Testing of integrated circuits [IC]

Industry

CPC
G01R31/2851

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2851Testing of integrated circuits [IC]

Industries

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit and method for diagnosing an integrated circuit
- Patent number 11,953,546
- Issue date Apr 9, 2024
- STMicroelectronics (Alps) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly
- Patent number 11,940,462
- Issue date Mar 26, 2024
- Jong Choen Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transducer built-in self-test
- Patent number 11,913,988
- Issue date Feb 27, 2024
- QUALCOMM Technologies, Inc.
- Michael Carfore
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit with on-state diagnosis for driver channels
- Patent number 11,885,845
- Issue date Jan 30, 2024
- STMicroelectronics S.r.l.
- Gaudenzia Bagnati
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device including temperature sensing circuit
- Patent number 11,860,045
- Issue date Jan 2, 2024
- SK Hynix Inc.
- Dahoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Usage metering by bias temperature instability
- Patent number 11,835,572
- Issue date Dec 5, 2023
- International Business Machines Corporation
- Effendi Leobandung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-chip oscilloscope
- Patent number 11,835,551
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Single-event transient (SET) pulse measuring circuit capable of eli...
- Patent number 11,828,788
- Issue date Nov 28, 2023
- NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
- Bin Liang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixing device and fixing method for fixing chip in two orthogonal d...
- Patent number 11,815,546
- Issue date Nov 14, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jinrong Huang
- G01 - MEASURING TESTING
Information Patent Grant
Power profiling in an integrated circuit having a current sensing c...
- Patent number 11,808,804
- Issue date Nov 7, 2023
- NXP USA, INC.
- Antonio Mauricio Brochi
- G01 - MEASURING TESTING
Information Patent Grant
Parameter space reduction for device testing
- Patent number 11,789,074
- Issue date Oct 17, 2023
- National Instruments Corporation
- James C. Nagle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and semiconductor device
- Patent number 11,789,061
- Issue date Oct 17, 2023
- Fuji Electric Co., Ltd.
- Isao Saito
- G01 - MEASURING TESTING
Information Patent Grant
Probe card integrated with a hall sensor
- Patent number 11,761,983
- Issue date Sep 19, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Guoquan Teo
- G01 - MEASURING TESTING
Information Patent Grant
Determining electronic component authenticity via electronic signal...
- Patent number 11,734,409
- Issue date Aug 22, 2023
- University of South Florida
- Yunghsiao Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer system power monitoring
- Patent number 11,714,480
- Issue date Aug 1, 2023
- Apple Inc.
- Jay B. Fletcher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct scan access JTAG
- Patent number 11,693,055
- Issue date Jul 4, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Method and non-transitory computer-readable medium for performing m...
- Patent number 11,686,761
- Issue date Jun 27, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa Su
- G01 - MEASURING TESTING
Information Patent Grant
Shadow feature-based determination of capacitance values for integr...
- Patent number 11,687,695
- Issue date Jun 27, 2023
- SIEMENS INDUSTRY SOFTWARE INC.
- Omar Elsewefy
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect retimer enhancements
- Patent number 11,675,003
- Issue date Jun 13, 2023
- Intel Corporation
- Daniel S. Froelich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing testing utilizing staggered clocks
- Patent number 11,668,750
- Issue date Jun 6, 2023
- NVIDIA Corporation
- Sailendra Chadalavada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of recycled integrated circuits and system-on-chips based...
- Patent number 11,657,405
- Issue date May 23, 2023
- University of Florida Research Foundation, Incorporated
- Sreeja Chowdhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 11,630,151
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Power monitor
- Patent number 11,630,501
- Issue date Apr 18, 2023
- Delta Electronics, Inc.
- Kuan-Sheng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit and method for diagnosing an integrated circuit
- Patent number 11,624,779
- Issue date Apr 11, 2023
- STMicroelectronics (Alps) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Grant
Core partition circuit and testing device
- Patent number 11,624,782
- Issue date Apr 11, 2023
- SHANGHAI ZHAOXIN SEMICONDUCTOR CO., LTD.
- Yunhao Xing
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing through-silicon-vias
- Patent number 11,600,349
- Issue date Mar 7, 2023
- RAMBUS INC.
- Thomas Vogelsang
- G11 - INFORMATION STORAGE
Information Patent Grant
Quantum error-correction in microwave integrated quantum circuits
- Patent number 11,573,259
- Issue date Feb 7, 2023
- Rigetti & Co, LLC
- William J. Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,567,105
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Circuit configured to determine a test voltage suitable for very lo...
- Patent number 11,519,960
- Issue date Dec 6, 2022
- NXP USA, INC.
- Srikanth Jagannathan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD
