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G03F7/2049

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GPHYSICS G03Photography G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES G03F7/00Photomechanical

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G03F7/2049using a cantilever

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Microfabricated optical probe
- Patent number 10,161,961
- Issue date Dec 25, 2018
- The United States of America, as represented by the Secretary of Commerce
- Vladimir A. Aksyuk
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning probe microscope
- Patent number 10,126,325
- Issue date Nov 13, 2018
- Shimadzu Corporation
- Masamichi Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heat actuated and projected lithography systems and methods
- Patent number 9,766,551
- Issue date Sep 19, 2017
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple probe detection and actuation
- Patent number 9,739,798
- Issue date Aug 22, 2017
- INFINITESIMA LIMITED
- Andrew Humphris
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Selective composite manufacturing for components having multiple ma...
- Patent number 9,694,541
- Issue date Jul 4, 2017
- Raytheon Company
- James A. Pruett
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Systems and methods for polymer tips using silanated supports
- Patent number 9,618,840
- Issue date Apr 11, 2017
- New York University
- Adam B. Braunschweig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multiple probe actuation
- Patent number 9,389,243
- Issue date Jul 12, 2016
- INFINITESIMA LIMITED
- Andrew Humphris
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 8,499,621
- Issue date Aug 6, 2013
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermochemical nanolithography components, systems, and methods
- Patent number 8,468,611
- Issue date Jun 18, 2013
- Georgia Tech Research Corporation
- Elisa Riedo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Patterning nano-scale patterns on a film comprising unzipping polym...
- Patent number 8,389,205
- Issue date Mar 5, 2013
- International Business Machines Corporation
- Urs T. Duerig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface and site-specific polymerization by direct-write lithography
- Patent number 8,012,400
- Issue date Sep 6, 2011
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,887,885
- Issue date Feb 15, 2011
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thin film pattern forming device and method
- Patent number 7,834,332
- Issue date Nov 16, 2010
- Top Engineering Co., Ltd.
- Chang-Bok Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Parallel electron beam lithography stamp (PEBLS)
- Patent number 7,550,747
- Issue date Jun 23, 2009
- Blaise Laurent Mouttet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of Z-lift electrostatic nanolithography
- Patent number 7,538,332
- Issue date May 26, 2009
- The United States of America as represented by the Secretary of the Air Force
- Shane Juhl
- G01 - MEASURING TESTING
Information Patent Grant
Process for obtaining spatially-organised nanostructures on thin films
- Patent number 7,534,468
- Issue date May 19, 2009
- Scriba Nanotechnologie S.R.L.
- Fabio Biscarini
- G11 - INFORMATION STORAGE
Information Patent Grant
Multifunctional probe array system
- Patent number 7,523,650
- Issue date Apr 28, 2009
- The Board of Trustees of the University of Illinois
- Xuefeng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe based patterning of microelectronic and micromechanical devices
- Patent number 7,514,942
- Issue date Apr 7, 2009
- Intel Corporation
- Valluri Rao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Fabrication method of extreme ultraviolet radiation mask mirror usi...
- Patent number 7,507,505
- Issue date Mar 24, 2009
- IUFC-HYU (Industry-University Cooperation Foundation Hanyang University)
- Hai Won Lee
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Direct-write nanolithography method of transporting ink with an ela...
- Patent number 7,491,422
- Issue date Feb 17, 2009
- Nanoink, Inc.
- Hua Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,485,856
- Issue date Feb 3, 2009
- General Nanotechnology LLP
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of polymer nanolithography
- Patent number 7,431,970
- Issue date Oct 7, 2008
- United States of America as represented by the Secretary of the Air Force
- Sergei Lyuksyutov
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanolithography and microlithography devices and method of manufact...
- Patent number 7,413,638
- Issue date Aug 19, 2008
- Reveo, Inc.
- Sadeg M. Faris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface and site-specific polymerization by direct-write lithography
- Patent number 7,326,380
- Issue date Feb 5, 2008
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication of sub-50 nm solid-state nanostructures based on nanoli...
- Patent number 7,291,284
- Issue date Nov 6, 2007
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multifunctional probe array system
- Patent number 7,281,419
- Issue date Oct 16, 2007
- The Board of Trustees of the University of Illinois
- Xuefeng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Fine pattern forming apparatus and fine pattern inspecting apparatus
- Patent number 7,196,321
- Issue date Mar 27, 2007
- Canon Kabushiki Kaisha
- Eigo Kawakami
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe lithography and making method thereof
- Patent number 7,115,863
- Issue date Oct 3, 2006
- Hitachi, Ltd.
- Masayoshi Ishibashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,045,780
- Issue date May 16, 2006
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Patterning methods and systems using reflected interference patterns
