Testing of input or output with loop-back

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CPC
G01R31/31716

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31716Testing of input or output with loop-back

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Patents Grantslast 30 patents

Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 12,287,366
- Issue date Apr 29, 2025
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and storage media for detecting a security intrus...
- Patent number 12,160,320
- Issue date Dec 3, 2024
- Level 3 Communications, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus having on-chip fail safe logic for I/O signal in high int...
- Patent number 12,020,978
- Issue date Jun 25, 2024
- Texas Instruments Incorporated
- Sam Gnana Sabapathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test for die-to-die physical interfaces
- Patent number 11,940,491
- Issue date Mar 26, 2024
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment comprising a device under test loopback an...
- Patent number 11,913,987
- Issue date Feb 27, 2024
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and storage media for detecting a security intrus...
- Patent number 11,863,332
- Issue date Jan 2, 2024
- Level 3 Communications, LLC
- Steven E. Drake
- G01 - MEASURING TESTING
Information Patent Grant
Spectral leakage-based loopback method for predicting performance o...
- Patent number 11,852,681
- Issue date Dec 26, 2023
- INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
- Byoungho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for die-to-die physical interfaces
- Patent number 11,662,380
- Issue date May 30, 2023
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced loopback diagnostic systems and methods
- Patent number 11,619,667
- Issue date Apr 4, 2023
- Advantest Corporation
- Mei-Mei Su
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems, methods, and storage media for detecting a security intrus...
- Patent number 11,563,530
- Issue date Jan 24, 2023
- Level 3 Communications, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Asynchronous circuits and test methods
- Patent number 11,500,018
- Issue date Nov 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Grant
Test system, electronic device and loopback testing method
- Patent number 11,456,827
- Issue date Sep 27, 2022
- Rohde & Schwarz GmbH & Co. KG
- Prabhakaran Ekambaram
- G01 - MEASURING TESTING
Information Patent Grant
Device, method and system of error detection and correction in mult...
- Patent number 11,385,288
- Issue date Jul 12, 2022
- STMicroelectronics S.A.
- Ricardo Gomez Gomez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flexible test systems and methods
- Patent number 11,334,459
- Issue date May 17, 2022
- Advantest Corporation
- Michael Bautista
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory loopback systems and methods
- Patent number 11,327,113
- Issue date May 10, 2022
- Micron Technology, Inc.
- David D. Wilmoth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device and testing method
- Patent number 11,313,904
- Issue date Apr 26, 2022
- Global Unichip Corporation
- Yen-Chung Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and storage media for detecting a security intrus...
- Patent number 11,228,404
- Issue date Jan 18, 2022
- Level 3 Communications, LLC
- Steven E. Drake
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device
- Patent number 11,156,658
- Issue date Oct 26, 2021
- Micron Technology, Inc.
- Chiaki Dono
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing a multi-die integrated circuit device
- Patent number 11,143,703
- Issue date Oct 12, 2021
- Marvell Israel (M.I.S.L) Ltd.
- Michael Fridburg
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing system and circuit testing method
- Patent number 11,073,555
- Issue date Jul 27, 2021
- Realtek Semiconductor Corporation
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Grant
Asynchronous circuits and test methods
- Patent number 11,047,911
- Issue date Jun 29, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus having on-chip fail safe logic for I/O signal in high int...
- Patent number 10,916,467
- Issue date Feb 9, 2021
- Texas Instruments Incorporated
- Sam Gnana Sabapathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device including a shift register
- Patent number 10,908,212
- Issue date Feb 2, 2021
- Samsung Electronics Co., Ltd.
- Hyunui Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for evaluating and optimizing a signaling system
- Patent number 10,855,413
- Issue date Dec 1, 2020
- RAMBUS INC.
- Jared Zerbe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying a fault at a device output and system therefor
- Patent number 10,782,347
- Issue date Sep 22, 2020
- NXP B.V.
- Robert Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying a fault at a device output and system therefor
- Patent number 10,436,839
- Issue date Oct 8, 2019
- NXP B.V.
- Robert Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Memory loopback systems and methods
- Patent number 10,393,803
- Issue date Aug 27, 2019
- Micron Technology, Inc.
- David D. Wilmoth
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device
- Patent number 10,365,325
- Issue date Jul 30, 2019
- Micron Technology, Inc.
- Chiaki Dono
- G01 - MEASURING TESTING
Information Patent Grant
Backplane testing system
