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the material being a silicon nitride not containing oxygen
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Electric elements
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SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
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Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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the material being a silicon nitride not containing oxygen
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Deposition method and plasma processing apparatus
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12,170,198
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Dec 17, 2024
Tokyo Electron Limited
Hiroyuki Matsuura
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Methods for forming a semiconductor device structure and related se...
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12,166,099
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Dec 10, 2024
ASM IP Holding B.V.
Chiyu Zhu
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Semiconductor device
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12,166,131
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Dec 10, 2024
Japan Display Inc.
Hajime Watakabe
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Integrated assemblies having thicker semiconductor material along o...
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12,167,602
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Dec 10, 2024
Kunal R. Parekh
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Dynamic multi zone flow control for a processing system
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12,159,785
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Dec 3, 2024
Applied Materials, Inc.
Daemian Raj Benjamin Raj
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Deposition of oxide thin films
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12,154,785
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Nov 26, 2024
ASM IP Holding B.V.
Suvi P. Haukka
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Dry etching method and method for producing semiconductor device
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12,154,791
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Nov 26, 2024
Central Glass Company, Limited
Hiroyuki Oomori
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GaN/two-dimensional AlN heterojunction rectifier on silicon substra...
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12,154,990
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Nov 26, 2024
South China University of Technology
Wenliang Wang
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Method of manufacturing semiconductor device including isolation st...
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12,154,821
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Nov 26, 2024
NANYA TECHNOLOGY CORPORATION
Ying-Cheng Chuang
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Epitaxial oxide materials, structures, and devices
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12,155,009
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Nov 26, 2024
SILANNA UV TECHNOLOGIES PTE LTD
Petar Atanackovic
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Silicon oxide layer for oxidation resistance and method forming same
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12,148,652
Issue date
Nov 19, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Wan-Yi Kao
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Method of manufacturing semiconductor device and semiconductor devices
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12,148,656
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Nov 19, 2024
Taiwan Semiconductor Manufacturing Company, Ltd
Hsiao-Min Chen
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Semiconductor structures and manufacturing methods thereof
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12,148,613
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Nov 19, 2024
ENKRIS SEMICONDUCTOR, INC.
Kai Cheng
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Boron nitride layer, apparatus including the same, and method of fa...
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12,139,814
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Nov 12, 2024
Samsung Electronics Co., Ltd.
Changseok Lee
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Active device substrate and fabrication method of active device sub...
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12,142,687
Issue date
Nov 12, 2024
Au Optronics Corporation
Chen-Shuo Huang
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Sequential plasma and thermal treatment
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12,142,475
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Nov 12, 2024
Applied Materials, Inc.
Ning Li
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Seam removal in high aspect ratio gap-fill
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12,142,480
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Nov 12, 2024
Applied Materials, Inc.
Qinghua Zhao
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Transistor structures having conductive structures along pillars of...
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12,142,680
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Nov 12, 2024
Micron Technology, Inc.
Sanh D. Tang
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Staircase etch control in forming three-dimensional memory device
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12,142,575
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Nov 12, 2024
Yangtza Memory Technologies Co., Ltd.
Zhenyu Lu
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Pre-deposition treatment for FET technology and devices formed thereby
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12,142,531
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Nov 12, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Cheng-Yen Tsai
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Chalcogen precursors for deposition of silicon nitride
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12,142,477
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Nov 12, 2024
Applied Materials, Inc.
Chandan Kr Barik
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Apparatus and method for cleaning reaction vessel for processing su...
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12,139,787
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Nov 12, 2024
Kokusai Electric Corporation
Shinya Ebata
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Method of processing substrate, method of manufacturing semiconduct...
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12,142,476
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Nov 12, 2024
Kokusai Electric Corporation
Masayuki Asai
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Contact over active gate structures for advanced integrated circuit...
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12,142,667
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Nov 12, 2024
Intel Corporation
Andrew W. Yeoh
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Method of manufacturing semiconductor device, substrate processing...
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12,136,545
Issue date
Nov 5, 2024
Kokusai Electric Corporation
Takashi Yahata
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Semiconductor device and manufacturing method of semiconductor device
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12,136,663
Issue date
Nov 5, 2024
Semiconductor Energy Laboratory Co., Ltd.
Shunpei Yamazaki
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Heterostructure including alternating sets of channel and barrier l...
Patent number
12,136,668
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Nov 5, 2024
ENKRIS SEMICONDUCTOR, INC.
Kai Cheng
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Synaptic transistor with long-term and short-term memory
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12,132,110
Issue date
Oct 29, 2024
Kookmin University Industry Academy Cooperation Foundation
Dae Hwan Kim
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Methods for depositing blocking layers on metal surfaces
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12,131,900
Issue date
Oct 29, 2024
Applied Materials, Inc.
Bhaskar Jyoti Bhuyan
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Metallization lines on integrated circuit products
Patent number
12,131,994
Issue date
Oct 29, 2024
GLOBALFOUNDRIES U.S. Inc.
Ruilong Xie
H01 - BASIC ELECTRIC ELEMENTS
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METHOD, SYSTEM, AND APPARATUS FOR DEPOSITION OF TRANSITION METAL FILM
Publication number
20240420958
Publication date
Dec 19, 2024
ASM IP HOLDING B.V.
Venkata Surya Naga Raju Chava
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LIGHT EMITTING DIODE CONTAINING PINHOLE MASKING LAYER AND METHOD OF...
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20240421246
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Dec 19, 2024
Samsung Electronics Co., Ltd.
