Testing of individual semiconductor devices

Industry

CPC
G01R31/26

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/26Testing of individual semiconductor devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Monitoring circuit monitoring performance of transistors
- Patent number 11,982,702
- Issue date May 14, 2024
- SK Hynix Inc.
- Sung Mook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Display device and method of driving display device
- Patent number 11,984,053
- Issue date May 14, 2024
- SHARP KABUSHIKI KAISHA
- Hirohisa Yamada
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Test method
- Patent number 11,982,701
- Issue date May 14, 2024
- Fuji Electric Co., Ltd.
- Shuhei Tatemichi
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring a protective device that includes a series ci...
- Patent number 11,982,703
- Issue date May 14, 2024
- Siemens Energy Global GmbH & Co. KG
- Nils Stahlhut
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Power device monitoring system and monitoring method
- Patent number 11,977,103
- Issue date May 7, 2024
- LS ELECTRIC CO., LTD.
- Sunghee Kang
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection of the varactor diodes in varactor metasurface a...
- Patent number 11,978,958
- Issue date May 7, 2024
- KYMETA CORPORATION
- Hussein Esfahlani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pull out-assisting linkage device for test load board of automatic...
- Patent number 11,977,111
- Issue date May 7, 2024
- Zhijie Bao
- G01 - MEASURING TESTING
Information Patent Grant
Display device
- Patent number 11,978,678
- Issue date May 7, 2024
- Innolux Corporation
- Tung-Kai Liu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Optical probe, optical probe array, optical probe card, and method...
- Patent number 11,971,431
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Injection device and inspection and repairing method
- Patent number 11,971,444
- Issue date Apr 30, 2024
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,971,364
- Issue date Apr 30, 2024
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
- Patent number 11,965,911
- Issue date Apr 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Method of analyzing semiconductor structure
- Patent number 11,959,958
- Issue date Apr 16, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yi Min Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip providing on-chip self-testing of an ana-log-to-...
- Patent number 11,962,320
- Issue date Apr 16, 2024
- Intel Corporation
- Kameran Azadet
- G01 - MEASURING TESTING
Information Patent Grant
Battery diode fault monitoring
- Patent number 11,953,540
- Issue date Apr 9, 2024
- WISK AERO LLC
- Geoffrey Alan Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus, image capturing apparatus, image capturing...
- Patent number 11,953,541
- Issue date Apr 9, 2024
- Canon Kabushiki Kaisha
- Kei Ochiai
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Switching matrix system and operating method thereof for semiconduc...
- Patent number 11,953,518
- Issue date Apr 9, 2024
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Test device and test method thereof
- Patent number 11,953,537
- Issue date Apr 9, 2024
- YUNGU (GU'AN) TECHNOLOGY CO., LTD.
- Zhaoyang Xi
- G01 - MEASURING TESTING
Information Patent Grant
Test method for tolerance against the hot carrier effect
- Patent number 11,953,542
- Issue date Apr 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yifei Pan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for predicting insulated gate bipolar transistor...
- Patent number 11,953,538
- Issue date Apr 9, 2024
- WUHAN UNIVERSITY
- Yigang He
- G01 - MEASURING TESTING
Information Patent Grant
Machine operation monitoring
- Patent number 11,953,539
- Issue date Apr 9, 2024
- Hitech & Development Wireless Sweden AB
- Örjan Fritz
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electronic device for managing degree of degradation
- Patent number 11,946,967
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Dong-Uk Ryu
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method for railroad smart flasher lamps
- Patent number 11,943,852
- Issue date Mar 26, 2024
- BNSF Railway Company
- Ross Martin Sterling
- B61 - RAILWAYS
Information Patent Grant
System for determining leakage current of a field effect transistor...
- Patent number 11,940,479
- Issue date Mar 26, 2024
- Texas Instruments Incorporated
- Robert Allan Neidorff
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a device parameter
- Patent number 11,933,836
- Issue date Mar 19, 2024
- Rohm Co., Ltd.
- Tatsuya Yanagi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, and inspection device
- Patent number 11,933,837
- Issue date Mar 19, 2024
- Nidec-Read Corporation
- Minoru Kato
- G01 - MEASURING TESTING
Information Patent Grant
Test method, adjustment method, test system, and storage medium for...
- Patent number 11,935,797
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xiaodong Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compressor, monitoring system, and method of monitoring compressor
- Patent number 11,933,291
- Issue date Mar 19, 2024
- Hitachi Industrial Equipment Systems Co., Ltd.
