using at least one grating in an off-plane configuration

Industry

CPC
G01J3/189

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/189using at least one grating in an off-plane configuration

Industries

Patents Grantslast 30 patents

Information Patent Grant
Pulsed-light spectroscopic device
- Patent number 12,270,704
- Issue date Apr 8, 2025
- Ushio Denki Kabushiki Kaisha
- Kazuki Shinoyama
- G02 - OPTICS
Information Patent Grant
Device for optical applications
- Patent number 12,247,877
- Issue date Mar 11, 2025
- FiSensGmbh
- Christian Waltermann
- G02 - OPTICS
Information Patent Grant
Single-photon timing system and method
- Patent number 12,130,176
- Issue date Oct 29, 2024
- The Regents of the University of Colorado, a Body Corporate
- Shu-Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical applications, spectrometer system and method...
- Patent number 12,018,985
- Issue date Jun 25, 2024
- FiSens GmbH
- Christian Waltermann
- G02 - OPTICS
Information Patent Grant
Apparatus for measuring Raman spectrum and method thereof
- Patent number 11,965,779
- Issue date Apr 23, 2024
- TimeGate Instruments Oy
- Lauri Kurki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system using fiber Bragg grating sensor
- Patent number 11,892,329
- Issue date Feb 6, 2024
- FBG KOREA INC.
- Geum Suk Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical monitoring for power grid systems
- Patent number 11,860,242
- Issue date Jan 2, 2024
- Xerox Corporation
- Ajay Raghavan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light filter and spectrometer including the same
- Patent number 11,828,650
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Jineun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical array waveguide grating-type multiplexer and demultiplexer...
- Patent number 11,828,982
- Issue date Nov 28, 2023
- LG Innotek Co., Ltd
- Lee Im Kang
- G01 - MEASURING TESTING
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,761,892
- Issue date Sep 19, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive waveguide providing structured illumination for object...
- Patent number 11,747,719
- Issue date Sep 5, 2023
- DigiLens. Inc.
- Milan Momcilo Popovich
- G01 - MEASURING TESTING
Information Patent Grant
Silicon fourier transform spectrometer and optical spectrum reconst...
- Patent number 11,733,098
- Issue date Aug 22, 2023
- Shanghai Jiao Tong University
- Liangjun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,719,633
- Issue date Aug 8, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G02 - OPTICS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,719,634
- Issue date Aug 8, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G02 - OPTICS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,709,135
- Issue date Jul 25, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G02 - OPTICS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,703,453
- Issue date Jul 18, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical applications, spectrometer system and method...
- Patent number 11,698,302
- Issue date Jul 11, 2023
- FiSens GmbH
- Christian Waltermann
- G01 - MEASURING TESTING
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,698,341
- Issue date Jul 11, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,680,901
- Issue date Jun 20, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,662,310
- Issue date May 30, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,619,583
- Issue date Apr 4, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polychromator systems and methods
- Patent number 11,579,459
- Issue date Feb 14, 2023
- Agilent Technologies, Inc.
- Sean M. Kent
- G02 - OPTICS
Information Patent Grant
Heterogeneous spectroscopic transceiving photonic integrated circui...
- Patent number 11,573,123
- Issue date Feb 7, 2023
- OpenLight Photonics, Inc.
- Gregory Alan Fish
- G02 - OPTICS
Information Patent Grant
Highly stable semiconductor lasers and sensors for III-V and silico...
- Patent number 11,573,178
- Issue date Feb 7, 2023
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G02 - OPTICS
Information Patent Grant
Optical monitoring to detect contamination of power grid components
- Patent number 11,555,864
- Issue date Jan 17, 2023
- Palo Alto Research Center Incorporated
- Saman Mostafavi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical device and spectral detection apparatus
- Patent number 11,536,606
- Issue date Dec 27, 2022
- BOE Technology Group Co., Ltd.
- Xianqin Meng
- G01 - MEASURING TESTING
Information Patent Grant
Integrated bound-mode spectral/angular sensors
- Patent number 11,480,463
- Issue date Oct 25, 2022
- Steven R. J. Brueck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature insensitive filter
- Patent number 11,360,262
- Issue date Jun 14, 2022
- Universiteit Gent
- Roeland Baets
- G02 - OPTICS
Information Patent Grant
Method, system and apparatus for a Raman spectroscopic measurement...
- Patent number 11,280,675
- Issue date Mar 22, 2022
