Time-of-flight spectrometers

Industry

CPC
H01J49/40

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/40Time-of-flight spectrometers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 12,123,421
- Issue date Oct 22, 2024
- Micromass UK Limited
- Cedric Marsh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror for multi-reflecting mass spectrometers
- Patent number 12,125,694
- Issue date Oct 22, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analysis apparatus
- Patent number 12,111,286
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Xiaoqiang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for pulsed mode charge detection mass spectrom...
- Patent number 12,112,936
- Issue date Oct 8, 2024
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for the analytical measurement of sample material on a sampl...
- Patent number 12,105,049
- Issue date Oct 1, 2024
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for multi-pass encoded frequency pushing
- Patent number 12,100,584
- Issue date Sep 24, 2024
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting human ingested substance and ingestion times
- Patent number 12,099,052
- Issue date Sep 24, 2024
- XIAMEN LISI TECH SERVICE CO., LTD.
- Zhiyin Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry device and analysis method
- Patent number 12,087,569
- Issue date Sep 10, 2024
- Shimadzu Corporation
- Takuro Kishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated system for online detection of organic molecular impuriti...
- Patent number 12,055,530
- Issue date Aug 6, 2024
- Elemental Scientific, Inc.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,057,305
- Issue date Aug 6, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 12,051,583
- Issue date Jul 30, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,031,943
- Issue date Jul 9, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,027,359
- Issue date Jul 2, 2024
- Micromass UK Limited
- Peter Carney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,027,360
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-calibration of high resolution mass spectrum
- Patent number 12,020,918
- Issue date Jun 25, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analyzing isoaspartic acid and mass spectrometer
- Patent number 12,020,919
- Issue date Jun 25, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Bench-top Time of Flight mass spectrometer
- Patent number 12,009,193
- Issue date Jun 11, 2024
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of gain calibration
- Patent number 11,996,277
- Issue date May 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting aerosol particles without using c...
- Patent number 11,996,280
- Issue date May 28, 2024
- Zeteo Tech, Inc.
- Michael Mcloughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for detecting aerosol particles
- Patent number 11,996,279
- Issue date May 28, 2024
- Zeteo Tech, Inc.
- Michael McLoughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical operation assisting device and non-transitory computer r...
- Patent number 11,988,680
- Issue date May 21, 2024
- Shimadzu Corporation
- Tomonori Oshikawa
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 11,990,328
- Issue date May 21, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring concentration of fluorine gas in halogen fluor...
- Patent number 11,984,308
- Issue date May 14, 2024
- Resonac Corporation
- Atsushi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage supply for a mass analyser
- Patent number 11,972,938
- Issue date Apr 30, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light absorption anisotropic film, laminate, and image display device
- Patent number 11,960,182
- Issue date Apr 16, 2024
- FUJIFILM Corporation
- Yumi Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF mass calibration
- Patent number 11,948,788
- Issue date Apr 2, 2024
- DH Technologies Development Pte. Ltd.
- Robert E. Haufler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20240379337
- Publication date Nov 14, 2024
- Zeteo Tech, Inc.
- Michael MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL INSTRUMENT CALIBRATION
- Publication number 20240371618
- Publication date Nov 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Daniel Marc Mourad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...
- Publication number 20240369516
- Publication date Nov 7, 2024
- Bruker Daltonics GmbH & Co. KG
- Nikolas KESSLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAVEFORMS IN AN ION MOBILITY SPECTROMETER
- Publication number 20240361274
- Publication date Oct 31, 2024
- Battelle Memorial Institute
- Adam L. Hollerbach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Mass Spectrometry and Mass Spectrometer
- Publication number 20240355609
- Publication date Oct 24, 2024
- Shimadzu Corporation
- Hiroko UEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENTRY/EXIT DEVICE
- Publication number 20240355606
- Publication date Oct 24, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Components Including Programmable Elements and De...
- Publication number 20240347332
- Publication date Oct 17, 2024
- PERKINELMER SCIENTIFIC CANADA ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE
- Publication number 20240339314
- Publication date Oct 10, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS ANALYSIS SYSTEM
- Publication number 20240331994
- Publication date Oct 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Space Charge Reduction in TOF-MS
- Publication number 20240312776
- Publication date Sep 19, 2024
- DH Technologies Development Pte. Ltd.
- Pavel RYUMIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPEDANCE-MATCHED COAXIAL CONDUCTOR, ELECTRICALLY CONDUCTING CONTAC...
- Publication number 20240304431
- Publication date Sep 12, 2024
- SPACETEK TECHNOLOGY AG
- Jürg JOST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM
- Publication number 20240297029
- Publication date Sep 5, 2024
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES
- Publication number 20240282568
- Publication date Aug 22, 2024
- Zeteo Tech, Inc.
- Michael McLoughlin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA STORAGE FOR TOF INSTRUMENTATION
- Publication number 20240282560
- Publication date Aug 22, 2024
- DH Technologies Development Pte. Ltd.
- Lyle L. BURTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES WITHOUT USING C...
- Publication number 20240282567
- Publication date Aug 22, 2024
- Zeteo Tech, Inc.
- MICHAEL MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240282559
- Publication date Aug 22, 2024
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Mirror for Time-of-Flight Mass Spectrometer
- Publication number 20240274428
- Publication date Aug 15, 2024
- Aaron Timothy BOOY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY
- Publication number 20240274424
- Publication date Aug 15, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gain Calibration for Quantitation Using On-Demand/Dynamic Implement...
- Publication number 20240249929
- Publication date Jul 25, 2024
- DH Technologies Development Pte. Ltd.
- Douglas Arnold Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Voltage Supply for a Mass Analyser
- Publication number 20240249931
- Publication date Jul 25, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND TIME-OF-FLIGHT MASS SPECTROMET...
- Publication number 20240242957
- Publication date Jul 18, 2024
- Shimadzu Corporation
- Yuta MIYAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIMING CONTROL FOR ANALYTICAL INSTRUMENT
- Publication number 20240234114
- Publication date Jul 11, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20240213013
- Publication date Jun 27, 2024
- KRATOS ANALYTICAL LIMITED
- Andrew BOWDLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20240203716
- Publication date Jun 20, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Denis CHERNYSHEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SUPPLY
- Publication number 20240192717
- Publication date Jun 13, 2024
- DH Technologies Development Pte. Ltd.
- Martian D. DIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, ST...
- Publication number 20240170272
- Publication date May 23, 2024
- FUJIFILM CORPORATION
- Yasuhiko HIRANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bifurcated Mass Spectrometer
- Publication number 20240162029
- Publication date May 16, 2024
- DH Technologies Development Pte. Ltd.
- Eric Thomas DZIEKONSKI
- H01 - BASIC ELECTRIC ELEMENTS