- Publication number 20240125881
- Publication date Apr 18, 2024
- Rohde& Schwarz GmbH & Co. KG
- Nico RIEDMANN
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ELECTRONIC COMPONENT AUTHENTICITY VIA ELECTRONIC SIGNAL...
- Publication number 20240126864
- Publication date Apr 18, 2024
- University of South Florida
- Yunghsiao CHUNG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR TESTING A CIRCUIT
- Publication number 20240103066
- Publication date Mar 28, 2024
- INFINEON TECHNOLOGIES AG
- Alessio CIARCIA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST ARRANGEMENT AND METHOD FOR TESTING AN INTEGRATED CIRCUIT
- Publication number 20240085471
- Publication date Mar 14, 2024
- INFINEON TECHNOLOGIES AG
- Alessio CIARCIA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DIAGNOSIS WITH DYNAMIC ROOT CAUSE DETECTION
- Publication number 20240070371
- Publication date Feb 29, 2024
- Siemens Industry Software Inc.
- Xiaoyuan Qi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
- Publication number 20240053391
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EXTRACTING SURFACE TRAP LEVEL CONSIDERING OXIDE THICKNES...
- Publication number 20240044970
- Publication date Feb 8, 2024
- University of Ulsan Foundation for Industry Cooperation
- Tae Woo KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO...
- Publication number 20230417824
- Publication date Dec 28, 2023
- YIK Corporation
- Yong Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
TEST LOGIC METHOD FOR AN INTEGRATED CIRCUIT DEVICE
- Publication number 20230384363
- Publication date Nov 30, 2023
- EM Microelectronic-Marin SA
- Ovidiu SIMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR DETERMINING DETERIORATION OF SE...
- Publication number 20230369142
- Publication date Nov 16, 2023
- Fuji Electric Co., Ltd.
- Motohito HORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...
- Publication number 20230341447
- Publication date Oct 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT CALIBRATION SYSTEMS
- Publication number 20230333192
- Publication date Oct 19, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Rajkumar Perumal
- G01 - MEASURING TESTING
Information Patent Application
ANOMALY DETECTION AND PROTECTION
- Publication number 20230288470
- Publication date Sep 14, 2023
- ZERO-ERROR SYSTEMS PTE. LTD.
- Joseph Sylvester CHANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH ON-STATE DIAGNOSIS FOR DRIVER CHANNELS
- Publication number 20230266382
- Publication date Aug 24, 2023
- STMicroelectronics S.r.l.
- Gaudenzia BAGNATI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS
- Publication number 20230266381
- Publication date Aug 24, 2023
- STMicroelectronics S.r.l.
- Gaudenzia BAGNATI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER
- Publication number 20230266387
- Publication date Aug 24, 2023
- STMicroelectronics International N.V.
- Rupesh SINGH
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20230251309
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND METHOD FOR DIAGNOSING AN INTEGRATED CIRCUIT
- Publication number 20230213577
- Publication date Jul 6, 2023
- STMicroelectronics (Grenoble 2) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Application
ATTENUATION APPARATUS AND TEST SYSTEM
- Publication number 20230208000
- Publication date Jun 29, 2023
- CALTERAH SEMICONDUCTOR TECHNOLOGY (SHANGHAI) CO., LTD.
- Zhefan CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GENERATING DEVICE MODEL AND COMPUTING DEVICE PERFORMING T...
- Publication number 20230194594
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Gwangnae GIL
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR PERFORMING M...
- Publication number 20230184820
- Publication date Jun 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Chien-Hwa SU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHODS FOR MODELING AND SIMULATING ON-DIE CAPACITORS
- Publication number 20230177246
- Publication date Jun 8, 2023
- Yangtze Memory Technologies Co., Ltd.
- Peng SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETO-ELECTRIC SENSOR FOR HARDWARE TROJAN DETECTION
- Publication number 20230176111
- Publication date Jun 8, 2023
- University of Southern California
- Ajey JACOB
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-CHIP OSCILLOSCOPE
- Publication number 20230122803
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Peng HSIEH
- G01 - MEASURING TESTING
Information Patent Application
LDO-BASED ODOMETER TO COMBAT IC RECYCLING
- Publication number 20230085919
- Publication date Mar 23, 2023
- University of Florida Research Foundation, Incorporated
- Domenic J. Forte
- G05 - CONTROLLING REGULATING
Information Patent Application
PROBE CARD INTEGRATED WITH A HALL SENSOR
- Publication number 20230083401
- Publication date Mar 16, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Guoquan TEO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING TEST DATA, WAFER TEST SYSTEM, AND...
- Publication number 20230081224
- Publication date Mar 16, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shisheng WANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...
- Publication number 20230080214
- Publication date Mar 16, 2023
- SINO IC TECHNOLOGY CO., LTD.
- Kun YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE HEAD STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230065443
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Yi LIN
- G01 - MEASURING TESTING

