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G01R31/31725
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/31725
Timing aspects
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Test compression in a JTAG daisy-chain environment
Patent number
11,965,930
Issue date
Apr 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for detecting glitch at high sampling rate
Patent number
11,965,929
Issue date
Apr 23, 2024
UESTC (Shenzhen) Advanced Research Institute
Zhijian Dai
G01 - MEASURING TESTING
Information
Patent Grant
Multi-die debug stop clock trigger
Patent number
11,946,969
Issue date
Apr 2, 2024
Apple Inc.
Charles J. Fleckenstein
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test for die-to-die physical interfaces
Patent number
11,940,491
Issue date
Mar 26, 2024
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Grant
Benchmark circuit on a semiconductor wafer and method for operating...
Patent number
11,927,628
Issue date
Mar 12, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Chu-Feng Liao
G01 - MEASURING TESTING
Information
Patent Grant
Fan-out buffer with skew control function, operating method thereof...
Patent number
11,921,158
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Byung-Sung Kim
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in resilient integrated circuit for processors
Patent number
11,921,157
Issue date
Mar 5, 2024
International Business Machines Corporation
Andreas H. A. Arp
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Register circuit with detection of data events, and method for dete...
Patent number
11,894,848
Issue date
Feb 6, 2024
Minima Processor Oy
Navneet Gupta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
On-die clock period jitter and duty cycle analyzer
Patent number
11,879,936
Issue date
Jan 23, 2024
Ampere Computing LLC
Yeshwant Kolla
G01 - MEASURING TESTING
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,879,941
Issue date
Jan 23, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Built-in self-test circuits and semiconductor integrated circuits i...
Patent number
11,867,757
Issue date
Jan 9, 2024
Samsung Electronics Co., Ltd.
Heejune Lee
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Techniques for isolating interfaces while testing semiconductor dev...
Patent number
11,867,744
Issue date
Jan 9, 2024
NVIDIA Corporation
Animesh Khare
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit screening system and circuit screening method
Patent number
11,852,682
Issue date
Dec 26, 2023
Taiwan Semiconductor Manufacturing Company Ltd.
Chi-Che Wu
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method to measure simulation to silicon timing correlation
Patent number
11,835,580
Issue date
Dec 5, 2023
MediaTek Singapore Pte Ltd.
Ashish Kumar Nayak
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Selectable JTAG or trace access with data store and output
Patent number
11,835,578
Issue date
Dec 5, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Battery SOH determination circuit
Patent number
11,835,584
Issue date
Dec 5, 2023
Analog Devices International Unlimited Company
Jeremy R. Gorbold
G01 - MEASURING TESTING
Information
Patent Grant
Built in self test (BIST) for clock generation circuitry
Patent number
11,821,946
Issue date
Nov 21, 2023
NXP USA, INC.
Jorge Arturo Corso Sarmiento
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Identifying data valid windows
Patent number
11,815,554
Issue date
Nov 14, 2023
Micron Technology, Inc.
Phillip A. Rasmussen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Die-to-die connectivity monitoring using a clocked receiver
Patent number
11,815,551
Issue date
Nov 14, 2023
PROTEANTECS LTD.
Eyal Fayneh
G01 - MEASURING TESTING
Information
Patent Grant
Scan test device and scan test method
Patent number
11,789,073
Issue date
Oct 17, 2023
Realtek Semiconductor Corporation
Po-Lin Chen
G01 - MEASURING TESTING
Information
Patent Grant
Delay fault testing of pseudo static controls
Patent number
11,768,726
Issue date
Sep 26, 2023
Texas Instruments Incorporated
Aravinda Acharya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Full-path circuit delay measurement device for field-programmable g...
Patent number
11,762,015
Issue date
Sep 19, 2023
ShanghaiTech University
Weixiong Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Jitter self-test using timestamps
Patent number
11,764,913
Issue date
Sep 19, 2023
Skyworks Solutions, Inc.
Raghunandan K. Ranganathan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Scan testing using scan frames with embedded commands
Patent number
11,740,286
Issue date
Aug 29, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for scan testing
Patent number
11,714,131
Issue date
Aug 1, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
G01 - MEASURING TESTING
Information
Patent Grant
Instrument noise correction for jitter measurements
Patent number
11,709,201
Issue date
Jul 25, 2023
Skyworks Solutions, Inc.
Daniel De Godoy Peixoto
G01 - MEASURING TESTING
Information
Patent Grant
Systems and/or methods for anomaly detection and characterization i...
Patent number
11,686,770
Issue date
Jun 27, 2023
GRAMMATECH INC.
Jason Alvin Dickens
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method to debug a voltage regulator
Patent number
11,686,780
Issue date
Jun 27, 2023
Intel Corporation
Sankaran M. Menon
G05 - CONTROLLING REGULATING
Information
Patent Grant
3D stacked die test architecture
Patent number
11,675,007
Issue date
Jun 13, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Interconnect retimer enhancements
Patent number
11,675,003
Issue date
Jun 13, 2023
Intel Corporation
Daniel S. Froelich
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING METHOD AND TESTING SYSTEM
Publication number
20240161847
Publication date
May 16, 2024
NANYA TECHNOLOGY CORPORATION
Bo Jung PENG
G11 - INFORMATION STORAGE
Information
Patent Application
ELECTRONIC DEVICE AND METHOD FOR PERFORMING CLOCK GATING IN ELECTRO...
