using a reference heater of the emissive surface type

Industry

CPC
G01J5/524

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J5/00Radiation pyrometry

Current Industry

G01J5/524using a reference heater of the emissive surface type

Industries

Patents Grantslast 30 patents

Information Patent Grant
Radiometric correction and alignment techniques for thermal imager...
- Patent number 10,598,550
- Issue date Mar 24, 2020
- FLIR Systems, Inc.
- Roderick C. Christel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Non-contact thermal measurements of VUV optics
- Patent number 10,139,283
- Issue date Nov 27, 2018
- KLA-Tencor Corporation
- Anatoly Shchemelinin
- G01 - MEASURING TESTING
Information Patent Grant
Thermal imaging calibration system and method
- Patent number 10,101,213
- Issue date Oct 16, 2018
- LEONARDO MW LTD
- Luke Alexander Pillans
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device for testing a sensor of train undercarriage temperatures
- Patent number 9,423,305
- Issue date Aug 23, 2016
- Progress Rail Services Corporation
- Alessandro Agostini
- B61 - RAILWAYS
Information Patent Grant
Low temperature measurement and control using low temperature pyrom...
- Patent number 8,967,860
- Issue date Mar 3, 2015
- Applied Materials, Inc.
- Kailash Kiran Patalay
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing a sensor of train undercarriage temperatures
- Patent number 8,944,677
- Issue date Feb 3, 2015
- Progress Rail Services Corp.
- Alessandro Agostini
- B61 - RAILWAYS
Information Patent Grant
Method of measuring in situ differential emissivity and temperature
- Patent number 8,192,077
- Issue date Jun 5, 2012
- SIEMENS ENERGY, INC.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Grant
Infrared target temperature correction system and method
- Patent number 8,177,421
- Issue date May 15, 2012
- Fluke Corporation
- Frank E. Liebmann
- G01 - MEASURING TESTING
Information Patent Grant
Infrared radiation sources, sensors and source combinations, and me...
- Patent number 7,968,848
- Issue date Jun 28, 2011
- Nomadics, Inc.
- Edward A. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Radiation measuring apparatus, and method and device for testing pr...
- Patent number 7,682,073
- Issue date Mar 23, 2010
- Kaz, Incorporated
- Bernhard Kraus
- G01 - MEASURING TESTING
Information Patent Grant
Infrared target temperature correction system and method
- Patent number 7,661,876
- Issue date Feb 16, 2010
- Fluke Corporation
- Frank E. Liebmann
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring in situ differential emissivity and temperature
- Patent number 7,632,012
- Issue date Dec 15, 2009
- SIEMENS ENERGY, INC.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Grant
Infrared radiation sources, sensors and source combinations, and me...
- Patent number 7,511,274
- Issue date Mar 31, 2009
- Ion Optics, Inc.
- Edward A Johnson
- G01 - MEASURING TESTING
Information Patent Grant
System and method for identifying and classifying dynamic thermodyn...
- Patent number 7,408,156
- Issue date Aug 5, 2008
- Victor John Yannacone, Jr.
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Infrared radiation sources, sensors and source combinations, and me...
- Patent number 7,119,337
- Issue date Oct 10, 2006
- Ion Optics, Inc.
- Edward A. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring ambient temperature and a temperature measureme...
- Patent number 6,817,756
- Issue date Nov 16, 2004
- Mahlo GmbH & Co. KG
- Klaus Raum
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for calibrating measurements of temperatures inde...
- Patent number 6,561,694
- Issue date May 13, 2003
- Steag RTP Systems GmbH
- Wilfried Lerch
- G01 - MEASURING TESTING
Information Patent Grant
Temperature determination using pyrometry
- Patent number 6,398,406
- Issue date Jun 4, 2002
- Sandia Corporation
- William G. Breiland
- G01 - MEASURING TESTING
Information Patent Grant
Range pyrometer
- Patent number 6,375,350
- Issue date Apr 23, 2002
- Quantum Logic Corp
- Alexander Stein
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Realtime sensitivity correction method and infrared imaging system
- Patent number 6,230,108
- Issue date May 8, 2001
- Fujitsu Limited
- Yuuichi Matsuda
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a heat source
- Patent number 5,697,705
- Issue date Dec 16, 1997
- Test Products, Inc.
- Dennis J. Callewaert
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for emissivity independent self-calibrating of...
- Patent number 5,690,429
- Issue date Nov 25, 1997
- Daniel Ng
- G01 - MEASURING TESTING
Information Patent Grant
Thermal difference detector system
- Patent number 5,542,764
- Issue date Aug 6, 1996
- Test Projects, Inc.