- Tomofumi Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Power semi-conductor module, mask, measurement method, computer sof...
- Patent number 11,927,619
- Issue date Mar 12, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE
- Publication number 20240153417
- Publication date May 9, 2024
- CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Hongting Lu
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Method of Monitoring Reliability of System Including Electrical Com...
- Publication number 20240151765
- Publication date May 9, 2024
- Aptiv Technologies AG
- Markus Heinrich
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE
- Publication number 20240153830
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Gyosoo CHOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Handling device for transporting interface units for a test device...
- Publication number 20240153804
- Publication date May 9, 2024
- Turbodynamics GmbH
- Stefan Thurmaier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING
- Publication number 20240151764
- Publication date May 9, 2024
- SYU GUANG TECHNOLOGY CO., LTD.
- KUN YU WU
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...
- Publication number 20240142495
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Kosuke FUJII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...
- Publication number 20240142546
- Publication date May 2, 2024
- CHONGQING UNIVERSITY
- Hui LI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240142511
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Yuki KUMAZAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING NON-SWITCHING SEMICONDUCTOR SWITCHES
- Publication number 20240146296
- Publication date May 2, 2024
- LEONI BORDNETZ-SYSTEME GMBH
- Matthias Ebert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CALCULATION METHOD AND CALCULATION DEVICE
- Publication number 20240142504
- Publication date May 2, 2024
- Sumitomo Electric Industries, Ltd.
- Takeshi Kawasaki
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE TESTING
- Publication number 20240142512
- Publication date May 2, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Zhi Peng Feng
- G01 - MEASURING TESTING
Information Patent Application
MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE
- Publication number 20240133940
- Publication date Apr 25, 2024
- VueReal Inc.
- Gholamreza Chaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE
- Publication number 20240133941
- Publication date Apr 25, 2024
- CARUX TECHNOLOGY PTE. LTD.
- Chao-Chin Sung
- G01 - MEASURING TESTING
Information Patent Application
OPTOELECTRONIC MODULE
- Publication number 20240136486
- Publication date Apr 25, 2024
- Harald ETSCHMAIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE TEMPERATURE CHARACTERISTIC OF THE DRAIN-...
- Publication number 20240125842
- Publication date Apr 18, 2024
- ROBERT BOSCH GmbH
- Georg Schill
- G01 - MEASURING TESTING
Information Patent Application
TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT
- Publication number 20240125841
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Cheongwon Lee
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS AND PROGNOSIS OF IGBT MODULES
- Publication number 20240118333
- Publication date Apr 11, 2024
- ABB Schweiz AG
- Aleksi Vulli
- G01 - MEASURING TESTING
Information Patent Application
GATE CHARGE AND LEAKAGE MEASUREMENT TEST SEQUENCE FOR SOLID STATE D...
- Publication number 20240118334
- Publication date Apr 11, 2024
- Infineon Technologies Austria AG
- Leo AICHRIEDLER
- G08 - SIGNALLING
Information Patent Application
TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...
- Publication number 20240118335
- Publication date Apr 11, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF M...
- Publication number 20240118332
- Publication date Apr 11, 2024
- SK HYNIX INC.
- Gyeong Ho HYUN
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...
- Publication number 20240110969
- Publication date Apr 4, 2024
- Advantest Corporation
- Kotaro HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
- Publication number 20240112935
- Publication date Apr 4, 2024
- Photon Dynamics, Inc.
- Neil Dang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MEASUREMENT FOR DEFECT DETECTION
- Publication number 20240110966
- Publication date Apr 4, 2024
- pSemi Corporation
- Ronald E. REEDY
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION CIRCUIT, SEMICONDUCTOR DEVICE, AND EVALUATION METHOD
- Publication number 20240110967
- Publication date Apr 4, 2024
- WINBOND ELECTRONICS CORP.
- Taihei SHIDO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES
- Publication number 20240110968
- Publication date Apr 4, 2024
- Industrial Technology Research Institute
- Yan-Rung Lin
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
- Publication number 20240110970
- Publication date Apr 4, 2024
- DENSO CORPORATION
- Masataka DEGUCHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE
- Publication number 20240103063
- Publication date Mar 28, 2024
- Innolux Corporation
- Zhi-Fu Huang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS
- Publication number 20240102921
- Publication date Mar 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- Je Won YOO
- G01 - MEASURING TESTING