- Patent number 10,352,996
- Issue date Jul 16, 2019
- Dell Products L.P.
- Umesh Chandra
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE
- Publication number 20250231236
- Publication date Jul 17, 2025
- Ampere Computing LLC
- Sandeep BRAHMADATHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...
- Publication number 20240129074
- Publication date Apr 18, 2024
- LEVEL 3 COMMUNICATIONS, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...
- Publication number 20240061034
- Publication date Feb 22, 2024
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
- Publication number 20230384377
- Publication date Nov 30, 2023
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Application
LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER
- Publication number 20230266387
- Publication date Aug 24, 2023
- STMicroelectronics International N.V.
- Rupesh SINGH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...
- Publication number 20230163901
- Publication date May 25, 2023
- LEVEL 3 COMMUNICATIONS, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Stacked Integrated Circuit Device
- Publication number 20230116320
- Publication date Apr 13, 2023
- Graphcore Limited
- Stephen FELIX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTRAL LEAKAGE-BASED LOOPBACK METHOD FOR PREDICTING PERFORMANCE O...
- Publication number 20230052971
- Publication date Feb 16, 2023
- Industry-University Cooperation Foundation Hanyang University Erica Campus
- Byoungho Kim
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...
- Publication number 20220236318
- Publication date Jul 28, 2022
- Advantest Corporation
- Andreas Hantsch
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...
- Publication number 20220116160
- Publication date Apr 14, 2022
- LEVEL 3 COMMUNICATIONS, LLC
- Steven E. Drake
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST SYSTEM, ELECTRONIC DEVICE AND LOOPBACK TESTING METHOD
- Publication number 20220109533
- Publication date Apr 7, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Prabhakaran Ekambaram
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ASYNCHRONOUS CIRCUITS AND TEST METHODS
- Publication number 20210325458
- Publication date Oct 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS
- Publication number 20210302498
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD
- Publication number 20210156916
- Publication date May 27, 2021
- Global Unichip Corporation
- Yen-Chung CHEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS HAVING ON-CHIP FAIL SAFE LOGIC FOR I/O SIGNAL IN HIGH INT...
- Publication number 20210118720
- Publication date Apr 22, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Sam Gnana Sabapathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR DETECTION AND CORRECTION
- Publication number 20210096183
- Publication date Apr 1, 2021
- STMicroelectronics S.A.
- Ricardo GOMEZ GOMEZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TESTING SYSTEM AND CIRCUIT TESTING METHOD
- Publication number 20200217886
- Publication date Jul 9, 2020
- REALTEK SEMICONDUCTOR CORPORATION
- Ying-Yen Chen
- G01 - MEASURING TESTING
Information Patent Application
ASYNCHRONOUS CIRCUITS AND TEST METHODS
- Publication number 20200132759
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ting-Yu Shen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...
- Publication number 20200106572
- Publication date Apr 2, 2020
- LEVEL 3 COMMUNICATIONS, LLC
- Steven E. Drake
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING A MULTI-DIE INTEGRATED CIRCUIT DEVICE
- Publication number 20200103464
- Publication date Apr 2, 2020
- Marvell Israel (M.I.S.L) Ltd.
- Michael Fridburg
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL LAYER DEVICE AND METHOD FOR PERFORMING PHYSICAL LAYER OPER...
- Publication number 20200072889
- Publication date Mar 5, 2020
- NXP B.V.
- Sujan PANDEY
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEMORY LOOPBACK SYSTEMS AND METHODS
- Publication number 20190353706
- Publication date Nov 21, 2019
- Micron Technology, Inc.
- David D. Wilmoth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20190302181
- Publication date Oct 3, 2019
- Micron Technology, Inc.
- Chiaki Dono
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE
- Publication number 20190271742
- Publication date Sep 5, 2019
- Samsung Electronics Co., Ltd.
- Hyunui Lee
- G01 - MEASURING TESTING
Information Patent Application
MEMORY LOOPBACK SYSTEMS AND METHODS
- Publication number 20190064265
- Publication date Feb 28, 2019
- Micron Technology, Inc.
- David D. Wilmoth
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS
- Publication number 20180238964
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR WAFER-LEVEL LOOPBACK TEST
- Publication number 20180231608
- Publication date Aug 16, 2018
- QUALCOMM Incorporated
- Alvin Leng Sun Loke
- G01 - MEASURING TESTING
Information Patent Application
BACKPLANE TESTING SYSTEM
- Publication number 20170059656
- Publication date Mar 2, 2017
- Dell Products L.P.
- Umesh Chandra
- G01 - MEASURING TESTING
Information Patent Application
BACKPLANE TESTING SYSTEM
- Publication number 20160266204
- Publication date Sep 15, 2016
- Dell Products L.P.
- Umesh Chandra
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND ITS CALIBRATION METHOD
- Publication number 20160077158
- Publication date Mar 17, 2016
- Anritsu Corporation
- Koji Yamashita
- G01 - MEASURING TESTING