Saket CHADDA
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DENSIFIED SEAM-FREE SILICON-CONTAINING MATERIAL GAP FILL PROCESSES
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20240420950
Publication date
Dec 19, 2024
Applied Materials, Inc.
Xiang Ji
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MATERIAL MONITORING SYSTEM, PROCESSING APPARATUS, METHOD OF MANUFAC...
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20240421007
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Dec 19, 2024
Kokusai Electric Corporation
Kentaro GOSHIMA
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SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
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20240421235
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Dec 19, 2024
Huawei Digital Power Technologies Co., Ltd.
Yi YU
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METHOD OF FORMING FILM, METHOD OF MANUFACTURING SEMICONDUCTOR DEVIC...
Publication number
20240412969
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Dec 12, 2024
Kokusai Electric Corporation
Yuki TAIRA
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METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS
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20240413082
Publication date
Dec 12, 2024
GLOBALFOUNDRIES U.S. Inc.
Ruilong Xie
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GALLIUM NITRIDE SEMICONDUCTOR DEVICE
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20240413233
Publication date
Dec 12, 2024
UNITED MICROELECTRONICS CORP.
Yi-Chuan Chen
H01 - BASIC ELECTRIC ELEMENTS
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MULTILAYER MOISTURE REPELLING FILMS FOR FRONT END FET APPLICATIONS
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20240413098
Publication date
Dec 12, 2024
Qorvo US, Inc.
Christo Bojkov
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HEMT DEVICE HAVING AN IMPROVED CONDUCTIVITY AND MANUFACTURING PROCE...
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20240405115
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Dec 5, 2024
STMicroelectronics International N.V.
Maria Eloisa CASTAGNA
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FUNCTIONALIZED CYCLOSILAZANES AS PRECURSORS FOR HIGH GROWTH RATE SI...
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20240395541
Publication date
Nov 28, 2024
VERSUM MATERIALS US, LLC
Manchao Xiao
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ETCHING GAS COMPOSITION AND METHOD OF MANUFACTURING INTEGRATED CIRC...
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20240392191
Publication date
Nov 28, 2024
SEMES CO., LTD.
Kyungseok MIN
H01 - BASIC ELECTRIC ELEMENTS
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ETCHING GAS COMPOSITION AND METHOD OF MANUFACTURING INTEGRATED CIRC...
Publication number
20240392192
Publication date
Nov 28, 2024
SEMES CO., LTD.
Kyungseok MIN
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING
Publication number
20240395559
Publication date
Nov 28, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Wan Hsuan Hsu
H01 - BASIC ELECTRIC ELEMENTS
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MULTILAYER MASKING LAYER AND METHOD OF FORMING SAME
Publication number
20240395907
Publication date
Nov 28, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Wen-Ju Chen
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
Publication number
20240395605
Publication date
Nov 28, 2024
Fujian Jinhua Integrated Circuit Co., Ltd.
Janbo Zhang
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF PLASMA ETCHING
Publication number
20240395560
Publication date
Nov 28, 2024
NANYA TECHNOLOGY CORPORATION
Shih Pin KUO
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICES
Publication number
20240395609
Publication date
Nov 28, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Hsiao-Min CHEN
H01 - BASIC ELECTRIC ELEMENTS
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SUBSTRATE TREATING APPARATUS AND METHOD
Publication number
20240392438
Publication date
Nov 28, 2024
JIANGSU LEADMICRO NANO TECHNOLOGY CO., LTD.
Xinyuan WU
H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor Device and Method
Publication number
20240395598
Publication date
Nov 28, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Shiang-Bau Wang
H01 - BASIC ELECTRIC ELEMENTS
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Microelectromechanical Systems (MEMS) Fabrication Process Including...
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20240395540
Publication date
Nov 28, 2024
StethX Microsystems
Farrokh Ayazi
H01 - BASIC ELECTRIC ELEMENTS
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SILICON OXIDE LAYER FOR OXIDATION RESISTANCE AND METHOD FORMING SAME
Publication number
20240387238
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Wan-Yi Kao
H01 - BASIC ELECTRIC ELEMENTS
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FILM STACK SIMPLIFICATION FOR HIGH ASPECT RATIO PATTERNING AND VERT...
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20240387258
Publication date
Nov 21, 2024
LAM RESEARCH CORPORATION
Hui-Jung Wu
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HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAME
Publication number
20240387720
Publication date
Nov 21, 2024
UNITED MICROELECTRONICS CORP.
Po-Yu Yang
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REMOTE PLASMA DEPOSITION WITH ELECTROSTATIC CLAMPING
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20240387226
Publication date
Nov 21, 2024
LAM RESEARCH CORPORATION
Aaron Blake MILLER
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SELF-ALIGNED INTERCONNECTION STRUCTURE AND MANUFACTURING METHOD THE...
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20240387250
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Kai-Fang CHENG
H01 - BASIC ELECTRIC ELEMENTS
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METHOD OF MODULATING STRESS OF DIELECTRIC LAYERS
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20240387729
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Chung-Ting Ko
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CMP SAFE ALIGNMENT MARK
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20240387398
Publication date
Nov 21, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Huang-Jen HSU
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR PROCESSING TOOL AND METHODS OF OPERATION
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20240379471
Publication date
Nov 14, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Kuang-Wei CHENG
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FORMING LOW-STRESS SILICON NITRIDE LAYER THROUGH HYDROGEN TREATMENT
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20240379346
Publication date
Nov 14, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Wei-Che Hsieh
H01 - BASIC ELECTRIC ELEMENTS