Testing of integrated circuits [IC]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Integrated circuit and method for diagnosing an integrated circuit

Test socket assembly

Transducer built-in self-test

Integrated circuit with on-state diagnosis for driver channels

Apparatus for testing electronic devices

Semiconductor device including temperature sensing circuit

Usage metering by bias temperature instability

On-chip oscilloscope

Single-event transient (SET) pulse measuring circuit capable of eli...

Fixing device and fixing method for fixing chip in two orthogonal d...

Power profiling in an integrated circuit having a current sensing c...

Parameter space reduction for device testing

Integrated circuit and semiconductor device

Probe card integrated with a hall sensor

Determining electronic component authenticity via electronic signal...

Computer system power monitoring

Direct scan access JTAG

Method and non-transitory computer-readable medium for performing m...

Shadow feature-based determination of capacitance values for integr...

Interconnect retimer enhancements

Performing testing utilizing staggered clocks

Detection of recycled integrated circuits and system-on-chips based...

Interface to full and reduced pin JTAG devices

Power monitor

Integrated circuit and method for diagnosing an integrated circuit

Core partition circuit and testing device

Testing through-silicon-vias

Quantum error-correction in microwave integrated quantum circuits

On-chip oscilloscope

Circuit configured to determine a test voltage suitable for very lo...

Patents Applicationslast 30 patents

POWER CALIBRATION ADAPTER, MEASUREMENT APPLICATION SYSTEM, METHOD

DETERMINING ELECTRONIC COMPONENT AUTHENTICITY VIA ELECTRONIC SIGNAL...

CIRCUIT AND METHOD FOR TESTING A CIRCUIT

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST ARRANGEMENT AND METHOD FOR TESTING AN INTEGRATED CIRCUIT

DEFECT DIAGNOSIS WITH DYNAMIC ROOT CAUSE DETECTION

APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF

METHOD FOR EXTRACTING SURFACE TRAP LEVEL CONSIDERING OXIDE THICKNES...

SEMICONDUCTOR WAFER TEST SYSTEM FOR CONTROLLING SUPPLY OF POWER TO...

TEST LOGIC METHOD FOR AN INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR DETERMINING DETERIORATION OF SE...

METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...

CIRCUIT CALIBRATION SYSTEMS

ANOMALY DETECTION AND PROTECTION

INTEGRATED CIRCUIT WITH ON-STATE DIAGNOSIS FOR DRIVER CHANNELS

INTEGRATED CIRCUIT WITH OFF-STATE DIAGNOSIS FOR DRIVER CHANNELS

LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

INTEGRATED CIRCUIT AND METHOD FOR DIAGNOSING AN INTEGRATED CIRCUIT

ATTENUATION APPARATUS AND TEST SYSTEM

METHOD OF GENERATING DEVICE MODEL AND COMPUTING DEVICE PERFORMING T...

METHOD AND NON-TRANSITORY COMPUTER-READABLE MEDIUM FOR PERFORMING M...

SYSTEM AND METHODS FOR MODELING AND SIMULATING ON-DIE CAPACITORS

MAGNETO-ELECTRIC SENSOR FOR HARDWARE TROJAN DETECTION

ON-CHIP OSCILLOSCOPE

LDO-BASED ODOMETER TO COMBAT IC RECYCLING

PROBE CARD INTEGRATED WITH A HALL SENSOR

METHOD AND SYSTEM FOR EVALUATING TEST DATA, WAFER TEST SYSTEM, AND...

SYSTEM AND METHOD FOR ANALYSIS OF INTEGRATED CIRCUIT TESTING ANOMAL...

PROBE HEAD STRUCTURE AND METHOD FOR FORMING THE SAME