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the means being located in the lateral device isolation region
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Electric elements
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SEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
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Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier
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H01L29/7846
the means being located in the lateral device isolation region
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Strained semiconductor using elastic edge relaxation of a stressor...
Patent number
11,978,800
Issue date
May 7, 2024
ACORN SEMI, LLC
Paul A. Clifton
H01 - BASIC ELECTRIC ELEMENTS
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Fin end plug structures for advanced integrated circuit structure f...
Patent number
11,961,838
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Apr 16, 2024
Intel Corporation
Byron Ho
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Dual metal silicide structures for advanced integrated circuit stru...
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11,961,767
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Apr 16, 2024
Intel Corporation
Jeffrey S. Leib
H01 - BASIC ELECTRIC ELEMENTS
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Dual metal gate structure having portions of metal gate layers in c...
Patent number
11,955,532
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Apr 9, 2024
Intel Corporation
Jeffrey S. Leib
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Semiconductor device
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11,955,550
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Apr 9, 2024
Semiconductor Manufacturing International (Shanghai) Corporation
Fei Zhou
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Heterogeneous metal line compositions for advanced integrated circu...
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11,955,534
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Apr 9, 2024
Intel Corporation
Andrew W. Yeoh
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Trench contact structures for advanced integrated circuit structure...
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11,948,997
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Apr 2, 2024
Intel Corporation
Subhash M. Joshi
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Source/drain epitaxial layer profile
Patent number
11,942,547
Issue date
Mar 26, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Gulbagh Singh
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Vertical transport field-effect transistor with ring-shaped wrap-ar...
Patent number
11,908,937
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Feb 20, 2024
International Business Machines Corporation
Xin Miao
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Integrated circuit devices and methods of fabricating such devices
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11,894,376
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Feb 6, 2024
Samsung Electronics Co., Ltd.
Dae-Won Ha
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Trench plug hardmask for advanced integrated circuit structure fabr...
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11,887,838
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Jan 30, 2024
Intel Corporation
Anthony St. Amour
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Fin patterning for advanced integrated circuit structure fabrication
Patent number
11,881,520
Issue date
Jan 23, 2024
Intel Corporation
Curtis Ward
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Continuous gate and fin spacer for advanced integrated circuit stru...
Patent number
11,837,456
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Dec 5, 2023
Intel Corporation
Heidi M. Meyer
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Devices with strained isolation features
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11,837,662
Issue date
Dec 5, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Xusheng Wu
H01 - BASIC ELECTRIC ELEMENTS
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Method for forming semiconductor structure with high aspect ratio
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11,823,960
Issue date
Nov 21, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Han-Pin Chung
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FinFET device with different liners for PFET and NFET and method of...
Patent number
11,810,827
Issue date
Nov 7, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Ming-Lung Cheng
H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor devices including resistor structures
Patent number
11,804,516
Issue date
Oct 31, 2023
Samsung Electronics Co., Ltd.
Tae-yeol Kim
H01 - BASIC ELECTRIC ELEMENTS
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Gate cut and fin trim isolation for advanced integrated circuit str...
Patent number
11,799,015
Issue date
Oct 24, 2023
Intel Corporation
Tahir Ghani
H01 - BASIC ELECTRIC ELEMENTS
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Relating to SOI wafers and devices with buried stressors
Patent number
11,791,411
Issue date
Oct 17, 2023
ACORN SEMI, LLC
Paul A. Clifton
H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor device and method for fabricating the same
Patent number
11,784,186
Issue date
Oct 10, 2023
Samsung Electronics Co., Ltd.
Sang Min Yoo
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Epitaxial oxide plug for strained transistors
Patent number
11,757,037
Issue date
Sep 12, 2023
Intel Corporation
Karthik Jambunathan
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Semiconductor devices
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11,742,411
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Aug 29, 2023
Samsung Electronics Co., Ltd.
Chang-woo Noh
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Dielectric isolated fin with improved fin profile
Patent number
11,728,428
Issue date
Aug 15, 2023
International Business Machines Corporation
Kangguo Cheng
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Isolation schemes for gate-all-around transistor devices
Patent number
11,705,518
Issue date
Jul 18, 2023
Intel Corporation
Rishabh Mehandru
H01 - BASIC ELECTRIC ELEMENTS
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Source/drain diffusion barrier for germanium nMOS transistors
Patent number
11,699,756
Issue date
Jul 11, 2023
Intel Corporation
Glenn A. Glass
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Trench contact structures for advanced integrated circuit structure...
