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the devices having a single sensing mass
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G01C19/5755
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PHYSICS
G01
Measuring instruments
G01C
MEASURING DISTANCES, LEVELS OR BEARINGS SURVEYING NAVIGATION GYROSCOPIC INSTRUMENTS PHOTOGRAMMETRY OR VIDEOGRAMMETRY
G01C19/00
Gyroscopes Turn-sensitive devices using vibrating masses Turn-sensitive devices without moving masses Measuring angular rate using gyroscopic effects
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G01C19/5755
the devices having a single sensing mass
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Patents Grants
last 30 patents
Information
Patent Grant
Micro hemispherical resonator gyroscope, and an assembly method and...
Patent number
11,920,932
Issue date
Mar 5, 2024
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Xuezhong Wu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Inertial sensor and method of inertial sensing with tuneable mode c...
Patent number
11,913,808
Issue date
Feb 27, 2024
SILICON MICROGRAVITY LIMITED
Xin Zhou
G01 - MEASURING TESTING
Information
Patent Grant
MEMS motion sensor and method of manufacturing
Patent number
11,852,481
Issue date
Dec 26, 2023
Motion Engine Inc.
Robert Mark Boysel
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope with calibration of the scale factor in real time an...
Patent number
11,808,573
Issue date
Nov 7, 2023
STMicroelectronics S.r.l.
Luca Guerinoni
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Low-parasitic capacitance MEMS inertial sensors and related methods
Patent number
11,746,004
Issue date
Sep 5, 2023
Analog Devices, Inc.
Charles Blackmer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Bandwidth extension for continuous mode reversal gyroscope
Patent number
11,680,799
Issue date
Jun 20, 2023
The Regents of the University of California
Bernhard Boser
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor having a movable body formed with through-...
Patent number
11,662,360
Issue date
May 30, 2023
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Method of optimising the performance of a MEMS rate gyroscope
Patent number
11,441,902
Issue date
Sep 13, 2022
Cambridge Enterprise Limited
Ashwin Arunkumar Seshia
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope with calibration of the scale factor in real time an...
Patent number
11,340,069
Issue date
May 24, 2022
STMicroelectronics S.r.l.
Luca Guerinoni
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Low-parasitic capacitance MEMS inertial sensors and related methods
Patent number
11,279,614
Issue date
Mar 22, 2022
Analog Devices, Inc.
Charles Blackmer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Gyroscope
Patent number
11,243,077
Issue date
Feb 8, 2022
Atlantic Inertial Systems Limited
Matthew Williamson
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Three-axis micromechanical rotation rate sensor system including li...
Patent number
11,226,202
Issue date
Jan 18, 2022
Robert Bosch GmbH
Odd-Axel Pruetz
G01 - MEASURING TESTING
Information
Patent Grant
Piezoresistive detection resonant device in particular with large v...
Patent number
11,125,632
Issue date
Sep 21, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Patrice Rey
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Vibration device and method for controlling the same
Patent number
11,092,440
Issue date
Aug 17, 2021
Kabushikikaisha Toshiba
Ryunosuke Gando
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Rotation rate sensor and method for manufacturing a rotation rate s...
Patent number
11,060,867
Issue date
Jul 13, 2021
Robert Bosch GmbH
Martin Putnik
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for sensing angular motion in the presence of l...
Patent number
11,041,722
Issue date
Jun 22, 2021
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating-mass gyroscope systems and method
Patent number
11,015,934
Issue date
May 25, 2021
Northrop Grumman Systems Corporation
Alexander Trusov
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range gyroscope
Patent number
10,914,585
Issue date
Feb 9, 2021
HRL Laboratories, LLC
Logan D. Sorenson
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-compensated micro-electromechanical device, and method...
Patent number
10,894,713
Issue date
Jan 19, 2021
STMicroelectronics S.r.l.
Ernesto Lasalandra
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Frequency mismatch detection method for mode matching in gyroscopes
Patent number
10,852,136
Issue date
Dec 1, 2020
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Grant
Single axis inertial sensor with suppressed parasitic modes
Patent number
10,809,277
Issue date
Oct 20, 2020
NXP USA, INC.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor having a movable body formed with through-...
