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G01R31/3177
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/3177
Testing of logic operation
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Patents Grants
last 30 patents
Information
Patent Grant
Test compression in a JTAG daisy-chain environment
Patent number
11,965,930
Issue date
Apr 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for detecting glitch at high sampling rate
Patent number
11,965,929
Issue date
Apr 23, 2024
UESTC (Shenzhen) Advanced Research Institute
Zhijian Dai
G01 - MEASURING TESTING
Information
Patent Grant
Single “A” latch with an array of “B” latches
Patent number
11,961,575
Issue date
Apr 16, 2024
SambaNova Systems, Inc.
Thomas A. Ziaja
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuit using clock gating scheme to hold capture procedure an...
Patent number
11,959,965
Issue date
Apr 16, 2024
Samsung Electronics Co., Ltd.
Giha Nam
G01 - MEASURING TESTING
Information
Patent Grant
Fault protected signal splitter apparatus
Patent number
11,955,686
Issue date
Apr 9, 2024
Nanotronics Imaging, Inc.
John B. Putman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monitoring of interconnect lines
Patent number
11,946,972
Issue date
Apr 2, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Dieter Jozef Joos
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
Patent number
11,940,490
Issue date
Mar 26, 2024
QUALCOMM Incorporated
Praveen Raghuraman
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test for die-to-die physical interfaces
Patent number
11,940,491
Issue date
Mar 26, 2024
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Grant
Cross-talk reduction in fault tolerant quantum computing system
Patent number
11,941,483
Issue date
Mar 26, 2024
Amazon Technologies, Inc.
Connor Hann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
Patent number
11,933,844
Issue date
Mar 19, 2024
Texas Instruments Incorporated
Wilson Pradeep
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Global time counter based debug
Patent number
11,927,629
Issue date
Mar 12, 2024
Texas Instruments Incorporated
Pandy Kalimuthu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for database scan acceleration
Patent number
11,927,634
Issue date
Mar 12, 2024
Samsung Electronics Co., Ltd.
Andrew Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for schedule-based I/O multiplexing for integrate...
Patent number
11,927,630
Issue date
Mar 12, 2024
MARVELL ASIA PTE. LTD.
Sounil Biswas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fan-out buffer with skew control function, operating method thereof...
Patent number
11,921,158
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Byung-Sung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Compressed scan chain diagnosis by internal chain observation, proc...
Patent number
11,921,159
Issue date
Mar 5, 2024
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Automated test equipment for testing one or more devices under test...
Patent number
11,913,990
Issue date
Feb 27, 2024
Advantest Corporation
Olaf Pöppe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hardware component and a method for implementing a camouflage of cu...
Patent number
11,906,581
Issue date
Feb 20, 2024
Nagravision SARL
Jean-Marie Martin
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Shadow access port method and apparatus
Patent number
11,906,582
Issue date
Feb 20, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
Patent number
11,899,063
Issue date
Feb 13, 2024
Texas Instruments Incorporated
Mudasir Shafat Kawoosa
G01 - MEASURING TESTING
Information
Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
Patent number
11,899,064
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Sandeep Kumar Goel
G01 - MEASURING TESTING
Information
Patent Grant
Basic logic element, semiconductor device including the same, outpu...
Patent number
11,899,062
Issue date
Feb 13, 2024
NEC Space Technologies, Ltd.
Hiroki Hihara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Constructing quantum processes for quantum processors
Patent number
11,900,212
Issue date
Feb 13, 2024
Rigetti & Co, LLC
William J. Zeng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method to weight defects with co-located modeled faults
Patent number
11,899,065
Issue date
Feb 13, 2024
KLA Corporation
David W. Price
G01 - MEASURING TESTING
Information
Patent Grant
Fault protected signal splitter apparatus
Patent number
11,894,596
Issue date
Feb 6, 2024
Nanotronics Imaging, Inc.
John B. Putman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Register circuit with detection of data events, and method for dete...
Patent number
11,894,848
Issue date
Feb 6, 2024
Minima Processor Oy
Navneet Gupta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and circuit for at-speed testing of multicycle path circuits
Patent number
11,892,506
Issue date
Feb 6, 2024
MediaTek Singapore Pte Ltd.