- Ruolin Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heterogeneous spectroscopic transceiving photonic integrated circui...
- Patent number 11,231,320
- Issue date Jan 25, 2022
- Aurrion, Inc.
- Gregory Alan Fish
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HYPERSPECTRAL COMPRESSIVE IMAGING WITH INTEGRATED PHOTONICS
- Publication number 20250076573
- Publication date Mar 6, 2025
- The Regents of the University of California
- Sung-Joo Ben Yoo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS
- Publication number 20240377246
- Publication date Nov 14, 2024
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PHOTON TIMING SYSTEM AND METHOD
- Publication number 20240183709
- Publication date Jun 6, 2024
- The Regents of the University of Colorado, a Body Corporate
- Shu-Wei HUANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR MAKING A TIME-SYNCHRONISED PHASOR MEASURE...
- Publication number 20240125827
- Publication date Apr 18, 2024
- Synaptec Limited
- Philip Orr
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OPTICAL SPECTROMETER SYSTEM
- Publication number 20240044705
- Publication date Feb 8, 2024
- Bar Ilan University
- Moti FRIDMAN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING MODULE
- Publication number 20230375525
- Publication date Nov 23, 2023
- ROCKLEY PHOTONICS LIMITED
- Sean Merritt
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS FOR OPTICAL APPLICATIONS, SPECTROMETER SYSTEM AND METHOD...
- Publication number 20230314217
- Publication date Oct 5, 2023
- FiSens GmbH
- Christian Waltermann
- G02 - OPTICS
Information Patent Application
PULSED-LIGHT SPECTROSCOPIC DEVICE
- Publication number 20230314216
- Publication date Oct 5, 2023
- Ushio Denki Kabushiki Kaisha
- Kazuki Shinoyama
- G02 - OPTICS
Information Patent Application
INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP
- Publication number 20220412800
- Publication date Dec 29, 2022
- UNM Rainforest Innovations
- Steven R.J. BRUECK
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING RAMAN SPECTRUM AND METHOD THEREOF
- Publication number 20220373392
- Publication date Nov 24, 2022
- TimeGate Instruments Oy
- Lauri Kurki
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR OPTICAL APPLICATIONS
- Publication number 20220341763
- Publication date Oct 27, 2022
- FiSensGmbh
- Christian Waltermann
- G01 - MEASURING TESTING
Information Patent Application
SILICON FOURIER TRANSFORM SPECTROMETER AND OPTICAL SPECTRUM RECONST...
- Publication number 20220187129
- Publication date Jun 16, 2022
- SHANGHAI JIAO TONG UNIVERSITY
- Liangjun LU
- G01 - MEASURING TESTING
Information Patent Application
Diffractive Waveguide Providing Structured Illumination for Object...
- Publication number 20220187692
- Publication date Jun 16, 2022
- DIGILENS INC.
- Milan Momcilo Popovich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING T...
- Publication number 20220128407
- Publication date Apr 28, 2022
- SAMSUNG ELECTRONICS CO,. LTD.
- Jaesoong LEE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MONITORING FOR POWER GRID SYSTEMS
- Publication number 20220107367
- Publication date Apr 7, 2022
- Palo Alto Research Center Incorporated
- Ajay Raghavan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...
- Publication number 20220107219
- Publication date Apr 7, 2022
- Aurrion, Inc.
- Gregory Alan Fish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL MONITORING TO DETECT CONTAMINATION OF POWER GRID COMPONENTS
- Publication number 20220107366
- Publication date Apr 7, 2022
- Palo Alto Research Center Incorporated
- Saman Mostafavi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compact Edge Illuminated Diffractive Display
- Publication number 20220075242
- Publication date Mar 10, 2022
- DIGILENS INC.
- Milan Momcilo Popovich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210404957
- Publication date Dec 30, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396668
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396666
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396670
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396669
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396664
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396665
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210396667
- Publication date Dec 23, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- G01 - MEASURING TESTING
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210389241
- Publication date Dec 16, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...
- Publication number 20210389242
- Publication date Dec 16, 2021
- The Government of the United States of America, as represented by the Secreta...
- Jerry R. Meyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photonic Circuit With Integrated Light Coupler
- Publication number 20210294034
- Publication date Sep 23, 2021
- IMEC vzw
- Tom Claes
- G01 - MEASURING TESTING
Information Patent Application
LASER DIAGNOSTICS APPARATUS
- Publication number 20210296848
- Publication date Sep 23, 2021
- ARRIS Enterprises LLC
- Hector E. Sanchez
- G01 - MEASURING TESTING

