using an arc discharge

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H01J49/12

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/12using an arc discharge

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 12,165,863
- Issue date Dec 10, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for preparing glow discharge sputtering sample...
- Patent number 12,019,025
- Issue date Jun 25, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Xing Yu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electrostatic loading of powder samples for ionization
- Patent number 11,913,861
- Issue date Feb 27, 2024
- Bruker Scientific LLC
- Brian D Musselman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 11,742,194
- Issue date Aug 29, 2023
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discharge chambers and ionization devices, methods and systems usin...
- Patent number 11,705,319
- Issue date Jul 18, 2023
- PerkinElmer Scientific Canada ULC
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for analyzing the elemental composition of a liquid sampl...
- Patent number 11,474,042
- Issue date Oct 18, 2022
- Agnes Obuchowska
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,430,647
- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Duoplasmatron ion source with a partially ferromagnetic anode
- Patent number 11,289,299
- Issue date Mar 29, 2022
- Arizona Board of Regents on behalf of Arizona State University
- Peter Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric-pressure ionization and fragmentation of molecules for...
- Patent number 11,133,170
- Issue date Sep 28, 2021
- Indiana University Research and Technology Corporation
- Jacob T. Shelley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 11,049,707
- Issue date Jun 29, 2021
- IonSense, Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Grant
Discharge chambers and ionization devices, methods and systems usin...
- Patent number 11,031,227
- Issue date Jun 8, 2021
- PerkinElmer Health Sciences Canada, Inc.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,910,208
- Issue date Feb 2, 2021
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glow discharge ion source
- Patent number 10,714,325
- Issue date Jul 14, 2020
- Micromass UK Limited
- Jeffery Mark Brown
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 10,643,833
- Issue date May 5, 2020
- IonSense, Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 10,636,644
- Issue date Apr 28, 2020
- Nova Measuring Instruments Inc.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry using plasma ion source
- Patent number 10,510,522
- Issue date Dec 17, 2019
- Agilent Technologies, Inc.
- Naoki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and a method for plating an Nd—Fe—B magnet
- Patent number 10,480,057
- Issue date Nov 19, 2019
- YANTAI SHOUGANG MAGNETIC MATERIALS INC.
- Kunkun Yang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Pulsed plasma analyzer and method for analyzing the same
- Patent number 10,249,485
- Issue date Apr 2, 2019
- Samsung Electronics Co., Ltd.
- Vladimir Volynets
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ionization device with mass spectrometer therewith
- Patent number 10,236,169
- Issue date Mar 19, 2019
- Carl Zeiss SMT GmbH
- Michel Aliman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 10,134,575
- Issue date Nov 20, 2018
- IonSense, Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation system having beam angle control in drift and dece...
- Patent number 10,037,877
- Issue date Jul 31, 2018
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 9,960,029
- Issue date May 1, 2018
- IonSense, Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for ionizing particles of a sample gas flow
- Patent number 9,916,972
- Issue date Mar 13, 2018
- University of Helsinki
- Mikko Sipilä
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle charger
- Patent number 9,875,873
- Issue date Jan 23, 2018
- Shimadzu Corporation
- Yoshihiro Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for thermal assisted desorption ionization sys...
- Patent number 9,514,923
- Issue date Dec 6, 2016
- Ionsense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glow discharge mass spectrometry method and device
- Patent number 9,508,539
- Issue date Nov 29, 2016
- HORIBA Jobin Yvon SAS
- Patrick Chapon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glow discharge ion source
- Patent number 9,500,607
- Issue date Nov 22, 2016
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Remote arc discharge plasma assisted processes
- Patent number 9,412,569
- Issue date Aug 9, 2016
- Vapor Technologies, Inc.
- Vladimir Gorokhovsky
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Glow discharge ion source
- Patent number 9,080,936
- Issue date Jul 14, 2015
- Micromass UK Limited
- Jeffery Mark Brown
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PREPARING GLOW DISCHARGE SPUTTERING SAMPLE...
- Publication number 20220205922
- Publication date Jun 30, 2022
- NCS Testing Technology CO.,LTD
- Xing YU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...
- Publication number 20220102130
- Publication date Mar 31, 2022
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC LOADING OF POWDER SAMPLES FOR IONIZATION
- Publication number 20210372892
- Publication date Dec 2, 2021
- IonSense Inc.
- Brian D. Musselman
- G01 - MEASURING TESTING
Information Patent Application
DUOPLASMATRON ION SOURCE WITH A PARTIALLY FERROMAGNETIC ANODE
- Publication number 20210375574
- Publication date Dec 2, 2021
- Peter Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20210327699
- Publication date Oct 21, 2021
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20210305037
- Publication date Sep 30, 2021
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYZING THE ELEMENTAL COMPOSITION OF A LIQUID SAMPL...
- Publication number 20210131971
- Publication date May 6, 2021
- Agnes OBUCHOWSKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20200303175
- Publication date Sep 24, 2020
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE FOR GENERATING IONS AND CALIBRATING METHODS OF MASS SPEC...
- Publication number 20200273685
- Publication date Aug 27, 2020
- Shimadzu Corporation
- Liang WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20200258733
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...
- Publication number 20190355565
- Publication date Nov 21, 2019
- PERKINELMER HEALTH SCIENCES CANADA, INC.
- Mehrnaz Sarrafzadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY USING PLASMA ION SOURCE
- Publication number 20190214239
- Publication date Jul 11, 2019
- Agilent Technologies, Inc.
- Naoki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20190080894
- Publication date Mar 14, 2019
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20180226240
- Publication date Aug 9, 2018
- IonSense Inc.
- Jordan Krechmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED PLASMA ANALYZER AND METHOD FOR ANALYZING THE SAME
- Publication number 20180130651
- Publication date May 10, 2018
- Samsung Electronics Co., Ltd.
- VLADIMIR VOLYNETS
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PARTICLE CHARGER
- Publication number 20170229275
- Publication date Aug 10, 2017
- SHIMADZU CORPORATION
- Yoshihiro UENO
- G01 - MEASURING TESTING
Information Patent Application
Glow Discharge Ion Source
- Publication number 20170069478
- Publication date Mar 9, 2017
- Micromass UK Limited
- Jeffery Mark Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE DISPLACEMENT MEASURING APPARATUS, IONIZATION APPARATUS INCLUD...
- Publication number 20160203968
- Publication date Jul 14, 2016
- Canon Kabushiki Kaisha
- Yoichi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Ionizing Particles of a Sample Gas Flow
- Publication number 20160126079
- Publication date May 5, 2016
- University of Helsinki
- Mikko Sipilä
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GLOW DISCHARGE MASS SPECTROMETRY METHOD AND DEVICE
- Publication number 20160111270
- Publication date Apr 21, 2016
- HORIBA JOBIN YVON SAS
- Patrick CHAPON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20140346348
- Publication date Nov 27, 2014
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Application
LOOPED IONIZATION SOURCE
- Publication number 20140246581
- Publication date Sep 4, 2014
- SMITHS DETECTION MONTREAL INC.
- Daniel Levin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ANALYSIS AND ION SOURCE
- Publication number 20140103205
- Publication date Apr 17, 2014
- Scientific Analysis Instruments Limited
- Victor Carl Parr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Remote Arc Discharge Plasma Assisted Processes
- Publication number 20140076718
- Publication date Mar 20, 2014
- VAPOR TECHNOLOGIES, INC.
- Vladimir Gorokhovsky
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Glow Discharge Ion Source
- Publication number 20140051181
- Publication date Feb 20, 2014
- Micromass UK Limited
- Jeffery Mark Brown
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20130280812
- Publication date Oct 24, 2013
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...
- Publication number 20120199735
- Publication date Aug 9, 2012
- IonSense Inc.
- Jordan Krechmer
- G01 - MEASURING TESTING
Information Patent Application
Ion Population Control for an Electrical Discharge Ionization Source
- Publication number 20120149125
- Publication date Jun 14, 2012
- Lee EARLEY
- H01 - BASIC ELECTRIC ELEMENTS

