the body of the probe being perpendicular to test object

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G01R1/07314

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07314the body of the probe being perpendicular to test object

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Lidless BGA socket apparatus for testing semiconductor device
- Patent number 12,248,001
- Issue date Mar 11, 2025
- HICON CO., LTD.
- Dong Weon Hwang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite intermediary device using vertical probe for wafer testing
- Patent number 12,235,313
- Issue date Feb 25, 2025
- SYU GUANG TECHNOLOGY CO., LTD.
- Kun Yu Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly with multiple spacers and methods of assembling the...
- Patent number 12,196,780
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Ming-Cheng Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,782
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,196,781
- Issue date Jan 14, 2025
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,188,977
- Issue date Jan 7, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Lead guides having a recessed face
- Patent number 12,181,516
- Issue date Dec 31, 2024
- Texas Instruments Incorporated
- Chi-Tsung Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for testing power devices under high temperature and hig...
- Patent number 12,158,481
- Issue date Dec 3, 2024
- MAXONE SEMICONDUCTOR (SUZHOU) CO., LTD.
- Liangyu Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card having different probes
- Patent number 12,146,897
- Issue date Nov 19, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus
- Patent number 12,140,623
- Issue date Nov 12, 2024
- Global Unichip Corporation
- Chih-Chieh Liao
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 12,117,484
- Issue date Oct 15, 2024
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating test socket
- Patent number 12,105,133
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Seungha Baek
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 12,092,660
- Issue date Sep 17, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection jig and inspection device
- Patent number 12,072,352
- Issue date Aug 27, 2024
- Nidec-Read Corporation
- Michio Kaida
- G01 - MEASURING TESTING
Information Patent Grant
Probes with planar unbiased spring elements for electronic componen...
- Patent number 12,066,462
- Issue date Aug 20, 2024
- Microfabrica Inc.
- Arun S. Veeramani
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal, inspection jig, and inspection device
- Patent number 12,055,561
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Norihiro Ota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chevron interconnect for very fine pitch probing
- Patent number 12,032,002
- Issue date Jul 9, 2024
- Intel Corporation
- Pooya Tadayon
- G01 - MEASURING TESTING
Information Patent Grant
Detection unit, semiconductor film layer inspection apparatus inclu...
- Patent number 12,032,012
- Issue date Jul 9, 2024
- En Vigth Co., Ltd.
- Kook Chul Moon
- G01 - MEASURING TESTING
Information Patent Grant
Clad wire and method for producing clad wires
- Patent number 12,020,829
- Issue date Jun 25, 2024
- Heraeus Deutschland GmbH & Co. KG
- Marc Rättig
- G01 - MEASURING TESTING
Information Patent Grant
Multi-beam vertical probes with independent arms formed of a high c...
- Patent number 12,000,865
- Issue date Jun 4, 2024
- Microfabrica Inc.
- Uri Frodis
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and fence-like probe thereof
- Patent number 11,988,686
- Issue date May 21, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Wei-Jhih Su
- G01 - MEASURING TESTING
Information Patent Grant
Particle measurement device, three-dimensional shape measurement de...
- Patent number 11,940,463
- Issue date Mar 26, 2024
- Tokyo Seimitsu Co., Ltd.
- Natsumi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Fan-out buffer with skew control function, operating method thereof...
- Patent number 11,921,158
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Byung-Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Probe card structure
- Patent number 11,879,913
- Issue date Jan 23, 2024
- XINZHUO TECHNOLOGY (ZHEJIANG) CO., LTD.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Probe head and probe card having same
- Patent number 11,860,192
- Issue date Jan 2, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo Ahn
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic conductive sheet, anisotropic conductive composite shee...
- Patent number 11,860,193
- Issue date Jan 2, 2024
- Mitsui Chemicals, Inc.
- Taichi Koyama
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 11,828,773
- Issue date Nov 28, 2023
- Kabushiki Kaisha Nihon Micronics
- Akihiro Shuto
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing components under elevated gas pressure
- Patent number 11,815,542
- Issue date Nov 14, 2023
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for testing high-frequency components, particularl...
- Patent number 11,782,072
- Issue date Oct 10, 2023
- Advantest Corporation
- José Moreira
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus, System and Method for Repairing a Test Contact Arrangement
- Publication number 20250076342
- Publication date Mar 6, 2025
- Pac Tech - Packaging Technologies GmbH
- Thorsten Krause
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER SUBSTRATE AND JIG
- Publication number 20250063660
- Publication date Feb 20, 2025
- NIDEC ADVANCE TECHNOLOGY CORPORATION
- Shigeki SAKAI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
- Publication number 20250035699
- Publication date Jan 30, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS
- Publication number 20250004012
- Publication date Jan 2, 2025
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD
- Publication number 20240426871
- Publication date Dec 26, 2024
- POINT ENGINEERING CO., LTD.
- Bum Mo AHN
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND BATTERY PRODUCTION LINE
- Publication number 20240426873
- Publication date Dec 26, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Jun YANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
- Publication number 20240377436
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...
- Publication number 20240377433
- Publication date Nov 14, 2024
- Smiths Interconnect Americas, Inc.
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER
- Publication number 20240369623
- Publication date Nov 7, 2024
- TOKYO SEIMITSU CO., LTD.
- Akira YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE
- Publication number 20240369599
- Publication date Nov 7, 2024
- Silicon Future Manufacturing Company Ltd.
- TIEN-CHIA LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240353445
- Publication date Oct 24, 2024
- NHK Spring Co., Ltd.
- Naruhiko Nishiwaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...
- Publication number 20240345131
- Publication date Oct 17, 2024
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Senlin JIN
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF
- Publication number 20240345134
- Publication date Oct 17, 2024
- HERMES TESTING SOLUTIONS INC.
- Wei-Ting Chen
- G01 - MEASURING TESTING
Information Patent Application
Roller Tap Down Technique for Probe Arrays
- Publication number 20240345133
- Publication date Oct 17, 2024
- Sterling Tadashi Collins
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND CALIBRATION METHOD FOR PROBER
- Publication number 20240337678
- Publication date Oct 10, 2024
- United Microelectronics Corp.
- Huan-Chen Peng
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240329085
- Publication date Oct 3, 2024
- YOKOWO CO., LTD.
- Takeshi TODOROKI
- G01 - MEASURING TESTING
Information Patent Application
STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...
- Publication number 20240329083
- Publication date Oct 3, 2024
- MPI CORPORATION
- CHIA-NAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND PROBE UNIT
- Publication number 20240264200
- Publication date Aug 8, 2024
- NHK Spring Co., Ltd.
- Kazuya Soma
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20240264038
- Publication date Aug 8, 2024
- SK HYNIX INC.
- Sung Wook CHO
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET AND METHOD FOR FABRICATING THE SAME
- Publication number 20240248118
- Publication date Jul 25, 2024
- LEENO INDUSTRIAL INC.
- Geunsu KIM
- G01 - MEASURING TESTING
Information Patent Application
SPRING PROBE CONTACT ASSEMBLY
- Publication number 20240241153
- Publication date Jul 18, 2024
- Johnstech International Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING APPARATUS
- Publication number 20240219448
- Publication date Jul 4, 2024
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP F...
- Publication number 20240219894
- Publication date Jul 4, 2024
- Intel Corporation
- Santosh Tripathi
- G01 - MEASURING TESTING
Information Patent Application
DETECTION UNIT, SEMICONDUCTOR FILM LAYER INSPECTION APPARATUS INCLU...
- Publication number 20240219446
- Publication date Jul 4, 2024
- EnVigth Co., Ltd.
- Kook Chul MOON
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD TRANSPORTING APPARATUS AND METHOD
- Publication number 20240183895
- Publication date Jun 6, 2024
- SEMES CO., LTD.
- Ho Young LEE
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VER...
- Publication number 20240175900
- Publication date May 30, 2024
- MPI Corporation
- CHIN-YI LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND PROBE CARD
- Publication number 20240168056
- Publication date May 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Mika NASU
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING
- Publication number 20240151764
- Publication date May 9, 2024
- SYU GUANG TECHNOLOGY CO., LTD.
- KUN YU WU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND METHOD FOR REPAIRING PROBE CARD
- Publication number 20240110974
- Publication date Apr 4, 2024
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Yutaka TOMITA
- G01 - MEASURING TESTING

