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Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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Industry
CPC
G01R31/2801
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2801
Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Multiple circuit board tester
Patent number
11,977,112
Issue date
May 7, 2024
LAT Enterprises Inc.
Laura Thiel
G01 - MEASURING TESTING
Information
Patent Grant
Instrument panel for computing system
Patent number
11,966,519
Issue date
Apr 23, 2024
Baker Hughes Oilfield Operations LLC
Steven William Fisher
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for measuring device inside through-silicon via s...
Patent number
11,955,392
Issue date
Apr 9, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Shuo-Wen Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monitoring system with bridges for interconnecting system elements
Patent number
11,841,390
Issue date
Dec 12, 2023
Bently Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Grant
Rigid-flex printed circuit board including built-in diagnostic
Patent number
11,821,938
Issue date
Nov 21, 2023
Hamilton Sundstrand Corporation
Gomathi Ganesh Narayanan
G08 - SIGNALLING
Information
Patent Grant
Multiple circuit board tester
Patent number
11,703,538
Issue date
Jul 18, 2023
LAT Enterprises, Inc.
Laura Thiel
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring systems for industrial machines having dynamically adjus...
Patent number
11,592,471
Issue date
Feb 28, 2023
Bently Nevada, LLC
Dustin Hess
G05 - CONTROLLING REGULATING
Information
Patent Grant
Electronic device and method for detecting connection state of conn...
Patent number
11,513,167
Issue date
Nov 29, 2022
Samsung Electronics Co., Ltd.
Cheolho Lee
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring system with bridges for interconnecting system elements
Patent number
11,486,920
Issue date
Nov 1, 2022
Bently Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Grant
Power modules having current sensing circuits
Patent number
11,333,691
Issue date
May 17, 2022
Astec International Limited
Mao Xi Xiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, system and apparatus for detecting polarity of component, a...
Patent number
11,330,705
Issue date
May 10, 2022
VAYO (SHANGHAI) TECHNOLOGY CO., LTD.
Shengjie Qian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Monitoring system with serial data lane transmission network
Patent number
11,300,604
Issue date
Apr 12, 2022
Bently Nevada, LLC
Michael Alan Tart
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for semiconductor device testing
Patent number
11,293,974
Issue date
Apr 5, 2022
Taiwan Semiconductor Manufacturing Company, Ltd
Hao Chen
G01 - MEASURING TESTING
Information
Patent Grant
Display diagnostic system
Patent number
11,257,407
Issue date
Feb 22, 2022
Facebook Technologies, LLC
Ilias Pappas
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Multiple circuit board tester
Patent number
11,221,360
Issue date
Jan 11, 2022
LAT Enterprises, Inc.
Laura Thiel
G01 - MEASURING TESTING
Information
Patent Grant
Method for identification of proper probe placement on printed circ...
Patent number
11,181,549
Issue date
Nov 23, 2021
International Business Machines Corporation
Jason T. Albert
G01 - MEASURING TESTING
Information
Patent Grant
Flexible and scalable monitoring systems for industrial machines
Patent number
11,112,449
Issue date
Sep 7, 2021
Bendy Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring system with multidrop backplane scheduler
Patent number
11,105,840
Issue date
Aug 31, 2021
Bently Nevada, LLC
Dustin Hess
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Monitoring systems for industrial machines having dynamically adjus...
Patent number
11,016,141
Issue date
May 25, 2021
Bently Nevada, LLC
Dustin Hess
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring system with bridges for interconnecting system elements
Patent number
10,928,440
Issue date
Feb 23, 2021
Bently Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Grant
Power modules having current sensing circuits
Patent number
10,877,079
Issue date
Dec 29, 2020
Astec International Limited
Mao Xi Xiang
G01 - MEASURING TESTING
Information
Patent Grant
Signal channel expanding system based on PAD
Patent number
10,797,672
Issue date
Oct 6, 2020
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
Xueqian Lai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated arc fault and ground fault current sensing package
Patent number
10,622,800
Issue date
Apr 14, 2020
SCHNEIDER ELECTRIC USA, INC.
