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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

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Patents Grantslast 30 patents

Information Patent Grant
Measurement system for analysing radio frequency signals, and metho...
- Patent number 12,332,290
- Issue date Jun 17, 2025
- Rohde & Schwarz GmbH & Co. KG
- Thomas Ruster
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide connector for connecting first and second waveguides, whe...
- Patent number 12,046,787
- Issue date Jul 23, 2024
- Teradyne, Inc.
- Roger A. Sinsheimer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interconnect system with high current and low leakage capability
- Patent number 11,927,605
- Issue date Mar 12, 2024
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Grant
High density waveguide assembly for millimeter and 5G applications
- Patent number 11,506,686
- Issue date Nov 22, 2022
- Advantest Corporation
- Roger McAleenan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe apparatus
- Patent number 11,486,900
- Issue date Nov 1, 2022
- Teknologian tutkimuskeskus VTT Oy
- Vladimir Ermolov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantum power sensor and method of measuring power in transmission...
- Patent number 11,112,442
- Issue date Sep 7, 2021
- NPL MANAGEMENT LIMITED
- Oleg Vladimirovich Astafiev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Miniature test probe
- Patent number 10,914,756
- Issue date Feb 9, 2021
- Keysight Technologies, Inc.
- Jason Andrew Swaim
- G01 - MEASURING TESTING
Information Patent Grant
Nonlinear transmission line (NLTL)-based miniature reflectometers w...
- Patent number 10,871,508
- Issue date Dec 22, 2020
- Anritsu Company
- Thomas Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring absorbent hygiene products
- Patent number 10,852,252
- Issue date Dec 1, 2020
- TEWS Elektronik GmbH & Co. KG
- Udo Schlemm
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test cable used in USB 3.0 type C and test method using the same
- Patent number 10,775,415
- Issue date Sep 15, 2020
- Pegatron Corporation
- Kuo-Shun Wen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Over the air wireless test system for testing microelectronic devic...
- Patent number 10,680,727
- Issue date Jun 9, 2020
- Mediatek Inc.
- Yen-Ju Lu
- G01 - MEASURING TESTING
Information Patent Grant
Dual stripline test fixture apparatuses and methods
- Patent number 10,634,700
- Issue date Apr 28, 2020
- The Boeing Company
- Lydell L. Frasch
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and devices for real-time monitoring of tunable filters
- Patent number 10,615,892
- Issue date Apr 7, 2020
- Purdue Research Foundation
- Mohammad Abu Khater
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for guided wave communications using an absorber
- Patent number 10,541,460
- Issue date Jan 21, 2020
- AT&T Intellectual Property I, L.P.
- Paul Shala Henry
- G01 - MEASURING TESTING
Information Patent Grant
Frequency-scalable NLTL-based mm-wave vector signal de-modulator
- Patent number 10,469,296
- Issue date Nov 5, 2019
- Anritsu Company
- Karam Noujeim
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal field probes
- Patent number 10,401,389
- Issue date Sep 3, 2019
- VDW DESIGN, LLC
- Daniel Warren van der Weide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Re-filters for PIM measurements and a test bench utilizing the same
- Patent number 10,403,949
- Issue date Sep 3, 2019
- SPINNER GMBH
- Martin Grassl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wave interface assembly for automatic test equipment for semiconduc...
- Patent number 10,393,772
- Issue date Aug 27, 2019
- Advantest Corporation
- Don Lee
- G01 - MEASURING TESTING
Information Patent Grant
Multiple waveguide structure with single flange for automatic test...
- Patent number 10,381,707
- Issue date Aug 13, 2019
- Advantest Corporation
- Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for guided wave communications using an absorber
- Patent number 10,374,281
- Issue date Aug 6, 2019
- AT&T Intellectual Property I, L.P.
- Paul Shala Henry
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for socket power calibration with flexible pri...
- Patent number 10,371,716
- Issue date Aug 6, 2019
- Advantest Corporation
- Donald Lee
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for real-time monitoring of tunable filters
- Patent number 10,122,478
- Issue date Nov 6, 2018
- Purdue Research Foundation
- Mohammad Abu Khater
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Waveguides for capturing close-proximity electromagnetic radiation...
- Patent number 10,031,160
- Issue date Jul 24, 2018
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Grant
Waveguides for capturing close-proximity electromagnetic radiation...
- Patent number 9,817,025
- Issue date Nov 14, 2017
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Grant
Signal measuring system, method for electrically conducting signals...
- Patent number 9,746,496
- Issue date Aug 29, 2017
- Koninklijke Philips N.V.
- Alexander Dubielczyk
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Waveguides for capturing close-proximity electromagnetic radiation...
- Patent number 9,588,173
- Issue date Mar 7, 2017
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Grant
Waveguides for capturing close-proximity electromagnetic radiation...
- Patent number 9,535,115
- Issue date Jan 3, 2017
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Grant
Resonance based cable compensation
- Patent number 9,450,284
- Issue date Sep 20, 2016
- Hamilton Sundstrand Corporation
- James Saloio
- G01 - MEASURING TESTING
Information Patent Grant
Detector device for functional certification
- Patent number 9,442,161
- Issue date Sep 13, 2016
- National Applied Research Laboratories