using an arc discharge

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for preparing glow discharge sputtering sample...

Electrostatic loading of powder samples for ionization

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for thermal assisted desorption ionization sys...

Discharge chambers and ionization devices, methods and systems usin...

Apparatus for analyzing the elemental composition of a liquid sampl...

Systems and approaches for semiconductor metrology and surface anal...

Duoplasmatron ion source with a partially ferromagnetic anode

Atmospheric-pressure ionization and fragmentation of molecules for...

Apparatus and method for thermal assisted desorption ionization sys...

Discharge chambers and ionization devices, methods and systems usin...

Systems and approaches for semiconductor metrology and surface anal...

Glow discharge ion source

Apparatus and method for thermal assisted desorption ionization sys...

Systems and approaches for semiconductor metrology and surface anal...

Mass spectrometry using plasma ion source

Apparatus and a method for plating an Nd—Fe—B magnet

Pulsed plasma analyzer and method for analyzing the same

Ionization device with mass spectrometer therewith

Apparatus and method for thermal assisted desorption ionization sys...

Ion implantation system having beam angle control in drift and dece...

Apparatus and method for thermal assisted desorption ionization sys...

Method and device for ionizing particles of a sample gas flow

Particle charger

Apparatus and method for thermal assisted desorption ionization sys...

Glow discharge mass spectrometry method and device

Glow discharge ion source

Remote arc discharge plasma assisted processes

Glow discharge ion source

Patents Applicationslast 30 patents

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

APPARATUS AND METHOD FOR PREPARING GLOW DISCHARGE SPUTTERING SAMPLE...

DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...

ELECTROSTATIC LOADING OF POWDER SAMPLES FOR IONIZATION

DUOPLASMATRON ION SOURCE WITH A PARTIALLY FERROMAGNETIC ANODE

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

APPARATUS FOR ANALYZING THE ELEMENTAL COMPOSITION OF A LIQUID SAMPL...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

ION SOURCE FOR GENERATING IONS AND CALIBRATING METHODS OF MASS SPEC...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

DISCHARGE CHAMBERS AND IONIZATION DEVICES, METHODS AND SYSTEMS USIN...

MASS SPECTROMETRY USING PLASMA ION SOURCE

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

PULSED PLASMA ANALYZER AND METHOD FOR ANALYZING THE SAME

PARTICLE CHARGER

Glow Discharge Ion Source

PROBE DISPLACEMENT MEASURING APPARATUS, IONIZATION APPARATUS INCLUD...

Method and Device for Ionizing Particles of a Sample Gas Flow

GLOW DISCHARGE MASS SPECTROMETRY METHOD AND DEVICE

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

LOOPED IONIZATION SOURCE

METHOD AND APPARATUS FOR ANALYSIS AND ION SOURCE

Remote Arc Discharge Plasma Assisted Processes

Glow Discharge Ion Source

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

APPARATUS AND METHOD FOR THERMAL ASSISTED DESORPTION IONIZATION SYS...

Ion Population Control for an Electrical Discharge Ionization Source