- Dennis J. Callewaert
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for temperature measurement by radiation
- Patent number 5,127,742
- Issue date Jul 7, 1992
- Thermoscan Inc.
- Jacob Fraden
- G01 - MEASURING TESTING
Information Patent Grant
Emissivity calibration apparatus and method
- Patent number 4,989,991
- Issue date Feb 5, 1991
- AG Processing Technologies, Inc.
- Michel Pecot
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring surface temperature of semiconductor wafer sub...
- Patent number 4,979,134
- Issue date Dec 18, 1990
- Minolta Camera Kabushiki Kaisha
- Jiro Arima
- G01 - MEASURING TESTING
Information Patent Grant
Optical pyrometer with at least one fibre
- Patent number 4,955,979
- Issue date Sep 11, 1990
- Electricite de France - Service National
- Yves Denayrolles
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for accurately measuring temperature of materials of vari...
- Patent number 4,883,364
- Issue date Nov 28, 1989
- Barnes Engineering Company
- Robert W. Astheimer
- G01 - MEASURING TESTING
Information Patent Grant
Emissivity calibration apparatus and method
- Patent number 4,854,727
- Issue date Aug 8, 1989
- AG Processing Technologies, Inc.
- Michel Pecot
- G01 - MEASURING TESTING
Information Patent Grant
Infrared electronic thermometer and method for measuring temperature
- Patent number 4,797,840
- Issue date Jan 10, 1989
- Thermoscan Inc.
- Jacob Fraden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MOLYBDENUM SILICIDE / SILICON NITRIDE COMPOSITE INFRARED EMITTER AP...
- Publication number 20200203914
- Publication date Jun 25, 2020
- Alex Kropachev
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
RADIOMETRIC CORRECTION AND ALIGNMENT TECHNIQUES FOR THERMAL IMAGER...
- Publication number 20180238740
- Publication date Aug 23, 2018
- FLIR SYSTEMS, INC.
- Roderick C. Christel
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SHIELD PLATE AND MEASUREMENT APPARATUS
- Publication number 20180106680
- Publication date Apr 19, 2018
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING LIGHT INTENSITY DISTRIBUTION
- Publication number 20130327937
- Publication date Dec 12, 2013
- KAI-LI JIANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
DEVICE FOR TESTING A SENSOR OF TRAIN UNDERCARRIAGE TEMPERATURES
- Publication number 20130094535
- Publication date Apr 18, 2013
- Progress Rail Services Corporation
- Alessandro Agostini
- B61 - RAILWAYS
Information Patent Application
LOW TEMPERATURE MEASUREMENT AND CONTROL USING LOW TEMPERATURE PYROM...
- Publication number 20120201267
- Publication date Aug 9, 2012
- Applied Materials, Inc.
- KAILASH Kiran PATALAY
- G01 - MEASURING TESTING
Information Patent Application
INFRARED TARGET TEMPERATURE CORRECTION SYSTEM AND METHOD
- Publication number 20100103976
- Publication date Apr 29, 2010
- FLUKE CORPORATION
- Frank E. Liebmann
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING IN SITU DIFFERENTIAL EMISSIVITY AND TEMPERATURE
- Publication number 20100014555
- Publication date Jan 21, 2010
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Application
INFRARED RADIATION SOURCES, SENSORS AND SOURCE COMBINATIONS, AND ME...
- Publication number 20100006761
- Publication date Jan 14, 2010
- ION OPTICS, INC.
- Edward A. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Infrared Target Temperature Correction System and Method
- Publication number 20090122826
- Publication date May 14, 2009
- FLUKE CORPORATION
- Frank E. Liebmann
- G01 - MEASURING TESTING
Information Patent Application
Radiation Measuring Apparatus, and Method and Device for Testing Pr...
- Publication number 20080019415
- Publication date Jan 24, 2008
- KAZ, INCORPORATED
- Bernhard Kraus
- G01 - MEASURING TESTING
Information Patent Application
Infrared radiation sources, sensors and source combinations, and me...
- Publication number 20070221848
- Publication date Sep 27, 2007
- Edward A. Johnson
- G01 - MEASURING TESTING
Information Patent Application
System and method for identifying and classifying dynamic thermodyn...
- Publication number 20070051889
- Publication date Mar 8, 2007
- Victor John Yannacone Jr
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method of measuring in situ differential emissivity and temperature
- Publication number 20070047615
- Publication date Mar 1, 2007
- Siemens Power Generation, Inc.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring temperature in microscale
- Publication number 20060176930
- Publication date Aug 10, 2006
- Jung Yul Yoo
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring ambient temperature and a temperature measureme...
- Publication number 20040013159
- Publication date Jan 22, 2004
- Mahlo GmbH & Co. KG
- Klaus Raum
- G01 - MEASURING TESTING