the body of the probe being perpendicular to test object

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Lidless BGA socket apparatus for testing semiconductor device

Composite intermediary device using vertical probe for wafer testing

Probe assembly with multiple spacers and methods of assembling the...

Probes with planar unbiased spring elements for electronic componen...

Probes with planar unbiased spring elements for electronic componen...

Contact probe, probe holder and probe unit

Lead guides having a recessed face

Probe card for testing power devices under high temperature and hig...

Vertical probe card having different probes

Testing apparatus

Test device

Method for fabricating test socket

Test socket

Probe card

Inspection jig and inspection device

Probes with planar unbiased spring elements for electronic componen...

Contact terminal, inspection jig, and inspection device

Chevron interconnect for very fine pitch probing

Detection unit, semiconductor film layer inspection apparatus inclu...

Clad wire and method for producing clad wires

Multi-beam vertical probes with independent arms formed of a high c...

Vertical probe card and fence-like probe thereof

Particle measurement device, three-dimensional shape measurement de...

Fan-out buffer with skew control function, operating method thereof...

Probe card structure

Probe head and probe card having same

Anisotropic conductive sheet, anisotropic conductive composite shee...

Electrical connecting device

Device for testing components under elevated gas pressure

Test arrangement for testing high-frequency components, particularl...

Patents Applicationslast 30 patents

Apparatus, System and Method for Repairing a Test Contact Arrangement

MULTILAYER SUBSTRATE AND JIG

CONTACT PROBE, PROBE HOLDER AND PROBE UNIT

PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHS

VERTICAL PROBE CARD

TEST APPARATUS AND BATTERY PRODUCTION LINE

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF

TEST SOCKET AND PROBE WITH STEPPED COLLAR FOR SEMICONDUCTOR INTEGRA...

WAFER TEST SYSTEM, PROBE CARD REPLACING METHOD, AND PROBER

PROBE CARD DEVICE

PROBE CARD

PROBE MODULE FOR TESTING OF ELECTRICAL RESISTIVITY OF CONDUCTIVE FI...

PROBE CARD MONITORING SYSTEM AND MONITORING METHOD THEREOF

Roller Tap Down Technique for Probe Arrays

PROBE CARD AND CALIBRATION METHOD FOR PROBER

PROBE CARD

STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...

CONTACT PROBE AND PROBE UNIT

PROBE CARD

TEST SOCKET AND METHOD FOR FABRICATING THE SAME

SPRING PROBE CONTACT ASSEMBLY

TESTING APPARATUS

METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP F...

DETECTION UNIT, SEMICONDUCTOR FILM LAYER INSPECTION APPARATUS INCLU...

PROBE CARD TRANSPORTING APPARATUS AND METHOD

PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VER...

PROBE AND PROBE CARD

COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING

PROBE CARD AND METHOD FOR REPAIRING PROBE CARD