Testing of input or output with loop-back

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated test equipment comprising a device under test loopback an...

Component die validation built-in self-test (VBIST) engine

Systems, methods, and storage media for detecting a security intrus...

Apparatus having on-chip fail safe logic for I/O signal in high int...

Built-in self-test for die-to-die physical interfaces

Automated test equipment comprising a device under test loopback an...

Systems, methods, and storage media for detecting a security intrus...

Spectral leakage-based loopback method for predicting performance o...

Built-in self-test for die-to-die physical interfaces

Enhanced loopback diagnostic systems and methods

Systems, methods, and storage media for detecting a security intrus...

Asynchronous circuits and test methods

Test system, electronic device and loopback testing method

Device, method and system of error detection and correction in mult...

Flexible test systems and methods

Memory loopback systems and methods

Testing device and testing method

Systems, methods, and storage media for detecting a security intrus...

Semiconductor memory device

Method and apparatus for testing a multi-die integrated circuit device

Circuit testing system and circuit testing method

Asynchronous circuits and test methods

Apparatus having on-chip fail safe logic for I/O signal in high int...

Semiconductor memory device including a shift register

Method and apparatus for evaluating and optimizing a signaling system

Method for identifying a fault at a device output and system therefor

Method for identifying a fault at a device output and system therefor

Memory loopback systems and methods

Semiconductor memory device

Backplane testing system

Patents Applicationslast 30 patents

COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE

SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...

AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...

Built-in Self-Test for Die-to-Die Physical Interfaces

LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER

SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...

Stacked Integrated Circuit Device

SPECTRAL LEAKAGE-BASED LOOPBACK METHOD FOR PREDICTING PERFORMANCE O...

AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AN...

SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...

TEST SYSTEM, ELECTRONIC DEVICE AND LOOPBACK TESTING METHOD

ASYNCHRONOUS CIRCUITS AND TEST METHODS

ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS

TESTING DEVICE AND TESTING METHOD

APPARATUS HAVING ON-CHIP FAIL SAFE LOGIC FOR I/O SIGNAL IN HIGH INT...

ERROR DETECTION AND CORRECTION

CIRCUIT TESTING SYSTEM AND CIRCUIT TESTING METHOD

ASYNCHRONOUS CIRCUITS AND TEST METHODS

SYSTEMS, METHODS, AND STORAGE MEDIA FOR DETECTING A SECURITY INTRUS...

METHOD AND APPARATUS FOR TESTING A MULTI-DIE INTEGRATED CIRCUIT DEVICE

PHYSICAL LAYER DEVICE AND METHOD FOR PERFORMING PHYSICAL LAYER OPER...

MEMORY LOOPBACK SYSTEMS AND METHODS

SEMICONDUCTOR MEMORY DEVICE

MEMORY DEVICE

MEMORY LOOPBACK SYSTEMS AND METHODS

NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS

SYSTEMS AND METHODS FOR WAFER-LEVEL LOOPBACK TEST

BACKPLANE TESTING SYSTEM

BACKPLANE TESTING SYSTEM

TESTING DEVICE AND ITS CALIBRATION METHOD