Randall J Gass
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board testing system
Patent number
10,502,776
Issue date
Dec 10, 2019
Primax Electronics Ltd.
Pei-Ming Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for health monitoring and early warning for elect...
Patent number
10,458,823
Issue date
Oct 29, 2019
Fifth Electronics Research Institute of Ministry of Industry and Information...
Yiqiang Chen
G01 - MEASURING TESTING
Information
Patent Grant
Ceramic multilayer substrate
Patent number
10,426,027
Issue date
Sep 24, 2019
MURATA MANUFACTURING CO., LTD.
Masaaki Hanao
G01 - MEASURING TESTING
Information
Patent Grant
Ceramic multilayer substrate
Patent number
10,390,426
Issue date
Aug 20, 2019
MURATA MANUFACTURING CO., LTD.
Masaaki Hanao
G01 - MEASURING TESTING
Information
Patent Grant
Method for identification of proper probe placement on printed circ...
Patent number
10,371,718
Issue date
Aug 6, 2019
International Business Machines Corporation
Jason T. Albert
G01 - MEASURING TESTING
Information
Patent Grant
Universal test cell
Patent number
10,161,962
Issue date
Dec 25, 2018
Advantest Corporation
Ben Rogel-Favila
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
ICT probe contact improvement
Patent number
10,001,507
Issue date
Jun 19, 2018
International Business Machines Corporation
Wei Guo
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE AND PROBE DEVICE
Publication number
20240125814
Publication date
Apr 18, 2024
HIROSE ELECTRIC CO., LTD.
Yujin HAGA
G01 - MEASURING TESTING
Information
Patent Application
ANISOTROPIC CONDUCTIVE SHEET AND ELECTRICAL INSPECTION METHOD
Publication number
20240036102
Publication date
Feb 1, 2024
Mitsui Chemicals, Inc.
Katsunori NISHIURA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC UNIT AND METHOD FOR TESTING AT LEAST ONE STATE OF AN ELE...
Publication number
20230366921
Publication date
Nov 16, 2023
Endress+Hauser SE+Co. KG
Bernd Strütt
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
Publication number
20230369144
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Shuo-Wen Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CIRCUIT BOARD TESTER
Publication number
20230349966
Publication date
Nov 2, 2023
LAT Enterprises Inc., d/b/a MediPak Energy Systems
Laura Thiel
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERI...
Publication number
20230341447
Publication date
Oct 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
Maosong MA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING A PRINTED CIRCUIT BOARD
Publication number
20230296662
Publication date
Sep 21, 2023
Telefonaktiebolaget LM Ericsson (publ)
Lackis ELEFTHERIADIS
G01 - MEASURING TESTING
Information
Patent Application
POTENTIAL DIFFERENCE EARLY-WARNING CIRCUIT AND SYSTEM
Publication number
20230288496
Publication date
Sep 14, 2023
INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD.
Jie CUI
G01 - MEASURING TESTING
Information
Patent Application
STORAGE MEDIUM, ELECTROMAGNETIC FIELD ANALYSIS DEVICE, AND ELECTROM...
Publication number
20230204650
Publication date
Jun 29, 2023
Fujitsu Limited
Takashi YAMAZAKI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REVERSE RECOVERY MEASUREMENTS AND PLOTS
Publication number
20230133047
Publication date
May 4, 2023
Tektronix, Inc.
Vivek Shivaram
G01 - MEASURING TESTING
Information
Patent Application
ANISOTROPIC CONDUCTIVE SHEET, ELECTRICAL INSPECTION DEVICE, AND ELE...
Publication number
20230106035
Publication date
Apr 6, 2023
Mitsui Chemicals, Inc.
Katsunori NISHIURA
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
RIGID-FLEX PRINTED CIRCUIT BOARD INCLUDING BUILT-IN DIAGNOSTIC
Publication number
20230101751
Publication date
Mar 30, 2023
HAMILTON SUNDSTRAND CORPORATION
Gomathi Ganesh Narayanan
G08 - SIGNALLING
Information
Patent Application
PORTABLE NODAL IMPEDANCE ANALYSER
Publication number
20230080282
Publication date
Mar 16, 2023
QMAX TEST EQUIPMENTS PVT. LTD.
