Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Industry

CPC
G01R31/2801

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
System and method for measuring device inside through-silicon via s...
- Patent number 12,159,809
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray sensitive materials for data protection
- Patent number 12,079,377
- Issue date Sep 3, 2024
- International Business Machines Corporation
- Eric J. Campbell
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Portable nodal impedance analyser
- Patent number 12,007,423
- Issue date Jun 11, 2024
- QMAX TEST EQUIPMENTS PVT, LTD
- S. R. Sabapathi
- G01 - MEASURING TESTING
Information Patent Grant
Potential difference early-warning circuit and system
- Patent number 11,994,565
- Issue date May 28, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Jie Cui
- G01 - MEASURING TESTING
Information Patent Grant
Multiple circuit board tester
- Patent number 11,977,112
- Issue date May 7, 2024
- LAT Enterprises Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Instrument panel for computing system
- Patent number 11,966,519
- Issue date Apr 23, 2024
- Baker Hughes Oilfield Operations LLC
- Steven William Fisher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for measuring device inside through-silicon via s...
- Patent number 11,955,392
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring system with bridges for interconnecting system elements
- Patent number 11,841,390
- Issue date Dec 12, 2023
- Bently Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Grant
Rigid-flex printed circuit board including built-in diagnostic
- Patent number 11,821,938
- Issue date Nov 21, 2023
- Hamilton Sundstrand Corporation
- Gomathi Ganesh Narayanan
- G08 - SIGNALLING
Information Patent Grant
Multiple circuit board tester
- Patent number 11,703,538
- Issue date Jul 18, 2023
- LAT Enterprises, Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring systems for industrial machines having dynamically adjus...
- Patent number 11,592,471
- Issue date Feb 28, 2023
- Bently Nevada, LLC
- Dustin Hess
- G05 - CONTROLLING REGULATING
Information Patent Grant
Electronic device and method for detecting connection state of conn...
- Patent number 11,513,167
- Issue date Nov 29, 2022
- Samsung Electronics Co., Ltd.
- Cheolho Lee
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system with bridges for interconnecting system elements
- Patent number 11,486,920
- Issue date Nov 1, 2022
- Bently Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Grant
Power modules having current sensing circuits
- Patent number 11,333,691
- Issue date May 17, 2022
- Astec International Limited
- Mao Xi Xiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, system and apparatus for detecting polarity of component, a...
- Patent number 11,330,705
- Issue date May 10, 2022
- VAYO (SHANGHAI) TECHNOLOGY CO., LTD.
- Shengjie Qian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring system with serial data lane transmission network
- Patent number 11,300,604
- Issue date Apr 12, 2022
- Bently Nevada, LLC
- Michael Alan Tart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for semiconductor device testing
- Patent number 11,293,974
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Display diagnostic system
- Patent number 11,257,407
- Issue date Feb 22, 2022
- Facebook Technologies, LLC
- Ilias Pappas
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Multiple circuit board tester
- Patent number 11,221,360
- Issue date Jan 11, 2022
- LAT Enterprises, Inc.
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Grant
Method for identification of proper probe placement on printed circ...
- Patent number 11,181,549
- Issue date Nov 23, 2021
- International Business Machines Corporation
- Jason T. Albert
- G01 - MEASURING TESTING
Information Patent Grant
Flexible and scalable monitoring systems for industrial machines
- Patent number 11,112,449
- Issue date Sep 7, 2021
- Bendy Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system with multidrop backplane scheduler
- Patent number 11,105,840
- Issue date Aug 31, 2021
- Bently Nevada, LLC
- Dustin Hess
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring systems for industrial machines having dynamically adjus...
- Patent number 11,016,141
- Issue date May 25, 2021
- Bently Nevada, LLC
- Dustin Hess
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system with bridges for interconnecting system elements
- Patent number 10,928,440
- Issue date Feb 23, 2021
- Bently Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Grant
Power modules having current sensing circuits
- Patent number 10,877,079
- Issue date Dec 29, 2020
- Astec International Limited
- Mao Xi Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Signal channel expanding system based on PAD
- Patent number 10,797,672
- Issue date Oct 6, 2020
- Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Xueqian Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated arc fault and ground fault current sensing package
- Patent number 10,622,800
- Issue date Apr 14, 2020
- SCHNEIDER ELECTRIC USA, INC.
- Randall J Gass
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board testing system
- Patent number 10,502,776
- Issue date Dec 10, 2019
- Primax Electronics Ltd.
- Pei-Ming Chang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for health monitoring and early warning for elect...
- Patent number 10,458,823
- Issue date Oct 29, 2019
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Ceramic multilayer substrate
- Patent number 10,426,027
- Issue date Sep 24, 2019
- MURATA MANUFACTURING CO., LTD.