- Patent number 6,967,067
- Issue date Nov 22, 2005
- University of Tennessee Research Foundation
- Daniel J. C. Herr
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PRODUCING A NANO-STRUCTURED ELEMENT MADE OF HEXAGONAL BO...
- Publication number 20240255844
- Publication date Aug 1, 2024
- ETH Zurich
- David J. NORRIS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
- Publication number 20240210335
- Publication date Jun 27, 2024
- Carl Zeiss SMT GMBH
- Daniel Rhinow
- G01 - MEASURING TESTING
Information Patent Application
MICROFABRICATED OPTICAL PROBE
- Publication number 20180210009
- Publication date Jul 26, 2018
- Government of the United States of America, as Represented by the Secretary o...
- Vladimir A. Aksyuk
- G02 - OPTICS
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180172726
- Publication date Jun 21, 2018
- Shimadzu Corporation
- Masamichi Nagai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HEAT ACTUATED AND PROJECTED LITHOGRAPHY SYSTEMS AND METHODS
- Publication number 20180059550
- Publication date Mar 1, 2018
- Northwestern University
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Application
LEVELING APPARATUS AND ATOMIC FORCE MICROSCOPE INCLUDING THE SAME
- Publication number 20140304861
- Publication date Oct 9, 2014
- Park Systems Corp.
- Suk Hyun Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
POLYMER TIPS
- Publication number 20140141167
- Publication date May 22, 2014
- NEW YORK UNIVERSITY
- Adam B. Braunschweig
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Cantilevers for deposition
- Publication number 20110274839
- Publication date Nov 10, 2011
- NanoInk, Inc.
- Joseph S. Fragala
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
THERMOCHEMICAL NANOLITHOGRAPHY COMPONENTS, SYSTEMS, AND METHODS
- Publication number 20110053805
- Publication date Mar 3, 2011
- Georgia Tech Research Corporation
- Elisa Riedo
- G01 - MEASURING TESTING
Information Patent Application
PATTERNING NANO-SCALE PATTERNS ON A FILM COMPRISING UNZIPPING POLYM...
- Publication number 20100316960
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Urs T. Duerig
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
ARTICLE, AND A METHOD FOR CREATING THE ARTICLE, WITH A CHEMICALLY P...
- Publication number 20100055413
- Publication date Mar 4, 2010
- University of Durham
- Jas Pal Singh Badyal
- B82 - NANO-TECHNOLOGY
Information Patent Application
Composition and Use Thereof
- Publication number 20080311300
- Publication date Dec 18, 2008
- Koninklijke Philips Electronics, N.V.
- Dirk Burdinski
- B82 - NANO-TECHNOLOGY
Information Patent Application
SURFACE AND SITE-SPECIFIC POLYMERIZATION BY DIRECT-WRITE LITHOGRAPHY
- Publication number 20080167202
- Publication date Jul 10, 2008
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscopy Inspection and Modification System
- Publication number 20080121028
- Publication date May 29, 2008
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Probe based patterning of microelectronic and micromechanical devices
- Publication number 20080074126
- Publication date Mar 27, 2008
- Valluri Rao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTIFUNCTIONAL PROBE ARRAY SYSTEM
- Publication number 20070289369
- Publication date Dec 20, 2007
- Xuefeng Wang
- G01 - MEASURING TESTING
Information Patent Application
Parallel Electron Beam Lithography stamp (PEBLS)
- Publication number 20070228296
- Publication date Oct 4, 2007
- Blaise Laurent Mouttet
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of selective removal of organophosphonic acid molecules from...
- Publication number 20070212808
- Publication date Sep 13, 2007
- Heng-Yong Nie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Thin film pattern forming device and method
- Publication number 20070148560
- Publication date Jun 28, 2007
- Top Engineering Co., Ltd.
- Chang-Bok Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTIFUNCTIONAL PROBE ARRAY SYSTEM
- Publication number 20070062264
- Publication date Mar 22, 2007
- Xuefeng Wang
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of extreme ultraviolet radiation mask mirror usi...
- Publication number 20070054196
- Publication date Mar 8, 2007
- Hai Won Lee
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20070022804
- Publication date Feb 1, 2007
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Nanolithography and microlithography devices and method of manufact...
- Publication number 20060202294
- Publication date Sep 14, 2006
- Sadeg M. Faris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Process for obtaining spatially-organised nanostructures on thin films
- Publication number 20060019439
- Publication date Jan 26, 2006
- Fabio Biscarini
- G11 - INFORMATION STORAGE
Information Patent Application
Fabrication of sub-50 nm solid-state nanostructures based on nanoli...
- Publication number 20060014001
- Publication date Jan 19, 2006
- Hua Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fine pattern forming apparatus and fine pattern inspecting apparatus
- Publication number 20050269035
- Publication date Dec 8, 2005
- Eigo Kawakami
- G01 - MEASURING TESTING
Information Patent Application
Surface and site-specific polymerization by direct-write lithography
- Publication number 20050272885
- Publication date Dec 8, 2005
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Direct-write nanolithography with stamp tips: fabrication and appli...
- Publication number 20050255237
- Publication date Nov 17, 2005
- NanoInk, Inc.
- Hua Zhang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20050172703
- Publication date Aug 11, 2005
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Field-assisted micro- and nano-fabrication method
- Publication number 20050112505
- Publication date May 26, 2005
- Wen C. Huang
- G01 - MEASURING TESTING