Time-of-flight spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Time of flight mass analyser with spatial focussing

Bench-top time of flight mass spectrometer

Ion mirror for multi-reflecting mass spectrometers

Ion mobility analysis apparatus

Apparatus and method for pulsed mode charge detection mass spectrom...

Method for the analytical measurement of sample material on a sampl...

Methods and systems for multi-pass encoded frequency pushing

Method for detecting human ingested substance and ingestion times

Time-of-flight mass spectrometry device and analysis method

Automated system for online detection of organic molecular impuriti...

Mass analysis apparatuses and methods

Ion entry/exit device

Ion analyzer

Bench-top Time of Flight mass spectrometer

Mass spectrometer

Self-calibration of high resolution mass spectrum

Method for analyzing isoaspartic acid and mass spectrometer

Source-detector synchronization in multiplexed secondary ion mass s...

Bench-top Time of Flight mass spectrometer

Method of gain calibration

Methods and systems for detecting aerosol particles without using c...

Methods and systems for detecting aerosol particles

Analytical operation assisting device and non-transitory computer r...

Mass spectrometer

Method for measuring concentration of fluorine gas in halogen fluor...

Voltage supply for a mass analyser

High resolution imaging apparatus and method

Light absorption anisotropic film, laminate, and image display device

TOF mass calibration

Mass analyzer with 3D electrostatic field

Patents Applicationslast 30 patents

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

ANALYTICAL INSTRUMENT CALIBRATION

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

METHOD OF BIOANALYTICAL ANALYSIS UTILIZING ION SPECTROMETRY, INCLUD...

WAVEFORMS IN AN ION MOBILITY SPECTROMETER

Method for Mass Spectrometry and Mass Spectrometer

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

ION ENTRY/EXIT DEVICE

Mass Spectrometer Components Including Programmable Elements and De...

MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE

TIME OF FLIGHT MASS ANALYSIS SYSTEM

Space Charge Reduction in TOF-MS

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

IMPEDANCE-MATCHED COAXIAL CONDUCTOR, ELECTRICALLY CONDUCTING CONTAC...

SELF-CALIBRATION OF HIGH RESOLUTION MASS SPECTRUM

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES

DATA STORAGE FOR TOF INSTRUMENTATION

METHODS AND SYSTEMS FOR DETECTING AEROSOL PARTICLES WITHOUT USING C...

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

Ion Mirror for Time-of-Flight Mass Spectrometer

TANDEM MASS SPECTROMETER AND METHOD OF TANDEM MASS SPECTROMETRY

Gain Calibration for Quantitation Using On-Demand/Dynamic Implement...

Voltage Supply for a Mass Analyser

TIME-OF-FLIGHT MASS SPECTROMETER AND TIME-OF-FLIGHT MASS SPECTROMET...

TIMING CONTROL FOR ANALYTICAL INSTRUMENT

TIME OF FLIGHT MASS SPECTROMETER

METHODS AND APPARATUS FOR MASS SPECTROMETRY

POWER SUPPLY

STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, ST...

Bifurcated Mass Spectrometer