using at least one grating in an off-plane configuration

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Pulsed-light spectroscopic device

Device for optical applications

Single-photon timing system and method

Apparatus for optical applications, spectrometer system and method...

Apparatus for measuring Raman spectrum and method thereof

Measurement system using fiber Bragg grating sensor

Optical monitoring for power grid systems

Light filter and spectrometer including the same

Optical array waveguide grating-type multiplexer and demultiplexer...

Highly stable semiconductor lasers and sensors for III-V and silico...

Diffractive waveguide providing structured illumination for object...

Silicon fourier transform spectrometer and optical spectrum reconst...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Apparatus for optical applications, spectrometer system and method...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Highly stable semiconductor lasers and sensors for III-V and silico...

Polychromator systems and methods

Heterogeneous spectroscopic transceiving photonic integrated circui...

Highly stable semiconductor lasers and sensors for III-V and silico...

Optical monitoring to detect contamination of power grid components

Optical device and spectral detection apparatus

Integrated bound-mode spectral/angular sensors

Temperature insensitive filter

Method, system and apparatus for a Raman spectroscopic measurement...

Heterogeneous spectroscopic transceiving photonic integrated circui...

Patents Applicationslast 30 patents

HYPERSPECTRAL COMPRESSIVE IMAGING WITH INTEGRATED PHOTONICS

INTEGRATED BOUND-MODE SPECTRAL/ANGULAR SENSORS

SINGLE-PHOTON TIMING SYSTEM AND METHOD

METHODS AND APPARATUS FOR MAKING A TIME-SYNCHRONISED PHASOR MEASURE...

OPTICAL SPECTROMETER SYSTEM

OPTICAL SENSING MODULE

APPARATUS FOR OPTICAL APPLICATIONS, SPECTROMETER SYSTEM AND METHOD...

PULSED-LIGHT SPECTROSCOPIC DEVICE

INTEGRATED CHIRPED-GRATING SPECTROMETER-ON-A-CHIP

APPARATUS FOR MEASURING RAMAN SPECTRUM AND METHOD THEREOF

DEVICE FOR OPTICAL APPLICATIONS

SILICON FOURIER TRANSFORM SPECTROMETER AND OPTICAL SPECTRUM RECONST...

Diffractive Waveguide Providing Structured Illumination for Object...

SPECTRAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING T...

OPTICAL MONITORING FOR POWER GRID SYSTEMS

HETEROGENEOUS SPECTROSCOPIC TRANSCEIVING PHOTONIC INTEGRATED CIRCUI...

OPTICAL MONITORING TO DETECT CONTAMINATION OF POWER GRID COMPONENTS

Compact Edge Illuminated Diffractive Display

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Highly Stable Semiconductor Lasers and Sensors for III-V and Silico...

Photonic Circuit With Integrated Light Coupler

LASER DIAGNOSTICS APPARATUS