Patent number
11,664,439
Issue date
May 30, 2023
Intel Corporation
Subhash M. Joshi
H01 - BASIC ELECTRIC ELEMENTS
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Inverted leads for packaged isolation devices
Patent number
11,658,243
Issue date
May 23, 2023
Texas Instruments Incorporated
John Paul Tellkamp
H01 - BASIC ELECTRIC ELEMENTS
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Fin cut and fin trim isolation for advanced integrated circuit stru...
Patent number
11,646,359
Issue date
May 9, 2023
Intel Corporation
Tahir Ghani
H01 - BASIC ELECTRIC ELEMENTS
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Trench isolation for advanced integrated circuit structure fabrication
Patent number
11,640,985
Issue date
May 2, 2023
Intel Corporation
Michael L. Hattendorf
H01 - BASIC ELECTRIC ELEMENTS
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Strain enhancement for FinFETs
Patent number
11,626,328
Issue date
Apr 11, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Tsung-Lin Lee
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20240145594
Publication date
May 2, 2024
UNITED MICROELECTRONICS CORP.
Po-Yu Yang
H01 - BASIC ELECTRIC ELEMENTS
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TRENCH PLUG HARDMASK FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABR...
Publication number
20240105520
Publication date
Mar 28, 2024
Intel Corporation
Anthony ST. AMOUR
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR-ON-INSULATOR FIELD-EFFECT TRANSISTORS INCLUDING STRES...
Publication number
20240105503
Publication date
Mar 28, 2024
GLOBALFOUNDRIES U.S. Inc.
SHESH MANI PANDEY
H01 - BASIC ELECTRIC ELEMENTS
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FIN TRIM PLUG STRUCTURES WITH METAL FOR IMPARTING CHANNEL STRESS
Publication number
20240088292
Publication date
Mar 14, 2024
Intel Corporation
Tao CHU
H01 - BASIC ELECTRIC ELEMENTS
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METHOD FOR FORMING SEMICONDUCTOR STRUCTURE WITH HIGH ASPECT RATIO
Publication number
20240047276
Publication date
Feb 8, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Han-Pin CHUNG
H01 - BASIC ELECTRIC ELEMENTS
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HETEROGENEOUS METAL LINE COMPOSITIONS FOR ADVANCED INTEGRATED CIRCU...
Publication number
20240047556
Publication date
Feb 8, 2024
Intel Corporation
Andrew W. YEOH
H01 - BASIC ELECTRIC ELEMENTS
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CONTINUOUS GATE AND FIN SPACER FOR ADVANCED INTEGRATED CIRCUIT STRU...
Publication number
20240038578
Publication date
Feb 1, 2024
Intel Corporation
Heidi M. MEYER
H01 - BASIC ELECTRIC ELEMENTS
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SOI WAFERS AND DEVICES WITH BURIED STRESSORS
Publication number
20240006532
Publication date
Jan 4, 2024
Acorn Semi, LLC
Paul A. Clifton
H01 - BASIC ELECTRIC ELEMENTS
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GATE CUT AND FIN TRIM ISOLATION FOR ADVANCED INTEGRATED CIRCUIT STR...
Publication number
20230420545
Publication date
Dec 28, 2023
Intel Corporation
Tahir GHANI
H01 - BASIC ELECTRIC ELEMENTS
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MULTI-STATE FIELD EFFECT TRANSISTOR DEVICE
Publication number
20230411533
Publication date
Dec 21, 2023
International Business Machines Corporation
Karthik Yogendra
H01 - BASIC ELECTRIC ELEMENTS
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DEVICES WITH STRAINED ISOLATION FEATURES
Publication number
20230387300
Publication date
Nov 30, 2023
Taiwan Semiconductor Manufacturing Co., LTD
Xusheng Wu
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20230378174
Publication date
Nov 23, 2023
Samsung Electronics Co., Ltd.
Sang Min YOO
H01 - BASIC ELECTRIC ELEMENTS
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INVERTED LEADS FOR PACKAGED ISOLATION DEVICES
Publication number
20230299201
Publication date
Sep 21, 2023
TEXAS INSTRUMENTS INCORPORATED
JOHN PAUL TELLKAMP
H01 - BASIC ELECTRIC ELEMENTS
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TRENCH CONTACT STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE...