- Yu-Shao Shiao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIAMOND SENSOR UNIT
- Publication number 20240118327
- Publication date Apr 11, 2024
- Sumitomo Electric Industries, Ltd.
- Yoshiki NISHIBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
RF DISTRIBUTION VOLUME AND ELECTRONIC DEVICE
- Publication number 20230239999
- Publication date Jul 27, 2023
- EV-TECHNOLOGIES
- Sidina WANE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Intelligent Wafer-Level Testing of Photonic Devices
- Publication number 20230063481
- Publication date Mar 2, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Amir Silber
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY WAVEGUIDE ASSEMBLY FOR MILLIMETER AND 5G APPLICATIONS
- Publication number 20210156889
- Publication date May 27, 2021
- Advantest Corporation
- Roger McAleenan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERCONNECT SYSTEM WITH HIGH CURRENT AND LOW LEAKAGE CAPABILITY
- Publication number 20200386790
- Publication date Dec 10, 2020
- KEITHLEY INSTRUMENTS, LLC
- Gregory Sobolewski
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20200158757
- Publication date May 21, 2020
- Teknologian Tutkimuskeskus VTT Oy
- Vladimir ERMOLOV
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR REAL-TIME MONITORING OF TUNABLE FILTERS
- Publication number 20200076516
- Publication date Mar 5, 2020
- Purdue Research Foundation
- Mohammad Abu Khater
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MINIATURE TEST PROBE
- Publication number 20200057094
- Publication date Feb 20, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Jason Andrew Swaim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DUAL STRIPLINE TEST FIXTURE APPARATUSES AND METHODS
- Publication number 20190324059
- Publication date Oct 24, 2019
- The Boeing Company
- Lydell L. Frasch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR GUIDED WAVE COMMUNICATIONS USING AN ABSORBER
- Publication number 20190305399
- Publication date Oct 3, 2019
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Paul Shala Henry
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM POWER SENSOR
- Publication number 20190204372
- Publication date Jul 4, 2019
- ROYAL HOLLOWAY AND BEDFORD NEW COLLEGE
- Oleg Vladimirovich Astafiev
- G01 - MEASURING TESTING
Information Patent Application
TEST CABLE AND TEST METHOD USING THE SAME
- Publication number 20190025343
- Publication date Jan 24, 2019
- PEGATRON CORPORATION
- Kuo-Shun Wen
- G01 - MEASURING TESTING
Information Patent Application
FILTER STRUCTURES FOR PIM MEASUREMENTS
- Publication number 20180342779
- Publication date Nov 29, 2018
- SPINNER GmbH
- Martin GRASSL
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDES FOR CAPTURING CLOSE-PROXIMITY ELECTROMAGNETIC RADIATION...
- Publication number 20180031606
- Publication date Feb 1, 2018
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SOCKET POWER CALIBRATION WITH FLEXIBLE PRI...
- Publication number 20180003736
- Publication date Jan 4, 2018
- Advantest Corporation
- Donald LEE
- G01 - MEASURING TESTING
Information Patent Application
PASSIVE INTERMODULATION TEST LEAD
- Publication number 20170287596
- Publication date Oct 5, 2017
- Huber + Suhner AG
- Maurizio DE CET
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...
- Publication number 20170229753
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...
- Publication number 20170229754
- Publication date Aug 10, 2017
- Advantest Corporation
- Don LEE
- G01 - MEASURING TESTING
Information Patent Application
ORTHOGONAL FIELD PROBES
- Publication number 20170219630
- Publication date Aug 3, 2017
- vdW Design, LLC
- Daniel Warren van der Weide
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES FOR REAL-TIME MONITORING OF TUNABLE FILTERS
- Publication number 20170201335
- Publication date Jul 13, 2017
- Purdue Research Foundation
- Mohammad Abu Khater
- G01 - MEASURING TESTING
Information Patent Application
Waveguides for Capturing Close-Proximity Electromagnetic Radiation...
- Publication number 20170160310
- Publication date Jun 8, 2017
- Keyssa, Inc.
- Roger Isaac
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE SAMPLING SYSTEM
- Publication number 20150362528
- Publication date Dec 17, 2015
- DELTA ELECTRONICS (SHANGHAI) CO., LTD.
- Bo-Yu PU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR PERFORMING ELECTRICAL TESTS TO ELECTRICAL WIRING HARNESSES
- Publication number 20150241473
- Publication date Aug 27, 2015
- EADS Contrucciones Aeronauticas S.A.
- Josef Ignacio Hötz Ordoño
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20140300381
- Publication date Oct 9, 2014
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL TRANSMISSION MEDIUM AND HIGH FREQUENCY SIGNAL TRANSMISSION M...
- Publication number 20140028413
- Publication date Jan 30, 2014
- YOKOWO CO., LTD
- Yasunobu Ishii
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL MEASURING SYSTEM, METHOD FOR ELECTRICALLY CONDUCTING SIGNALS...
- Publication number 20130027058
- Publication date Jan 31, 2013
- Koninklijke Philips Electronics N.V.
- Alexander Dubielczyk
- G01 - MEASURING TESTING
Information Patent Application
Gap-Mode Waveguide
- Publication number 20120243823
- Publication date Sep 27, 2012
- Kirk S. Giboney
- G01 - MEASURING TESTING
Information Patent Application
INTELLIGENT COUPLER
- Publication number 20120142277
- Publication date Jun 7, 2012
- Paul J. Vermette
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS MEASURING SYSTEM
- Publication number 20110260743
- Publication date Oct 27, 2011
- ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG
- Thomas Zelder
- G01 - MEASURING TESTING
Information Patent Application
POLARITY CONTROL OF ELECTROMOTIVE FORCES
- Publication number 20110253444
- Publication date Oct 20, 2011
- Kitaru Watanabe
- G01 - MEASURING TESTING