Publication number
20240110976
Publication date
Apr 4, 2024
Realtek Semiconductor Corp.
Ching-Feng Huang
G01 - MEASURING TESTING
Information
Patent Application
GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and St...
Publication number
20240103075
Publication date
Mar 28, 2024
Beijing ESWIN Computing Technology Co., Ltd.
Zeliang Xie
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD
Publication number
20240094288
Publication date
Mar 21, 2024
Taiwan Semiconductor Manufacturing company Ltd.
CHI-CHE WU
G01 - MEASURING TESTING
Information
Patent Application
Adaptive Port Ceiling Assignment for Background I/O Operations Betw...
Publication number
20240085474
Publication date
Mar 14, 2024
Dell Products, L.P.
Ananthakrishnan Anirudhan
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
Publication number
20240085475
Publication date
Mar 14, 2024
MEDIATEK SINGAPORE PTE LTD
Ashish Kumar Nayak
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CIRCUIT AND METHOD TO MEASURE SIMULATION TO SILICON TIMING CORRELATION
Publication number
20240077533
Publication date
Mar 7, 2024
MEDIATEK SINGAPORE PTE LTD
Ashish Kumar Nayak
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Serial Protocol-Based Event Trigger
Publication number
20240061042
Publication date
Feb 22, 2024
NXP USA, Inc.
Tiefei Zang
G01 - MEASURING TESTING
Information
Patent Application
FLIP-FLOPS AND SCAN CHAIN CIRCUITS INCLUDING THE SAME
Publication number
20240061039
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Byounggon Kang
G01 - MEASURING TESTING
Information
Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
Publication number
20240019489
Publication date
Jan 18, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20240012050
Publication date
Jan 11, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
ON-DIE CLOCK PERIOD JITTER AND DUTY CYCLE ANALYZER
Publication number
20240003969
Publication date
Jan 4, 2024
Ampere Computing LLC
Yeshwant KOLLA
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT ARRANGEMENT FOR VALIDATION OF OPERATION OF A LOGIC MODULE I...
Publication number
20230393198
Publication date
Dec 7, 2023
STMicroelectronics S.r.l.
Diego ALAGNA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER
Publication number
20230393196
Publication date
Dec 7, 2023
PROTEANTECS LTD.
Eyal FAYNEH
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR EVALUATING PERFORMANCE OF SEQUENTIAL LOGIC EL...
Publication number
20230384372
Publication date
Nov 30, 2023
Changxin Memory Technologies, Inc.
Zengquan WU
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD FOR GENERATING A SIGNAL TEST SPECIFICATION, DATA PROCESSING...
Publication number
20230384371
Publication date
Nov 30, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Markus Herdin
G01 - MEASURING TESTING
Information
Patent Application
SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS
Publication number
20230384376
Publication date
Nov 30, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
Publication number
20230384377
Publication date
Nov 30, 2023
Apple Inc.
Fabien S. Faure
G01 - MEASURING TESTING
Information
Patent Application
SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS
Publication number
20230366928
Publication date
Nov 16, 2023
Skyworks Solutions, Inc.
Daniel de Godoy Peixoto
G01 - MEASURING TESTING
Information
Patent Application
DEVICE ACCESS PORT SELECTION
Publication number
20230296670
Publication date
Sep 21, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTIVE LOGIC DEVICES
Publication number
20230273257
Publication date
Aug 31, 2023
Taiwan Semiconductor Manufacturing company Ltd.
CHI-CHE WU
G01 - MEASURING TESTING
Information
Patent Application
TEST COMPRESSION IN A JTAG DAISY-CHAIN ENVIRONMENT
Publication number
20230266389
Publication date
Aug 24, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER
Publication number
20230266387
Publication date
Aug 24, 2023
STMicroelectronics International N.V.
Rupesh SINGH
G01 - MEASURING TESTING
Information
Patent Application
DELAY MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20230258721
Publication date
Aug 17, 2023
Taiwan Semiconductor Manufacturing company Ltd.
SHANG HSIEN YANG
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
Publication number
20230251309
Publication date
Aug 10, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND DEVICES FOR TESTING A DEVICE UNDER TEST USING TEST SITE...
Publication number
20230228805
Publication date
Jul 20, 2023
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM ON CHIP INCLUDING A PVT SENSOR AND CORRESPONDING PVT SENSING...
Publication number
20230213578
Publication date
Jul 6, 2023
STMicroelectronics S.r.l
Riccardo CONDORELLI
G01 - MEASURING TESTING
Information
Patent Application
FULL-PATH CIRCUIT DELAY MEASUREMENT DEVICE FOR FIELD-PROGRAMMABLE G...
Publication number
20230194602
Publication date
Jun 22, 2023
Shanghaitech University
Weixiong JIANG
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUE FOR ENABLING ON-DIE NOISE MEASUREMENT DURING ATE TESTING...
Publication number
20230146920
Publication date
May 11, 2023
NVIDIA Corporation
Bonita Bhaskaran
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Measurement of a Parameter of a DUT
Publication number
20230147947
Publication date
May 11, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Tsung-Hsien Tsai
G01 - MEASURING TESTING