using a reference heater of the emissive surface type

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiometric correction and alignment techniques for thermal imager...

Non-contact thermal measurements of VUV optics

Thermal imaging calibration system and method

Device for testing a sensor of train undercarriage temperatures

Low temperature measurement and control using low temperature pyrom...

Device for testing a sensor of train undercarriage temperatures

Method of measuring in situ differential emissivity and temperature

Infrared target temperature correction system and method

Infrared radiation sources, sensors and source combinations, and me...

Radiation measuring apparatus, and method and device for testing pr...

Infrared target temperature correction system and method

Method of measuring in situ differential emissivity and temperature

Infrared radiation sources, sensors and source combinations, and me...

System and method for identifying and classifying dynamic thermodyn...

Infrared radiation sources, sensors and source combinations, and me...

Method of measuring ambient temperature and a temperature measureme...

Method and device for calibrating measurements of temperatures inde...

Temperature determination using pyrometry

Range pyrometer

Realtime sensitivity correction method and infrared imaging system

Method for testing a heat source

Method and apparatus for emissivity independent self-calibrating of...

Thermal difference detector system

Apparatus and method for temperature measurement by radiation

Emissivity calibration apparatus and method

Method for measuring surface temperature of semiconductor wafer sub...

Optical pyrometer with at least one fibre

Apparatus for accurately measuring temperature of materials of vari...

Emissivity calibration apparatus and method

Infrared electronic thermometer and method for measuring temperature

Patents Applicationslast 30 patents

MOLYBDENUM SILICIDE / SILICON NITRIDE COMPOSITE INFRARED EMITTER AP...

RADIOMETRIC CORRECTION AND ALIGNMENT TECHNIQUES FOR THERMAL IMAGER...

SHIELD PLATE AND MEASUREMENT APPARATUS

METHOD FOR MEASURING LIGHT INTENSITY DISTRIBUTION

DEVICE FOR TESTING A SENSOR OF TRAIN UNDERCARRIAGE TEMPERATURES

LOW TEMPERATURE MEASUREMENT AND CONTROL USING LOW TEMPERATURE PYROM...

INFRARED TARGET TEMPERATURE CORRECTION SYSTEM AND METHOD

METHOD OF MEASURING IN SITU DIFFERENTIAL EMISSIVITY AND TEMPERATURE

INFRARED RADIATION SOURCES, SENSORS AND SOURCE COMBINATIONS, AND ME...

Infrared Target Temperature Correction System and Method

Radiation Measuring Apparatus, and Method and Device for Testing Pr...

Infrared radiation sources, sensors and source combinations, and me...

System and method for identifying and classifying dynamic thermodyn...

Method of measuring in situ differential emissivity and temperature

Method for measuring temperature in microscale

Method of measuring ambient temperature and a temperature measureme...