using a cantilever

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Microfabricated optical probe

Scanning probe microscope

Heat actuated and projected lithography systems and methods

Multiple probe detection and actuation

Selective composite manufacturing for components having multiple ma...

Systems and methods for polymer tips using silanated supports

Multiple probe actuation

Scanning probe microscopy inspection and modification system

Thermochemical nanolithography components, systems, and methods

Patterning nano-scale patterns on a film comprising unzipping polym...

Surface and site-specific polymerization by direct-write lithography

Nanolithography methods and products therefor and produced thereby

Thin film pattern forming device and method

Parallel electron beam lithography stamp (PEBLS)

Method of Z-lift electrostatic nanolithography

Process for obtaining spatially-organised nanostructures on thin films

Multifunctional probe array system

Probe based patterning of microelectronic and micromechanical devices

Fabrication method of extreme ultraviolet radiation mask mirror usi...

Direct-write nanolithography method of transporting ink with an ela...

Scanning probe microscopy inspection and modification system

Method of polymer nanolithography

Nanolithography and microlithography devices and method of manufact...

Surface and site-specific polymerization by direct-write lithography

Fabrication of sub-50 nm solid-state nanostructures based on nanoli...

Multifunctional probe array system

Fine pattern forming apparatus and fine pattern inspecting apparatus

Probe for scanning probe lithography and making method thereof

Scanning probe microscopy inspection and modification system

Patterning methods and systems using reflected interference patterns

Patents Applicationslast 30 patents

METHOD FOR PRODUCING A NANO-STRUCTURED ELEMENT MADE OF HEXAGONAL BO...

APPARATUS FOR ANALYSING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...

MICROFABRICATED OPTICAL PROBE

SCANNING PROBE MICROSCOPE

HEAT ACTUATED AND PROJECTED LITHOGRAPHY SYSTEMS AND METHODS

LEVELING APPARATUS AND ATOMIC FORCE MICROSCOPE INCLUDING THE SAME

POLYMER TIPS

Cantilevers for deposition

THERMOCHEMICAL NANOLITHOGRAPHY COMPONENTS, SYSTEMS, AND METHODS

PATTERNING NANO-SCALE PATTERNS ON A FILM COMPRISING UNZIPPING POLYM...

ARTICLE, AND A METHOD FOR CREATING THE ARTICLE, WITH A CHEMICALLY P...

Composition and Use Thereof

SURFACE AND SITE-SPECIFIC POLYMERIZATION BY DIRECT-WRITE LITHOGRAPHY

Scanning Probe Microscopy Inspection and Modification System

Probe based patterning of microelectronic and micromechanical devices

MULTIFUNCTIONAL PROBE ARRAY SYSTEM

Parallel Electron Beam Lithography stamp (PEBLS)

Method of selective removal of organophosphonic acid molecules from...

Thin film pattern forming device and method

MULTIFUNCTIONAL PROBE ARRAY SYSTEM

Fabrication method of extreme ultraviolet radiation mask mirror usi...

Scanning probe microscopy inspection and modification system

Nanolithography and microlithography devices and method of manufact...

Process for obtaining spatially-organised nanostructures on thin films

Fabrication of sub-50 nm solid-state nanostructures based on nanoli...

Fine pattern forming apparatus and fine pattern inspecting apparatus

Surface and site-specific polymerization by direct-write lithography

Direct-write nanolithography with stamp tips: fabrication and appli...

Scanning probe microscopy inspection and modification system

Field-assisted micro- and nano-fabrication method