Patent number
10,809,278
Issue date
Oct 20, 2020
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Gyroscope in-field prognostics
Patent number
10,782,147
Issue date
Sep 22, 2020
Atlantic Inertial Systems Limited
Thomas Mansfield
G01 - MEASURING TESTING
Information
Patent Grant
MEMS gyroscope with improved rejection of a quadrature error
Patent number
10,775,171
Issue date
Sep 15, 2020
STMicroelectronics S.r.l.
Gabriele Gattere
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Sensor device employing MEMS
Patent number
10,760,910
Issue date
Sep 1, 2020
Kabushiki Kaisha Toshiba
Ryunosuke Gando
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS out of plane actuator
Patent number
10,753,744
Issue date
Aug 25, 2020
Honeywell International Inc.
Mikulas Jandak
G01 - MEASURING TESTING
Information
Patent Grant
High dynamic range gyroscope
Patent number
10,697,772
Issue date
Jun 30, 2020
HRL Laboratories, LLC
Logan D. Sorenson
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating-mass gyroscope system
Patent number
10,648,811
Issue date
May 12, 2020
Northrop Grumman Systems Corporation
Alexander A. Trusov
G01 - MEASURING TESTING
Information
Patent Grant
Physical quantity sensor, physical quantity sensor device, electron...
Patent number
10,641,789
Issue date
May 5, 2020
Seiko Epson Corporation
Satoru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Inertial sensor
Patent number
10,551,192
Issue date
Feb 4, 2020
Hitachi Automotive Systems, Ltd.
Daisuke Maeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RESONANT SENSOR SYSTEM AND METHOD FOR OPERATING A RESONANT SENSOR S...
Publication number
20240337491
Publication date
Oct 10, 2024
ROBERT BOSCH GmbH
Antonios Nikas
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
CIRCUIT AND METHOD FOR DRIVING A MICRO-ELECTRO-MECHANICAL RESONATOR...
Publication number
20240240945
Publication date
Jul 18, 2024
STMicroelectronics S.r.l.
Gabriele GATTERE
G01 - MEASURING TESTING
Information
Patent Application
MEMS MOTION SENSOR AND METHOD OF MANUFACTURING
Publication number
20240210174
Publication date
Jun 27, 2024
MOTION ENGINE INC.
Robert Mark Boysel
G01 - MEASURING TESTING
Information
Patent Application
SENSOR SYSTEM AND METHOD FOR COMPENSATING FOR AN OFFSET OF AN ANGUL...
Publication number
20230213340
Publication date
Jul 6, 2023
ROBERT BOSCH GmbH
Francesco Diazzi
G01 - MEASURING TESTING
Information
Patent Application
MEMS DIE AND MEMS-BASED VIBRATION SENSOR
Publication number
20230192475
Publication date
Jun 22, 2023
KNOWLES ELECTRONICS, LLC
Ken Deng
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FABRICATION OF MEMS STRUCTURES FROM FUSED SILICA FOR INERTIAL SENSORS
Publication number
20230067030
Publication date
Mar 2, 2023
Atlantic Inertial Systems Limited
Christopher Paul Fell
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
DRIVING CIRCUIT FOR CONTROLLING A MEMS OSCILLATOR OF RESONANT TYPE
Publication number
20220412739
Publication date
Dec 29, 2022
STMicroelectronics S.r.l.
Andrea DONADEL
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MEMS GYROSCOPE WITH CALIBRATION OF THE SCALE FACTOR IN REAL TIME AN...
Publication number
20220252397
Publication date
Aug 11, 2022
STMicroelectronics S.r.l.
Luca GUERINONI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
LOW-PARASITIC CAPACITANCE MEMS INERTIAL SENSORS AND RELATED METHODS
Publication number
20220162059
Publication date
May 26, 2022
Analog Devices, Inc.
Charles Blackmer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICRO HEMISPHERICAL RESONATOR GYROSCOPE, AND AN ASSEMBLY METHOD AND...
Publication number
20220049959
Publication date
Feb 17, 2022
NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY
Xuezhong WU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR AND ELECTRONIC DEVICE
Publication number
20210381831
Publication date
Dec 9, 2021
Kabushiki Kaisha Toshiba
Ryunosuke GANDO
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR HAVING A MOVABLE BODY FORMED WITH THROUGH-...
