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the insulator being formed after the semiconductor body, the semiconductor being a III-V compound
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Structure and formation method of semiconductor device structure wi...
Patent number
12,148,792
Issue date
Nov 19, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Chih-Wei Lin
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High electron mobility transistor and method for fabricating the same
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12,125,903
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Oct 22, 2024
United Microelectronics Corp.
Shin-Chuan Huang
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Method of fabricating super-junction based vertical gallium nitride...
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12,080,757
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Sep 3, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Hao Cui
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Wafer level sequencing flow cell fabrication
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12,057,309
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Aug 6, 2024
MGI Tech Co., Ltd.
Shifeng Li
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Semiconductor power device and method for producing same
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12,009,213
Issue date
Jun 11, 2024
Rohm Co., Ltd.
Yuki Nakano
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Semiconductor structure
Patent number
11,923,460
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Mar 5, 2024
Mediatek Inc.
Cheng-Tien Wan
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Method of fabricating super-junction based vertical gallium nitride...
Patent number
11,824,086
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Nov 21, 2023
NEXGEN POWER SYSTEMS, INC.
Hao Cui
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High electron mobility transistor and method for fabricating the same
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11,804,544
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Oct 31, 2023
United Microelectronics Corp.
Shin-Chuan Huang
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Nitride semiconductor device and fabrication method therefor
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11,777,024
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Oct 3, 2023
Rohm Co., Ltd.
Kenji Yamamoto
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Semiconductor device and method for manufacturing the same
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11,757,028
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Sep 12, 2023
Kabushiki Kaisha Toshiba
Yosuke Kajiwara
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Integrated circuit devices with an engineered substrate
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11,735,460
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Aug 22, 2023
QROMIS, Inc.
Vladimir Odnoblyudov
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Method of manufacturing a HEMT device with reduced gate leakage cur...
Patent number
11,728,404
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Aug 15, 2023
STMicroelectronics S.r.l.
Ferdinando Iucolano
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Structure and formation method of semiconductor device structure wi...
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11,728,376
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Aug 15, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Chih-Wei Lin
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Epitaxial structure of N-face group III nitride, active device, and...
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11,605,731
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Mar 14, 2023
Chih-Shu Huang
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Planar transistors with wrap-around gates and wrap-around source an...
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11,588,037
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Feb 21, 2023
Intel Corporation
Nidhi Nidhi
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Super-junction based vertical gallium nitride JFET power devices
Patent number
11,575,000
Issue date
Feb 7, 2023
NEXGEN POWER SYSTEMS, INC.
Hao Cui
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Silicon rich nitride layer between a plurality of semiconductor layers
Patent number
11,515,411
Issue date
Nov 29, 2022
Kabushiki Kaisha Toshiba
Yosuke Kajiwara
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Doped gate dielectrics materials
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11,437,485
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Sep 6, 2022
HRL Laboratories, LLC
Yu Cao
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Method of making a high power transistor with gate oxide barriers
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11,424,355
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Aug 23, 2022
Texas Instruments Incorporated
Nicholas Stephen Dellas
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Semiconductor structure
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11,404,587
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Aug 2, 2022
Mediatek Inc.
Cheng-Tien Wan
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Wafer level sequencing flow cell fabrication
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11,387,096
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Jul 12, 2022
MGI Tech Co., Ltd.
Shifeng Li
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Transistor devices and methods of forming a transistor device
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11,380,677
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Jul 5, 2022
GLOBALFOUNDRIES Singapore Pte. Ltd.
Jiacheng Lei
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Method of manufacturing semiconductor device and semiconductor device
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11,362,174
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Jun 14, 2022
Kabushiki Kaisha Toshiba
Tatsuo Shimizu
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Semiconductor device
Patent number
11,355,593
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Jun 7, 2022
Toyoda Gosei Co., Ltd.
Takatomi Izumi
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Enhancement mode III-nitride devices having an Al1-xSixO gate insul...
Patent number
11,322,599
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May 3, 2022
Transphorm Technology, Inc.
Carl Joseph Neufeld
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Semiconductor power device and method for producing same
Patent number
11,276,574
Issue date
Mar 15, 2022
Rohm Co., Ltd.
Yuki Nakano
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Gallium nitride based semiconductor device and manufacturing method...
Patent number
11,257,676
Issue date
Feb 22, 2022
Fuji Electric Co., Ltd.
Hideaki Matsuyama
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High electron mobility transistors and methods for fabricating the...
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11,227,943
Issue date
Jan 18, 2022
The Government of the United States of America, as represented by the Secreta...
Travis J. Anderson
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Semiconductor device having high-κ dielectric layer and method for...
Patent number
11,201,055
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Dec 14, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Chien-Hua Fu
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MOSFET with ultra low drain leakage
Patent number
11,201,212
Issue date
Dec 14, 2021
International Business Machines Corporation
Joel P. de Souza
H01 - BASIC ELECTRIC ELEMENTS
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STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WI...
Publication number
20240379740
Publication date
Nov 14, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Chih-Wei LIN
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF FABRICATING SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE...
Publication number
20240371929
Publication date
Nov 7, 2024
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Hao CUI
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SEMICONDUCTOR POWER DEVICE AND METHOD FOR PRODUCING SAME
Publication number
20240304447
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Sep 12, 2024
Rohm Co., Ltd.