Testing of individual semiconductor devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Monitoring circuit monitoring performance of transistors

Display device and method of driving display device

Test method

Method for monitoring a protective device that includes a series ci...

System for testing an integrated circuit of a device and its method...

Power device monitoring system and monitoring method

Optical inspection of the varactor diodes in varactor metasurface a...

Pull out-assisting linkage device for test load board of automatic...

Display device

Optical probe, optical probe array, optical probe card, and method...

Injection device and inspection and repairing method

Semiconductor device inspection method and semiconductor device ins...

Inspection apparatus having a contactor for inspecting electrical c...

Method of analyzing semiconductor structure

Semiconductor chip providing on-chip self-testing of an ana-log-to-...

Battery diode fault monitoring

Semiconductor apparatus, image capturing apparatus, image capturing...

Switching matrix system and operating method thereof for semiconduc...

Test device and test method thereof

Test method for tolerance against the hot carrier effect

Method and system for predicting insulated gate bipolar transistor...

Machine operation monitoring

Electronic device for managing degree of degradation

System and method for railroad smart flasher lamps

System for determining leakage current of a field effect transistor...

Method of measuring a device parameter

Inspection jig, and inspection device

Test method, adjustment method, test system, and storage medium for...

Compressor, monitoring system, and method of monitoring compressor

Power semi-conductor module, mask, measurement method, computer sof...

Patents Applicationslast 30 patents

ARRAY SUBSTRATE, DISPLAY PANEL, AND METHOD OF TESTING ARRAY SUBSTRATE

Method of Monitoring Reliability of System Including Electrical Com...

SEMICONDUCTOR DEVICE INCLUDING DETECTION STRUCTURE

Handling device for transporting interface units for a test device...

COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING

TESTING DEVICE, TESTING METHOD, AND NON-TRANSITORY STORAGE MEDIUM S...

METHOD FOR TESTING AND EVALUATING SHORT-CIRCUIT WITHSTAND CAPABILIT...

SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR IDENTIFYING NON-SWITCHING SEMICONDUCTOR SWITCHES

CALCULATION METHOD AND CALCULATION DEVICE

TESTING APPARATUS AND TESTING METHOD

SEMICONDUCTOR DEVICE TESTING

MICRO DEVICE ARRANGEMENT IN DONOR SUBSTRATE

ELECTRONIC DEVICE AND TEST METHOD FOR ELECTRONIC DEVICE

OPTOELECTRONIC MODULE

METHOD FOR DETERMINING THE TEMPERATURE CHARACTERISTIC OF THE DRAIN-...

TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT

DIAGNOSIS AND PROGNOSIS OF IGBT MODULES

GATE CHARGE AND LEAKAGE MEASUREMENT TEST SEQUENCE FOR SOLID STATE D...

TEST DEVICE CAPABLE OF TESTING MICRO LED AND MANUFACTURING METHOD T...

TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF M...

TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE ME...

SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING

CURRENT MEASUREMENT FOR DEFECT DETECTION

EVALUATION CIRCUIT, SEMICONDUCTOR DEVICE, AND EVALUATION METHOD

INSPECTION SYSTEM AND METHOD FOR INSPECTING LIGHT-EMITTING DIODES

METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...

APPARATUS FOR TESTING ELECTRONIC DEVICES

METHOD FOR INSPECTING ELECTRONIC COMPONENTS AND ELECTRONIC DEVICE

OPTICAL INSPECTION APPARATUS