S.R. Sabapathi
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MONITORING PRODUCTS FOR DEFECTS, ELECTRONIC DEVICE, AND...
Publication number
20230074247
Publication date
Mar 9, 2023
HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
ZI-QING XIA
G01 - MEASURING TESTING
Information
Patent Application
MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS
Publication number
20220390504
Publication date
Dec 8, 2022
Bently Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING DEVICE INSIDE THROUGH-SILICON VIA S...
Publication number
20220367299
Publication date
Nov 17, 2022
Taiwan Semiconductor Manufacturing Company, Ltd.
Shuo-Wen Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTIPLE CIRCUIT BOARD TESTER
Publication number
20220128618
Publication date
Apr 28, 2022
LAT Enterprises Inc., d/b/a MediPak Energy Systems
Laura Thiel
G01 - MEASURING TESTING
Information
Patent Application
MONITORING SYSTEMS FOR INDUSTRIAL MACHINES HAVING DYNAMICALLY ADJUS...
Publication number
20220113347
Publication date
Apr 14, 2022
Bently Nevada, LLC
Dustin Hess
G01 - MEASURING TESTING
Information
Patent Application
CONNECTION SYSTEM
Publication number
20210215773
Publication date
Jul 15, 2021
Sakai Display Products Corporation
HIROKAZU TSURUTA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MONITORING SYSTEM WITH BRIDGES FOR INTERCONNECTING SYSTEM ELEMENTS
Publication number
20210172997
Publication date
Jun 10, 2021
Bently Nevada, LLC
Michael Alan Tart
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SEMICONDUCTOR DEVICE TESTING
Publication number
20210096173
Publication date
Apr 1, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Hao Chen
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR DETECTING CONNECTION STATE OF CONN...
Publication number
20210072326
Publication date
Mar 11, 2021
SAMSUNG ELECTRONICS CO., LTD.
Cheolho LEE
G01 - MEASURING TESTING
Information
Patent Application
Power Modules Having Current Sensing Circuits
Publication number
20210072294
Publication date
Mar 11, 2021
Astec International Limited
Mao Xi XIANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, SYSTEM AND APPARATUS FOR DETECTING POLARITY OF COMPONENT, A...
Publication number
20200288568
Publication date
Sep 10, 2020
VAYO (SHANGHAI) TECHNOLOGY CO., LTD.
SHENGJIE QIAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Monitoring System With Multidrop Backplane Scheduler
Publication number
20190310308
Publication date
Oct 10, 2019
Bently Nevada, LLC
Dustin Hess
G05 - CONTROLLING REGULATING
Information
Patent Application
Monitoring System With Bridges For Interconnecting System Elements
Publication number
20190310309
Publication date
Oct 10, 2019
Bently Nevada, LLC
Michael Alan Tart
G05 - CONTROLLING REGULATING
Information
Patent Application
Monitoring System With Serial Data Lane Transmission Network
Publication number
20190310310
Publication date
Oct 10, 2019
Bently Nevada, LLC
Michael Alan Tart
G05 - CONTROLLING REGULATING
Information
Patent Application
MONITORING SYSTEMS FOR INDUSTRIAL MACHINES HAVING DYNAMICALLY ADJUS...
Publication number
20190310312
Publication date
Oct 10, 2019
Bently Nevada, LLC
Dustin Hess
G05 - CONTROLLING REGULATING
Information
Patent Application
FLEXIBLE AND SCALABLE MONITORING SYSTEMS FOR INDUSTRIAL MACHINES
Publication number
20190310311
Publication date
Oct 10, 2019
Bently Nevada, LLC
Michael Alan Tart
G05 - CONTROLLING REGULATING
Information
Patent Application
METHOD FOR IDENTIFICATION OF PROPER PROBE PLACEMENT ON PRINTED CIRC...
Publication number
20190285665
Publication date
Sep 19, 2019
International Business Machines Corporation
Jason T. Albert
G01 - MEASURING TESTING