- Masaaki Hanao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20240395640
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSTRUMENT PANEL FOR COMPUTING SYSTEM
- Publication number 20240272728
- Publication date Aug 15, 2024
- Baker Hughes Oilfield Operations LLC
- Steven William Fisher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20240241171
- Publication date Jul 18, 2024
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE AND PROBE DEVICE
- Publication number 20240125814
- Publication date Apr 18, 2024
- HIROSE ELECTRIC CO., LTD.
- Yujin HAGA
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONDUCTIVE SHEET AND ELECTRICAL INSPECTION METHOD
- Publication number 20240036102
- Publication date Feb 1, 2024
- Mitsui Chemicals, Inc.
- Katsunori NISHIURA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20230369144
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC UNIT AND METHOD FOR TESTING AT LEAST ONE STATE OF AN ELE...
- Publication number 20230366921
- Publication date Nov 16, 2023
- Endress+Hauser SE+Co. KG
- Bernd Strütt
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20230349966
- Publication date Nov 2, 2023
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...
- Publication number 20230341447
- Publication date Oct 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Maosong MA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR TESTING A PRINTED CIRCUIT BOARD
- Publication number 20230296662
- Publication date Sep 21, 2023
- Telefonaktiebolaget LM Ericsson (publ)
- Lackis ELEFTHERIADIS
- G01 - MEASURING TESTING
Information Patent Application
POTENTIAL DIFFERENCE EARLY-WARNING CIRCUIT AND SYSTEM
- Publication number 20230288496
- Publication date Sep 14, 2023
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.
- Jie CUI
- G01 - MEASURING TESTING
Information Patent Application
STORAGE MEDIUM, ELECTROMAGNETIC FIELD ANALYSIS DEVICE, AND ELECTROM...
- Publication number 20230204650
- Publication date Jun 29, 2023
- Fujitsu Limited
- Takashi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVERSE RECOVERY MEASUREMENTS AND PLOTS
- Publication number 20230133047
- Publication date May 4, 2023
- Tektronix, Inc.
- Vivek Shivaram
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONDUCTIVE SHEET, ELECTRICAL INSPECTION DEVICE, AND ELE...
- Publication number 20230106035
- Publication date Apr 6, 2023
- Mitsui Chemicals, Inc.
- Katsunori NISHIURA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
RIGID-FLEX PRINTED CIRCUIT BOARD INCLUDING BUILT-IN DIAGNOSTIC
- Publication number 20230101751
- Publication date Mar 30, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Gomathi Ganesh Narayanan
- G08 - SIGNALLING
Information Patent Application
PORTABLE NODAL IMPEDANCE ANALYSER
- Publication number 20230080282
- Publication date Mar 16, 2023
- QMAX TEST EQUIPMENTS PVT. LTD.
- S.R. Sabapathi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING PRODUCTS FOR DEFECTS, ELECTRONIC DEVICE, AND...
- Publication number 20230074247
- Publication date Mar 9, 2023
- HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
- ZI-QING XIA
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS
- Publication number 20220390504
- Publication date Dec 8, 2022
- Bently Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
- Publication number 20220367299
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shuo-Wen Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE CIRCUIT BOARD TESTER
- Publication number 20220128618
- Publication date Apr 28, 2022
- LAT Enterprises Inc., d/b/a MediPak Energy Systems
- Laura Thiel
- G01 - MEASURING TESTING
Information Patent Application
MONITORING SYSTEMS FOR INDUSTRIAL MACHINES HAVING DYNAMICALLY ADJUS...
- Publication number 20220113347
- Publication date Apr 14, 2022
- Bently Nevada, LLC
- Dustin Hess
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION SYSTEM
- Publication number 20210215773
- Publication date Jul 15, 2021
- Sakai Display Products Corporation
- HIROKAZU TSURUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS
- Publication number 20210172997
- Publication date Jun 10, 2021
- Bently Nevada, LLC
- Michael Alan Tart
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE TESTING
- Publication number 20210096173
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hao Chen
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR DETECTING CONNECTION STATE OF CONN...
- Publication number 20210072326
- Publication date Mar 11, 2021
- SAMSUNG ELECTRONICS CO., LTD.
- Cheolho LEE
- G01 - MEASURING TESTING
Information Patent Application
Power Modules Having Current Sensing Circuits
- Publication number 20210072294
- Publication date Mar 11, 2021
- Astec International Limited
- Mao Xi XIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD, SYSTEM AND APPARATUS FOR DETECTING POLARITY OF COMPONENT, A...
- Publication number 20200288568
- Publication date Sep 10, 2020
- VAYO (SHANGHAI) TECHNOLOGY CO., LTD.
- SHENGJIE QIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring System With Multidrop Backplane Scheduler
- Publication number 20190310308
- Publication date Oct 10, 2019
- Bently Nevada, LLC
- Dustin Hess
- G05 - CONTROLLING REGULATING
Information Patent Application
Monitoring System With Bridges For Interconnecting System Elements
- Publication number 20190310309
- Publication date Oct 10, 2019
- Bently Nevada, LLC
- Michael Alan Tart
- G05 - CONTROLLING REGULATING
Information Patent Application
Monitoring System With Serial Data Lane Transmission Network
- Publication number 20190310310
- Publication date Oct 10, 2019
- Bently Nevada, LLC
- Michael Alan Tart
- G05 - CONTROLLING REGULATING

Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for measuring device inside through-silicon via s...

X-ray sensitive materials for data protection

Portable nodal impedance analyser

Potential difference early-warning circuit and system

Multiple circuit board tester

Instrument panel for computing system

System and method for measuring device inside through-silicon via s...

Monitoring system with bridges for interconnecting system elements

Rigid-flex printed circuit board including built-in diagnostic

Multiple circuit board tester

Monitoring systems for industrial machines having dynamically adjus...

Electronic device and method for detecting connection state of conn...

Monitoring system with bridges for interconnecting system elements

Power modules having current sensing circuits

Method, system and apparatus for detecting polarity of component, a...

Monitoring system with serial data lane transmission network

System and method for semiconductor device testing

Display diagnostic system

Multiple circuit board tester

Method for identification of proper probe placement on printed circ...

Flexible and scalable monitoring systems for industrial machines

Monitoring system with multidrop backplane scheduler

Monitoring systems for industrial machines having dynamically adjus...

Monitoring system with bridges for interconnecting system elements

Power modules having current sensing circuits

Signal channel expanding system based on PAD

Integrated arc fault and ground fault current sensing package

Circuit board testing system

System and method for health monitoring and early warning for elect...

Ceramic multilayer substrate

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

INSTRUMENT PANEL FOR COMPUTING SYSTEM

MULTIPLE CIRCUIT BOARD TESTER

PROBE AND PROBE DEVICE

ANISOTROPIC CONDUCTIVE SHEET AND ELECTRICAL INSPECTION METHOD

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

ELECTRONIC UNIT AND METHOD FOR TESTING AT LEAST ONE STATE OF AN ELE...

MULTIPLE CIRCUIT BOARD TESTER

METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...

METHOD AND SYSTEM FOR TESTING A PRINTED CIRCUIT BOARD

POTENTIAL DIFFERENCE EARLY-WARNING CIRCUIT AND SYSTEM

STORAGE MEDIUM, ELECTROMAGNETIC FIELD ANALYSIS DEVICE, AND ELECTROM...

REVERSE RECOVERY MEASUREMENTS AND PLOTS

ANISOTROPIC CONDUCTIVE SHEET, ELECTRICAL INSPECTION DEVICE, AND ELE...

RIGID-FLEX PRINTED CIRCUIT BOARD INCLUDING BUILT-IN DIAGNOSTIC

PORTABLE NODAL IMPEDANCE ANALYSER

METHOD FOR MONITORING PRODUCTS FOR DEFECTS, ELECTRONIC DEVICE, AND...

MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS

SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...

MULTIPLE CIRCUIT BOARD TESTER

MONITORING SYSTEMS FOR INDUSTRIAL MACHINES HAVING DYNAMICALLY ADJUS...

CONNECTION SYSTEM

MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS

SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE TESTING

ELECTRONIC DEVICE AND METHOD FOR DETECTING CONNECTION STATE OF CONN...

Power Modules Having Current Sensing Circuits

METHOD, SYSTEM AND APPARATUS FOR DETECTING POLARITY OF COMPONENT, A...

Monitoring System With Multidrop Backplane Scheduler

Monitoring System With Bridges For Interconnecting System Elements

Monitoring System With Serial Data Lane Transmission Network