Ashish Kumar Nayak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,879,941
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
Patent number
11,879,940
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Wilson Pradeep
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Intelligent charge pump architecture for flash array
Patent number
11,875,860
Issue date
Jan 16, 2024
Alberto Troia
G11 - INFORMATION STORAGE
Information
Patent Grant
Reduced signaling interface method and apparatus
Patent number
11,867,756
Issue date
Jan 9, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
Publication number
20240133951
Publication date
Apr 25, 2024
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Sandeep Kumar GOEL
G01 - MEASURING TESTING
Information
Patent Application
INTERPOSER INSTRUMENTATION METHOD AND APPARATUS
Publication number
20240133947
Publication date
Apr 25, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Automatic Test Pattern Generation-Based Circuit Verification Method...
Publication number
20240125850
Publication date
Apr 18, 2024
Huawei Technologies Co., Ltd
Huiling Zhen
G01 - MEASURING TESTING
Information
Patent Application
COMPARATOR TESTING CIRCUIT AND TESTING METHOD THEREOF
Publication number
20240110977
Publication date
Apr 4, 2024
Nuvoton Technology Corporation
Chih-Ping Lu
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC VOLTAGE FREQUENCY SCALING TO REDUCE TEST TIME
Publication number
20240110979
Publication date
Apr 4, 2024
MEDIATEK INC.
Anshul Varma
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT AND METHOD FOR TESTING A CIRCUIT
Publication number
20240103067
Publication date
Mar 28, 2024
INFINEON TECHNOLOGIES AG
Alessio CIARCIA
G01 - MEASURING TESTING
Information
Patent Application
INTERPOSER CIRCUIT
Publication number
20240094289
Publication date
Mar 21, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD
Publication number
20240097661
Publication date
Mar 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Huaixin XIAN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ANALOG PHASE SELECTION TEST SYSTEM
Publication number
20240085476
Publication date
Mar 14, 2024
NXP B.V.
Andreas Johannes Köllmann
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FLIP FLOP STANDARD CELL
Publication number
20240072777
Publication date
Feb 29, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Nick Samra
G11 - INFORMATION STORAGE
Information
Patent Application
Self-Timed Delayed Keeper for Dynamic Logic
Publication number
20240063795
Publication date
Feb 22, 2024
Apple Inc.
Andrew Russell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20240061038
Publication date
Feb 22, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEBUG ARCHITECTURE
Publication number
20240044979
Publication date
Feb 8, 2024
NORDIC SEMICONDUCTOR ASA
Hannu TALVITIE
G01 - MEASURING TESTING
Information
Patent Application
PERFORMING SCAN DATA TRANSFER INSIDE MULTI-DIE PACKAGE WITH SERDES...
Publication number
20240027525
Publication date
Jan 25, 2024
ADVANCED MICRO DEVICES, INC.
AHMET TOKUZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
Publication number
20240019489
Publication date
Jan 18, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20240012050
Publication date
Jan 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN CIRCUIT AND METHOD
Publication number
20240012051
Publication date
Jan 11, 2024
STMicroelectronics International N.V.
Venkata Narayanan Srinivasan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods And Apparatus For Selectively Extracting And Loading Regist...
Publication number
20240012466
Publication date
Jan 11, 2024
Intel Corporation
Shiva Rao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROVIDING CONFIGURABLE SECURITY FOR INTELLECTUAL PROPERTY CIRCUITS...
Publication number
20240003973
Publication date
Jan 4, 2024
Intel Corporation
Ratheesh Thekke Veetil
G01 - MEASURING TESTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230417831
Publication date
Dec 28, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
FAULT TOLERANT SYNCHRONIZER
Publication number
20230400512
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Denis Roland BEAUDOIN
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ADDRESSABLE TEST ACCESS PORT
Publication number
20230400513
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT ARRANGEMENT FOR VALIDATION OF OPERATION OF A LOGIC MODULE I...
Publication number
20230393198
Publication date
Dec 7, 2023
STMicroelectronics S.r.l.
Diego ALAGNA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems And Methods For Debugging Cryptographic Modules
Publication number
20230393197
Publication date
Dec 7, 2023
Intel Corporation
Richard Fant
G01 - MEASURING TESTING
Information
Patent Application
Fault Protected Signal Splitter Apparatus
Publication number
20230387564
Publication date
Nov 30, 2023
Nanotronics Imaging, Inc.
John B. Putman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20230384376
Publication date
Nov 30, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
Publication number
20230384377
Publication date
Nov 30, 2023
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20230366920
Publication date
Nov 16, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN CHAIN CIRCUIT AND CORRESPONDING METHOD
Publication number
20230358806
Publication date
Nov 9, 2023
STMicroelectronics S.r.l.
Marco CASARSA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS
Publication number
20230349970
Publication date
Nov 2, 2023
NVIDIA Corporation
Shantanu Sarangi
G06 - COMPUTING CALCULATING COUNTING