publication number 20250004037
- Publication date Jan 2, 2025
- TRUMPF Photonic Components GmbH
- Sven Bader
- H01 - BASIC ELECTRIC ELEMENTS

Testing of individual semiconductor devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Wafer-level semiconductor high-voltage reliability test fixture

Monitoring an ideal diode

System and method of measuring capacitance of device-under-test

Illuminator method and device for semiconductor package testing

Model parameter test structures for transistors and preparation met...

System and method for identifying non-switching semiconductor switches

On-die aging measurements for dynamic timing modeling

Degradation detection device and degradation detection method

Semiconductor device

Ultrasonic testing device and ultrasonic testing method

Monitoring semiconductor reliability and predicting device failure...

Apparatus and method for inspecting light-emitting diode dies

System for automatically monitored signalling of a vehicle state an...

Semiconductor fault analysis device and semiconductor fault analysi...

Gate drive circuit, test device, and switching method

Display panel and burn-in test method of the display panel

System and method for identifying non-switching semiconductor switches

Selective micro device transfer to receiver substrate

Two-domain two-stage sensing front-end circuits and systems

Semiconductor inspection device and method for inspecting semicondu...

Methods and apparatus for testing inaccessible interface circuits i...

Method for testing light-emitting devices

Semiconductor devices comprising failure detectors for detecting fa...

Inspection method

Method and device for testing wafer, electronic device and storage...

Luminous flux test circuitry, test method and display panel

Onboard circuits and methods to predict the health of critical elem...

Array substrate, display panel, and method of testing array substrate

Probe module for inspecting display panel, panel inspection apparat...

Intelligent wafer-level testing of photonic devices

Patents Applicationslast 30 patents

POWER DEVICE THRESHOLD VOLTAGE MEASUREMENT CIRCUIT AND OPERATION ME...

GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR...

AN ADAPTIVE BODY BIASING SYSTEM FOR SILICON ON INSULATOR SEMICONDUC...

METHOD FOR CHECKING THE SWITCH-OFF CAPABILITY OF A MOSFET

CHIP TURRET SORTING APPARATUS AND FORMATION METHOD THEREOF

FAST RF POWER MEASUREMENT APPARATUS FOR PRODUCTION TESTING

ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES

METHOD AND APPARATUS FOR DETERMINING TURN-OFF NEGATIVE VOLTAGE OF S...

Electro-optical device via arrangement

PROTECTING A POWER INVERTER BY SENSING A PHASE NODE VOLTAGE

STRESS CALIBRATION METHOD, CORRESPONDING ELECTRONIC DEVICE

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

LIGHT-EMITTING ELEMENT DRIVING DEVICE

LAMP MANUFACTURING PROCESS

SYSTEM AND METHOD FOR VOLTAGE DRIFT MONITORING

Method for monitoring a semiconductor switch for failure and invert...

LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP

METHOD FOR TESTING TOTAL DOSE EFFECT OF SIC MOSFET DEVICE

TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM

METHOD AND DEVICE FOR MEASURING THE STATE OF HEALTH OF SEMICONDUCTO...

SELECTIVE MICRO DEVICE TRANSFER TO RECEIVER SUBSTRATE

SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH

RESISTIVE-NETWORK CELL REGION, BUILT-IN SELF-TESTER INCLUDING SAME,...

WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTURE

ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS

MONITORING CIRCUIT AND CORRESPONDING METHOD

SEMICONDUCTOR DEVICE CONFIGURED FOR GATE DIELECTRIC MONITORING

DISPLAY DEVICE AND INSPECTION METHOD USING DISPLAY DEVICE

ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURIN...

METHOD FOR PROVIDING A CALIBRATION NUMBER, COMPUTER PROGRAM PRODUCT...