Transmission-line

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement system for analysing radio frequency signals, and metho...

Intelligent wafer-level testing of photonic devices

Waveguide connector for connecting first and second waveguides, whe...

Interconnect system with high current and low leakage capability

High density waveguide assembly for millimeter and 5G applications

Probe apparatus

Quantum power sensor and method of measuring power in transmission...

Miniature test probe

Nonlinear transmission line (NLTL)-based miniature reflectometers w...

Device and method for measuring absorbent hygiene products

Test cable used in USB 3.0 type C and test method using the same

Over the air wireless test system for testing microelectronic devic...

Dual stripline test fixture apparatuses and methods

Methods and devices for real-time monitoring of tunable filters

Apparatus and method for guided wave communications using an absorber

Frequency-scalable NLTL-based mm-wave vector signal de-modulator

Orthogonal field probes

Re-filters for PIM measurements and a test bench utilizing the same

Wave interface assembly for automatic test equipment for semiconduc...

Multiple waveguide structure with single flange for automatic test...

Apparatus and method for guided wave communications using an absorber

Method and apparatus for socket power calibration with flexible pri...

Methods and devices for real-time monitoring of tunable filters

Waveguides for capturing close-proximity electromagnetic radiation...

Waveguides for capturing close-proximity electromagnetic radiation...

Signal measuring system, method for electrically conducting signals...

Waveguides for capturing close-proximity electromagnetic radiation...

Waveguides for capturing close-proximity electromagnetic radiation...

Resonance based cable compensation

Detector device for functional certification

Patents Applicationslast 30 patents

DIAMOND SENSOR UNIT

RF DISTRIBUTION VOLUME AND ELECTRONIC DEVICE

Intelligent Wafer-Level Testing of Photonic Devices

HIGH DENSITY WAVEGUIDE ASSEMBLY FOR MILLIMETER AND 5G APPLICATIONS

INTERCONNECT SYSTEM WITH HIGH CURRENT AND LOW LEAKAGE CAPABILITY

PROBE APPARATUS

METHODS AND DEVICES FOR REAL-TIME MONITORING OF TUNABLE FILTERS

MINIATURE TEST PROBE

DUAL STRIPLINE TEST FIXTURE APPARATUSES AND METHODS

APPARATUS AND METHOD FOR GUIDED WAVE COMMUNICATIONS USING AN ABSORBER

QUANTUM POWER SENSOR

TEST CABLE AND TEST METHOD USING THE SAME

FILTER STRUCTURES FOR PIM MEASUREMENTS

WAVEGUIDES FOR CAPTURING CLOSE-PROXIMITY ELECTROMAGNETIC RADIATION...

METHOD AND APPARATUS FOR SOCKET POWER CALIBRATION WITH FLEXIBLE PRI...

PASSIVE INTERMODULATION TEST LEAD

MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...

WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...

ORTHOGONAL FIELD PROBES

METHODS AND DEVICES FOR REAL-TIME MONITORING OF TUNABLE FILTERS

Waveguides for Capturing Close-Proximity Electromagnetic Radiation...

VOLTAGE SAMPLING SYSTEM

SYSTEM FOR PERFORMING ELECTRICAL TESTS TO ELECTRICAL WIRING HARNESSES

CONTACTLESS MEASURING SYSTEM

SIGNAL TRANSMISSION MEDIUM AND HIGH FREQUENCY SIGNAL TRANSMISSION M...

SIGNAL MEASURING SYSTEM, METHOD FOR ELECTRICALLY CONDUCTING SIGNALS...

Gap-Mode Waveguide

INTELLIGENT COUPLER

CONTACTLESS MEASURING SYSTEM

POLARITY CONTROL OF ELECTROMOTIVE FORCES