Publication number
20230261089
Publication date
Aug 17, 2023
Intel Corporation
Subhash M. JOSHI
H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE WITH TRENCH ISOLATION STRUCTURES IN A TRANSITI...
Publication number
20230238459
Publication date
Jul 27, 2023
Infineon Technologies Austria AG
Lars Müller-Meskamp
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
TRENCH ISOLATION FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
Publication number
20230207664
Publication date
Jun 29, 2023
Intel Corporation
Michael L. HATTENDORF
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
ENHANCED CHANNEL STRAIN TO REDUCE CONTACT RESISTANCE IN NMOS FET DE...
Publication number
20230187447
Publication date
Jun 15, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Yu-Chang LIN
H01 - BASIC ELECTRIC ELEMENTS
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CONTACT OVER ACTIVE GATE STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT...
Publication number
20230144607
Publication date
May 11, 2023
Intel Corporation
Andrew W. Yeoh
H01 - BASIC ELECTRIC ELEMENTS
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GATE LINE PLUG STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE...
Publication number
20230131757
Publication date
Apr 27, 2023
Intel Corporation
Byron HO
H01 - BASIC ELECTRIC ELEMENTS
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FIN PATTERNING FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
Publication number
20230126174
Publication date
Apr 27, 2023
Intel Corporation
Curtis WARD
H01 - BASIC ELECTRIC ELEMENTS
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HETEROGENEOUS METAL LINE COMPOSITIONS FOR ADVANCED INTEGRATED CIRCU...
Publication number
20230101723
Publication date
Mar 30, 2023
Intel Corporation
Andrew W. YEOH
H01 - BASIC ELECTRIC ELEMENTS
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FIN TRIM PLUG STRUCTURES HAVING AN OXIDATION CATALYST LAYER SURROUN...
Publication number
20230089815
Publication date
Mar 23, 2023
Intel Corporation
Leonard GULER
H01 - BASIC ELECTRIC ELEMENTS
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MULTIGATE DEVICE WITH STRESSOR LAYERS AND METHOD OF FABRICATING THE...
Publication number
20230068140
Publication date
Mar 2, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Ka-Hing FUNG
H01 - BASIC ELECTRIC ELEMENTS
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DUAL METAL SILICIDE STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT STRU...
Publication number
20230042218
Publication date
Feb 9, 2023
Intel Corporation
Jeffrey S. LEIB
H01 - BASIC ELECTRIC ELEMENTS
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STRAINED SEMICONDUCTOR USING ELASTIC EDGE RELAXATION OF A STRESSOR...
Publication number
20230020403
Publication date
Jan 19, 2023
Acorn Semi, LLC
Paul A. Clifton
H01 - BASIC ELECTRIC ELEMENTS
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VERTICAL TRANSPORT FIELD-EFFECT TRANSISTOR WITH RING-SHAPED WRAP-AR...
Publication number
20230013383
Publication date
Jan 19, 2023
International Business Machines Corporation
Xin Miao
H01 - BASIC ELECTRIC ELEMENTS
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CONTINUOUS GATE AND FIN SPACER FOR ADVANCED INTEGRATED CIRCUIT STRU...
Publication number
20220406650
Publication date
Dec 22, 2022
Intel Corporation
Heidi M. MEYER
H01 - BASIC ELECTRIC ELEMENTS
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TRENCH PLUG HARDMASK FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABR...
Publication number
20220367283
Publication date
Nov 17, 2022
Intel Corporation
Anthony ST. AMOUR
H01 - BASIC ELECTRIC ELEMENTS
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SOURCE/DRAIN EPITAXIAL LAYER PROFILE
Publication number
20220359751
Publication date
Nov 10, 2022
Taiwan Semiconductor Manufacturing Co., Ltd.
Gulbagh SINGH
H01 - BASIC ELECTRIC ELEMENTS
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ISOLATION WALL STRESSOR STRUCTURES TO IMPROVE CHANNEL STRESS AND TH...
Publication number
20220352029
Publication date
Nov 3, 2022
Intel Corporation
Aaron D. Lilak
H01 - BASIC ELECTRIC ELEMENTS