Publication number
20210003607
Publication date
Jan 7, 2021
SEIKO EPSON CORPORATION
Satoru TANAKA
G01 - MEASURING TESTING
Information
Patent Application
LOW-PARASITIC CAPACITANCE MEMS INERTIAL SENSORS AND RELATED METHODS
Publication number
20200407217
Publication date
Dec 31, 2020
Analog Devices, Inc.
Charles Blackmer
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS GYROSCOPE WITH CALIBRATION OF THE SCALE FACTOR IN REAL TIME AN...
Publication number
20200400434
Publication date
Dec 24, 2020
STMicroelectronics S.r.l.
Luca GUERINONI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
BANDWIDTH EXTENSION FOR CONTINUOUS MODE REVERSAL GYROSCOPE
Publication number
20200378763
Publication date
Dec 3, 2020
The Regents of the University of California
Bernhard Boser
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MICROMECHANICAL ROTATION RATE SENSOR SYSTEM INCLUDING LI...
Publication number
20200355500
Publication date
Nov 12, 2020
ROBERT BOSCH GmbH
Odd-Axel Pruetz
G01 - MEASURING TESTING
Information
Patent Application
GYROSCOPE
Publication number
20200200536
Publication date
Jun 25, 2020
Atlantic Inertial Systems Limited
Matthew WILLIAMSON
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR DEVICE AND ELECTRONIC APPARATUS
Publication number
20200072607
Publication date
Mar 5, 2020
Sony Semiconductor Solutions Corporation
SATOSHI MITANI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SENSING ANGULAR MOTION IN THE PRESENCE OF L...
Publication number
20200025566
Publication date
Jan 23, 2020
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL QUANTITY SENSOR, PHYSICAL QUANTITY SENSOR DEVICE, COMPOSIT...
Publication number
20190302142
Publication date
Oct 3, 2019
SEIKO EPSON CORPORATION
Satoru TANAKA
G01 - MEASURING TESTING
Information
Patent Application
MONOLITHIC PZT ACTUATOR, STAGE, AND METHOD FOR MAKING
Publication number
20190214543
Publication date
Jul 11, 2019
Cornell University
Amit Lal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SINGLE AXIS INERTIAL SENSOR WITH SUPPRESSED PARASITIC MODES
Publication number
20190187169
Publication date
Jun 20, 2019
NXP USA, Inc.
Jun Tang
G01 - MEASURING TESTING
Information
Patent Application
VIBRATING-MASS GYROSCOPE SYSTEM
Publication number
20190170514
Publication date
Jun 6, 2019
Northrop Grumman Systems Corporation
ALEXANDER A. TRUSOV
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE
Publication number
20190078886
Publication date
Mar 14, 2019
Kabushiki Kaisha Toshiba
Ryunosuke GANDO
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MISMATCH DETECTION METHOD FOR MODE MATCHING IN GYROSCOPES
Publication number
20190063923
Publication date
Feb 28, 2019
Analog Devices, Inc.
Jiefeng Yan
G01 - MEASURING TESTING
Information
Patent Application
ROTATION RATE SENSOR AND METHOD FOR MANUFACTURING A ROTATION RATE S...
Publication number
20190041213
Publication date
Feb 7, 2019
ROBERT BOSCH GmbH
Martin Putnik
G01 - MEASURING TESTING
Information
Patent Application
Simplified Time Domain Switched Ring/Disk Resonant Gyroscope
Publication number
20180347985
Publication date
Dec 6, 2018
United States of America as represented by Secretary of the Navy
Andrew B. Sabater
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE
Publication number
20180299270
Publication date
Oct 18, 2018
RICHTEK TECHNOLOGY CORPORATION
Chia-Yu Wu
G01 - MEASURING TESTING
Information
Patent Application
GYROSCOPE IN-FIELD PROGNOSTICS
Publication number
20180259359
Publication date
Sep 13, 2018
Atlantic Inertial Systems Limited
Thomas MANSFIELD
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE WITH IMPROVED SPRING SYSTEM
Publication number
20180128615
Publication date
May 10, 2018
InvenSense, Inc.
Joseph SEEGER
G01 - MEASURING TESTING