Yuki Nakano
H01 - BASIC ELECTRIC ELEMENTS
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SELECTIVE GATE OXIDE FORMATION ON 2D MATERIAL BASED TRANSISTOR DEVICES
Publication number
20240222441
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Jul 4, 2024
Intel Corporation
Mahmut Sami Kavrik
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SEMICONDUCTOR STRUCTURE
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20240170580
Publication date
May 23, 2024
MEDIATEK INC.
Cheng-Tien Wan
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR ELEMENT WITH SHIELDING
Publication number
20240096935
Publication date
Mar 21, 2024
ROBERT BOSCH GmbH
Christian Huber
H01 - BASIC ELECTRIC ELEMENTS
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NITRIDE SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREFOR
Publication number
20230411508
Publication date
Dec 21, 2023
ROHM CO., LTD.
Kenji Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
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STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WI...
Publication number
20230378253
Publication date
Nov 23, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Chih-Wei LIN
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR STRUCTURE
Publication number
20220336680
Publication date
Oct 20, 2022
MEDIATEK INC.
Cheng-Tien Wan
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WAFER LEVEL SEQUENCING FLOW CELL FABRICATION
Publication number
20220301848
Publication date
Sep 22, 2022
MGI TECH CO., LTD.
Shifeng Li
H01 - BASIC ELECTRIC ELEMENTS
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NITRIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20220271144
Publication date
Aug 25, 2022
DENSO CORPORATION
Takashi OKAWA
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SWITCHING DEVICE AND METHOD FOR MANUFACTURING THE SAME
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20220270882
Publication date
Aug 25, 2022
DENSO CORPORATION
Hidemoto TOMITA
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SEMICONDUCTOR POWER DEVICE AND METHOD FOR PRODUCING SAME
Publication number
20220157606
Publication date
May 19, 2022
Rohm Co., Ltd.
Yuki Nakano
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20220115529
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Apr 14, 2022
KABUSHIKI KAISHA TOSHIBA
Yosuke KAJIWARA
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METHOD AND SYSTEM FOR SUPER-JUNCTION BASED VERTICAL GALLIUM NITRIDE...
Publication number
20210399091
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Dec 23, 2021
NEXGEN POWER SYSTEMS, INC.
Hao Cui
H01 - BASIC ELECTRIC ELEMENTS
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STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE WI...
Publication number
20210384294
Publication date
Dec 9, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Chih-Wei LIN
H01 - BASIC ELECTRIC ELEMENTS
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INTEGRATED CIRCUIT DEVICES WITH AN ENGINEERED SUBSTRATE
Publication number
20210358795
Publication date
Nov 18, 2021
QROMIS, Inc.
Vladimir Odnoblyudov
H01 - BASIC ELECTRIC ELEMENTS
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TRANSISTOR DEVICES AND METHODS OF FORMING A TRANSISTOR DEVICE
Publication number
20210335778
Publication date
Oct 28, 2021
GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Jiacheng LEI
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20210234032
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Jul 29, 2021
KABUSHIKI KAISHA TOSHIBA
Yosuke KAJIWARA
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NITRIDE SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREFOR
Publication number
20210217886
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Jul 15, 2021
ROHM CO., LTD.
Kenji Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
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Doped Gate Dielectrics Materials
Publication number
20210151578
Publication date
May 20, 2021
HRL LABORATORIES, LLC
Yu CAO
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR CRYSTAL SUBSTRATE, INFRARED DETECTOR, AND METHOD FOR...
Publication number
20210143009
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May 13, 2021
Fujitsu Limited
Shigekazu Okumura
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SEMICONDUCTOR STRUCTURE
Publication number
20210135016
Publication date
May 6, 2021
MEDIATEK INC.
Cheng-Tien WAN
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
Publication number
20210118984
Publication date
Apr 22, 2021
KABUSHIKI KAISHA TOSHIBA
Tatsuo SHIMIZU
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EPITAXIAL STRUCTURE OF N-FACE GROUP III NITRIDE, ACTIVE DEVICE, AND...
Publication number
20210083086
Publication date
Mar 18, 2021
CHIH-SHU HUANG
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR POWER DEVICE AND METHOD FOR PRODUCING SAME
Publication number
20210043456
Publication date
Feb 11, 2021
Rohm Co., Ltd.
Yuki Nakano
H01 - BASIC ELECTRIC ELEMENTS
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ENHANCEMENT MODE III-NITRIDE DEVICES HAVING AN AL1-XSIXO GATE INSUL...
Publication number
20210043750
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Feb 11, 2021
Transphorm Technology, Inc.
Carl Joseph Neufeld
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WAFER LEVEL SEQUENCING FLOW CELL FABRICATION
Publication number
20210013025
Publication date
Jan 14, 2021
MGI TECH CO., LTD.
Shifeng Li
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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ENHANCEMENT MODE SADDLE GATE DEVICE
Publication number
20200411676
Publication date
Dec 31, 2020
Northrop Grumman Systems Corporation
Josephine Chang
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CO-INTEGRATION OF EXTENDED-DRAIN AND SELF-ALIGNED III-N TRANSISTORS...
Publication number
20200395358
Publication date
Dec 17, 2020
Intel Corporation
Marko Radosavljevic
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